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How to prepare samples for atomic force microscopy?

How to prepare samples for atomic force microscopy?, Total:21 items.

In the international standard classification, How to prepare samples for atomic force microscopy? involves: Physics. Chemistry, Optics and optical measurements, Ceramics, Linear and angular measurements, Nuclear energy engineering, Test conditions and procedures in general, Analytical chemistry, Protection against dangerous goods, Air quality.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, How to prepare samples for atomic force microscopy?

GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon nanomaterials involving biological effect

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, How to prepare samples for atomic force microscopy?

GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic steps

German Institute for Standardization, How to prepare samples for atomic force microscopy?

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Japanese Industrial Standards Committee (JISC), How to prepare samples for atomic force microscopy?

JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy

Professional Standard - Nuclear Industry, How to prepare samples for atomic force microscopy?

EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool

British Standards Institution (BSI), How to prepare samples for atomic force microscopy?

BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
23/30461942 DC BS ISO 19606. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy

American Society for Testing and Materials (ASTM), How to prepare samples for atomic force microscopy?

ASTM D6480-05(2010) Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
ASTM D6480-99 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
ASTM D6480-05 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
ASTM D6480-19 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Surface Loading by Transmission Electron Microscopy

Aerospace, Security and Defence Industries Association of Europe (ASD), How to prepare samples for atomic force microscopy?

ASD-STAN PREN 2004-10-1993 Aerospace Series Test Methods for Aluminium and Aluminium Alloy Products Part 10: Preparation of Micrographic Specimens for Aluminium Alloys (Edition P 1)

ASD-STAN - Aerospace and Defence Industries Association of Europe - Standardization, How to prepare samples for atomic force microscopy?

PREN 2004-10-1993 Aerospace Series Test Methods for Aluminium and Aluminium Alloy Products Part 10: Preparation of Micrographic Specimens for Aluminium Alloys (Edition P 1)

NL-NEN, How to prepare samples for atomic force microscopy?

NVN 5770-1993 Soil and sludge. Sample preparation of soil and sludge for the determination of elements by atomic spectrometry. Destruction with nitric acid and hydrochloric acid in a microwave oven

Association Francaise de Normalisation, How to prepare samples for atomic force microscopy?

NF X43-265-2:2012 Workplace air - Determination of metals and metalloids in airborne particulate matter by inductively coupled plasma atomic emission spectrometry - Part 2 : sample preparation.