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thin film x-ray diffractometer
thin film x-ray diffractometer, Total:58 items.
In the international standard classification, thin film x-ray diffractometer involves: Optics and optical measurements, Radiation protection, Testing of metals, Occupational safety. Industrial hygiene, Analytical chemistry, Non-destructive testing, Linear and angular measurements, Products of the chemical industry, Production of metals, Ceramics, Non-metalliferous minerals, Welding, brazing and soldering, Education, Inorganic chemicals, Applications of information technology.
Professional Standard - Machinery, thin film x-ray diffractometer
National Metrological Verification Regulations of the People's Republic of China, thin film x-ray diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Verification Regulation for Polycrystalline X-Ray Diffractometer
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, thin film x-ray diffractometer
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 8362-1987 Retained austenite in steel--Quantitative determination--Method of X-ray diffractometer
- GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
工业和信息化部, thin film x-ray diffractometer
- YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel
PL-PKN, thin film x-ray diffractometer
- PN C99282-06-1989 Radiographic medical films Qualitative and usable characteristic of films for X-ray radiography
Occupational Health Standard of the People's Republic of China, thin film x-ray diffractometer
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
American National Standards Institute （ANSI), thin film x-ray diffractometer
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
国家市场监督管理总局、中国国家标准化管理委员会, thin film x-ray diffractometer
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
Professional Standard - Ferrous Metallurgy, thin film x-ray diffractometer
- YB/T 5337-2006 Determination method of metal lattice constant X-ray diffractometer method
- YB/T 5338-2006 X-ray Diffraction Method for Quantitative Determination of Retained Austenite in Steel
- YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
National Metrological Technical Specifications of the People's Republic of China, thin film x-ray diffractometer
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
British Standards Institution (BSI), thin film x-ray diffractometer
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- 20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements alignment and positioning, data collection, data analysis and reporting
- BS ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
RU-GOST R, thin film x-ray diffractometer
- GOST R 8.698-2010 State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer
Japanese Industrial Standards Committee (JISC), thin film x-ray diffractometer
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
International Organization for Standardization (ISO), thin film x-ray diffractometer
- ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- ISO 17636-1:2013 Non-destructive testing of welds - Radiographic testing - Part 1: X- and gamma-ray techniques with film
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
American Society for Testing and Materials (ASTM), thin film x-ray diffractometer
- ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-19 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-21 Standard Practice for Verifying the Alignment of X-Ray Diffraction Instruments for Residual Stress Measurement
- ASTM E2120-00 Standard Practice for the Performance Evaluation of the Portable X-Ray Fluorescence Spectrometer for the Measurement of Lead in Paint Films
German Institute for Standardization, thin film x-ray diffractometer
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN ISO 17636-1:2013 Non-destructive testing of welds - Radiographic testing - Part 1: X- and gamma-ray techniques with film (ISO 17636-1:2013); German version EN ISO 17636-1:2013
European Committee for Standardization (CEN), thin film x-ray diffractometer
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Association Francaise de Normalisation, thin film x-ray diffractometer
Danish Standards Foundation, thin film x-ray diffractometer
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Lithuanian Standards Office , thin film x-ray diffractometer
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- LST EN ISO 17636-1:2013 Non-destructive testing of welds - Radiographic testing - Part 1: X- and gamma-ray techniques with film (ISO 17636-1:2013)
Professional Standard - Customs, thin film x-ray diffractometer
- HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
AENOR, thin film x-ray diffractometer
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
未注明发布机构, thin film x-ray diffractometer
Professional Standard - Education, thin film x-ray diffractometer
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, thin film x-ray diffractometer
- GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
Korean Agency for Technology and Standards (KATS), thin film x-ray diffractometer
- KS D ISO 16413:2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
KR-KS, thin film x-ray diffractometer
- KS D ISO 16413-2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting