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Surface Instrumentation Surface Analysis
Surface Instrumentation Surface Analysis, Total:500 items.
In the international standard classification, Surface Instrumentation Surface Analysis involves: Equipment for the chemical industry, Analytical chemistry, Vocabularies, Linear and angular measurements, Optics and optical measurements, Acoustics and acoustic measurements, Road engineering, Electrical accessories, Installations in buildings, Coatings and related processes used in aerospace industry, Shipbuilding and marine structures in general, Applications of information technology, Bearings, TESTING, Sugar. Sugar products. Starch, Products of the chemical industry, Solar energy engineering, Electronic display devices, Radiation measurements, Education, Semiconductor devices, Domestic, commercial and industrial heating appliances, Metrology and measurement in general, Radiation protection, Electricity. Magnetism. Electrical and magnetic measurements, Nuclear energy engineering, Glass, IT terminal and other peripheral equipment, Thermodynamics and temperature measurements, Electrical wires and cables, Industrial automation systems, Environmental testing, Electrical and electronic testing, Vacuum technology, Equipment for the metallurgical industry, Surface treatment and coating, Sports equipment and facilities, Tobacco, tobacco products and related equipment, Machine tool systems, Non-destructive testing, Construction materials, Quality, Powder metallurgy.
Defense Logistics Agency, Surface Instrumentation Surface Analysis
Group Standards of the People's Republic of China, Surface Instrumentation Surface Analysis
Professional Standard - Chemical Industry, Surface Instrumentation Surface Analysis
Korean Agency for Technology and Standards (KATS), Surface Instrumentation Surface Analysis
International Federation of Trucks and Engines, Surface Instrumentation Surface Analysis
KR-KS, Surface Instrumentation Surface Analysis
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Surface Instrumentation Surface Analysis
- GB/T 13592-1992 Terms relating to surface analysis
- GB/T 22461-2008 Surface chemical analysis.Vocabulary
- GB/T 25187-2010 Surface chemical analysis.Auger electron spectroscopy.Description of selected instrumental performance parameters
- GB/T 21007-2007 Surface chemical analysis.Information formats
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/T 28894-2012 Surface chemical analysis.Handing of specimens prior to analysis
- GB/T 19499-2004 Surface chemical analysis-Data transfer format
- GB/T 29732-2013 Surface chemical analysis.Medium resolution Auger electron spectrometers.Calibration of energy scales for elemental analysis
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 29557-2013 Surface chemical analysis.Depth Profiling.Measurment of sputtered depth
- GB/T 15222-1994 Evaluation of surface contamination--Part 2:Tritium surface cantamination
- GB/T 14056.2-2011 Evaluation of surface contamination.Part 2: Tritium surface contamination
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 8997-1988 Calibration for alpha,beta surface contamination meters and monitors
- GB/T 29731-2013 Surface chemical analysis.High-resolution Auger electron spectrometers.Calibration of energy scales for elemental and chemical-state analysis
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
- GB/T 5202-1985 Alpha,beta and alpha-beta surface contamination meters and monitors
- GB/T 8997-2008 Calibration for alpha,beta and alpha/beta surface contamination meters and monitors
- GB 5202-1985 Alpha,beta and alpha-beta surface contamination meters and monitors
- GB/T 19146-2010 Infrared devices for instant screening of human skin temperature
- GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
- GB/T 30815-2014 Surface chemical analysis.Guidelines for preparation and mounting of specimens for analysis
- GB/Z 32494-2016 Analysis of Surface Chemical Analysis Auger Electron Spectroscopy Chemical Information Interpretation
- GB 9290-1988 Surface active agents－Technical ethoxylated fatty amines－Methods of analysis
- GB/T 9290-1988 Surface active agents--Technical ethoxylated fatty amines--Methods of analysis
- GB/T 19502-2004 Surface chemical analysis-Glow discharge optical emission spectrometry(GD-OSE)-Introduction to use
- GB/T 9290-2008 Surface active agents.Technical ethoxylated fatty amines.Method of analysis
International Organization for Standardization (ISO), Surface Instrumentation Surface Analysis
- ISO/CD 20289:2017 Surface chemical analysis
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
- ISO 18115:2001 Surface chemical analysis - Vocabulary
- ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
- ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
- ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- ISO 14975:2000 Surface chemical analysis - Information formats
- ISO/TR 14187:2020 Surface chemical analysis — Characterization of nanostructured materials
- ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
- ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
- ISO 18115:2001/Amd 1:2006 Surface chemical analysis - Vocabulary; Amendment 1
- ISO 18115:2001/Amd 2:2007 Surface chemical analysis - Vocabulary; Amndment 2
- ISO 14976:1998 Surface chemical analysis - Data transfer format
- ISO 24465:2023 Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
- ISO 18115-3:2022 Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
- ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
- ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 7503-2:1988 Evaluation of surface contamination; part 2: tritium surface contamination
- ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles - Part 6: Verification of the performance of laser profilometers used for pavement texture measurements
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO 25178-1:2016 Geometrical product specifications (GPS) - Surface texture: Areal - Part 1: Indication of surface texture
- ISO/TR 14187:2011 Surface chemical analysis - Characterization of nanostructured materials
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO/TR 22335:2007 Surface chemical analysis - Depth profiling - Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
- ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 25178-6:2010 Geometrical product specifications (GPS) - Surface texture: Areal - Part 6: Classification of methods for measuring surface texture
- ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
- ISO 893:1989 Surface active agents; technical alkane sulfonates; methods of analysis
- ISO/TS 15338:2020 Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
- ISO 893:1978 Surface active agents — Technical sodium alkane sulphonates — Methods of analysis
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
- ISO 13473-3:2002 Characterization of pavement texture by use of surface profiles - Part 3: Specifications and classification of profilometers
- ISO 25178-2:2012 Geometrical product specifications (GPS) - Surface texture: Areal - Part 2: Terms, definitions and surface texture parameters
- ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
- ISO 894:1977 Surface active agents; Technical sodium primary alkylsulphates; Methods of analysis
- ISO 895:1977 Surface active agents; Technical sodium secondary alkylsulphates; Methods of analysis
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- ISO/TR 29901:2007/cor 1:2009 Selected illustrations of full factorial experiments with four factors; Technical Corrigendum 1
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
- ISO 6384:1981 Surface active agents; Technical ethoxylated fatty amines; Methods of analysis
- ISO 456:1973 Surface active agents; Analysis of soaps; Determination of free caustic alkali
- ISO 4287-1:1984 Surface roughness; Terminology; Part 1 : Surface and its parameters Trilingual edition
AT-ON, Surface Instrumentation Surface Analysis
- ONORM M 1113-1982 Technical surfaces; methods of surjace analyzing Surjaces techniqu.es; methodes de essai des surfaces
- ONORM M 1114-1982 Measurement of surface roughness with contact (Stylus) Instruments
RO-ASRO, Surface Instrumentation Surface Analysis
- STAS 11195-1987 SURFACE AGENTS Analysis method
- SR 110-9-1995 Sugar. Methods of analysis. Determination of the apparent mass
- STAS 5730/4-1987 Surfaces condition RULES FOR THE MEASURE- MENT OF SURFACE ROUGHNESS USING STYLUS INSTRUMENTS
- STAS SR CEI 776-1983 Expression of the properties of logic analyzers
- STAS ISO 1879:1993 Instrumets for the measurement of surface roughness by the profile method. Vocabulary
- STAS SR ISO 7503-2:1996 Evaluation of surface contamination Part 2: Tritium surface contamination
- STAS SR ISO 3274:1995 Instruments for the measurements of surface roughness by the profile method - Contact (stylus) instruments of consecutive profile transformation - Contact profile meters, system M
Japanese Industrial Standards Committee (JISC), Surface Instrumentation Surface Analysis
- JIS B 0651:1996 Surface texture -- Instruments for the assessment of surface texture -- Profile method
- JIS K 0147:2004 Surface chemical analysis -- Vocabulary
- JIS K 0142:2000 Surface chemical analysis -- Information formats
- JIS K 0141:2000 Surface chemical analysis -- Data transfer format
- JIS B 0681-6:2014 Geometrical product specifications (GPS) -- Surface texture: Areal -- Part 6: Classification of methods for measuring surface texture
- JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
- JIS K 0154:2017 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis
- JIS B 0660:1998 Surface roughness -- Terminology -- Part 1: Surface and its parameters
- JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- JIS B 0681-1:2023 Geometrical product specifications (GPS) -- Surface texture: Areal -- Part 1: Indication of surface texture
- JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
Association Francaise de Normalisation, Surface Instrumentation Surface Analysis
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF ISO 18117:2009 Analyse chimique des surfaces - Manipulation des échantillons avant analyse
- NF X21-065*NF ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- NF EN ISO 25178-700:2023 Spécification géométrique des produits (GPS) - Etat de surface : Surfacique - Partie 700 : Etalonnage, ajustage et vérification d'instruments de mesure de la topographie des surfaces
- NF X21-052/A2:2008 Surface chemical analysis - Vocabulary - Amendment 2.
- NF X21-052/A1:2008 Surface chemical analysis - Vocabulary - AMENDMENT 1.
- NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
- NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
- NF ISO 18116:2006 Analyse chimique des surfaces - Lignes directrices pour la préparation et le montage des échantillons destinés à l'analyse
- NF EN 61725:1998 Expression analytique des profils solaires journaliers
- NF M60-702:1988 Evaluation of surface contamination. Part 2 : tritium surface contamination.
- NF EN ISO 25178-601:2010 Spécification géométrique des produits (GPS) - État de surface : surfacique - Partie 601 : caractéristiques nominales des instruments à contact (à palpeur)
- NF X21-056*NF ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- NF ISO 893:1990 Agents de surface - Alcanesulfonates techniques - Méthode d'analyse.
