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Remote Spectrum Analyzer

Remote Spectrum Analyzer, Total:497 items.

In the international standard classification, Remote Spectrum Analyzer involves: Optics and optical measurements, Fibre optic communications, Optoelectronics. Laser equipment, Special measuring equipment for use in telecommunications, Analytical chemistry, Metalliferous minerals, Organic chemicals, Electricity. Magnetism. Electrical and magnetic measurements, Non-ferrous metals, Education, Electronic components in general, Water quality, Test conditions and procedures in general, Quality, Testing of metals, Fuels, Power stations in general, Photography, Medical sciences and health care facilities in general, Iron and steel products, Optical equipment, Lubricants, industrial oils and related products, Construction materials, Ferrous metals, Refractories, Non-destructive testing, Products of the chemical industry, Linear and angular measurements, Nuclear energy engineering, Ferroalloys, Jewellery, Electromagnetic compatibility (EMC), Welding, brazing and soldering, Corrosion of metals.

Taiwan Provincial Standard of the People's Republic of China, Remote Spectrum Analyzer

CNS 14341-1999 Optical spectrum analyzer

U.S. Air Force, Remote Spectrum Analyzer

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

International Electrotechnical Commission (IEC), Remote Spectrum Analyzer

IEC 62129:2006 Calibration of optical spectrum analyzers
IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
IEC 61290-1-1:1998 Optical fibre amplifiers - Basic specification - Part 1-1: Test methods for gain parameters - Optical spectrum analyzer
IEC 61290-5-1:2000 Optical fibre amplifiers - Basic specification - Part 5-1: Test methods for reflectance parameters - Optical spectrum analyser
IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
IEC 61290-10-1:2003 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters; Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-2-2:1998 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
IEC 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
IEC 61290-10-2:2007 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
IEC 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyser
IEC 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyser method
IEC 61290-1-2:1998 Optical fibre amplifiers - Basic specification - Part 1-2: Test methods for gain parameters - Electrical spectrum analyzer

European Committee for Standardization (CEN), Remote Spectrum Analyzer

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers
EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
prEN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

Association Francaise de Normalisation, Remote Spectrum Analyzer

NF C93-845:2006 Calibration of optical spectrum analyzers.
NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF EN 61290-5-1:2006 Amplificateurs optiques - Méthodes d'essais - Partie 5-1 : paramètres de réflectance - Méthode d'analyseur de spectre optique
NF EN 61290-3-1:2004 Amplificateurs optiques - Méthodes d'essai - Partie 3-1 : paramètres du facteur de bruit - Méthode d'analyseur du spectre optique
NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
NF EN IEC 61290-1-1:2020 Amplificateurs optiques - Méthodes d'essai - Partie 1-1 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre optique
NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
NF EN 61290-5-2:2004 Amplificateurs optiques - Méthodes d'essai - Partie 5-2 : paramètres du facteur de réflexion - Méthode de l'analyseur de spectre électrique
NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
NF EN 61290-3-2:2009 Amplificateurs optiques - Méthodes d'essais - Partie 3-2 : paramètres du facteur de bruit - Méthode de l'analyseur spectral électrique
NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
NF EN 61290-10-1:2009 Amplificateurs optiques - Méthodes d'essai - Partie 10-1 : paramètres à canaux multiples - Méthode d'impulsion utilisant un interrupteur optique et un analyseur de spectre optique
NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
NF EN 61290-1-2:2006 Amplificateurs optiques - Méthodes d'essai - Partie 1-2 : paramètres de puissance et de gain - Méthode de l'analyseur de spectre électrique
NF EN ISO 23674:2022 Cosmétiques - Méthodes d'analyse - Dosage direct des traces de mercure dans les cosmétiques par décomposition thermique et spectrométrie d'absorption atomique (analyseur de mercure)
NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
NF EN 61290-10-2:2008 Amplificateurs optiques - Méthodes d'essai - Partie 10-2 : paramètres à canaux multiples - Méthode d'impulsion utilisant un analyseur de spectre optique stroboscopique
NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
NF C93-805-10-4*NF EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4 : multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
NF EN 61290-10-4:2007 Amplificateurs optiques - Méthodes d'essai - Partie 10-4 : paramètres à canaux multiples - Méthode par soustraction de source interpolée en utilisant un analyseur de spectre optique
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-805-10-2:2003 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer.
NF C93-805-10-2*NF EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2 : multichannel parameters - Pulse method using a gated optical spectrum analyzer
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF C93-845-2*NF EN 62150-2:2011 Fibre optic active components and devices - Test and measurement procedures - Part 2 : ATM-PON transceivers.
NF C93-805-5-1*NF EN 61290-5-1:2006 Optical amplifier test methods - Part 5-1 : reflectance parameters - Optical spectrum analyser method
NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
NF C93-805-5-3*NF EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Part 5-3 : test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser.
T01-040:1982 Analytical spectroscopic methods. Flame emission, atomic absorption and atomic fluorescence. Vocabulary.

Korean Agency for Technology and Standards (KATS), Remote Spectrum Analyzer

KS C 6918-1995(2020) Test methods of fiber-optic spectrum analyzer
KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS C IEC 61290-5-1-2007(2022) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-5-1-2007(2017) Optical amplifiers－Test methods－Part 5－1：Reflectance parameters －Optical spectrum analyzer method
KS C IEC 61290-3-1-2005(2020) Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS C IEC 61290-3-1:2005 Optical amplifiers－Test methods－Part 3－1：Noise figure parameters－Optical spectrum analyzer method
KS D 2558-1995 Method for emission spectrographic analysis of tantalum
KS D 1684-1993 Methods for emission spectrographic analysis of magnesium ingot
KS D 1682-1993 Methods for emission spectrochemical analysis of lead ingot
KS D 1684-1985 Methods for emission spectrographic analysis of magnesium ingot
KS D 1682-2020 Method for photoelectric emission spectrochemical analysis of lead metal
KS C IEC 61290-3-2-2005(2020) Optical amplifiers－Part 3－2：Test methods for noise figure parameters－Electrical spectrum analyzer method
KS C IEC 61290-10-1-2005(2020) Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS D 2569-2005 Methods for ICP emission spectrometric analysis of tantalum
KS D 2569-2016 Methods for ICP emission spectrometric analysis of tantalum
KS D 2553-2015(2020) Tantalum－Method for atomic absorption spectrometric analysis
KS D 2568-2019 Tantalum－Method for atomic absorption spectrometric analysis
KS D 2569-2016(2021) Methods for ICP emission spectrometric analysis of tantalum
KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
KS C IEC 61290-10-2-2005(2020) Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS D 2518-2015 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS B ISO 14490-3-2006(2021) Optics and optical instruments — Test methods for telescopic systems— Part 3: Test methods for telescopic sights
KS D 1681-1993 Method for emission spectrochemical analysis of aluminium ingot
KS D 2086-1993 Methods for emission spectrochemical analysis of titanium
KS D 1684-2008(2018) Methods for emission spectrographic analysis of magnesium ingot
KS D 2086-2019 Methods for atomic emission spectrometric analysis of titanium
KS L 3316-2014 Method for X-ray fluorescence spectrometric analysis of refractory products
KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
KS L 3316-2014(2019) Method for X-ray fluorescence spectrometric analysis of refractory products
KS D 2518-2015(2020) Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS L 3316-1998 Method for X-ray fluorescence spectrometric analysis of refractory products
KS L 3316-1988 Method for X-ray fluorescence spectrometric analysis of refractory products
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS B ISO 14490-3:2006 Optics and optical instruments－Test methods for telescopic systems－Part 3：Test methods for telescopic sights
KS D 1899-2003 Methods for emission spectrochemical analysis of electrolytic cathode copper
KS D 1683-1993 Method for emission spectrochemical analysis of silver ingot
KS D 1681-2018 Method for emission spectrochemical analysis of aluminium ingot
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C IEC 61290-10-1:2005 Optical amplifiers－Test methods－Part 10－1：Multichannel parameters－Pulse method using an optical switch and optical spectrum analyzer
KS E 3076-2017 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
KS D 1650-2008 General rules for photoelectric emission spectrochemical analysis of metal materials
KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
KS D 1899-2019 Methods for photoelectric emission spectrochemical analysis of electrolytic cathode copper
KS D 1929-2019 Methods for photoelectric emission spectrochemical analysis of die casting zinc alloys
KS D 1929-2004 Methods for photoelectric emission spectrochemical analysis of die casting zinc alloys
KS D 2597-1996(2021) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D 1685-1993 Methods for emission spectrochemical analysis of zinc metal
KS D 1687-2007 Emission-spectroscopic analysis for pig iron and cast iron
KS C IEC 61290-10-2:2005 Optical amplifiers－Test methods－Part 10－2：Multichannel parameters－Pulse method using a gated optical spectrum analyzer
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D 1852-2005 Methods for photoelectric emission spectrochemical analysis of aluminium and aluminium alloys
KS E 3075-2002 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS D 1852-2015 Methods for photoelectric emission spectrochemical analysis of aluminium and aluminium alloys
KS D 1852-2020 Methods for optical emission spectrochemical analysis of aluminium and aluminium alloys
KS D 1655-2008(2019) Method for X-ray fluorescence spectrometric analysis of iron and steel
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D 1679-1993 Methods for atomic absorption spectrometric analysis of aluminium and aluminium alloys
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS E 3075-2017 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS D 1686-2011(2016) Method for x-ray fluorescence spectrometric analysis of ferroalloys
KS E 3075-2022 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
KS D 1929-2009 Methods for emission spectrochemical analysis of die casting zinc alloy
KS D 1929-1993 Methods for Emission Spectrochemical Analysis of Die Casting Zinc Alloy
KS D 1679-2008 Methods for atomic absorption spectrometric analysis of aluminium and aluminium alloys
KS D 1899-1993 Methods for emission spectrochemical analysis of electrolytic cathode copper
KS D 1652-2022 Iron and steel — Method for spark discharge atomic emission spectrometric analysis
KS D 1652-2007(2017) Iron and steel－Method for spark discharge atomic emission spectrometric analysis
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D 2597-1996(2016) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys

Japanese Industrial Standards Committee (JISC), Remote Spectrum Analyzer

JIS C 6183-1:2019 Optical spectrum analyzers -- Part 1: Test methods
JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS H 1691:1968 Method for spectrochemical analysis of tantalum
JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
JIS C 6122-5-1:2001 Optical fiber amplifiers -- Test methods -- Part 5-1: Test methods for reflectance parameters -- Optical spectrum analyzer test method
JIS H 1123:2021 Method for photoelectric emission spectrochemical analysis of lead metal
JIS B 7263-4:2007 Optics and optical instruments -- Test methods for telescopic systems -- Part 4: Test methods for astronomical telescopes
JIS H 1683:2002 Tantalum -- Method for atomic absorption spectrometric analysis
JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
JIS G 1202:1975 General rules on emission-spectroscopic analysis for iron and steel
JIS G 1257:1994 Iron and steel -- Methods for atomic absorption spectrometric analysis
JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
JIS H 1163:1991 Method for photoelectric emission spectrochemical analysis of cadmium metal
JIS H 1287:2015 Nickel and nickel alloys -- Methods for X-ray fluorescence spectrometric analysis
JIS H 1113:2022 Method for photoelectric emission spectrochemical analysis of zinc metal
JIS H 1303:1976 Method for emission spectrochemical analysis of aluminium ingot
JIS H 1322:1976 Method for emission spectrochemical analysis of magnesium ingot
JIS C 6122-10-1:2007 Optical amplifiers -- Test methods -- Part 10-1: Multichannel parameters -- Pulse method using an optical switch and optical spectrum analyzer
JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
JIS H 1669:1990 Method for X-ray fluorescence spectrometric analysis of zirconium alloys
JIS G 1351:1987 Method for X-ray fluorescence spectrometric analysis of ferroalloys
JIS B 7263-3:2005 Optics and optical instruments -- Test methods for telescopic systems -- Part 3: Test methods for telescopic sights
JIS C 6122-1-2:2011 Optical amplifiers -- Test methods -- Part 1-2: Power and gain parameters -- Electrical spectrum analyzer method
JIS H 1183 AMD 1:2012 Method for emission spectrochemical analysis of silver bullion (Amendment 1)
JIS G 1251:1976 Emission-spectroscopic analysis for pig iron and cast iron
JIS C 6122-10-2:2010 Optical amplifiers -- Test methods -- Part 10-2: Multichannel parameters -- Pulse method using a gated optical spectrum analyzer
JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS H 1305:1976 Method for photoelectric emission spectrochemical analysis of aluminium and aluminium alloy
JIS C 6122-10-4:2012 Optical amplifiers -- Test methods -- Part 10-4: Multichannel parameters -- Interpolated source subtraction method using an optical spectrum analyzer
JIS H 1306:1992 Methods for atomic absorption spectrometric analysis of aluminium and aluminium alloys
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS R 2216:1995 Method for X-ray fluorescence spectrometric analysis of refractory bricks and refractory mortars
JIS B 7263-1:2007 Optics and optical instruments -- Test methods for telescopic systems -- Part 1: Test methods for basic characteristics
JIS H 1291:1977 Method for atomic absorption spectrochemical analysis of copper and copper alloys
JIS H 1306:1999 Methods for atomic absorption spectrometric analysis of aluminium and aluminium alloys
JIS G 1257 AMD 1:1999 Iron and steel -- Methods for atomic absorption spectrometric analysis (Amendment 1)
JIS K 0121:1993 General rules for atomic absorption spectrochemical analysis
JIS B 7263-2:2007 Optics and optical instruments -- Test methods for telescopic systems -- Part 2: Test methods for binocular systems
JIS G 1252:1975 Emission-spectroscopic analysis for carbon steel and low alloy steel

British Standards Institution (BSI), Remote Spectrum Analyzer

BS EN 62129:2006 Calibration of optical spectrum analyzers
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
BS EN ISO 23674:2022 Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
BS EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1:Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
19/30398879 DC BS EN 61290-1-1. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS EN 61290-5-2:2004 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Electrical spectrum analyser method
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS EN 61280-1-1:1998 Optical fibre amplifiers.Basic spectrum analyzers - Transmitter output optical power measurement for single-mode optical fibre cable
BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
BS ISO 14490-7:2005 Optics and optical instruments - Test methods for telescopic systems - Test methods for limit of resolution
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
18/30387381 DC BS EN 61290-1-1 Ed.4.0. Optical amplifiers. Test methods. Part 1-1. Power and gain parameters. Optical spectrum analyzer method
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
BS EN 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
BS EN 61290-1-2:2007 Optical amplifiers. Test methods. Power and gain parameters. Electrical spectrum analyzer method
21/30387777 DC BS EN ISO 23674. Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition. Atomic absorption spectrometry (mercury analyzer)
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS EN 61290-5-3:2002 Optical fibre amplifiers - Basic specification - Test methods for reflectance parameters - Reflectance tolerance using an electrical spectrum analyser
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS EN 61290-3-2:2009 Optical amplifiers. Test methods. Noise figure parameters. Electrical spectrum analyzer method
BS EN 61290-3-2:2008 Optical amplifiers - Test methods - Noise figure parameters - Electrical spectrum analyzer method

Danish Standards Foundation, Remote Spectrum Analyzer

DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
DS/EN 61290-1-2:2006 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
DS/EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
DS/EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
DS/EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer

National Metrological Verification Regulations of the People's Republic of China, Remote Spectrum Analyzer

JJG 1035-2022 Communication Spectrum Analyzer
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Remote Spectrum Analyzer

GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
GB/T 11462-1989 Test methods of spectrum analyzers
GB/T 5123-1985 Nickel--Method of spectral analysis
GB/T 5871-1986 Method for spectrographic analysis of aluminium and its alloys
GB/T 16599-1996 Methods for emission spectrum analysis of molybdenum
GB/T 16600-1996 Methods for emission spectrum analysis of tungsten
GB/T 6040-2002 General rules for infrared analysis
GB/T 11170-1989 Method for photoelectric emission spectroscopic analysis of stainless steel
GB/T 5678-1985 The method for sampling cast alloys for spectrochemical analysis
GB/T 5678-2013 Sampling methods of spectrochemical analysis for cast alloys
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 26042-2010 Methods for analysis of zinc and zinc alloys.The optical emission spectrometry
GB/T 7999-2000 Standard method for direct reading spectromertric analysis of aluminum and its alloys
GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
GB/T 7999-2015 Optical emission spectrometric analysis method of aluminum and aluminum alloys
GB/T 7999-2007 Optical emission spectrometric analysis method of aluminum and aluminum alloys
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 16597-1996 Analytical methods of metallurgical products. General rule for X-ray fluorescence spectrometric methods
GB/T 19502-2004 Surface chemical analysis-Glow discharge optical emission spectrometry(GD-OSE)-Introduction to use
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 8151.15-2005 Methods for chemical analysis of zinc concentrates-Determination of mercury content-Atomic fluorescence spectrometry method
GB/T 8152.11-2006 Methods for chemical analysis of lead concentrates. Determination of mercury content. Atomic fluorescence spectrometer method
GB/T 8152.5-2006 Methods for chemical analysis of lead concentrates. Determination of arsenic content. Atomic fluorescence spectrometer method
GB/T 4325.3-2013 Methods for chemical analysis of molybdenum.Part 3:Determination of bismuth content.Atomic fluorescence spectrometry
GB/T 4325.4-2013 Methods for chemical analysis of molybdenum.Part 4:Determination of tin content.Atomic fluorescence spectrometry
GB/T 4325.5-2013 Methods for chemical analysis of molybdenum.Part 5:Determination of antimony content.Atomic fluorescence spectrometry
GB/T 4325.6-2013 Methods for chemical analysis of molybdenum.Part 6:Determination of arsenic content.Atomic fluorescence spectrometry

ZA-SANS, Remote Spectrum Analyzer

SANS 62129:2008 Calibration of optical spectrum analyzers
SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method

IN-BIS, Remote Spectrum Analyzer

Lithuanian Standards Office , Remote Spectrum Analyzer

LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
LST EN 61290-1-1-2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006)
LST EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)
LST EN 61290-3-2-2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008)
LST EN 61290-10-1-2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009)
LST EN 61290-5-2-2004 Optical amplifiers. Test methods. Part 5-2: Reflectance parameters. Electrical spectrum analyser method (IEC 61290-5-2:2003)
LST EN 61290-10-2-2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007)
LST EN 61290-10-4-2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007)
LST EN 61290-1-2-2006 Optical amplifiers. Test methods. Part 1-2: Power and gain parameters. Electrical spectrum analyzer method (IEC 61290-1-2:2005)

German Institute for Standardization, Remote Spectrum Analyzer

DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
DIN EN 62129 Berichtigung 1:2008 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006, Corrigendum to DIN EN 62129:2007-01; German version CENELEC-Cor. :2006 to EN 62129:2006
DIN EN 61290-10-1:2010-01 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (IEC 61290-10-1:2009); German version EN 61290-10-1:2009 / Note: DIN EN 61290-10-1 (2004-02) remains valid along...
DIN ISO 14490-3:2004 Optics and optical instruments - Test methods for telescopic systems - Part 3: Test methods for telescopic sights (ISO 14490-3:2004)
DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
DIN EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN EN 61290-10-2:2008-07 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008 / Note: DIN EN 61290-10-2 (2004-02) remains valid alongside this stan...
DIN EN IEC 61290-1-1:2019 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 86C/1563/CD:2018); Text in German and English
DIN EN IEC 61290-1-1:2022-07 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020); German version EN IEC 61290-1-1:2020 / Note: DIN EN 61290-1-1 (2016-03) remains valid alongside this standard until 2023-10...
DIN EN 61290-1-2:2006-07 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005 / Note: DIN EN 61290-1-2 (1999-08) remains valid alongside this standard until 2008-10-0...
DIN EN 61290-10-4:2008 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007
DIN EN 61290-1-2:2006 Optical amplifier - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (IEC 61290-1-2:2005); German version EN 61290-1-2:2005
DIN ISO 14490-5:2007 Optics and optical instruments - Test methods for telescopic systems - Part 5: Test methods for transmittance (ISO 14490-5:2005)；English version of DIN ISO 14490-5:2007-06
DIN EN 61290-5-2:2004-12 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method (IEC 61290-5-2:2003); German version EN 61290-5-2:2004
DIN EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (IEC 61290-10-2:2007); German version EN 61290-10-2:2008
DIN EN 61290-10-4:2008-02 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007); German version EN 61290-10-4:2007 / Note: Applies in conjunction with DIN EN 61291...
DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

American National Standards Institute （ANSI), Remote Spectrum Analyzer

ANSI/ASTM D6645:2001 Test Methods for Methyl (Comonomer) Content in Polyethylene by Infrared Spectrophotometry
ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA-455-206-2000 FOTP206 - IEC 61290-1-1 - Optical Fiber Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
ANSI/TIA/EIA 455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer
ANSI/TIA-455-210-2000 FOTP210-IEC 61290-2-2 - Optical Fibre Amplifiers - Basic Specification - Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer

IEC - International Electrotechnical Commission, Remote Spectrum Analyzer

PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)

RU-GOST R, Remote Spectrum Analyzer

GOST 17261-1977 Zinc. Spectral method of analysis
GOST 15483.10-2004 Tin. Methods of atomic-emission spectral analysis
GOST 12228.1-1978 Ruthenium. Method of spectral analysis
GOST 15483.10-1978 Tin. Spectral methods for determination of bismuth, iron, copper, arsenic, lead, antimony, zinc and aluminium
GOST 12552.2-1977 Platinum-nickel alloys. Method of spectral of analysis
GOST 27981.1-2015 High purity copper. Method of atomic-spectral analysis
GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
GOST 4.450-1986 Product-quality index system. Instruments for spectral analysis. Nomenclature of indices
GOST 23116.0-1983 Cadmium of high purity. General requirements for methods of spectral analysis
GOST 27981.3-1988 Copper of high purity. Method of emission-spectral analysis with photoelectric registration of spectrum / Note: To be replaced by GOST 31382 (2009).

European Committee for Electrotechnical Standardization（CENELEC）, Remote Spectrum Analyzer

EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)
EN 61290-10-1:2009 Optical amplifiers - Test methods - Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
EN 61290-5-1:2006 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
EN 61290-10-4:2007 Optical amplifiers - Test methods - Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
EN 61290-5-2:2004 Optical amplifiers Test methods Part 5-2: Reflectance parameters Electrical spectrum analyser method

ES-UNE, Remote Spectrum Analyzer

UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
UNE-EN 61290-10-1:2009 Optical amplifiers - Test methods -- Part 10-1: Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer (Endorsed by AENOR in July of 2009.)
UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
UNE-EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer (Endorsed by AENOR in May of 2008.)
UNE-EN 61290-1-2:2005 Optical amplifiers - Test methods -- Part 1-2: Power and gain parameters - Electrical spectrum analyzer method (Endorsed by AENOR in March of 2006.)
UNE-EN ISO 23674:2023 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
UNE-EN 61290-10-4:2007 Optical amplifiers - Test methods -- Part 10-4: Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer (IEC 61290-10-4:2007). (Endorsed by AENOR in November of 2007.)

工业和信息化部/国家能源局, Remote Spectrum Analyzer

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer

Professional Standard - Education, Remote Spectrum Analyzer

JY/T 0571-2020 General Rules of Fluorescence Spectroscopy Analysis Methods
JY/T 0566-2020 General rules for atomic fluorescence spectrometry
JY/T 0573-2020 General Rules of Laser Raman Spectroscopy Analysis Method
JY/T 002-1996 General Rules for Laser Raman Spectroscopy Analysis Methods
JY/T 0572-2020 General Rules for Analytical Methods of Circular Dichroism Spectroscopy
JY/T 0565-2020 General rules for electrothermal atomic absorption spectrometry
JY/T 0570-2020 General rules for ultraviolet and visible absorption spectrometry

Professional Standard - Electron, Remote Spectrum Analyzer

SJ 2656-1986 Mothod of tungsten spectral analysis
SJ 2657-1986 Mothod of molybdeuum spectral analysis
SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
SJ/Z 3206.10-1989 General rules for analysis of properties of emision spectrum
SJ/Z 3206.11-1989 General rules for analysis of quantities of emision spectrum
SJ/Z 1544-1979 Method for spectral analysis of Nickel-- Tungsten-Magnesium alloy
SJ/Z 3206.8-1989 Geneeral rules for preparation of standard sample for spectrum analysis
SJ/Z 3206.12-1989 General rules for emission spectrum analysis for vacuum materials
SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials
SJ/Z 3206.5-1989 Treatment methods for sensitized plate and film photograph for chemical analysis using spectrum
SJ 1543-1988 Method for spectral analysis of Nickel and Nickel aloy for vacuum tubes

未注明发布机构, Remote Spectrum Analyzer

BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale

Indonesia Standards, Remote Spectrum Analyzer

SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers

Group Standards of the People's Republic of China, Remote Spectrum Analyzer

T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
T/CSTM 00011E-2021 General rules for original position statistic distribution analysis by laser induced breakdown spectroscopy
T/CSTM 00011-2017 General Rules for In Situ Statistical Distribution Analysis Method of Laser Induced Breakdown Spectroscopy
T/CPCIF 0185-2022 Rapid analysis method of automobile diesel fuels— Near infrared spectrometry
T/CPCIF 0184-2022 Rapid analysis method of motor vehicle gasoline— Near infrared spectrometry

Shanxi Provincial Standard of the People's Republic of China, Remote Spectrum Analyzer

DB1404/T 18-2021 Inspection and testing laboratory instrument analysis method validation requirements Spectroscopy
DB1404/T 17-2021 Inspection and testing laboratory instrument analytical method validation requirements chromatography

CZ-CSN, Remote Spectrum Analyzer

CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
CSN 42 0600 Cast.3-1975 Antimony of high parity. Methods of chemical and spectral analysis. Delermmation of arsenic by photomotric metod
CSN 42 0600 Cast.2-1975 Antimony of high purity. Methods of chemical and spectral analysis. Preparation of the sample
CSN 42 0600 Cast.5-1975 Antimony of high purity. Methods of chemical and spectral analysis. Dctermination of silver, bismuth. copper, iron. nickel, lead. and tin by spectral method
CSN 42 0600 Cast.1-1975 Antimony of high purity. Methods of chemical and spectral analysis General data
CSN 42 0600 Cast.4-1975 Antimony of high purity. Method of chemical and spectral anaysis.Determination of sulfur by aombustion method

SE-SIS, Remote Spectrum Analyzer

SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

Professional Standard - Non-ferrous Metal, Remote Spectrum Analyzer

YS/T 631-2007 Methods for analysis of zinc.The optical emission spectrometry
YS/T 558-2009 Methods for emission spectrum analysis of molybdenum
YS/T 559-2009 Methods for emission spectrum analysis of tungsten
YS/T 558-2006 Molybdenum Emission Spectroscopy Analysis Method
YS/T 559-2006 Tungsten Emission Spectroscopy Analysis Method
YS/T 464-2003 Methods for analytical of copper cathode-The optical emission spectrometry
YS/T 482-2005 Methods for analysis of copper and copper alloys-The atomic emission spectrometry
YS/T 1036-2015 Test method of optical emission spectrometric analysis of magnesium rare earth alloys
YS/T 536.7-2009 Methods for chemical analysis of bismuth.Determination of arsenic content.Atomic fluorescence spectrometric method
YS/T 536.11-2009 Methods for chemical analysis of bismuth.Determination of mercury content.Atomic fluorescence spectrometric method
YS/T 555.4-2009 Methods for chemical analysis of molybdenum concentrate.Determination of tin content.Atomic fluorescence spectrometry

International Organization for Standardization (ISO), Remote Spectrum Analyzer

ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 14490-4:2005 Optics and optical instruments - Test methods for telescopic systems - Part 4: Test methods for astronomical telescopes
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 14490-3:2004 Optics and optical instruments - Test methods for telescopic systems - Part 3: Test methods for telescopic sights
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 23674:2022 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 14490-7:2005 Optics and optical instruments - Test methods for telescopic systems - Part 7: Test methods for limit of resolution
ISO 14490-5:2005 Optics and optical instruments - Test methods for telescopic systems - Part 5: Test methods for transmittance
ISO 14490-6:2005 Optics and optical instruments - Test methods for telescopic systems - Part 6: Test methods for veiling glare index
ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
ISO 14490-1:2005 Optics and optical instruments - Test methods for telescopic systems - Part 1: Test methods for basic characteristics
ISO 14490-8:2011 Optics and optical instruments - Test methods for telescopic systems - Part 8: Test methods for night-vision devices
ISO 14490-2:2005 Optics and optical instruments - Test methods for telescopic systems - Part 2: Test methods for binocular systems
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

American Society for Testing and Materials (ASTM), Remote Spectrum Analyzer

ASTM D7941/D7941M-23 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM D7941/D7941M-14 Standard Test Method for Hydrogen Purity Analysis Using a Continuous Wave Cavity Ring-Down Spectroscopy Analyzer
ASTM E718-80 Method for Spectrographic Analysis of Cartridge Brass
ASTM E2224-02 Standard Guide for Forensic Analysis of Fibers by Infrared Spectroscopy
ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E2040-19 Standard Test Method for Mass Scale Calibration of Thermogravimetric Analyzers
ASTM C791-83(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM C696-11 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM D7417-17 Standard Test Method for Analysis of In-Service Lubricants Using Particular Four-Part Integrated Tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity, and Laser Particle Counter)
ASTM E1009-95(2000) Standard Practice for Evaluating an Optical Emission Vacuum Spectrometer to Analyze Carbon and Low-Alloy Steel

国家市场监督管理总局、中国国家标准化管理委员会, Remote Spectrum Analyzer

GB/T 6040-2019 General rules for infrared analysis
GB/T 16597-2019 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods

National Metrological Technical Specifications of the People's Republic of China, Remote Spectrum Analyzer

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
JJF(电子) 37-1982 Calibration Method of BP-9 Broadband Microwave Spectrum Analyzer
JJF(电子) 38-1982 Calibration method of BP-24, BP-25, BP-30 microwave spectrum analyzer

KR-KS, Remote Spectrum Analyzer

KS D ISO 14707-2003(2023)
KS D ISO 15472-2003(2023)
KS D 1652-2007(2017)(英文版) Iron and steel－Method for spark discharge atomic emission spectrometric analysis

CENELEC - European Committee for Electrotechnical Standardization, Remote Spectrum Analyzer

EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
EN 61290-10-1:2003 Optical amplifiers Test methods Part 10-1: Multichannel parameters Pulse method using an optical switch and optical spectrum analyzer
EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
EN 61290-10-2:2003 Optical amplifiers - Test methods Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-10-2:2008 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters - Pulse method using a gated optical spectrum analyzer
EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
EN 61290-1-2:1998 Optical Fibre Amplifiers - Basic Specification Part 1-2: Test Methods for Gain Parameters Electrical Spectrum Analyzer

Professional Standard - Ferrous Metallurgy, Remote Spectrum Analyzer

YB/T 4177-2008 Determination of chemical composition in stag by X-ray fluorescence spectrometry

Professional Standard - Electricity, Remote Spectrum Analyzer

DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer

The American Road & Transportation Builders Association, Remote Spectrum Analyzer

AASHTO DIVISION I-A 4.4 Single Mode Spectral Analysis Method - Procedure 2

AASHTO - American Association of State Highway and Transportation Officials, Remote Spectrum Analyzer

DIVISION I-A 4.5-1996 Multimode Spectral Analysis Method - Procedure 3
DIVISION I-A 4.4-1996 Single Mode Spectral Analysis Method - Procedure 2 (Interim 1998)

工业和信息化部, Remote Spectrum Analyzer

YS/T 464-2019 Direct reading spectroscopic analysis method of copper cathode
SJ/T 1543-2020 Spectral analysis method of nickel and nickel alloys for electric vacuum devices

RO-ASRO, Remote Spectrum Analyzer

STAS 11564-1982 RAPID STEELS FOR TOOLS Spectrographic analysis in emission
STAS 11607-1981 LOW AND MEDIUM ALLOYED CARBON STEELS Spectrographic analysis
STAS 10274/1-1983 Solid fuels ASH ANALYSIS General directions for spectral and chemical analysis carrying out

Professional Standard - Agriculture, Remote Spectrum Analyzer

SN/T 5566-2023 General Rules of Laser Micro Raman Spectroscopy Analysis Method

Guangdong Provincial Standard of the People's Republic of China, Remote Spectrum Analyzer

DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry

PL-PKN, Remote Spectrum Analyzer

PN-EN IEC 61290-1-1-2021-06 E Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2020)

