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Calibration of Electron Microscopes

Calibration of Electron Microscopes, Total:16 items.

In the international standard classification, Calibration of Electron Microscopes involves: Optical equipment, Metrology and measurement in general, Optoelectronics. Laser equipment.

American Society for Testing and Materials (ASTM), Calibration of Electron Microscopes

• ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

British Standards Institution (BSI), Calibration of Electron Microscopes

• BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
• BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

National Metrological Technical Specifications of the People's Republic of China, Calibration of Electron Microscopes

• JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China, Calibration of Electron Microscopes

• T/CSTM 00162-2020 Calibration methods for transmission electron microscope

Shanghai Provincial Standard of the People's Republic of China, Calibration of Electron Microscopes

• DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
• DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

Korean Agency for Technology and Standards (KATS), Calibration of Electron Microscopes

• KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification

International Organization for Standardization (ISO), Calibration of Electron Microscopes

• ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
• ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Association Francaise de Normalisation, Calibration of Electron Microscopes

• NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

Others:   Electron Microscope Calibration, Sample Calibration, calibration of xps, Calibration of pH Meter, Electron Microscope Calibration, calibration error, Analysis of Calibration Curves, Calibration of the mass spectrometer, Calibration of fluorescence instruments, Calibration of dometer, Calibration for photogrammetry, Spectral Calibration of Fluorescence, Lan instrument calibration, Calibration of standard curve, Calibration site, time calibration, Calibration of Electron Microscopes, The concept of calibrator, Basis for Calibration of Equipment, The role of calibration.