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF E05-031-6*NF EN ISO 25178-6:2010 Geometrical product specifications (GPS) - Surface texture : Areal - Part 6 : classification of methods for measuring surface texture
- NF C46-251-3*NF EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3 : paramagnetic oxygen analysers
- NF EN IEC 61207-3:2019 Analyseurs de gaz - Expression des performances - Partie 3 : analyseurs d'oxygène paramagnétiques
- NF EN 61207-6:2015 Expression des performances des analyseurs de gaz - Partie 6 : analyseurs photométriques
- NF T73-292*NF EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analysis method.
- NF EN 14670:2005 Agents de surface - Dodécylsulfate de sodium - Méthode d'analyse
- NF EN ISO 105-Z01:1996 Textiles - Essais de solidité des teintures - Partie Z01 : solidité des teintures aux métaux dans les bains de teinture : sels de chrome.
- NF EN ISO 25178-2:2022 Spécification géométrique des produits (GPS) - État de surface : surfacique - Partie 2 : termes, définitions et paramètres d'états de surface
- NF EN ISO 25178-701:2010 Spécification géométrique des produits (GPS) - État de surface : surfacique - Partie 701 : étalonnage et étalons de mesure pour les instruments à contact (à palpeur)
- NF T73-428*NF EN 15647:2009 Surface active agents - Determination of the dispersing effect of surfactants on powder
- NF E05-031-1*NF EN ISO 25178-1:2016 Geometrical product specifications (GPS) - Surface texture : areal - Part 1 : indication of surface texture
- NF P90-149-2*NF EN 15330-2:2017 Surfaces for sports areas - Synthetic turf and needle-punched surfaces primarily designed for outdoor use - Part 2 : specification for needle-punched surfaces for tennis and multi-sport surfaces
- NF C46-251-6*NF EN 61207-6:2015 Expression of performance of gas analyzers - Part 6 : photometric analyzers
- NF C46-256:1994 Expression of performance of gas analysers. Part 6 : photometric analyzers.
- NF EN ISO 25178-606:2015 Spécification géométrique des produits (GPS) - État de surface : surfacique - Partie 606 : caractéristiques nominales des instruments sans contact (à variation focale)
- FD X21-063*FD ISO/TR 22335:2008 Surface chemical analysis - Depth profiling - Measurement of sputtering rate : mesh-replica method using a mechanical stylus profilometer
- NF S31-252-1:2004 Characterization of pavement texture by use of surface profiles - Part 1 : determination of mean profile depth.
- NF EN ISO 25178-1:2016 Spécification géométrique des produits (GPS) - État de surface : surfacique - Partie 1 : indication des états de surface
- NF EN 15647:2009 Agents de surface - Détermination des forces de dispersion des surfactants sur la poudre
- NF T73-275:1982 Surface active agents. Technical ethoxylated fatty amines. Methods of analysis.
- NF T73-233*NF ISO 893:1990 Surface active agents. Technical alkane sulfonates. Methods of analysis.
- XP CEN/TS 15901-13:2011 Caractéristiques de surface des routes et aéroports - Partie 13 : mode opératoire de détermination de l'adhérence de la surface d'un revêtement de chaussée par mesurage d'un coefficient de frottement transversal (CFTO) : l'odoliographe
- NF EN ISO 25178-607:2019 Spécification géométrique des produits (GPS) - État de surface : Surfacique - Partie 607 : caractéristiques nominales des instruments sans contact (microscopie confocale)
- NF EN ISO 25178-73:2019 Spécification géométrique des produits (GPS) - État de surface : surfacique - Partie 73 : termes et définitions pour les défauts de surface sur les mesures matérialisées
- NF EN IEC 60580:2020 Appareils électromédicaux - Radiamètres de produit exposition-surface
- NF ISO 17974:2009 Analyse chimique des surfaces - Spectromètres d'électrons Auger à haute résolution - Étalonnage des échelles d'énergie pour l'analyse élémentaire et de l'état chimique
- XP P98-832-5*XP CEN/TS 15901-5:2011 Road and airfield surface characteristics - Part 5 : procedure for determining the skid resistance of a pavement surface using a device with longitudinal controlled slip (LFCRDK) : ROAR (Road Analyser and Recorder of Norsemeter)
- NF EN 15042-1:2006 Mesure de l'épaisseur des revêtements et caractérisation des surfaces à l'aide d'ondes de surface - Partie 1 : guide pour la détermination des constantes élastiques, de la masse volumique et de l'épaisseur des films à l'aide d'ondes de su...
- NF C46-253*NF EN 61207-3:2002 Gas analysers - Expression of performance - Part 3 : paramagnetic oxygen analysers.
- NF T73-232:1978 Surface active agents. Technical sodium secondary alkylsulphates. Methods of analysis.
- NF T73-231:1978 Surface active agents. Technical sodium primary alkylsulphates. Methods of analysis.
- NF P98-857-1*NF EN 12274-1:2018 Slurry surfacing - Test methods - Part 1 : sampling of slurry surfacing mixture
YU-JUS, Surface Instrumentation Surface Analysis
- JUS H.E0.005-1979 Surface active agents. Glossarj. List V. Analysis
- JUS M.A1.024-1981 Sur face roughness of industrial products. Classification of surface fktws
- JUS M.A1.027-1981 Surface roughness ofindustrial products. Classification ofscraped surfaces.
- JUS M.A1.032-1980 Classification of imtruments and devices for measurement and evaluation of the geometrical parameters of surface finish
- JUS M.A1.031-1982 Instruments for the measurement of surface roughness by the profile method — Contactprofile meters, system M
- JUS H.E8.053-1992 Surface active agents.Technical ethoxylated fatty amines. Methods of analysis
German Institute for Standardization, Surface Instrumentation Surface Analysis
- DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
- DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
- DIN VDE 0603-2-1:2017 Meter panels - Part 2-1: Meter panels for direct measurement up to 63 A
- DIN VDE 0603-3-3 Berichtigung 1:2021 Meter Panels - Part 3-3: Terminal connectors for meters; Corrigendum 1
- DIN ISO 13473-3:2004-07 Characterization of pavement texture by use of surface profiles - Part 3: Specifications and classification of profilometers (ISO 13473-3:2002)
- DIN ISO 13473-3:2004 Characterization of pavement texture by use of surface profiles - Part 3: Specifications and classification of profilometers (ISO 13473-3:2002)
- DIN 43700:1982 Measurement and control; measurement and control instruments for panel mounting; nominal front- and cut-out-dimensions
- DIN VDE 0603-3-2:2017 Meter panels - Part 3-2: Device for mounting and connection (BKE) of electronic meters (eHZ) for household use on meter panels
- DIN EN 61098:2008 Radiation protection instrumentation - Installed personnel surface contamination monitoring assemblies (IEC 61098:2003, modified); German version EN 61098:2007
- DIN ISO 13473-2:2004 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis (ISO 13473-2:2002)
- DIN ISO 13473-2:2004-07 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis (ISO 13473-2:2002)
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method; German version EN 14670:2005
- DIN 28400-6:1980-10 Vacuum technology; terms and definitions, surface analysis techniques
- DIN EN 61725:1998-03 Analytical expression for daily solar profiles (IEC 61725:1997); German version EN 61725:1997
- DIN EN 61207-6:1995 Expression of performance of gas analyzers - Part 6: Photometric analyzers (IEC 61207-6:1994); German version EN 61207-6:1994
- DIN 43870 Bb.1:1986 Meter mounting boards; information concerning functional area
- DIN EN 61207-6:2016-03 Expression of performance of gas analyzers - Part 6: Photometric analyzers (IEC 61207-6:2014); German version EN 61207-6:2015 / Note: DIN EN 61207-6 (1995-02) remains valid alongside this standard until 2017-12-30.
- DIN EN IEC 61207-3:2020-12 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (IEC 61207-3:2019); German version EN IEC 61207-3:2019 / Note: DIN EN 61207-3 (2002-11) and DIN EN 61207-3 Berichtigung 1 (2003-05) remain valid alongside this standard u...
- DIN EN 14670:2005-09 Surface active agents - Sodium dodecyl sulfate - Analytical method; German version EN 14670:2005
- DIN 28400-6:1980 Vacuum technology; terms and definitions, surface analysis techniques
- DIN 68861-8:2001-04 Furniture surfaces - Part 8: Behaviour on subjection to wet heat
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN EN ISO 25178-1:2016-12 Geometrical product specifications (GPS) - Surface texture: Areal - Part 1: Indication of surface texture (ISO 25178-1:2016); German version EN ISO 25178-1:2016
- DIN EN 15330-2:2017 Surfaces for sports areas - Synthetic turf and needle-punched surfaces primarily designed for outdoor use - Part 2: Specification for needle-punched surfaces for tennis and multi-sport surfaces
- DIN 6094-13:1997-05 Means of packaging - Finishes - Part 13: 2 thread- and 3 thread-screw-finishes
- DIN EN ISO 25178-6:2010-06 Geometrical product specifications (GPS) - Surface texture: Areal - Part 6: Classification of methods for measuring surface texture (ISO 25178-6:2010); German version EN ISO 25178-6:2010
- DIN EN ISO 13473-1:2004 Characterization of pavement texture by use of surface profiles - Part 1: Determination of Mean Profile Depth (ISO 13473-1:1997); German version EN ISO 13473-1:2004
- DIN EN 15647:2009-04 Surface active agents - Determination of the dispersing effect of surfactants on powder; German version EN 15647:2009
- DIN EN 15647:2009 Surface active agents - Determination of the dispersing effect of surfactants on powder; English version of DIN EN 15647:2009-04
- DIN CEN/TS 15901-2:2010-03*DIN SPEC 1142:2010-03 Road and airfield surface characteristics - Part 2: Procedure for determining the skid resistance of a pavement surface using a device with longitudinal controlled slip (LFCRNL): ROAR (Road Analyser and Recorder of Norsemeter); German version CEN/TS 15...