Professional Standard - Chemical Industry, Remote Spectrum Analyzer

HG/T 2954~2955-2008 Standard writing format for atomic absorption spectroscopic analysis method Standard writing format for molecular absorption spectroscopic analysis method
HG/T 2955-2008 Layouts for standards of molecular absorption spectrometric analysis
HG/T 2955-1989(1997) Rules for drafting molecular absorption spectrometry analysis standards
HG/T 2954-2008 Layouts for standard of atomic absorption spectrometric analysis

GOSTR, Remote Spectrum Analyzer

GOST 9716.3-1979 Copper-zinc alloys. Method of spectral analysis of oxide spesimens with photographic registration of spectrum
GOST 9716.1-1979 Copper-zinc alloys. Method of spectral analysis of metal standard spesimens with photographic registration of spectrum

(U.S.) Telecommunications Industries Association , Remote Spectrum Analyzer

TIA/EIA-455-209-2000 FOTP-209 IEC 61290-2-1 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
TIA/EIA-455-206-2000 FOTP-206 IEC 61290-1-1 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters - Optical Spectrum Analyzer
TIA/EIA-455-210-2000 FOTP-210 IEC 61290-2-2 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters - Electrical Spectrum Analyzer

Professional Standard - Forestry, Remote Spectrum Analyzer

LY/T 2053-2012 Standard method for near infrared qualitative analysis of Wood
LY/T2053-2012 Standard method for mear infrarde qualitative analysis of wood

Professional Standard - Commodity Inspection, Remote Spectrum Analyzer

SN/T 2083-2008 Method for analysis of brass.Spark discharge atomic emission spectrometric
SN/T 2079-2008 Method for analysis of stainless and alloy steels.X-ray fluorescence spectrometry

Professional Standard - Energy, Remote Spectrum Analyzer

NB/SH/T 0940-2016 Test method for the analysis of in-use lubricants using a specific 4-in-1 tester (Atomic Emission Spectroscopy, Infrared Spectroscopy, Viscosity and Laser Particle Counter)

国家能源局, Remote Spectrum Analyzer

SH/T 0940-2016 Test methods for analyzing in-service lubricants using specific four-in-one testers (atomic emission spectrometry, infrared spectroscopy, viscosity and laser particle counter)
SY/T 7662-2022 Laser Raman spectroscopy analysis method of solid organic matter and inclusions
SY/T 5121-2021 Infrared spectroscopic analysis method of organic matter and crude oil in rocks

Standard Association of Australia （SAA）, Remote Spectrum Analyzer

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Remote Spectrum Analyzer

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales

YU-JUS, Remote Spectrum Analyzer

JUS C.A1.360-1977 Methods for chemical analysis of zine and zine alloys. Determination of group of elements - spectrographic analysis
JUS C.A1.650-1987 Methodes of chemical analysis of silver. Determination of impurities contents. Spectrographic metod".

Professional Standard - Petroleum, Remote Spectrum Analyzer

SY/T 5121-1986 Infrared spectroscopic analysis method of rock organic matter and crude oil

Professional Standard - Aviation, Remote Spectrum Analyzer

HB 5219.11-1998 Chemical Analysis Methods of Magnesium Alloys - Determination of Nickel Content by Atomic Absorption Spectrometry
HB 5219.13-1998 Magnesium Alloy Chemical Analysis Methods Atomic Absorption Spectroscopic Analysis Determination of Zinc Content
HB 5219.20-1998 Methods of chemical analysis of magnesium alloys - Determination of silver content by atomic absorption spectrometry
HB 5219.3-1998 Methods of chemical analysis of magnesium alloys - Determination of copper content by atomic absorption spectrometry
HB 5219.8-1998 Methods of chemical analysis of magnesium alloys - Determination of manganese content by atomic absorption spectrometry
HB 5219.5-1998 Methods of chemical analysis of magnesium alloys - Determination of iron content by atomic absorption spectrometry
HB 6731.1-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 1:Determination of copper content by flame atomic absorption spectrometric method
HB 6731.2-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 2:Determination of magnesium content by flame atomic absorption spectrometric method
HB 6731.3-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 1:Determination of zinc content by flame atomic absorption spectrometric method
HB 6731.4-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 4:Determination of lead content by flame atomic absorption spectrometric method
HB 6731.5-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 5:Determination of cadmium content by flame atomic absorption spectrometric method
HB 6731.6-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 6:Determination of iron content by flame atomic absorption spectrometric method
HB 6731.7-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 7:Determination of manganese content by flame atomic absorption spectrometric method
HB 6731.8-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 8:Determination of nickel content by flame atomic absorption spectrometric method
HB 6731.9-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 9:Determination of chrome content by flame atomic absorption spectrometric method

AT-ON, Remote Spectrum Analyzer

OENORM EN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Remote Spectrum Analyzer

IPC TM-650 2.2.14.2-1995 Solder Powder Particle Size Distribution - Optical Image Analyzer Method