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Conductive test piece

Conductive test piece, Total:500 items.

In the international standard classification, Conductive test piece involves: Testing of metals, Optoelectronics. Laser equipment, Semiconductor devices, Electromechanical components for electronic and telecommunications equipment, Semiconducting materials, Integrated circuits. Microelectronics, Inks. Printing inks, Rubber and plastics products, Electricity. Magnetism. Electrical and magnetic measurements, Electrical wires and cables, Electronic components in general, On-board equipment and instruments, Rectifiers. Convertors. Stabilized power supply, Printed circuits and boards, Electrical accessories, Surface treatment and coating, Conducting materials, Shafts and couplings, Automatic controls for household use, Power transmission and distribution networks, Piezoelectric and dielectric devices, Components and accessories for telecommunications equipment, Magnetic materials, Burners. Boilers, Test conditions and procedures in general, Reinforced plastics, Medical equipment, Cinematography, Radiation measurements, Optics and optical measurements, Insulating fluids, Electronic tubes, Hydraulic energy engineering, Telecommunication systems, Protection against fire, Non-destructive testing, Materials for aerospace construction, Components for electrical equipment, Ceramics, Adhesives, Water quality, Raw materials for rubber and plastics, Insulating materials, Electrical and electronic testing, Resistors, Plastics, Capacitors, Pipeline components and pipelines, Farming and forestry, Continuous handling equipment, Vocabularies, Optical equipment, Products of the chemical industry, Pumps, Audio, video and audiovisual engineering, Electronic component assemblies, Refractories, Nuclear energy engineering, Acoustics and acoustic measurements, Analytical chemistry, Thermodynamics and temperature measurements, Elements of buildings, Products of the textile industry, Road vehicle systems, Shipbuilding and marine structures in general, Aerospace electric equipment and systems, Paints and varnishes, Environmental testing, Materials for the reinforcement of composites, Organic chemicals, Fuel cells, Rubber, Photography, Fuels.


IPC - Association Connecting Electronics Industries, Conductive test piece

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Conductive test piece

  • GB/T 6616-2023 Non-contact eddy current method for testing semiconductor wafer resistivity and semiconductor film sheet resistance
  • GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
  • GB/T 28030-2011 Earth continuity tester
  • GB/T 13789-2008 Methods of measurement of the magnetic properties of magnetic sheet and strip by means a single sheet tester
  • GB/T 13789-2022 Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester
  • GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
  • GB/T 12631-1990 Test method for resistance of conductor of printed boards
  • GB/T 42835-2023 Semiconductor Integrated Circuit System on Chip (SoC)
  • GB/T 1550-1997 Standard methods for measuring conductivity type of extrinsic semiconducting materials
  • GB/T 26068-2018 Measurement of Carrier Recombination Lifetime of Silicon Wafer and Ingot Non-contact Microwave Reflection Photoconductivity Decay Method
  • GB/T 31293-2014 Vacuum resin infusion molding epoxy for wind blade
  • GB/T 13920-1992 35mm cinematography.Subjective test film(colour chart)
  • GB/T 13920-2015 35 mm cinematography.Subjective test film (colour chart)
  • GB/T 5201-1994 Test procedures for semiconductor charged particle detectors
  • GB/T 32206-2015 Standard practice for testing electrolytic conductivity detectors used in gas chrometography
  • GB/T 6616-1995 Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
  • GB/T 15662-1995 Method of testing volume resistivity of conducting and antistatic plastics
  • GB/T 12966-1991 The method for electrical conductivity measurement of aluminium alloys by use of eddy current
  • GB/T 12966-2008 The method for determining aluminum alloys conductivity using eddy current
  • GB/T 42838-2023 Semiconductor Integrated Circuit Hall Circuit Test Method
  • GB/T 4825.1-1984 Test method for partial discharge of conductors on printed boards
  • GB/T 4377-2018 Semiconductor integrated circuits.Measuring method of voltage regulators
  • GB/T 20671.10-2006 Classification system and test methods for nonmetallic gasket materials-Part10:Standard practice for evaluating thermal conductivity of gasket materials
  • GB 12201-1990 Test methods of VSWR of the waveguide feed-system for marine radar
  • GB 3320.3-1982 Wow and flutter test record
  • GB/T 3320.3-1982 Wow and flutter test record
  • GB/T 32791-2016 Electromagnetic (eddy-current) examination method for electrical conductivity of copper and copper alloys
  • GB/T 22586-2008 Measurements of surface resistance of high temperature superconductor thin films at microwave frequencies
  • GB/T 42975-2023 Semiconductor integrated circuit driver test methods
  • GB/T 6833.9-1987 Electromagnetic compatibility test specification forelectronic measuring instruments--Conduced interference test
  • GB/T 3789.6-1991 Measurements of the electrical properties of transmitting tubes--Measuring methods of transconductance and amplification factor
  • GB/T 26070-2010 Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method
  • GB/T 42970-2023 Semiconductor integrated circuit video encoding and decoding circuit testing methods
  • GB/T 6833.6-1987 Electromagnetic compatibility test specification for electronic measuring instruments--Conducted susceptibility test
  • GB 35007-2018 Semiconductor integrated circuit low voltage differential signal circuit testing method
  • GB/T 43061-2023 Semiconductor integrated circuit PWM controller testing method
  • GB 3320.4-1982 Rumble measurement test record
  • GB/T 3320.4-1982 Rumble measurement test record
  • GB/T 3320.1-1987 Frequency response test record
  • GB/T 2522-2007 Methods of test for the determination of surface insulation resistance and lamination factor of electric sheet and strip
  • GB/T 13789-1992 Magnetic sheet and strip.Methods of measurement of magnetic properties by means of a single sheet tester
  • GB/T 23907-2009 Non-destructive testing.Shims for magnetic particle testing
  • GB/T 36477-2018 Semiconductor integrated circuit.Measuring methods for flash memory
  • GB/T 43040-2023 Semiconductor integrated circuit AC/DC converter testing method
  • GB/T 11007-1989 Test method of electric conductivity analyzers
  • GB/T 11007-2008 Test method of electrolytic conductivity analyzers
  • GB/T 6619-1995 Test methods for bow of silicon slices
  • GB/T 6619-2009 Test method for bow of silicon wafers
  • GB/T 9037.2-1988 Measuring methods for photographic facsimile apparatus
  • GB/T 12636-1990 Stripline test method for complex permittivity of microwave dielectric substrates

Defense Logistics Agency, Conductive test piece

PL-PKN, Conductive test piece

  • PN T04850-1974 Transmiliing tubes Elec?rical ?es?s
  • PN E04160 ArkusZ54-1973 Electric cables Me?hods of ?esting Te?t for resistant againt? gluing ol con- duc?ors
  • PN E04160-68-1988 Electric cables Methods of test Electrical test of conducting polymeric screen
  • PN C99460-09-1986 Sampling of photographic light sensitive materials for testing Guide sampling of aerofilms
  • PN E04605-02-1992 Electrical and electronic products Basic cnvironmental testing procedures Test Eb and guidance: bump
  • PN E04605-05-1992 Electrical and electronic products Basic environmental testing procedures Test Ee and guidance: bounce
  • PN E04160 ArkusZ84-1973 Bectric cables Methods ot testing Measuring ot the transfer admi??ance due to electric coupling

RO-ASRO, Conductive test piece

  • STAS 10138-1975 PENETRANT RADIATION TESTING Guidances for radiographs viewing
  • STAS SR 11388-2000 Common test methods for electric cables and conductors
  • SR EN 108-1996 Methods of testing doors Test for deformation of the leaf in its plane
  • STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties

Professional Standard - Electron, Conductive test piece

  • SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
  • SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
  • SJ/Z 9010.12-1987 Measurements of electrical properties of electronic tubes and valves--Part 12: Methods of measuring for electrode resistance, transcondductance, amplification factor, conversion resistance and conversion transconductance
  • SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
  • SJ 2857.2-1988 Methods for measurement of thermoelectric refrigeration materials properties--Methods for measurements of conductivity
  • SJ/T 11742-2019 Thermal conductive semi-solidifying sheets of non-prepreg for printed circuits
  • SJ 3260-1989 Methods of measurement for electric properties of resonator with tuning fork and tablet
  • SJ 2355.4-1983 Methods of measurement for junction capacitance of light-emitting devices
  • SJ/T 11386-2008 General specification of earth coninuity tester
  • SJ/T 11098-1996 Test method for standing wave coefficient of marine navigation radar waveguide feed system
  • SJ 2355.3-1983 Method of measurement for reverse current of light-emitting devices
  • SJ 1388-1978 Methods of measurement for anode conductance of noise-generator diodes
  • SJ/Z 9010.3-1987 Measurements of electrical properties of electronic tubes and valves--Part 3: Measurement of equivalent input and output admittances
  • SJ/T 11822-2022 Detailed specifications for patch single conductive silicone elastic buttons
  • SJ 2857.1-1988 Methods for measurement of thermoelectric refrigeration materials properties--Methods for measurement of thermal conductivity
  • SJ 2658.4-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for capacitance
  • SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
  • SJ 2658.3-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for backward voltage
  • SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
  • SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
  • SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
  • SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
  • SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
  • SJ/T 10482-1994 Test method for characterizing semiconductor deep levels by transient capacitance techniques
  • SJ 2214.3-1982 Method of measurement for dark current of semiconductor photodiodes
  • SJ 2214.5-1982 Method of measurement for junction capacitance of semiconductor photodiodes
  • SJ 2214.8-1982 Method of measurement for dark current voltage of semiconductor phototransistors

Association Francaise de Normalisation, Conductive test piece

  • NF C96-050-9*NF EN 62047-9:2012 Semiconductor devices - Micro-electromechanical devices - Part 9 : wafer to wafer bonding strength measurement for MEMS.
  • NF C28-913:2007 Magnetic materials - Methods of measurement of the magnetic properties of electrical sheet and strip by means of a single sheet tester.
  • NF EN 62415:2010 Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
  • NF C96-050-3*NF EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices - Part 3 : thin film standard test piece for tensile testing
  • NF EN ISO 284:2013 Courroies transporteuses - Conductibilité électrique - Spécification et méthode d'essai
  • NF C53-225:1985 Testing of semiconductor valves for high-voltage D.C. Power transmission.
  • NF EN 61338-1-5:2015 Résonateurs diélectriques à modes guidés - Partie 1-5 : informations générales et conditions d'essais - Méthode de mesure de la conductivité au niveau de l'interface entre une couche conductrice et un substrat diélectrique fonctionnant aux h...
  • NF C20-131:1974 Cosses à plage en cuivre ou en aluminium avec revêtement conducteur pour conducteurs en aluminium - Règles et dimensions
  • NF EN 62567:2014 Lignes électriques aériennes - Méthodes d'essai des caractéristiques d'auto-amortissement des conducteurs
  • NF C96-050-16*NF EN 62047-16:2015 Semiconductor devices - Micro-electromechanical devices - Part 16 : test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

International Electrotechnical Commission (IEC), Conductive test piece

  • IEC 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
  • IEC 62047-9:2011/COR1:2012 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
  • IEC 62899-202-3:2019 Printed electronics - Part 202-3: Materials - Conductive ink - Measurement of sheet resistance of conductive films - Contactless method
  • IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
  • IEC PAS 61338-1-5:2010 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
  • IEC TR 63307:2020 Measurement methods of the complex relative permeability and permittivity of noise suppression sheet
  • IEC 62047-3:2006 Semiconductor devices - Micro electromechanical devices - Part 3: Thin film standard test piece for tensile-testing
  • IEC 60404-3:2010 Magnetic materials – Part 3: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester (Edition 2.2 Consolidated Reprint)