- DIN CEN/TS 15901-5:2010-03*DIN SPEC 1145:2010-03 Road and airfield surface characteristics - Part 5: Procedure for determining the skid resistance of a pavement surface using a device with longitudinal controlled slip (LFCRDK): ROAR (Road Analyser and Recorder of Norsemeter); German version CEN/TS 15...
Standard Association of Australia （SAA）, Surface Instrumentation Surface Analysis
- AS ISO 18115:2006 Surface chemical analysis - Vocabulary
- AS ISO 14975:2006 Surface chemical analysis - Information formats
- AS ISO 14976:2006 Surface chemical analysis - Data transfer format
- AS ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- AS 1627.7:1988 Metal finishing—Preparation and pretreatment of surfaces Part 7: Hand tool cleaning of metal surfaces
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
British Standards Institution (BSI), Surface Instrumentation Surface Analysis
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 14975:2000 Surface chemical analysis - Information formats
- BS ISO 14975:2001 Surface chemical analysis. Information formats
- DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles. Spectral analysis of texture profiles
- PD ISO/TR 14187:2020 Surface chemical analysis. Characterization of nanostructured materials
- BS ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
- BS EN IEC 61207-3:2019 Tracked Changes. Gas Analyzers. Expression of performance. Paramagnetic oxygen analysers
- BS DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Spectral analysis of texture profiles
- BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
- BS ISO 14976:1998 Surface chemical analysis - Data transfer format
- BS EN 61725:1997 Analytical expression for daily solar profiles
- BS ISO 24465:2023 Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
- DD ISO/TR 15969:2001 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS DD ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
- BS PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS 6351-2:1983 Electric surface heating - Guide to the design of electric surface heating systems
- BS ISO 18115-1:2010 Surface chemical analysis - Vocabulary - General terms and terms used in spectroscopy
- BS ISO 18115-1:2013 Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy
- BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
- BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
- 21/30404376 DC BS ISO 24465. Surface chemical analysis. Determination of the minimum detectability of Surface Plasmon Resonance device
- BS 1134-1:1988 Assessment of surface texture. Methods and instrumentation
- BS ISO 13473-3:2002 Characterization of pavement texture by use of surface profiles - Specification and classification of profilometers
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
- PD ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles. Verification of the performance of laser profilometers used for pavement texture measurements
- 21/30385921 DC BS ISO 18115-3. Surface chemical analysis. Vocabulary. Part 3. Terms used in optical interface analysis
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- BS 6351-1:1983 Electric surface heating - Specification for electric surface heating devices
- BS 6329:1982 Method of expression of the properties of spectrum analyzers
- BS ISO 17973:2016 Tracked Changes. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- BS EN 61207-6:2015 Tracked Changes. Expression of performance of gas analyzers. Photometric analyzers
- BS EN 1370:1997 Founding - Surface roughness inspection by visual tactile comparators
- BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
- BS 6829-0:1991 Analysis of surface active agents (raw materials) - General introduction
- BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- BS ISO 15471:2016 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
- BS DD ISO/TS 25138:2011 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
- PD ISO/TR 19693:2018 Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
- BS EN ISO 8503-4:2012 Preparation of steel substrates before application of paints and related products. Surface roughness characteristics of blast-cleaned steel substrates. Method for the calibration of ISO surface profile comparators and for the determination of surface prof
- BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- BS EN ISO 25178-6:2010 Geometrical product specifications (GPS) - Surface texture - Areal - Classification of methods for measuring surface texture
- PD ISO/TR 15969:2021 Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS EN 15330-2:2008 Surfaces for sports areas - Synthetic turf and needle- punched surfaces primarily designed for outdoor use - Part 2: Specification for needle-punched surfaces
- PD ISO/TR 22335:2007 Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
- BS EN 15647:2009 Surface active agents - Determination of the dispersing effect of surfactants on powder
- BS 4359-4:1995 Determination of the specific surface area of powders - Recommendations for methods of determination of metal surface area using gas adsorption techniques
- BS 6653:1985 Method for expression of the properties of logic analyzers
- BS ISO 14707:2015 Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
- BS ISO 14707:2000 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Society of Automotive Engineers (SAE), Surface Instrumentation Surface Analysis
Professional Standard-Ships, Surface Instrumentation Surface Analysis
