ZH
RU
ES
Thin Film Surface Analysis
Thin Film Surface Analysis, Total:189 items.
In the international standard classification, Thin Film Surface Analysis involves: Analytical chemistry, Organic chemicals, Rubber and plastics products, Piezoelectric and dielectric devices, Testing of metals, Construction materials, Surface treatment and coating, Plastics, Rubber, Products of the chemical industry, Conducting materials, Vocabularies, Ceramics, Floor treatment appliances, Iron and steel products, Linear and angular measurements, Glass, Integrated circuits. Microelectronics, Structures of buildings, Resistors, Road vehicles in general, Water quality, Acoustics and acoustic measurements, Applications of information technology, Equipment for the chemical industry, Non-ferrous metals, Protection of and in buildings, Road engineering, Electromechanical components for electronic and telecommunications equipment, Insulating materials, Sugar. Sugar products. Starch, Farming and forestry.
British Standards Institution (BSI), Thin Film Surface Analysis
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- PD ISO/TS 25138:2019 Tracked Changes. Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- BS ISO 8296:2003 Plastics - Film and sheeting - Determination of wetting tension
- BS DD ISO/TS 25138:2011 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- BS ISO 23170:2022 Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
- 21/30423416 DC BS ISO 23170. Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
- BS ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
- BS ISO 14975:2000 Surface chemical analysis - Information formats
- BS ISO 14975:2001 Surface chemical analysis. Information formats
- BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
- BS EN 15042-1:2006 Thickness measurement of coatings and characterization of surfaces with surface waves - Guide to the determination of elastic constants, density and thickness of films by laser induced surface acoustic waves
- PD ISO/TR 14187:2020 Surface chemical analysis. Characterization of nanostructured materials
- PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
国家市场监督管理总局、中国国家标准化管理委员会, Thin Film Surface Analysis
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
- GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
International Organization for Standardization (ISO), Thin Film Surface Analysis
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO/TS 25138:2010 Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- ISO 8296:2003 Plastics - Film and sheeting - Determination of wetting tension
- ISO 8296:1987 Plastics; Film and sheeting; Determination of wetting tension
- ISO 8296:1987/Cor 1:1998 Plastics - Film and sheeting - Determination of wetting tension; Technical Corrigendum 1
- ISO/TS 25138:2019 Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- ISO/CD 20289:2017 Surface chemical analysis
- ISO 23170:2022 Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
- ISO 14606:2000 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- ISO 14606:2015 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- ISO 18115:2001 Surface chemical analysis - Vocabulary
- ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
- ISO 12625-18:2022 Tissue paper and tissue products — Part 18: Determination of surface friction
- ISO 14975:2000 Surface chemical analysis - Information formats
- ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
- ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
- ISO/TR 14187:2020 Surface chemical analysis — Characterization of nanostructured materials
- ISO 18115-3:2022 Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
- ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
AR-IRAM, Thin Film Surface Analysis
ES-AENOR, Thin Film Surface Analysis
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Thin Film Surface Analysis
- GB/T 33051-2016 Optical functional films—Superficial hardening film—Determination of thickness of hardening coating
- GB/T 33398-2016 Optical functional films—Polyethylene terephthalate(PET) film—Determination of surface resistance
- GB/T 32996-2016 Surface chemical analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry
- GB/T 33498-2017 Surface chemical analysis—Characterization of nanostructured materials
Korean Agency for Technology and Standards (KATS), Thin Film Surface Analysis
German Institute for Standardization, Thin Film Surface Analysis
- DIN ISO 8296:2006 Plastics - Film and sheeting - Determination of wetting tension (ISO 8296:2003)
- DIN ISO 8296:2008 Plastics - Film and sheeting - Determination of wetting tension (ISO 8296:2003);English version of DIN ISO 8296:2008-03
- DIN EN 140401:2009-12 Blank Detail Specification: Fixed low power film surface mount (SMD) resistors; German version EN 140401:2009 / Note: DIN EN 140401 (2002-12) remains valid alongside this standard until 2012-03-01.