German Institute for Standardization, Conductive test piece

  • DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
  • DIN 50435:1988 Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
  • DIN 50441-4:1999 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 4: Slice diameter, diamter variation, flat diameter, flat length, flat depth
  • DIN 50441-2:1998 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 2: Testing of edge profile
  • DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
  • DIN EN 62047-3:2007 Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006
  • DIN 50445:1992 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers
  • DIN 16726:2017-08 Plastic sheets - Testing
  • DIN 50441-1:1996 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation
  • DIN ISO 3310-3:1992-02 Test sieves; technical requirements and testing; test sieves of electroformed sheets; identical with ISO 3310-3:1990
  • DIN EN ISO 284:2013-04 Conveyor belts - Electrical conductivity - Specification and test method (ISO 284:2012); German version EN ISO 284:2012
  • DIN 50441-5:2001 Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 5: Terms of shape and flatness deviation
  • DIN EN 60749-19:2011-01 Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003 + A1:2010); German version EN 60749-19:2003 + A1:2010 / Note: DIN EN 60749-19 (2003-10) remains valid alongside this standard until 2013-09-01.
  • DIN 52913:2002-04 Testing of static gaskets for flange connections - Compression creep testing of gaskets made from sheets
  • DIN EN 61395:1998 Overhead electrical conductors - Creep test procedures for stranded conductors (IEC 61395:1998); German version EN 61395:1998
  • DIN 47304:1969-01 R.f. waveguides; tests
  • DIN 45549:1980 Tracking ability-test-record
  • DIN IEC 60404-3 Berichtigung 1:2010-09 Magnetic materials - Part 3: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester (IEC 60404-3:1992 + A1:2002 + A2:2009), Corrigendum to DIN IEC 60404-3:2010-05 / Note: To be replaced b...
  • DIN IEC 60404-3:2010-05 Magnetic materials - Part 3: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester (IEC 60404-3:1992 + A1:2002 + A2:2009) / Note: To be replaced by DIN EN IEC 60404-3 (2021-07).
  • DIN EN 62047-9:2012 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011
  • DIN 45544:1971 Rumble Measurement Test Record; St 33 and M 33

European Committee for Electrotechnical Standardization（CENELEC）, Conductive test piece

  • EN 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
  • EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices Part 3: Thin film standard test piece for tensile testing
  • EN IEC 60404-3:2022 Magnetic materials - Part 3: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester

CZ-CSN, Conductive test piece

FI-SFS, Conductive test piece

Professional Standard - Machinery, Conductive test piece

  • JB/T 8223.8-1999 Elements for electrical instrumentation.Conductive chips
  • JB/T 5469-1991 Testing instrument of total loss ratio of single electric steel sheet (strip)
  • JB/T 9687.1-1999 Molybdenum disk for power semiconductor devices
  • JB/T 9687.2-1999 Tungsten disk for power semiconductor devices
  • JB/T 7061-1993 Silicon wafers intended to be used in power semiconductor devices
  • JB/T 8736-1998 Aluminum nitride ceramics substrate intended to be used in power semiconductor modules
  • JB/T 6065-2004 Test piece for non-destructive testing magnetic particle testing
  • JB/T 6307.1-1992 Test method for power semiconductor module Rectifier diode pair of arms

Korean Agency for Technology and Standards (KATS), Conductive test piece

  • KS C IEC 62899-202-3:2021 Printed electronics — Part 202-3: Materials — Conductive ink —Measurement of sheet resistance of conductive films Contactless method
  • KS M ISO 23559:2014 Plastics — Film and sheeting — Guidance on the testing of thermoplastic films
  • KS M ISO 23559:2019 Plastics — Film and sheeting — Guidance on the testing of thermoplastic films
  • KS I 3201-2007(2017) Testing methods for electric conductivity in highly purified water
  • KS C IEC 61395:2014 Overhead electrical conductors — Creep test procedures for stranded conductors
  • KS C IEC 61395:2020 Overhead electrical conductors — Creep test procedures for stranded conductors
  • KS C 2129-1996(2001) TESTING METHODS FOR DC RESISTANCE OR CONDUCTANCE OF INSULATING MATERIALS
  • KS P 4402-2007 Test lens set
  • KS C IEC 61788-21:2020 Superconductivity — Part 21: Superconducting wires — Test methods for practical superconducting wires — General characteristics and guidance
  • KS L 1630-2021 Test methods for electrical conductivity of conductive fine ceramics
  • KS M 6773-2014 Testing method for volume resistivity of electrically conductive rubber and plastic materials
  • KS L 3306-2007(2012) Testing method for thermal conductivity of firebricks by hot wire
  • KS L 3306-1980 Testing method for thermal conductivity of firebricks by hot wire
  • KS C 2603-1980(2020) Testing Method for Conductor-Resistance and Resistivity of Metallic Resistance materials
  • KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
  • KS M 6773-2014(2019) Testing method for volume resistivity of electrically conductive rubber and plastic materials
  • KS C 5514-2005 16MM STANDARD MAGNETIC SOUND TEST FILM
  • KS C 5514-1982 16MM STANDARD MAGNETIC SOUND TEST FILM
  • KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
  • KS M 6773-2009 Testing method for volume resistivity of electrically conductive rubber and plastic materials
  • KS M 3858-1988(1998) TESTING METHODS FOR PHOTOGRAPHIC GRADE CHEMICALS
  • KS B 5639-1999 Cinematography－Photographic sound test films, 35mm and 16mm－Specifications
  • KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe

KR-KS, Conductive test piece

  • KS C IEC 62899-202-3-2021 Printed electronics — Part 202-3: Materials — Conductive ink —Measurement of sheet resistance of conductive films Contactless method
  • KS M ISO 23559-2019 Plastics — Film and sheeting — Guidance on the testing of thermoplastic films
  • KS I 3201-2023 Testing methods for electric conductivity in highly purified water
  • KS C IEC 61395-2020 Overhead electrical conductors — Creep test procedures for stranded conductors
  • KS C IEC 61788-21-2020 Superconductivity — Part 21: Superconducting wires — Test methods for practical superconducting wires — General characteristics and guidance