- CB 1085.4-1989 Man-hour quota surface treatment for instrumentation manufacturing
National Metrological Verification Regulations of the People's Republic of China, Surface Instrumentation Surface Analysis
- JJG 478-2016 α、β Surface Contamination Monitors
- JJG(建材) 107-1999 Verification regulation for determination specific surface area of air permeability apparatus
- JJG 478-1996 Verification Regulation of Alpha Beta and Gamma Surface Contamination Instruments
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Surface Instrumentation Surface Analysis
- GB/T 33498-2017 Surface chemical analysis—Characterization of nanostructured materials
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
- GB/T 32999-2016 Surface chemical analysis—Depth profiling—Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
- GB/T 32996-2016 Surface chemical analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry
未注明发布机构, Surface Instrumentation Surface Analysis
- BS ISO 14975:2000(2012) Surface chemical analysis — Information formats
- BS ISO 18117:2009(2015) Surface chemical analysis — Handling of specimens prior to analysis
- ISO 14976:1998/Cor 1:1999 Surface Chemical Analysis Data Transfer Format Technical Corrigendum 1
- BS 6829-0:1991(2008) Analysis of surface active agents (raw materials) — Part 0 : General introduction
- BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS 7044-4:1991(1999) Artificial sports surfaces — Part 4 : Specification for surfaces for multi - sports use
- BS 6351-2:1983(1999) Electric surface heating — Part 2 : Guide to the design of electric surface heating systems
Professional Standard - Machinery, Surface Instrumentation Surface Analysis
AWS - American Welding Society, Surface Instrumentation Surface Analysis
- C4.1 SET-1977 Oxygen Cutting Surface Roughness Gauge and Chart for Criteria Describing Oxygen Cut Surfaces
Indonesia Standards, Surface Instrumentation Surface Analysis
- SNI 05-4533-1998 Instruments for the measurement of surface roughness by the profile method- Contact (stylus) instrumens of progressive profile transformation - Profile recording instrument
American Society for Testing and Materials (ASTM), Surface Instrumentation Surface Analysis
- ASTM E673-98E1 Standard Terminology Relating to Surface Analysis
- ASTM E673-01 Standard Terminology Relating to Surface Analysis
- ASTM E673-03 Standard Terminology Relating to Surface Analysis
- ASTM E673-02 Standard Terminology Relating to Surface Analysis
- ASTM E673-02b Standard Terminology Relating to Surface Analysis
- ASTM E673-02a Standard Terminology Relating to Surface Analysis
- ASTM D1001-51 Specification for Sieve Analysis of Granular Mineral Surfacing for Asphalt Roofing and Shingles
- ASTM E1829-14(2020) Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E770-80(1985)e1 Method for Classifying Pavement Surface Textures
- ASTM E1829-02 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1829-97 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1829-09 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1078-14(2020) Standard Guide for Specimen Preparation and Mounting in Surface Analysis
- ASTM E1829-14 Standard Guide for Handling Specimens Prior to Surface Analysis
- ASTM E1078-14 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
- ASTM D7013/D7013M-15 Standard Guide for Calibration Facility Setup for Nuclear Surface Gauges
- ASTM D452-91(1997)e1 Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
- ASTM D452-91(2008) Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
- ASTM D452/D452M-19 Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
ET-QSAE, Surface Instrumentation Surface Analysis
AENOR, Surface Instrumentation Surface Analysis
- UNE-EN 61725:1998 ANALYTICAL EXPRESSION FOR DAILY SOLAR PROFILES.
- UNE 82303:1991 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROFILE METHOD. VOCABULARY
- UNE 55517:1984 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL ALKYLBETAINES
- UNE 20776:1996 EXPRESSION OF THE PROPERTIES OF LOGIC ANALYZERS.
- UNE-EN 61207-3:2004 Gas analyzers - Expression of performance -- Part 3: Paramagnetic oxygen analyzers
- UNE 55510:1991 SURFACE ACTIVE AGENTS. TECHNICAL ALKANE SULFONATES. METHODS OF ANALYSIS.
- UNE-EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- UNE 55526:1982 SURFACE ACTIVE AGENTS. SURFACE ACTIVE AGENTS AND DETERGENTS. METHODS OF SAMPLE DIVISION
- UNE-EN 15647:2009 Surface active agents - Determination of the dispersing effect of surfactants on powder
- UNE 55909:1985 SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF TOTAL FREE ALKALI
- UNE-EN 15330-2:2009 Surfaces for sports areas - Synthetic turf and needle-punched surfaces primarily designed for outdoor use - Part 2: Specification for needle-punched surfaces
- UNE 55511-1:1981 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL SODIUM PRIM-ALKYLSULFATES. SCOPE
International Electrotechnical Commission (IEC), Surface Instrumentation Surface Analysis
- IEC 61134:1992 Airborne instrumentation for measurement of terrestrial gamma radiation
- IEC 61098:2003 Radiation protection instrumentation - Installed personnel surface contamination monitoring assemblies
- IEC 61207-3:2002/COR2:2003 Gas analyzers - Expression of performance - Part 3：Paramagnetic oxygen analyzers; Technical Corrigendum 2
- IEC 60714:1981 Expression of the properties of spectrum analyzers
- IEC 61207-3:2019 RLV Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- IEC 60776:1983 Expression of the properties of logic analysers
