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How to Test Carrier Concentration

How to Test Carrier Concentration, Total:57 items.

In the international standard classification, How to Test Carrier Concentration involves: Testing of metals, Printed circuits and boards, Semiconducting materials, Inorganic chemicals, Insulating fluids, Continuous handling equipment, Electromechanical components for electronic and telecommunications equipment, Air quality.

国家市场监督管理总局、中国国家标准化管理委员会, How to Test Carrier Concentration

GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, How to Test Carrier Concentration

GB/T 8757-1988 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
GB/T 8757-2006 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
GB/T 11068-1989 Gallium arsenide epitaxial layer--Determination of carrier concentration--Voltage-capacitance method
GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
GB/T 11068-2006 Gallium arsenide epitaxial layer.Determination of carrier concentration voltage-capacitance method
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
GB 11068-1989 GaAs Epitaxial Layer Carrier Concentration Capacitance-Voltage Measurement Method
GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes
GB/T 14863-1993 Standard test method for net carrier density in silicon eqitaxial layers by voltage-capacitance of gated and ungated diodes

Professional Standard - Electron, How to Test Carrier Concentration

SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection
SJ 3244.1-1989 Methods of measurement for hall mobility and carrier concentration of Gallium arsenide and Indium phosphide
SJ 3244.4-1989 Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials--Electrochemical voltage capacitance method

Institute of Interconnecting and Packaging Electronic Circuits (IPC), How to Test Carrier Concentration

IPC TP-1113-1994 Circuit Board Ionic Cleanliness Measurement: What Does It Tell Us?

Group Standards of the People's Republic of China, How to Test Carrier Concentration

T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method

British Standards Institution (BSI), How to Test Carrier Concentration

PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
BS EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Current-carrying capacity tests - Test 5b - Current-temperature derating
BS EN 13205-4:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Laboratory performance test based on comparison of concentrations
BS EN 13205-6:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Transport and handling tests
BS EN 13205-2:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Laboratory performance test based on determination of sampling efficiency

American Society for Testing and Materials (ASTM), How to Test Carrier Concentration

ASTM F398-92(1997) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
ASTM F1393-92(1997) Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe
ASTM D6056-96 Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environement by Transmission Electron Microscopy
ASTM D6056-96(2001) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environement by Transmission Electron Microscopy
ASTM D6059-96(2001) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ASTM D6059-96 Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ASTM D6056-96(2006) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
ASTM D6059-96(2006) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
ASTM D6281-06 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
ASTM D6281-04 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
ASTM D6281-09 Standard Test Method for Airborne Asbestos Concentration in Ambient and Indoor Atmospheres as Determined by Transmission Electron Microscopy Direct Transfer (TEM)
ASTM F391-96 Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage

Korean Agency for Technology and Standards (KATS), How to Test Carrier Concentration

KS M ISO 283-1:2011 Textile conveyor belts－Full thickness tensile testing－Part 1：Determination of tensile strength, elongation at break and elongation at the reference load
KS M ISO 283-1:2007 Textile conveyor belts－Full thickness tensile testing－Part 1：Determination of tensile strength, elongation at break and elongation at the reference load
KS C IEC 60512-5-2:2003 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating
KS C IEC 60512-5-2-2003(2008) Connectors for electronic equipment－Tests and measurements－Part 5－2：Current－carrying capacity tests－Test 5b：Current－temperature derating
KS C IEC 60512-5-2:2014 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating

KR-KS, How to Test Carrier Concentration

KS M ISO 283-1-2007 Textile conveyor belts－Full thickness tensile testing－Part 1：Determination of tensile strength, elongation at break and elongation at the reference load

AENOR, How to Test Carrier Concentration

UNE-EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements -- Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating.

International Electrotechnical Commission (IEC), How to Test Carrier Concentration

IEC TS 62607-5-3:2020 Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
IEC 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating

Lithuanian Standards Office , How to Test Carrier Concentration

LST EN 60512-5-2-2003 Connectors for electronic equipment. Tests and measurements. Part 5-2: Current-carrying capacity tests. Test 5b: Current-temperature derating (IEC 60512-5-2:2002)

German Institute for Standardization, How to Test Carrier Concentration

DIN EN 60512-5-2:2003-01 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002); German version EN 60512-5-2:2002 / Note: DIN IEC 60512-3 (1994-05) remains valid along...
DIN EN 13205-4:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 4: Laboratory performance test based on comparison of concentrations; German version EN 13205-4:2014
DIN EN 60512-5-2:2003 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002); German version EN 60512-5-2:2002

Association Francaise de Normalisation, How to Test Carrier Concentration

NF X43-283-4*NF EN 13205-4:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 4 : laboratory performance test based on comparison of concentrations
NF C93-400-5-2*NF EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2 : current-carrying capacity tests - Test 5b : current-temperature derating.
NF X43-283-6*NF EN 13205-6:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 6 : transport and handling tests
NF X43-283-2*NF EN 13205-2:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 2 : laboratory performance test based on determination of sampling efficiency

Japanese Industrial Standards Committee (JISC), How to Test Carrier Concentration

JIS C 5402-5-2:2005 Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating

Danish Standards Foundation, How to Test Carrier Concentration

DS/EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating

工业和信息化部, How to Test Carrier Concentration

YS/T 679-2018 Surface photovoltage method for measuring minority carrier diffusion length in extrinsic semiconductors

European Committee for Electrotechnical Standardization（CENELEC）, How to Test Carrier Concentration

EN 60512-5-2:2002 Connectors for Electronic Equipment - Tests and Measurements Part 5-2: Current-Carrying Capacity Tests - Test 5b: Current-Temperature Derating

Professional Standard - Non-ferrous Metal, How to Test Carrier Concentration

YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-state surface photovoltage