Professional Standard - Aerospace, Conductive test piece

  • QJ 1523-1988 Conductive Adhesive Resistivity Test Method
  • QJ 259-1977 器件
  • QJ 257-1977 Semiconductor TTL Integrated Digital Circuit Testing Method
  • QJ 1528-1988 Semiconductor integrated circuit time base test method
  • QJ 260-1977 器件
  • QJ 20022-2011 The electrical measuring method of radome for passive seeker
  • QJ 20027-2011 Test method for thermal conductivity of thermal conductive grease at low temperature
  • QJ 1238.15-1987 Conduction Test of Cable Test Method on Missile Launch Vehicle
  • QJ 1460-1988 Test method for broadband amplifier of semiconductor integrated circuit
  • QJ 2491-1993 Test methods for operational amplifiers in semiconductor integrated circuits
  • QJ 2464-1993 Test method of terminal guidance radar for coastal defense missile

Society of Motion Picture and Television Engineers (SMPTE), Conductive test piece

  • SMPTE ST 183M-1996 Motion-Picture Film - Photographic Audio Level Test Films - Measurement of Photoelectric Output Factor
  • SMPTE 183M-1996 Motion-Picture Film - Photographic Audio Level Test Films - Measurement of Photoelectric Output Factor

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Conductive test piece

  • JEDEC JESD51-4-1997 Thermal Test Chip Guideline (Wire Bond Type Chip) Errata - September 1997; Replaces JEP129: 1997

Standard Association of Australia （SAA）, Conductive test piece

Group Standards of the People's Republic of China, Conductive test piece

  • T/SHMHZQ 042-2022 Thermal conductive graphite sheets for electronic products
  • T/IAWBS 011-2019 Test methods for measuring resistivity of conductive silicon carbide wafers with a noncontact eddy-current gauge
  • T/WJDGC 0005-2021 Test method for automatic rice cooker insulation sheet
  • T/CSEE 0209-2021 Guidelines for testing low-voltage power emergency power supply equipment
  • T/CECA 64-2021 Base metal conductive paste for multilayers ceramic chip capacitors
  • T/CEC 611-2022 Technical Guidelines for Acoustic Imaging Testing of Substation Equipment
  • T/CSEE 0114-2019 Injection capacitive current test guide for neutral point different frequency signal
  • T/CIMA 0007-2020 Test guideline for synchronous line loss measuring device of distribution network
  • T/ZGIA 001-2019 Graphene test method for the determination of powder conductivity four-probe method

CU-NC, Conductive test piece

  • NC 66-100-1988 Electronic and Electrotechical Industry. Power Conductors Electric Tests
  • NC 68-05-1985 Industrial Household Apparatus. Flat Solar Collectors for Fluids Testing Methods
  • NC 90-13-36-1986 Metrological Assurance Conductometers. Testing Methods

AR-IRAM, Conductive test piece

American Society for Testing and Materials (ASTM), Conductive test piece

  • ASTM F673-90(1996)e1 Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage
  • ASTM D4399-05(2023) Standard Test Method for Measuring Electrical Conductivity of Electrocoat Baths
  • ASTM D4496-21 Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
  • ASTM D4399-05 Standard Test Method for Measuring Electrical Conductivity of Electrocoat Baths
  • ASTM D4399-90(1999) Standard Test Method for Measuring Electrical Conductivity of Electrocoat Baths
  • ASTM D2739-97 Standard Test Method for Volume Resistivity of Conductive Adhesives
  • ASTM B193-02 Standard Test Method for Resistivity of Electrical Conductor Materials
  • ASTM B193-00 Standard Test Method for Resistivity of Electrical Conductor Materials
  • ASTM B193-01 Standard Test Method for Resistivity of Electrical Conductor Materials
  • ASTM D1125-95(1999) Standard Test Methods for Electrical Conductivity and Resistivity of Water
  • ASTM B193-87(1992) Standard Test Method for Resistivity of Electrical Conductor Materials
  • ASTM B193-19 Standard Test Method for Resistivity of Electrical Conductor Materials
  • ASTM B193-87 Standard Test Method for Resistivity of Electrical Conductor Materials
  • ASTM B193-20 Standard Test Method for Resistivity of Electrical Conductor Materials
  • ASTM F1680-96 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
  • ASTM D4399-05e1 Standard Test Method for Measuring Electrical Conductivity of Electrocoat Baths
  • ASTM D4399-05(2011) Standard Test Method for Measuring Electrical Conductivity of Electrocoat Baths
  • ASTM D4399-05(2017) Standard Test Method for Measuring Electrical Conductivity of Electrocoat Baths
  • ASTM D3380-90(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
  • ASTM B342-63(1980)e1 Test Method for Electrical Conductivity by Use of Eddy Currents
  • ASTM F1896-10 Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
  • ASTM C483-95(2000) Standard Test Method for Electrical Resistance of Conductive Ceramic Tile (Withdrawn 2004)
  • ASTM D5128-90(1999)e1 Standard Test Method for On-Line pH Measurement of Water of Low Conductivity
  • ASTM E2584-07 Standard Practice for Thermal Conductivity of Materials Using a Thermal Capacitance (Slug) Calorimeter
  • ASTM E1004-09 Standard Test Method for Determining Electrical Conductivity Using the Electromagnetic (Eddy-Current) Method
  • ASTM B869-07(2013) Standard Specification for Copper-Clad Steel Electrical Conductor for CATV Drop Wire
  • ASTM E2775-16 Standard Practice for Guided Wave Testing of Above Ground Steel Pipework Using Piezoelectric Effect Transduction
  • ASTM F1689-05(2020) Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
  • ASTM F1896-98(2004) Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
  • ASTM E1004-17 Standard Test Method for Determining Electrical Conductivity Using the Electromagnetic (Eddy Current) Method
  • ASTM F1896-16 Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
  • ASTM C417-05 Standard Test Method for Thermal Conductivity of Unfired Monolithic Refractories
  • ASTM F1896-98 Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
  • ASTM D5128-90(2005) Standard Test Method for On-Line pH Measurement of Water of Low Conductivity
  • ASTM D5128-09 Standard Test Method for On-Line pH Measurement of Water of Low Conductivity
  • ASTM F81-00 Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers

National Metrological Verification Regulations of the People's Republic of China, Conductive test piece

Institute of Electrical and Electronics Engineers (IEEE), Conductive test piece

  • IEEE No 51-1955 IEEE Guiding Principles for Dielectric Tests
  • IEEE Std 82-1963 IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors
  • IEEE 82-1963 IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors
  • SMPTE ST 183:1996 ST 183:1996 - SMPTE Standard - For Motion-Picture Film — Photographic Audio Level Test Films – Measurement of Photoelectric Output Factor
  • IEEE 82-2002 Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors
  • IEEE 82-1994 Test procedure for impulse voltage tests on insulated conductors
  • IEEE Std 82-2002 IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors
  • IEEE Std 82-1994 IEEE Standard test procedure for impulse voltage tests on insulated conductors
  • IEEE 82/COR-2009 Errata to IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors
  • IEEE Std 300-1988 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
  • ANSI/IEEE Std 300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
  • IEEE 1142-1995 Guide for the design, testing and application of moisture-impervious, solid dielectric, 5-35 kV power power cable using metal-plastic laminates

IX-ICAO, Conductive test piece

  • ICAO 8071-1-2000 Manual on Testing of Radio Navigation Aids - Volume I: Testing of Ground-based Radio Navigation Systems
  • ICAO 8071-2-2007 Manual on Testing of Radio Navigation Aids - Volume II: Testing of Satellite-based Radio Navigation Systems
  • ICAO 8071-2 CORR-2008 Manual on Testing of Radio Navigation Aids - Volume II: Testing of Satellite-based Radio Navigation Systems; Corrigendum
  • ICAO 8071-3-1998 Manual on Testing of Radio Navigation Aids - Volume III: Testing of Surveillance Radar Systems

YU-JUS, Conductive test piece

  • JUS N.C0.035-1983 Tatting of insulatad conductors and cables. Measurement of electrical resistance of conductors.
  • JUS N.C6.005-1981 Ri>dio-frequency cables. Continuity test of the silver coating of inner conductors
  • JUS N.A5.053-1990 Electrotechnical engineering. Pire bazsrd testivg. Glou-wire test
  • JUS N.R1.500-1980 Semioonductor ?evices. Acceptance. Electrical tests
  • JUS N.C0.031-1987 Electric povver and lighting. Testing of insulated conductors and cables. Checking of construction
  • JUS N.C0.048-1985 Electrical power and lighting. Testing of insulated conductors and cables. Separability of cores of flat twin insulated conductors
  • JUS N.C0.050-1984 Electrical power andlighting. Tests of insulatedconductors and cables. I/Vear resistance
  • JUS N.C0.030-1987 E/etric povver and lighting. Testing of insulated conductors and cab/es. General testing conditions
  • JUS N.R2.602-1980 Tantahim chip capacitors. Selection ofmethods oftest and general requirements
  • JUS N.C0.082-1990 Electric povverandlighting. Testing ofinsu/atedconductors andcables. Tinning ofplain conductors
  • JUS N.R4.493-1989 Electromechanical components for electronic equipment. Test methods. Test 16p: Torsional strength,. fixed male tabs
  • JUS N.M6.090-1985 Hand-held motor-operatedelectric tools. Sheetmetal shears. Supplementary reguirements andtests

CH-SNV, Conductive test piece

(U.S.) Ford Automotive Standards, Conductive test piece

Professional Standard - Ferrous Metallurgy, Conductive test piece

  • YB/T 4148-2006 Methods of measurement of the magnetic properties of electrical steel sheet and strip with a single small sheet sample
  • YB/T 4292-2012 Methods of determination of the geometrical characteristics of electric steel sheet and strip

CL-INN, Conductive test piece

Hebei Provincial Standard of the People's Republic of China, Conductive test piece

  • DB/1300 F04 6-1990 Guidelines for Water Balance Test in Thermal Power Plants
  • DB13/T 58-1991 Guidelines for Water Balance Test in Thermal Power Plants
  • DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication
  • DB13/T 5026.3-2019 Method for Determination of Physical Properties of Graphene Conductive Paste Part 3: Four-probe Method for Determination of Electrode Resistivity of Paste

RU-GOST R, Conductive test piece

  • GOST 21573-1976 Multidisk electromagnetic clutches with magnetic-flux-conducting disks. Basic parameters and dimensions
  • GOST 7229-1976 Cables, wires and cords. Method of measurement of electrical resistance of conductors
  • GOST 6134-2007 Rotodynamic pumps. Test methods
  • GOST 6134-1987 Rotodynamic pumps. Methods of testing
  • GOST 24461-1980 Power semiconductor devices. Test and measurement methods
  • GOST 21574-1988 Electromagnetic clutches with magnetic-flux-conducting discs. Specifications
  • GOST R 53835-2010 Vehicles. Elements of the steering actuator and guide vane suspension. Technical requirements and test methods