- DIN EN 15042-1:2006-06 Thickness measurement of coatings and characterization of surfaces with surface waves - Part 1: Guide to the determination of elastic constants, density and thickness of films by laser induced surface acoustic waves; German version EN 15042-1:2006
- DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
- DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
Group Standards of the People's Republic of China, Thin Film Surface Analysis
- T/CECA 69-2022 Single-crystal thin film substrates for SAW devices
- T/CPIA 0036.1-2022 Retroreflective optical films for photovoltaic modules Part 1: Films for tinned ribbon surfaces
- T/CSTM 00537-2021 Phase transition temperature measurement of micro-nano thin film -Optical power analysis
- T/ZSA 110-2022 Specific surface area and pore size analyzer
IPC - Association Connecting Electronics Industries, Thin Film Surface Analysis
AENOR, Thin Film Surface Analysis
- UNE 55501:1990 SURFACE ACTIVE AGENTS. DETERMINATION OF SURFACE TENSION BY DRAWING UP LIQUID FILMS.
- UNE 55708:1984 SURFACE ACTIVE AGENTS. DETERMINATION OF INTERFACIAL TENSION BY DRAWING UP LIQUID FILMS
- UNE-EN 15042-1:2007 Thickness measurement of coatings and characterization of surfaces with surface waves - Part 1: Guide to the determination of elastic constants, density and thickness of films by laser induced surface acoustic waves
- UNE-EN 60674-3-1:1999/A1:2012 Plastic films for electrical purposes -- Part 3: Specifications for individual materials -- Sheet 1: Biaxially oriented polypropylene (PP) film for capacitors
ECIA - Electronic Components Industry Association, Thin Film Surface Analysis
- IS-34-1987 Leaded Surface Mount Resistor Networks Fixed Film
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Thin Film Surface Analysis
- GB/T 22586-2008 Measurements of surface resistance of high temperature superconductor thin films at microwave frequencies
- GB/T 13592-1992 Terms relating to surface analysis
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 20175-2006 Surface chemical analysis.Sputter depth profiling.Optimization using layered systems as reference materials
- GB/T 22461-2008 Surface chemical analysis.Vocabulary
- GB/T 28894-2012 Surface chemical analysis.Handing of specimens prior to analysis
- GB/T 21007-2007 Surface chemical analysis.Information formats
- GB/T 29557-2013 Surface chemical analysis.Depth Profiling.Measurment of sputtered depth
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
American Society for Testing and Materials (ASTM), Thin Film Surface Analysis
- ASTM D3617-83(1994)e1 Standard Practice for Sampling and Analysis of New Built-Up Roof Membranes
- ASTM D3617-02 Standard Practice for Sampling and Analysis of New Built-Up Roof Membranes
- ASTM F22-02 Standard Test Method for Hydrophobic Surface Films by the Water-Break Test
- ASTM F22-02(2007) Standard Test Method for Hydrophobic Surface Films by the Water-Break Test
- ASTM F22-13 Standard Test Method for Hydrophobic Surface Films by the Water-Break Test
- ASTM D3207-92(2002) Standard Test Method for Detergent Resistance of Floor Polish Films
- ASTM F21-65(2007) Standard Test Method for Hydrophobic Surface Films by the Atomizer Test
- ASTM D3207-92(2008) Standard Test Method for Detergent Resistance of Floor Polish Films
- ASTM B825-19 Standard Test Method for Coulometric Reduction of Surface Films on Metallic Test Samples
- ASTM D3207-92(2016) Standard Test Method for Detergent Resistance of Floor Polish Films
- ASTM D5295-00 Standard Guide for Preparation of Concrete Surfaces for Adhered (Bonded) Membrane Waterproofing Systems
- ASTM F21-14 Standard Test Method for Hydrophobic Surface Films by the Atomizer Test