- IEC 61098:2023 Radiation protection instrumentation - Installed personnel surface contamination monitors
- IEC 61207-7:2013/COR1:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers; Corrigendum 1
Professional Standard - Education, Surface Instrumentation Surface Analysis
国家市场监督管理总局、中国国家标准化管理委员会, Surface Instrumentation Surface Analysis
- GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
- GB/T 6060.1-2018 Surface roughness comparison specimen—Part 1: Casting surface
- GB/T 41072-2021 Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 40109-2021 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of boron in silicon
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
- GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Surface Instrumentation Surface Analysis
SE-SIS, Surface Instrumentation Surface Analysis
- SIS SS-ISO 4287/1:1988 Surface roughness - Terminology - Part 1: Surface and its parameters
- SIS SS IEC 473:1981 Electrical measuring instruments — Panel-mounted instruments — Dimensions
- SIS SS-ISO 7503-2:1990 Evaluation of surface contamination — Part 2: Tritium surface contamination
- SIS SS-ISO 4287/2:1988 Surface roughness - Terminology - Part 2: Measurement of surface rough- ness parameters
- SIS SS-ISO 8503-4:1992 Preparation of steel substrates before application of paints and related products — Surface roughness characteristics of blast- cleaned steel substrates — Part 3: Method for the calibration of ISO surface profile comparators and for
RU-GOST R, Surface Instrumentation Surface Analysis
- GOST 19300-1986 Instruments for measurement of surface roughness by the profile method. Contact profilographs and profilometers. Types and main parameters
- GOST 9847-1979 Optical instruments for surface roughness parameters measuring. Basis parameters and types
- GOST R 50001-1992 Surface active agents. Technical sodium secondary alkylsulphates. Methods of analysis
- GOST R 50002-1992 Surface active agents. Primary technical sodium alkylsulphates. Methods of analysis
HU-MSZT, Surface Instrumentation Surface Analysis
TR-TSE, Surface Instrumentation Surface Analysis
- TS 929-1976 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROF?LE METHOD-VOCABULARY
- TS 930-1976 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE BY THE POFILE METHOD CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROF?LE TRANSFORMATION PROF?LE RECORDING INSTRUMENTS
National Metrological Technical Specifications of the People's Republic of China, Surface Instrumentation Surface Analysis
- JJF 1285-2011 Calibration Specification for Surface Resistance Tester
- JJF 1762-2019 Program of Pattern Evaluation of α、β Surface Contamination Monitors
- JJF(建材) 162-2019 Calibration specification for glass surface stress detector
- JJF 1105-2003 Calibration Specification for Contact (Stylus) Instruments of Surface Roughness Measurement by the Profile Method
- JJF 1105-2018 Calibration Specification for Contact (Stylus) Instruments of Surface Roughness Measurement by the Profile Method
Taiwan Provincial Standard of the People's Republic of China, Surface Instrumentation Surface Analysis
- CNS 10794-1984 Instruments for the Measurement of Surface Roughness by the Stylus Method
VN-TCVN, Surface Instrumentation Surface Analysis
- TCVN 7078-2-2007 Evaluation of surface contamination.Part 2: Tritium surface contamination
ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., Surface Instrumentation Surface Analysis
- ASHRAE 3864-1995 Frequency Response Analysis of Ground-Coupled Building Envelope Surfaces
GB-REG, Surface Instrumentation Surface Analysis
Professional Standard - Nuclear Industry, Surface Instrumentation Surface Analysis
- EJ/T 979-1995 Accumulation method for determination of surface radon exhalation rate
IT-UNI, Surface Instrumentation Surface Analysis
SAE - SAE International, Surface Instrumentation Surface Analysis
Institute of Electrical and Electronics Engineers (IEEE), Surface Instrumentation Surface Analysis
- IEEE/ASA C39.1-1955 ASA American Standard Electrical Indicating Instruments Panel, Switchboard, and Portable Instruments
- IEEE/ASA C39.1-1959 ASA American Standard Requirements for Electrical Indicating Instruments Panel, Switchboard, and Portable Instruments
MSS - Manufacturers Standardization Society of the Valve and Fittings Industry., Surface Instrumentation Surface Analysis
- SP 112 COMPARATOR-2016 Quality Standard For Evaluation Of Cast Surface Finishes – Visual and Tactile Method – Three Dimensional Cast Surface Comparator
Danish Standards Foundation, Surface Instrumentation Surface Analysis
- DS/ISO 4287/1:1986 Surface roughness Terminology Part 1: Surface and its parametres
- DS/EN 61207-3/Corr.2:2003 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- DS/EN 61207-3/Corr.1:2003 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- DS/EN 61207-3:2002 Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
- DS/EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- DS/IEC 776:1987 Expression of the properties of logic analysers
- DS/EN 15647:2009 Surface active agents - Determination of the dispersing effect of surfactants on powder
- DS/EN ISO 25178-6:2010 Geometrical product specifications (GPS) - Surface texture: Areal - Part 6: Classification of methods for measuring surface texture
- DS/EN 15330-2:2008 Surfaces for sports areas - Synthetic turf and needle-punched surfaces primarily designed for outdoor use - Part 2: Specification for needle-punched surfaces