SAE - SAE International, Conductive test piece

  • SAE AS85049/130C-2016 CONNECTOR ACCESSORIES, ELECTRICAL GASKETING MATERIAL, CONDUCTIVE/NON-CONDUCTIVE, FLANGE MOUNT, CATEGORY 7
  • SAE AS85049/130A-2006 CONNECTOR ACCESSORIES, ELECTRICAL GASKETING MATERIAL, CONDUCTIVE/NON-CONDUCTIVE, FLANGE MOUNT, CATEGORY 7
  • SAE AS85049/130B-2011 CONNECTOR ACCESSORIES, ELECTRICAL GASKETING MATERIAL, CONDUCTIVE/NON-CONDUCTIVE, FLANGE MOUNT, CATEGORY 7
  • SAE AS85049/130-2004 CONNECTOR ACCESSORIES@ ELECTRICAL GASKETING MATERIAL@ CONDUCTIVE/ NON-CONDUCTIVE@ FLANGE MOUNT@ CATEGORY 7 (FSC 5935)

Society of Automotive Engineers (SAE), Conductive test piece

  • SAE AS85049/130C-2021 CONNECTOR ACCESSORIES, ELECTRICAL GASKETING MATERIAL, CONDUCTIVE/NON-CONDUCTIVE, FLANGE MOUNT, CATEGORY 7
  • SAE ARP5724-2013 Aerospace - Testing of Electromechanical Actuators, General Guidelines For

Professional Standard - Chemical Industry, Conductive test piece

化学工业部, Conductive test piece

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Conductive test piece

IN-BIS, Conductive test piece

国家市场监督管理总局、中国国家标准化管理委员会, Conductive test piece

  • GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
  • GB/T 39042-2020 Measurement of the magnetic properties of electrical steels by means of a single sheet tester—H-coil method
  • GB/T 12966-2022 The methods for determining aluminium and aluminium alloys conductivity using eddy current

Danish Standards Foundation, Conductive test piece

  • DS/EN 61395:1998 Overhead electrical conductors. Creep test procedures for stranded conductors
  • DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
  • DS/EN ISO 284:2013 Conveyor belts - Electrical conductivity - Specification and test method
  • DS/EN 60749-19/A1:2010 Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
  • DS/EN 60749-19:2003 Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Electronic Components, Assemblies and Materials Association, Conductive test piece

  • ECA J-STD-002C-2007 Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires
  • ECA EIA-970-2013 Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

Japanese Industrial Standards Committee (JISC), Conductive test piece

  • JIS C 2556:2015 Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester
  • JIS Z 2359:2021 Principle of strain gauge testing
  • JIS R 1661:2004 Method for conductivity measurement of ion-conductive fine ceramics

IEC - International Electrotechnical Commission, Conductive test piece

  • PAS 61338-1-5-2010 Waveguide type dielectric resonators – Part 1-5: General information and test conditions – Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Edition 1.0)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Conductive test piece

  • GB/T 12631-2017 Test method for resistance of conductors of printed boards
  • GB/T 33655-2017 Superconducting power devices—General requirements for characteristic tests of current leads designed for powering superconducting devices
  • GB/T 35006-2018 Semiconductor integrated circuits—Measuring method of level converter
  • GB/T 2522-2017 Methods of test for the determination of coating insulation resistance and coating adhesion of electrical strip and sheet
  • GB/T 35007-2018 Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
  • GB/T 14028-2018 Semiconductor integrated circuits—Measuring method of analogue switch
  • GB/T 35010.5-2018 Semiconductor die products—Part 5：Requirements for concerning electrical simulation

Guangdong Provincial Standard of the People's Republic of China, Conductive test piece

  • DB4401/T 116-2021 Guidelines for Energy Efficiency Testing of Electric Heating Boilers

Aerospace Industries Association, Conductive test piece

  • AIA NAS 4122-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Extruded
  • AIA NAS 4119-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Press-On Type
  • AIA NAS 4121-1996 Heat Sink, Electrical-Electronic Component, Semiconductor Devices, Formed FSC 5999
  • AIA NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type

Military Standard of the People's Republic of China-General Armament Department, Conductive test piece

  • GJB 5232.3-2004 Tactical missile warhead range test method Part 3: static explosion test fragment velocity test
  • GJB 6390.2-2008 Static power method for anti-surface missile warhead.Part 2:Measurement of initial velocity of fragments
  • GJB 5232.2-2004 Tactical missile warhead range test method Part 2: static explosion test fragment scatter characteristics test
  • GJB 6919-2009 Test and evaluation methods of conductorial-fibre performance
  • GJB 8681-2015 Calibration procedures for conductivity and volume resistance testers of solid explosives
  • GJB 8696.7-2015 Terminal guided projectile test method Part 7: Circuit resistance detection
  • GJB 1047.2-1990 Test Methods for Black Powder - Determination of Potassium Nitrate Conductivity Method
  • GJB 9147-2017 Semiconductor integrated circuit operational amplifier test methods

Professional Standard - Water Conservancy, Conductive test piece

  • SL 78-1994 Determination of conductivity (Conductivity instrument method)

BR-ABNT, Conductive test piece

  • ABNT NBR 9150-2013 Wire and cables for telecommunication — Separation of insulated conductors — Test method

工业和信息化部, Conductive test piece

  • SJ/T 11792-2022 Test method for conductivity of lithium-ion battery electrode materials
  • SJ/T 11627-2016 On-line testing method of silicon wafer resistivity for solar cells
  • SJ/T 10805-2018 Semiconductor integrated circuit voltage comparator test method
  • SJ/T 11631-2016 Test method for appearance defects of silicon wafers for solar cells
  • SJ/T 11630-2016 Test method for geometric dimensions of silicon wafers for solar cells
  • SJ/T 11628-2016 Online testing method for silicon wafer size and electrical characterization for solar cells
  • SJ/T 11632-2016 Testing method for microcrack defects in silicon wafers for solar cells

CENELEC - European Committee for Electrotechnical Standardization, Conductive test piece

  • EN 62415:2010 Semiconductor devices - Constant current electromigration test

Professional Standard - Aviation, Conductive test piece

  • HB 5356-1986 Eddy current test method for electrical conductivity of aluminum alloy

Professional Standard - Energy, Conductive test piece

ES-UNE, Conductive test piece

  • UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
  • UNE-EN ISO 284:2012 Conveyor belts - Electrical conductivity - Specification and test method (ISO 284:2012) (Endorsed by AENOR in February of 2013.)
  • UNE-EN IEC 60404-3:2022 Magnetic materials - Part 3: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester (Endorsed by Asociación Española de Normalización in January of 2023.)

British Standards Institution (BSI), Conductive test piece

  • BS PD IEC TR 63307:2020 Measurement methods of the complex relative permeability and permittivity of noise suppression sheet
  • PD IEC TR 63307:2020 Measurement methods of the complex relative permeability and permittivity of noise suppression sheet
  • PD ES 59008-4-1:2001 Data requirements for semiconductor die. Specific requirements and recommendations. Test and quality
  • BS DD IEC/PAS 61338-1-5:2010 Waveguide type dielectric resonators - General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
  • BS EN 61338-1-5:2015 Waveguide type dielectric resonators. General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
  • BS EN IEC 60404-3:2022 Magnetic materials - Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester
  • BS IEC 62899-202-5:2018 Printed electronics - Materials. Conductive ink. Mechanical bending test of a printed conductive layer on an insulating substrate
  • PD IEC/TR 62878-2-2:2015 Device embedded substrate. Guidelines. Electrical testing
  • BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
  • 22/30383603 DC BS IEC 63215-4. Endurance test methods for die attach materials applied to power electronic devices - Part 4. Power cycling test method for die attach materials (near chip interconnection) applied to module type power electronic devices
  • BS EN 61395:1998 Overhead electrical conductors. Creep test procedures for stranded conductors
  • BS ISO 20567-2:2005 Paints and varnishes - Determination of stone-chip resistance of coatings - Single-impact test with a guided impact body
  • BS EN ISO 20567-2:2005 Paints and varnishes - Determination of stone-chip resistance of coatings - Single-impact test with a guided impact body
  • BS EN ISO 20567-2:2017 Paints and varnishes. Determination of stone-chip resistance of coatings. Single-impact test with a guided impact body
  • BS EN 60068-2-10:2005+A1:2018 Environmental testing - Tests. Test J and guidance: Mould growth
  • BS EN 10280:2001+A1:2007 Magnetic materials — Methods of measurement of the magnetic properties of electrical sheet and strip by means of a single sheet tester
  • 21/30438135 DC BS EN IEC 60404-3. Magnetic materials. Part 3. Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester

NZ-SNZ, Conductive test piece

  • AS/NZS 1660.5.5:2005 Test Methods for Electric Cables, Cords and Conductors Method 5.5: Fire Tests - Circuit integrity
  • AS/NZS 1660.1:1998 Test Methods for Electric Cables, Cords and Conductors Method 1: Conductors and Metallic Components
  • AS/NZS 1660.5.6:2005 Test Methods for Electric Cables, Cords and Conductors Method 5.6: Fire Tests - Test for vertical flame propagation for a single insulated wire or cable

Taiwan Provincial Standard of the People's Republic of China, Conductive test piece

  • CNS 7367-1981 Method of Test for D.C. Resistance or Conductance of Insulating Materials
  • CNS 7631-1981 Method of Test for Surface Insulation Resistivity of Multi-Strip Specimens

ZA-SANS, Conductive test piece

  • SANS 6282-1:2007 Test methods for bare conductors and conductors of insulated electric cables Part 1: Conductor resistance

TR-TSE, Conductive test piece

  • TS 2643-1977 Test Procedures For Bemiconductor Detectors For Ionizing Radiation
  • TS 1861-1975 CINEMATOGRAPHY — MOTION — PICTURE SAFETY F?LM — DEFINITION, TESTING AND MARKING
  • TS 2452-1976 MEASUBEMENTS OF THE ELECTRICAL PROPERTIES OF EIJECTRONIC TUBES AND VALVES PART 12 : METHODS OF MEASURING ELECTRODE RESISTANCE, TRANSCONDUCTANE, AMPLIFICATION FACTOR, CONVERSION RESISTANCE AND CONVERSION TRANSCONDUCTANCE
  • TS 2683-1977 Methods Of Test For General Purpose Electrical Cables With Copper Conductors For lircraft
  • TS 2443-1976 MEASUREMENTS OF THE ELECTRICAL PROPERTIES OF ELECTRONIC TUBES AND VALVES PART 3 : MEASUREMENT OF EQUIVALENT INPUT AND OUTPUT ADMITTANCES
  • TS 2586-1977 METHODS OF TEST FOR HEAT - RESISTING (190°C) ELEKCTRICAL CABLES WITH COPPER CONDUCTORS FOR AIRCRAFT

International Organization for Standardization (ISO), Conductive test piece

  • ISO 4241:1978 Cinematography — Leaders and run-out trailers for 35 mm and 16 mm release prints — Specifications

Guizhou Provincial Standard of the People's Republic of China, Conductive test piece

  • DB52/T 806-2013 CA551 Conductive Polymer Electrolyte Chip Tantalum Capacitor

Electronic Components, Assemblies and Materials Association, Conductive test piece

  • ECA 186-E-1978 Passive Electronic Component Parts, Test Methods for; General Instructions and Index of Tests

Professional Standard - Electricity, Conductive test piece

  • DL/T 1095-2008 Guide to on-site determination of electrostatic charging tendency of transformer oil
  • DL/T 2231-2021 Guidelines for frequency-domain dielectric spectrum testing of oil-paper insulated power equipment

ET-QSAE, Conductive test piece

AENOR, Conductive test piece

  • UNE 22315:1985 VENTILATION DUCTS. ELECTRIC CONDUCTIVITY. TESTING METHOD. SPECIFICATIONS.
  • UNE 18155:1981 ANTISTATIC ENDLESS V-BELTS - ELECTRICAL CONDUCTIVITY - CHARACTERISTICS AND METHOD OF TEST.
  • UNE-EN 61395:1999 OVERHEAD ELECTRICAL CONDUCTORS. CREEP TEST PROCEDURES FOR STRANDED CONDUCTORS.
  • UNE 22070:1992 COMPRESSED AIR HOSES. ELECTRIC CONDUCTIVITY. TESTING METHOD AND SPECIFICATIONS.