- ASTM D5295/D5295M-14 Standard Guide for Preparation of Concrete Surfaces for Adhered (Bonded) Membrane Waterproofing Systems
- ASTM B825-97 Standard Test Method for Coulometric Reduction of Surface Films on Metallic Test Samples
- ASTM F22-21 Standard Test Method for Hydrophobic Surface Films by the Water-Break Test
- ASTM B825-02 Standard Test Method for Coulometric Reduction of Surface Films on Metallic Test Samples
- ASTM B825-02(2008) Standard Test Method for Coulometric Reduction of Surface Films on Metallic Test Samples
- ASTM B825-13 Standard Test Method for Coulometric Reduction of Surface Films on Metallic Test Samples
- ASTM F1995-12 Standard Test Method for Determining the Shear Force of a Surface Mount Device (SMD) in a Membrane Switch
Professional Standard - Chemical Industry, Thin Film Surface Analysis
- HG/T 4303-2012 Test method of resistance to abrasion for hard-coating polyester film
- HG/T 2348-1992 The stylus method for measuring surface roughness of polyester film for magnetic tape
- HG/T 6138-2023 Specific surface area and pore size analyzer
Japanese Industrial Standards Committee (JISC), Thin Film Surface Analysis
- JIS K 6766:1977 Testing methods for polyethylene coatings on metals
- JIS R 1636:1998 Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer
- JIS K 0147:2004 Surface chemical analysis -- Vocabulary
- JIS K 0142:2000 Surface chemical analysis -- Information formats
- JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
- JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
- JIS K 7196:1991 Testing method for softening temperature of thermoplastics film and sheeting by thermomechanical analysis
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
- JIS K 0154:2017 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis
RU-GOST R, Thin Film Surface Analysis
- GOST 260-1975 Rubber. Method for determination of resilience of the lacquer film on rubber surface
- GOST 25209-1982 Plastics and polymer films. Methods for the determination of surface charges of electrets
Defense Logistics Agency, Thin Film Surface Analysis
- DLA DESC-DWG-87012 REV H-2013 RESISTOR NETWORK, FIXED, FILM, SURFACE MOUNT, GULL WING, 16 PIN
- DLA DESC-DWG-87013 REV H-2013 RESISTOR NETWORK, FIXED, FILM, SURFACE MOUNT, GULL WING, 14 PIN
- DLA DSCC-DWG-03010 REV C-2009 RESISTOR, FIXED, FILM, CHIP, SURFACE MOUNTED, ULTRA PRECISION, STYLE 1506
- DLA DESC-DWG-87016 REV N-2012 RESISTOR NETWORK, FIXED, FILM, SURFACE MOUNT, 20 PIN, LEADLESS CHIP CARRIER
- DLA DSCC-DWG-87015 REV F-2012 RESISTOR NETWORKS, FIXED, FILM, SURFACE MOUNT, 28 PIN, LEADLESS CHIP CARRIER
- DLA DESC-DWG-87014 REV K-2013 RESISTOR NETWORK, FIXED, FILM, SURFACE MOUNT, 16 PIN, LEADLESS CHIP CARRIER
- DLA A-A-50767 VALID NOTICE 3-2006 ANALYZER, SURFACE FINISH
- DLA A-A-50767 VALID NOTICE 2-2001 ANALYZER, SURFACE FINISH
- DLA A-A-50767 VALID NOTICE 1-1995 ANALYZER, SURFACE FINISH
- DLA A-A-50767-1983 ANALYZER, SURFACE FINISH
- DLA DSCC-DWG-04025 REV A-2010 RESISTOR, CHIP, FIXED, FILM, SURFACE MOUNT, 5 WATTS (UP TO 25 WATTS WITH HEATSINK)
- DLA DSCC-DWG-05015 REV A-2012 RESISTOR, CHIP, FIXED, FILM, SURFACE MOUNT, 2.25 WATTS (UP TO 20 WATTS WITH HEATSINK)
- DLA DSCC-DWG-04025 REV B-2012 RESISTOR, CHIP, FIXED, FILM, SURFACE MOUNT, 5 WATTS (UP TO 25 WATTS WITH HEATSINK)
- DLA DSCC-DWG-04025-2005 RESISTOR, CHIP, FIXED, FILM, SURFACE MOUNT, 5 WATTS (UP TO 25 WATTS WITH HEATSINK)
Association Francaise de Normalisation, Thin Film Surface Analysis
- NF EN 15042-1:2006 Mesure de l'épaisseur des revêtements et caractérisation des surfaces à l'aide d'ondes de surface - Partie 1 : guide pour la détermination des constantes élastiques, de la masse volumique et de l'épaisseur des films à l'aide d'ondes de su...