- DS/CEN/TS 15901-2:2011 Road and airfield surface characteristics - Part 2: Procedure for determining the skid resistance of a pavement surface using a device with longitudinal controlled slip (LFCRNL): ROAR (Road Analyser and Recorder of Norsemeter)
- DS/CEN/TS 15901-5:2011 Road and airfield surface characteristics - Part 5: Procedure for determining the skid resistance of a pavement surface using a device with longitudinal controlled slip (LFCRDK): ROAR (Road Analyser and Recorder of Norsemeter)
- DS/ISO 4287/2:1986 Surface roughness — Terminology Part 2: Parametres and characteristics of surface roughness
- DS/EN ISO 13473-5:2010 Characterization of pavement texture by use of surface profiles - Part 5: Determination of megatexture
European Committee for Standardization (CEN), Surface Instrumentation Surface Analysis
- EN ISO 25178-6:2010 Geometrical product specifications (GPS) - Surface texture: Areal - Part 6: Classification of methods for measuring surface texture (ISO 25178-6:2010)
- EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- EN ISO 25178-1:2016 Geometrical product specifications (GPS) - Surface texture: Areal - Part 1: Indication of surface texture
- EN 15647:2009 Surface active agents - Determination of the dispersing effect of surfactants on powder
- CEN/TS 15901-5:2009 Road and airfield surface characteristics - Part 5: Procedure for determining the skid resistance of a pavement surface using a device with longitudinal controlled slip (LFCRDK): ROAR (Road Analyser and Recorder of Norsemeter)
- CEN/TS 15901-2:2009 Road and airfield surface characteristics - Part 2: Procedure for determining the skid resistance of a pavement surface using a device with longitudinal controlled slip (LFCRNL): ROAR (Road Analyser and Recorder of Norsemeter)
AGMA - American Gear Manufacturers Association, Surface Instrumentation Surface Analysis
- 99FTM5-1999 Analysis of Micropitting on Prototype Surface Fatigue Test Gears
CENELEC - European Committee for Electrotechnical Standardization, Surface Instrumentation Surface Analysis
- EN 61207-6:1994 Expression of Performance of Gas Analyzers Part 6: Photometric Analyzers
ES-UNE, Surface Instrumentation Surface Analysis
- UNE-EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers (Endorsed by AENOR in February of 2015.)
- UNE-EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (Endorsed by Asociación Española de Normalización in October of 2019.)
- UNE 55901:1986 ERRATUM SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF CAUSTIC FREE ALKALI
- UNE-EN ISO 25178-1:2016 Geometrical product specifications (GPS) - Surface texture: Areal - Part 1: Indication of surface texture (ISO 25178-1:2016)
United States Navy, Surface Instrumentation Surface Analysis
Association of German Mechanical Engineers, Surface Instrumentation Surface Analysis
IN-BIS, Surface Instrumentation Surface Analysis
GOSTR, Surface Instrumentation Surface Analysis
- GOST R 58868-2020 Instrument rolling bearings. Deviation from the roundness of the surfaces of parts. Measurement procedure
Professional Standard - Electron, Surface Instrumentation Surface Analysis
European Committee for Electrotechnical Standardization（CENELEC）, Surface Instrumentation Surface Analysis
- EN IEC 61207-3:2019 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers
- EN 61207-6:2015 Expression of performance of gas analyzers - Part 6:Photometric analyzers
- HD 469-1987 Expression of the Properties of Logic Analysers
BE-NBN, Surface Instrumentation Surface Analysis
American Gear Manufacturers Association, Surface Instrumentation Surface Analysis
- AGMA 99FTM5-1999 Analysis of Micropitting on Prototype Surface Fatigue Test Gears
Lithuanian Standards Office , Surface Instrumentation Surface Analysis
- LST EN 14670-2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
- LST EN 15647-2009 Surface active agents - Determination of the dispersing effect of surfactants on powder
- LST EN 15330-2-2008 Surfaces for sports areas - Synthetic turf and needle-punched surfaces primarily designed for outdoor use - Part 2: Specification for needle-punched surfaces
IPC - Association Connecting Electronics Industries, Surface Instrumentation Surface Analysis
Military Standard of the People's Republic of China-General Armament Department, Surface Instrumentation Surface Analysis
- GJB 8201-2015 General specification for ground electronic equipment for decimeter wave instrument landing
CZ-CSN, Surface Instrumentation Surface Analysis
- CSN 68 1148-1994 Testing methods for surfactans and detergents. Surface active agents. Analysis of soaps. Determination of free caustic lkali
- CSN ISO 1879:1993 Instruments for the measurement of surface roughness by the profile method. Terminology
Professional Standard - Military and Civilian Products, Surface Instrumentation Surface Analysis
- WJ 2250-1994 Verification Regulations for Activated Carbon Specific Surface Area Meter
Professional Standard - Tobacco, Surface Instrumentation Surface Analysis
- YC/T 271.8-2008 Tobacco machinery-Modality design-Part 8:Surface protection and surface treatment
Professional Standard - Agriculture, Surface Instrumentation Surface Analysis
- JJG(教委) 004-1996 Verification rules for surface thermoionization isotope mass spectrometer
AT-OVE/ON, Surface Instrumentation Surface Analysis
- OVE EN IEC 61207-3:2021 Gas Analyzers - Expression of performance - Part 3: Paramagnetic oxygen analysers (german version)
(U.S.) Ford Automotive Standards, Surface Instrumentation Surface Analysis