未注明发布机构, Conductive test piece

  • DIN EN ISO 284:2004 Conveyor Belts – Electrical Conductivity – Specification and Test Methods

SE-SIS, Conductive test piece

  • SIS SS IEC 700:1984 Power electronics — Semiconductor valves for high-voltage d.c. power transmission — Testing
  • SIS SS IEC 333:1986 Nuclear instrumentation - Testprocedures for semiconductor chargedparticle detectors
  • SIS 02 81 23-1974 Determination of conductivity of water
  • SIS SS 3165-1988 Drafting film - Polyester based drafting film with mat surface - Testing

AIA/NAS - Aerospace Industries Association of America Inc., Conductive test piece

  • NAS4118-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Retainer Clip Type
  • NAS4120-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Encapsulating Type@ TO-5
  • NAS4121-2012 HEAT SINK@ ELECTRICAL@ ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ FORMED (Rev 1)

American National Standards Institute （ANSI), Conductive test piece

  • ANSI/ASTM D3380:2010 Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Plastic-based Microwave Circuit Substrates
  • ANSI/ASTM B63:2001 Test Method for Resistivity of Metallically Conducting Resistance and Contact Materials
  • ANSI/IEEE 300:1988 Test Procedures for Semiconductor Charged-Particle Detectors
  • ANSI/ASTM D257:2014 Standard Test Methods for DC Resistance or Conductance of Insulating Materials
  • ANSI/ASTM D4308:2013 Test Method for Electrical Conductivity of Liquid Hydrocarbons by Precision Meter

工业和信息化部/国家能源局, Conductive test piece

  • JB/T 13537-2018 Test method for volume resistivity of conductive powder for electromagnetic shielding
  • JB/T 13536-2018 Test method for magnetic permeability of electromagnetic shielding and absorbing materials

HU-MSZT, Conductive test piece

Military Standards (MIL-STD), Conductive test piece

WRC - Welding Research Council, Conductive test piece

  • BULLETIN 431-1998 SUMMARY OF GASKET STEAM LEAKAGE TESTS: I) GASKET STEAM LEAKAGE TESTS ; II) LEAK TESTS CONDUCTED ON GRAPHITE GASKETS; III) LONG DURATION AIR AND STEAM SCREENING TESTS ON ELASTOMERIC SHEET GASKET MATERI
  • BULLETIN 233-1977 REPORT OF GASKET FACTOR TESTS
  • BULLETIN 495- TEST PROTOCOL FOR GASKET MATERIALS

Indonesia Standards, Conductive test piece

  • SNI 06-6989.1-2004 Water and waste water - Part 1: Test methods of electrical conductivity

United States Navy, Conductive test piece

GOSTR, Conductive test piece

  • GOST 33461-2015 Aviation and distillate fuels. Test methods for electrical conductivity

Anhui Provincial Standard of the People's Republic of China, Conductive test piece

  • DB34/T 3571-2019 Electrical test method for insulating layer of large superconducting magnet

Cooling Technology Institute, Conductive test piece

  • CTI STD-149-2000 Corrosion Testing Procedures Corrosion Coupon Testing and Test Devices

Aerospace Industries Association/ANSI Aerospace Standards, Conductive test piece

  • AIA/NAS NAS4120-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, ENCAPSULATING TYPE, TO-5
  • AIA/NAS NAS4121-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, FORMED (Rev 1)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Conductive test piece

  • IEEE 300-1988 Standard Test Procedures for Semiconductor Charged-Particle Detectors
  • IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
  • IEEE 82 ERTA-2009 Errata to IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors
  • IEEE 1302-1998 Guide for the Electromagnetic Characterization of Conductive Gaskets in the Frequency Range of DC to 18 GHz
  • IEEE 1302-2008 Guide for the Electromagnetic Characterization of Conductive Gaskets in the Frequency Range of DC to 18 GHz

Henan Provincial Standard of the People's Republic of China, Conductive test piece

  • DB41/T 1790-2019 Determination of Conductive Properties of Textile Conductive Yarns

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Conductive test piece

  • GJB 5389.10-2005 Test method of gun-launched missile Part 10:Circuit resistance inspection
  • GJB 5491.7-2005 Test method of terminally guided projectile Part 7:Circuit resistance detection test and measurement

GM North America, Conductive test piece

Lithuanian Standards Office , Conductive test piece

  • LST EN 62415-2010 Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
  • LST EN ISO 284:2013 Conveyor belts - Electrical conductivity - Specification and test method (ISO 284:2012)

American Welding Society (AWS), Conductive test piece

工业和信息化部/国防科技工业局, Conductive test piece

  • WJ/T 9084-2015 Determination of non-conductive properties of detonating tubes

PT-IPQ, Conductive test piece

国家能源局, Conductive test piece

  • NB/T 25083-2018 Technical Guidelines for Basic Vibration Isolation Testing of Nuclear Power Plant Turbine Generator Units
  • NB/T 42080-2016 Test method for ion conductive membranes for all-vanadium redox flow batteries

Professional Standard - Environmental Protection, Conductive test piece

ECIA - Electronic Components Industry Association, Conductive test piece

  • EIA-970-2013 Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

AT-ON, Conductive test piece

  • ONORM EN 20284-1993 Conveyor belts — Electrical conductivity — Specification and method of test (ISO 284:1982)

JSAE - Society of Automotive Engineers of Japan@ Inc., Conductive test piece

  • JASO C458-1986 Test procedure of pH for brake linings@ pads and clutch facings of automobiles

VE-FONDONORMA, Conductive test piece

Professional Standard - Postal Service, Conductive test piece

  How to measure conductivity, How to measure conductivity, How to measure conductivity, Conductive test piece.

 



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