- NF X21-062*NF ISO 14606:2008 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- NF C83-241*NF EN 140401:2009 Blank Detail Specification : fixed low power film surface mount (SMD) resistors
- NF ISO 18117:2009 Analyse chimique des surfaces - Manipulation des échantillons avant analyse
- NF EN IEC 60674-3-4:2022 Films plastiques à usages électriques - Partie 3 : Spécifications pour matériaux particuliers - Feuille 4 : Films de polyimide utilisés dans l'isolation électrique
- NF X21-065*NF ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- NF EN IEC 60674-3-1:2021 Films plastiques à usages électriques - Partie 3 : spécifications pour matériaux particuliers - Feuille 1 : films de polypropylène biorienté (PP) pour condensateurs
- NF C31-888-15*NF EN 61788-15:2012 Superconductivity - Part 15 : electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
- NF EN 61788-15:2012 Supraconductivité - Partie 15 : mesures de caractéristiques électroniques - Impédance de surface intrinsèque de films supraconducteurs aux fréquences micro-ondes
- NF ISO 18116:2006 Analyse chimique des surfaces - Lignes directrices pour la préparation et le montage des échantillons destinés à l'analyse
European Association of Aerospace Industries, Thin Film Surface Analysis
- AECMA PREN 6085-1999 Aerospace Series Non-Metallic Materials Epoxy Surfacing Films Edition P1
- AECMA PREN 6084-1999 Aerospace Series Non-Metallic Materials Surfacing Films Technical Specification General Requirements Edition P1
RO-ASRO, Thin Film Surface Analysis
- STAS 11195-1987 SURFACE AGENTS Analysis method
- SR CEI 746-4-1996 Expression of performance of electrochemical analyzers Part 4: Dissolved oxygen in water measured by membrane covered amperometric sensors
- SR 110-9-1995 Sugar. Methods of analysis. Determination of the apparent mass
VDI - Verein Deutscher Ingenieure, Thin Film Surface Analysis
- VDI 2534 Blatt 1-1966 Oberflaechenschutz mit organischen Werkstoffen; Oberflaechenueberzuege mit Folien aus PVC hart (Polyvinylchlorid hart)
Danish Standards Foundation, Thin Film Surface Analysis
- DS/EN 15042-1:2006 Thickness measurement of coatings and characterization of surfaces with surface waves - Part 1: Guide to the determination of elastic constants, density and thickness of films by laser induced surface acoustic waves
- DS/EN 140401:2009 Blank Detail Specification: Fixed low power film surface mount (SMD) resistors
- DS/EN IEC 60674-3-1:2021 Plastic films for electrical purposes – Part 3: Specifications for individual materials – Sheet 1: Biaxially oriented polypropylene (PP) film for capacitors
- DS/EN 61788-15:2012 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
- DS/EN 60674-3-1/A1:2012 Plastic films for electrical purposes - Part 3: Specifications for individual materials - Sheet 1: Biaxially oriented polypropylene (PP) film for capacitors
- DS/EN 60674-3-1:1999 Plastic films for electrical purposes - Part 3: Specifications for individual materials - Sheet 1: Biaxially oriented polypropylene (PP) film for capacitors
Lithuanian Standards Office , Thin Film Surface Analysis
- LST EN 15042-1-2006 Thickness measurement of coatings and characterization of surfaces with surface waves - Part 1: Guide to the determination of elastic constants, density and thickness of films by laser induced surface acoustic waves
- LST EN 140401-2009 Blank Detail Specification: Fixed low power film surface mount (SMD) resistors
- LST EN 165000-3-2001 Film and hybrid integrated circuits. Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
AT-ON, Thin Film Surface Analysis
- ONORM M 1113-1982 Technical surfaces; methods of surjace analyzing Surjaces techniqu.es; methodes de essai des surfaces
American National Standards Institute （ANSI), Thin Film Surface Analysis
