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Quaternary X-ray Diffractometer
Quaternary X-ray Diffractometer, Total:46 items.
In the international standard classification, Quaternary X-ray Diffractometer involves: Optics and optical measurements, Radiation protection, Testing of metals, Occupational safety. Industrial hygiene, Analytical chemistry, Non-destructive testing, Products of the chemical industry, Production of metals, Non-metalliferous minerals, Education, Inorganic chemicals, Linear and angular measurements, Radiation measurements.
Professional Standard - Machinery, Quaternary X-ray Diffractometer
National Metrological Verification Regulations of the People's Republic of China, Quaternary X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Quaternary X-ray Diffractometer
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 8362-1987 Retained austenite in steel--Quantitative determination--Method of X-ray diffractometer
- GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
工业和信息化部, Quaternary X-ray Diffractometer
- YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel
Occupational Health Standard of the People's Republic of China, Quaternary X-ray Diffractometer
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
American National Standards Institute （ANSI), Quaternary X-ray Diffractometer
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
国家市场监督管理总局、中国国家标准化管理委员会, Quaternary X-ray Diffractometer
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Professional Standard - Ferrous Metallurgy, Quaternary X-ray Diffractometer
- YB/T 5337-2006 Determination method of metal lattice constant X-ray diffractometer method
- YB/T 5338-2006 X-ray Diffraction Method for Quantitative Determination of Retained Austenite in Steel
- YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
British Standards Institution (BSI), Quaternary X-ray Diffractometer
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
Japanese Industrial Standards Committee (JISC), Quaternary X-ray Diffractometer
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
American Society for Testing and Materials (ASTM), Quaternary X-ray Diffractometer
- ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-19 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-21 Standard Practice for Verifying the Alignment of X-Ray Diffraction Instruments for Residual Stress Measurement
Professional Standard - Education, Quaternary X-ray Diffractometer
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
German Institute for Standardization, Quaternary X-ray Diffractometer
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 16424:2015-03 Characterization of waste - Screening methods for the element composition by portable X-ray fluorescence instruments; German version EN 16424:2014
European Committee for Standardization (CEN), Quaternary X-ray Diffractometer
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Association Francaise de Normalisation, Quaternary X-ray Diffractometer
Danish Standards Foundation, Quaternary X-ray Diffractometer
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Lithuanian Standards Office , Quaternary X-ray Diffractometer
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Professional Standard - Customs, Quaternary X-ray Diffractometer
- HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
AENOR, Quaternary X-ray Diffractometer
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- UNE-EN 16424:2015 Characterization of waste - Screening methods for the element composition by portable X-ray fluorescence instruments
工业和信息化部/国家能源局, Quaternary X-ray Diffractometer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
Korean Agency for Technology and Standards (KATS), Quaternary X-ray Diffractometer
KR-KS, Quaternary X-ray Diffractometer
未注明发布机构, Quaternary X-ray Diffractometer
- BS EN 16424:2014(2015) Characterization of waste — Screening methods for the element composition by portable X - ray fluorescence instruments
RU-GOST R, Quaternary X-ray Diffractometer
- GOST R 8.698-2010 State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer
International Electrotechnical Commission (IEC), Quaternary X-ray Diffractometer
- IEC 61017-2:1994 Radiation protection instrumentation; portable, transportable or installed equipment to measure X or gamma radiation for environmental monitoring; part 2: integrating assemblies