- ANSI A108.16-2005 Installation of Paper-Faced, Back-Mounted, Edge-Mounted, or Clear Film Face-Mounted Glass Mosaic Tile
Standard Association of Australia （SAA）, Thin Film Surface Analysis
- AS ISO 14606:2006 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
- AS ISO 18115:2006 Surface chemical analysis - Vocabulary
- IEC 60674-3-3:2023 Plastic films for electrical purposes — Part 3:Specifications for individual materials — Sheet 3: Polycarbonate (PC) films used for electrical insulation
- AS ISO 14975:2006 Surface chemical analysis - Information formats
- AS/NZS 4201.6:1994 Pliable building membranes and underlays - Methods of test - Surface water absorbency
- IEC 60674-3-7:2023 Plastic films for electrical purposes — Part 3: Specifications for individual materials — Sheet 7: Fluoroethylene-propylene (FEP) films used for electrical insulation
European Committee for Electrotechnical Standardization（CENELEC）, Thin Film Surface Analysis
- EN 140401:2009 Blank Detail Specification: Fixed low power film surface mount (SMD) resistors
- EN IEC 60674-3-3:2023 Plastic films for electrical purposes - Part 3: Specifications for individual materials - Sheet 3: Polycarbonate (PC) films used for electrical insulation
- EN IEC 60674-3-7:2023 Plastic films for electrical purposes - Part 3: Specifications for individual materials - Sheet 7: Fluoroethylene-propylene (FEP) films used for electrical insulation
- EN IEC 60674-3-1:2021 Plastic films for electrical purposes - Part 3: Specifications for individual materials - Sheet 1: Biaxially oriented polypropylene (PP) film for capacitors
ES-UNE, Thin Film Surface Analysis
- UNE-EN 140401:2009 Blank Detail Specification: Fixed low power film surface mount (SMD) resistors (Endorsed by AENOR in July of 2009.)
- UNE-EN 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies (Endorsed by AENOR in March of 2012.)
- UNE-EN IEC 60674-3-1:2021 Plastic films for electrical purposes - Part 3: Specifications for individual materials - Sheet 1: Biaxially oriented polypropylene (PP) film for capacitors (Endorsed by Asociación Española de Normalización in November of 2021.)
YU-JUS, Thin Film Surface Analysis
Society of Automotive Engineers (SAE), Thin Film Surface Analysis
- SAE J138-1969 Film Analysis Guides for Dynamic Studies of Test Subjects
SAE - SAE International, Thin Film Surface Analysis
- SAE J138-2019 Performance Requirements for Motor Vehicle Headlamps
未注明发布机构, Thin Film Surface Analysis
CZ-CSN, Thin Film Surface Analysis
- CSN ISO 7704:1994 Water quality. Evaluation of membrane filters used for microbiological analyses
工业和信息化部, Thin Film Surface Analysis
- YS/T 1161.3-2016 Methods for analysis of pseudoboehmite Part 3: Determination of pore volume and specific surface area Nitrogen adsorption method
International Electrotechnical Commission (IEC), Thin Film Surface Analysis
- IEC 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
- IEC 60746-4:1992 Expression of performance of electrochemical analyzers; part 4: dissolved oxygen in water measured by membrane covered amperometric sensors
KR-KS, Thin Film Surface Analysis
CENELEC - European Committee for Electrotechnical Standardization, Thin Film Surface Analysis
- EN 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
(U.S.) Ford Automotive Standards, Thin Film Surface Analysis
- FORD WSS-M99P37-A-2014 PERFORMANCE,LAMINATED IN-COLOR FILM MATERIALS, CLASS "A" SURFACE, EXTERIOR ***TO BE USED WITH FORD WSS-M99P1111-A***
- FORD WSS-M99P37-B-2014 PERFORMANCE,LAMINATED IN-COLOR FILM MATERIALS, CLASS "A" SURFACE, EXTERIOR ***TO BE USED WITH FORD WSS-M99P1111-A***
Jiangsu Provincial Standard of the People's Republic of China, Thin Film Surface Analysis
- DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface