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half electric full electric

half electric full electric, Total:499 items.

In the international standard classification, half electric full electric involves: Occupational safety. Industrial hygiene, Rectifiers. Convertors. Stabilized power supply, Semiconductor devices, Insulating fluids, Paper and board, Electrical wires and cables, Transformers. Reactors, Vocabularies, Integrated circuits. Microelectronics, Electrical engineering in general, Insulating materials, Safety of machinery, Industrial automation systems, Radiocommunications, Electrical accessories, Optoelectronics. Laser equipment, Electromechanical components for electronic and telecommunications equipment, Construction materials, Welding, brazing and soldering, Graphical symbols, Capacitors, Applications of information technology, Materials for aerospace construction, Semiconducting materials, Testing of metals, Plastics, Electronic components in general, Products of the textile industry, Quality, Solar energy engineering, Components and accessories for telecommunications equipment, Conducting materials, Measurement of force, weight and pressure, Products of non-ferrous metals, Protection against electric shock, Resistors, Switchgear and controlgear, Power transmission and distribution networks, Wastes, Iron and steel products.


RU-GOST R, half electric full electric

  • GOST 12.2.007.11-1975 Occupation safety standards system. Semiconductor converters of electric energy. Safety requirements
  • GOST 26567-1985 Semiconductor energy converters. Test methods
  • GOST R 50471-1993 Semiconductor photoemitters. Measuring method for halfintensity angle
  • GOST 18130-1979 Semi-automatic consumable-electrode arc-welding machines. General specifications
  • GOST 26284-1984 Semiconductor power converters. Conventional designations
  • GOST R IEC 60748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • GOST R 50515-1993 All-or-nothing electrical relays
  • GOST 4.137-1985 Product-quality index system. Power semiconductor devices. Nomenclature of indices
  • GOST 18986.10-1974 Semiconductor diodes. Methods for measuring inductance
  • GOST R 53734.5.6-2021 Electrostatics. Protection of electronic devices against electrostatic phenomena. Integrated circuits and semiconductor devices
  • GOST 18986.4-1973 Semiconductor diodes. Methods for measuring capacitance
  • GOST 30617-1998 Power semiconductor modules. General specifications
  • GOST 20859.1-1989 Power semiconductor devices. General technical requirements
  • GOST 23414-1984 Semiconductor power converters. Terms and definitions
  • GOST R IEC 748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

American National Standards Institute （ANSI), half electric full electric

  • ANSI/UL 1557-2013 Standard for Safety for Electrically Isolated Semiconductor Devices

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, half electric full electric

  • GB 7971-1987 Semiconducting electric cable paper
  • GB/T 7971-2007 Semiconducting electric cable paper
  • GB/T 2900.32-1994 Electrotechnical terminology. Power semiconductor device
  • GB/T 20515-2006 Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
  • GB/T 13422-1992 Power semiconductor converters--Electrical test methods
  • GB/T 2900.66-2004 Electrotechnical terminology Semiconductor devices and integrated circuits
  • GB/T 12750-2006 Semiconductor devices. Integrated circuits. Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • GB/T 15872-1995 Power supply interface for semiconductor equipment
  • GB/T 15872-2013 Power supply interface for semiconductor equipment
  • GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
  • GB/T 42838-2023 Semiconductor Integrated Circuit Hall Circuit Test Method
  • GB/T 3048.3-1994 Test methods for determining electrical properties of electric cables and wires.Measurement of volumeresistivity of semi-conducting rubbers and plastics
  • GB/T 42736-2023 Heat-shinkable semiconductive polyolefin sleeving
  • GB 35007-2018 Semiconductor integrated circuit low voltage differential signal circuit testing method
  • GB/T 4377-2018 Semiconductor integrated circuits.Measuring method of voltage regulators
  • GB/T 6616-2023 Non-contact eddy current method for testing semiconductor wafer resistivity and semiconductor film sheet resistance
  • GB/T 19403.1-2003 Semiconductor Devices Integrated Circuits Part11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)
  • GB/T 14027.5-1992 Series and products of communication circuits for semiconductor integrated circuits-Products of telephone circuits
  • GB/T 12750-1991 Sectional specification for semiconductor integrated circuits,excluding hybrid circuits
  • GB/T 4376-1994 Series and products of voltage regulators for semiconductor integrated circuits
  • GB/T 8446.1-1987 Heat sink for power semiconductor device
  • GB/T 14113-1993 Terminology of packages for semiconductor integrated circuits
  • GB/T 7092-1993 Qutline dimensions of semiconductor integrated circuits
  • GB/T 42970-2023 Semiconductor integrated circuit video encoding and decoding circuit testing methods
  • GB/T 3048.3-2007 Test methods for electrical properties of electric cables and wires.Part 3: Test of volume resistivity of semi-conducting rubbers and plastics
  • GB/T 13422-2013 Semiconductor converters.Electrical test methods
  • GB/T 17951.2-2014 Cold-rolled non-oriented electrical steel strip delivered in the semi-processed state
  • GB/T 42836-2023 Microwave semiconductor integrated circuit mixer
  • GB/T 42835-2023 Semiconductor Integrated Circuit System on Chip (SoC)
  • GB/T 42837-2023 microwave semiconductor integrated circuit amplifier
  • GB/T 17574-1998 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
  • GB/T 17940-2000 Semiconductor devices Integrated circuits Part 3:Analogue integrated circuits
  • GB/T 3859.3-1993 Semiconductor convertors.Transformers and reactors
  • GB 5839-1986 Rating system for electron tubes and semiconductor devices
  • GB 12565-1990 Sectional Specification for Semiconductor Devices and Optoelectronic Devices
  • GB/T 3430-1989 The rule of type designation for semiconductor integrated circuits
  • GB/T 17951.2-2002 Cold-rolled grain non-oriented electrical steel strip (sheet) delivered in the semi-processed state
  • GB/T 5839-1986 Rating systems for electronic tubes and semiconductor devise
  • GB/T 42974-2023 Semiconductor integrated circuit flash memory (FLASH)
  • GB 28526-2012 Electrical safety of machinery.Functrional safety of safety-related electrical,electronic and programmable electronic control systems
  • GB/T 14030-1992 General principles of measuring methods of timer circuits for semiconductor integrated circuits
  • GB/T 12703.1-2008 Textile.Evaluation for electrostatic properties.Part1:Static half period
  • GB/T 42709.19-2023 Semiconductor devices microelectromechanical devices Part 19: Electronic compass
  • GB 14030-1992 Basic principles of semiconductor integrated circuit time-based circuit testing methods
  • GB/T 15509-1995 Series and products for semiconductor integrated circuits. Products of robot series for colour TV

Underwriters Laboratories (UL), half electric full electric

  • UL 1557-2022 UL Standard for Safety Electrically Isolated Semiconductor Devices
  • UL 1557-2018 UL Standard for Safety Electrically Isolated Semiconductor Devices (Sixth Edition)
  • UL 1557-1993 Electrically isolated semiconductor devices
  • UL 1557-1997 Electrically isolated semiconductor devices
  • UL 1557-2006 UL Standard for Safety Electrically Isolated Semiconductor Devices Fourth Edition; Reprint with Revisions through and Including 6/26/2006
  • UL 1557-2011 Electrically isolated semiconductor devices
  • UL 1557 BULLETINS-2006 UL Standard for Safety Electrically Isolated Semiconductor Devices (04/11/2006 (4p); 01/26/2006 (4p))
  • UL 1557 BULLETIN-2014 UL Standard for Safety Electrically Isolated Semiconductor Devices (COMMENTS DUE: OCTOBER 13@ 2014)
  • UL 1557 BULLETIN-2012 UL Standard for Safety Electrically Isolated Semiconductor Devices (COMMENTS DUE: July 22@ 2012)
  • UL 1557 BULLETIN-2011 UL Standard for Safety Electrically Isolated Semiconductor Devices (COMMENTS DUE: DECEMBER 19@ 2011)
  • UL 60730-2-4 BULLETIN-2003 UL Standard for Safety Automatic Electrical Controls for Household and Similar Use; Part 2: Particular Requirements for Thermal Motor Protectors for Motor-Compressors of Hermetic and Semi-Hermetic Type
  • UL 1557 BULLETIN-2018 UL Standard for Safety Electrically Isolated Semiconductor Devices (COMMENTS DUE: March 12@ 2018)
  • UL 1557 BULLETIN-2009 UL Standard for Safety Electrically Isolated Semiconductor Devices (COMMENTS DUE: July 13@ 2009)

Korean Agency for Technology and Standards (KATS), half electric full electric

CZ-CSN, half electric full electric

  • CSN 36 2311-1973 Pantographs and semi-pantographs of electric motor vehicfes
  • CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
  • CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
  • CSN 35 8735-1964 Semiconductor diodes. Measurement of d. c. currents and voltages
  • CSN 35 8773-1977 Meaaurement of semiconductor devices. Thyristors. Meaaurement of blocking current and reverse blocking current.
  • CSN 35 8732-1964 Semiconductor diodes. Measurement of forward current
  • CSN IEC 748-3:1994 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
  • CSN IEC 748-2:1994 Semiconductor devices.Integrated circuits.Part 2:Digital integrated circuits
  • CSN IEC 748-4:1994 Semiconductor devices.Integrated circuits.Part 4:Interface integrated circuits
  • CSN 35 8733-1975 Semiconductor devices. Diodes. Measurement of reverse voltago (working voltago)
  • CSN 35 8736-1964 Semiconductor diodes. Measurement of interelectrode capacitanoe
  • CSN 35 1603-1983 Power semiconductor devices. General methodes of measurements

Defense Logistics Agency, half electric full electric

TR-TSE, half electric full electric

  • TS 1-1959 SEMI - MANUFACTURED ELECTROLYTIC COPPER

Professional Standard - Machinery, half electric full electric

国家机械工业局, half electric full electric

  • JB 9644-1999 Reactor for semiconductor electric transmission

KR-KS, half electric full electric

  • KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-11-2020 Semiconductor devices — Integrated circuits — Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits

International Electrotechnical Commission (IEC), half electric full electric

  • IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
  • IEC 62415:2010 Semiconductor devices - Constant current electromigration test
  • IEC 60748-11:1990 Semiconductor devices; integrated circuits; part 11: sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • IEC 60748-11:1990/AMD2:1999 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits; Amendment 2
  • IEC 60700:1981 Testing of semiconductor valves for high-voltage d.c. power transmission
  • IEC 60748-11-1:1992 Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
  • IEC 60748-11:1990/AMD1:1995 Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • IEC 60204-33:2009 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
  • IEC 60853-3:2002 Calculation of the cyclic and emergency current rating of cables - Part 3: Cyclic rating factor for cables of all voltages, with partial drying of the soil
  • IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
  • IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
  • IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
  • IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
  • IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
  • IEC 60050-521:2002 International Electrotechnical Vocabulary - Part 521: Semiconductor devices and integrated circuits
  • IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
  • IEC 62435-7:2020 Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices
  • IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

RO-ASRO, half electric full electric

  • STAS 11943-1980 Trailers and semitrailers POLE SEMITRAILERS Types
  • STAS 12258/7-1987 OPTOELECTRONIC SEMICONDIC- TOH DEVICES PHOTOVOLTAIC CELLS Terminology and essential cliarac! eristics
  • STAS 11381/13-1981 Graphical symbols for electrical diagrams SEMICONDUCTOR DEVICES
  • SR CEI 748-11-1-1992 Semiconductor devices Integrated circuits Part 11: Section 1: Internai visual examination for semiconductor integrated circuits excluding hybrid circuits
  • SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
  • STAS 12258/2-1984 Optoelectronic semiconductor devices PIIOTODIODES Terminology and essentia] characteristics
  • STAS 12258/3-1985 Optoelectronic semiconductor devices PHOTOTRANSISTORS Terminology and essential characteristics
  • STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, half electric full electric

  • GB/T 5226.33-2017 Electrical safety of machinary—Electrical equipment of machines—Part 33: Requirements for semiconductor fabrication equipment
  • GB/T 35007-2018 Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
  • GB/T 35006-2018 Semiconductor integrated circuits—Measuring method of level converter

HU-MSZT, half electric full electric

Taiwan Provincial Standard of the People's Republic of China, half electric full electric

  • CNS 1368-1995 Bare Half-hard-drawn Solid Copper Wire
  • CNS 5744-1989 Half - Hard - Drawn Aluminium Wires for Electric Purposes
  • CNS 13802-5-1997 Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)
  • CNS 13802.5-1997 Graphical Symbols for Diagrams (Semiconductors and Electron Tubes)
  • CNS 11900-1987 Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)
  • CNS 8479-1982 Fixed Film Resistors - Precision and Semiprecision

British Standards Institution (BSI), half electric full electric

  • BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
  • BS EN 60204-33:2011 Safety of machinery. Electrical equipment of machines. Requirements for semiconductor fabrication equipment
  • BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
  • BS EN 62415:2010 Semiconductor devices - Constant current electromigration test
  • BS EN IEC 60747-5-5:2020 Semiconductor devices. Optoelectronic devices. Photocouplers
  • BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
  • BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
  • BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
  • BS EN 62047-19:2013 Semiconductor devices. Micro-electromechanical devices. Electronic compasses
  • BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integr...
  • BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
  • BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
  • BS EN 61811-50:2002 Electromechanical all-or-nothing relays - Sectional specification - Electromechanical all-or-nothing telecom relays of assessed quality
  • BS EN IEC 62435-7:2021 Electronic components. Long-term storage of electronic semiconductor devices. Micro-electromechanical devices
  • BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
  • BS IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation. - Part 2: Thermo power based thermoelectric energy harvesting
  • BS IEC 60748-1:2002 Semiconductor devices - Integrated circuits - General
  • BS 6493-2.1:1985 Semiconductor devices - Integrated circuits - General
  • BS EN IEC 63244-1:2021 Semiconductor devices. Semiconductor devices for wireless power transfer and charging. General requirements and specifications
  • BS IEC 61196-11:2022 Coaxial communication cables - Sectional specification for semi-rigid cables with polyethylene (PE) dielectric
  • BS IEC 61196-13:2023 Coaxial communication cables - Sectional specification for semi-rigid cables with silicon dioxide dielectric
  • BS IEC 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
  • BS EN 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
  • BS EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General
  • BS EN 60747-5-5:2011 Semiconductor devices. Discrete devices. Optoelectronic devices. Photocouplers
  • BS EN IEC 62435-4:2018 Electronic components. Long-term storage of electronic semiconductor devices. Storage
  • BS 6493-2.3:1987 Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
  • BS IEC 62830-5:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Test method for measuring generated power from flexible thermoelectric devices
  • BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
  • BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
  • BS EN IEC 62435-8:2020 Electronic components. Long-term storage of electronic semiconductor devices - Passive electronic devices
  • BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
  • BS IEC 62830-7:2021 Semiconductor devices. Semiconductor devices for energy harvesting and generation. Linear sliding mode triboelectric energy harvesting
  • BS 3839:1978 Specification for oxygen-free high-conductivity copper for electronic tubes and semiconductor devices
  • BS EN IEC 62435-3:2020 Electronic components. Long-term storage of electronic semiconductor devices - Data
  • BS EN 62435-1:2017 Electronic components. Long-term storage of electronic semiconductor devices - General
  • BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
  • BS EN 61508-2:2010 Functional safety of electrical/electronic/ programmable electronic safety-related systems. Requirements for electrical/electronic/ programmable electronic safety-related systems
  • BS EN 60747-16-4:2004+A2:2017 Semiconductor devices - Microwave integrated circuits. Switches
  • BS IEC 62899-203:2018 Printed electronics. Materials. Semiconductor ink
  • BS EN IEC 60966-4-3:2022 Radio frequency and coaxial cable assemblies - Detail specification for semi-rigid cable assemblies. Frequency range up to 6 000 MHz, type 50-12 low loss semi-rigid coaxial cable
  • BS EN IEC 60966-4-2:2022 Radio frequency and coaxial cable assemblies - Detail specification for semi rigid cable assemblies (jumper). Frequency range up to 6000 MHz, type 50-9 semi-rigid coaxial cable
  • BS IEC 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
  • BS EN 62047-5:2011 Semiconductor devices. Micro-electromechanical devices. RF MEMS switches
  • BS EN 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
  • BS EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Measuring methods
  • BS EN 60966-3:2003 Radio frequency and coaxial cable assemblies - Sectional specification for semi-flexible coaxial cable assemblies
  • BS EN 60966-4:2003 Radio frequency and coaxial cable assemblies - Sectional specification for semi-rigid coaxial cable assemblies
  • BS EN IEC 62435-9:2021 Electronic components. Long-term storage of electronic semiconductor devices. Special cases

PL-PKN, half electric full electric

  • PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
  • PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods

IECQ - IEC: Quality Assessment System for Electronic Components, half electric full electric

  • PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits
  • QC 790100-1990 Semiconductor Devices Integrated Circuits Part 11: Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits (IEC 748-11 ED 1)

Association Francaise de Normalisation, half electric full electric

  • NF EN 61029-1/A11:2011 Sécurité des machines-outils électriques semi-fixes - Partie 1 : règles générales
  • NF EN 61029-1/A12:2005 Sécurité des machines-outils électriques semi-fixes - Partie 1 : règles générales
  • NF EN 61029-1:2009 Sécurité des machines-outils électriques semi-fixes - Partie 1 : règles générales
  • NF C80-201*NF EN 62415:2010 Semiconductor devices - Constant current electromigration test.
  • NF C96-045:1992 Semiconductors devices. Integrated circuits. Part 11 : sectional specification for semiconducteur integrated circuits excluding hybrid circuits
  • UTE C93-551U*UTE C93-551:1977 Electronic components. Semi rigid coaxial cables. Detail requirements.
  • NF EN 61029-2-5/A11:2017 Sécurité des machines-outils électriques semi-fixes - Partie 2-5 : règles particulières pour les scies à ruban
  • NF EN 61029-2-5:2012 Sécurité des machines-outils électriques semi-fixes - Partie 2-5 : règles particulières pour les scies à ruban
  • NF EN 60204-33:2012 Sécurité des machines - Équipement électrique des machines - Partie 33 : exigences pour les équipements de fabrication des semi-conducteurs
  • NF C86-503:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Phototransistors, photodarlington transistors and phototrasistor-arrays. Blank detail specification CECC 20 003.
  • NF EN IEC 60966-3-4:2023 Cordons coaxiaux et cordons pour fréquences radioélectriques - Partie 3-4 : spécification particulière relative aux cordons semi-flexibles (câble de liaison), plage de fréquences jusqu'à 6 GHz, câble coaxial semi-flexible de type 50-141
  • NF EN IEC 60966-3-3:2023 Cordons coaxiaux et cordons pour fréquences radioélectriques - Partie 3-3 : spécification particulière relative aux cordons semi-flexibles (câble de liaison), plage de fréquences jusqu'à 18 GHz, câble coaxial semi-flexible de type 50-141
  • NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
  • NF C53-225:1985 Testing of semiconductor valves for high-voltage D.C. Power transmission.
  • NF EN 62047-19:2014 Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 19 : compas électroniques
  • NF C79-130-33*NF EN 60204-33:2012 Safety of machinery - Electrical equipment of machines - Part 33 : requirements for semiconductor fabrication equipment.
  • NF EN 62415:2010 Dispositifs à semiconducteurs - Essai d'électromigration en courant constant
  • NF EN IEC 60966-4-2:2022 Cordons coaxiaux et cordons pour fréquences radioélectriques - Partie 4-2 : Spécification particulière pour les cordons semi-rigides (jarretières) - Plage de fréquences jusqu'à 6 000 MHz, câble coaxial semi-rigide de type 50-9
  • NF EN IEC 60966-4-3:2022 Cordons coaxiaux et cordons pour fréquences radioélectriques - Partie 4-3 : Spécification particulière pour les cordons semi-rigides - Plage de fréquences jusqu'à 6 000 MHz, câble coaxial semi-rigide à faibles pertes de type 50-12
  • NF C96-050-19*NF EN 62047-19:2014 Semiconductor devices - Micro-electromechanical devices - Part 19 : electronic compasses
  • NF C96-042:1989 Semiconductor Devices Integrated circuits Part 2:Digital integrated circuits
  • NF C96-005-5*NF EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5 : optoelectronic devices - Photocouplers
  • NF EN IEC 60747-5-5:2020 Dispositifs à semiconducteurs - Partie 5-5 : dispositifs optoélectroniques - Photocoupleurs
  • NF EN 61029-2-11/A11:2013 Sécurité des machines-outils électriques semi-fixes - Partie 2-11 : règles particulières pour les scies d'établi-scies à mortaiser
  • NF EN 61029-2-3:2011 Sécurité des machines-outils électriques semi-fixes - Partie 2-3 : règles particulières pour les dégauchisseuses et les raboteuses
  • NF EN 61029-2-11:2017 Sécurité des machines-outils électriques semi fixes - Partie 2-11 : règles particulières pour les scies d'établi-scies à mortaiser
  • NF C86-010:1986 Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.
  • NF EN 300823:2001 Télécommunications - Télécommunications personnelles universelles (UPT) - UPT phase 2 - Spécification fonctionnelle de l'interface entre une Carte à puce (ICC) UPT et des terminaux du réseau téléphonique public commuté (RTPC), du réseau num...
  • NF C01-521:2002 International Electrotechnical Vocabulary - Part 521 : semiconductor devices and integrated circuits.

Military Standard of the People's Republic of China-General Armament Department, half electric full electric

  • GJB 33/17-2011 Semiconductor optoelectronic device.Detail specification for type GO11 semiconductor photocoupler
  • GJB 1524-1992 General specification for semi-air dielectric, semi-rigid coaxial radio frequency cables
  • GJB 597/12A-1998 Detailed specifications for semiconductor integrated circuit HCMOS gate circuits
  • GJB 1524A-2017 General specification for semi-air dielectric semi-rigid coaxial radio frequency cables
  • GJB 597A-1996 General Specification for Semiconductor Integrated Circuits
  • GJB 597/3-1990 Detailed specification for voltage comparators for semiconductor integrated circuits
  • GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler
  • GJB 8121-2013 General specification for semiconductor optoelectronic assembly
  • GJB 8120-2013 General specification for semiconductor optoelectronic module
  • GJB 597B-2012 General specification for semiconductor integrated circuits
  • GJB/Z 42.1-1993 Military microcircuit series type spectrum semiconductor integrated circuit analog integrated circuit
  • GJB/Z 42.2-1993 Military microcircuit series type spectrum semiconductor integrated circuit digital integrated circuit
  • GJB 8119-2013 General specification for semiconductor optoelectronic device
  • GJB 973-1990 General specification for flexible and semi-rigid radio frequency cables
  • GJB 1420A-1999 General Specification for Semiconductor Integrated Circuit Enclosures
  • GJB/Z 42.4-1993 Military Microcircuit Series Spectrum Semiconductor Integrated Circuit Interfacer Integrated Circuit
  • GJB/Z 41.3-1993 Military semiconductor discrete device series spectrum semiconductor optoelectronic devices
  • GJB 33/20-2011 Semiconductor optoelectronic device.Detail specification for type GH302 photocoupler
  • GJB 33/22-2011 Semiconductor optoelectronic device.Detail specification for type GO103 photocoupler
  • GJB/Z 56-1994 Guide to Selection of Electronic Components for Aerospace Use Semiconductor Integrated Circuits
  • GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor
  • GJB 1420B-2011 General specification for packages of semiconductor integrated circuits
  • GJB 973A-2004 Cables, radio frequency, flexible and semirigid, general specification for
  • GJB 973B-2021 General specification for flexible and semi-rigid radio frequency cables
  • GJB 33/21-2011 Semiconductor optoelectronic device.Detail specification for GD310A series photocopier
  • GJB 33/23-2011 Semiconductor optoelectronic device.Detail specification for type GH3201Z-4 photocoupler
  • GJB 33/19-2011 Semiconductor optoelectronic device.Detail specification for type GH302-4 photocoupler

Guizhou Provincial Standard of the People's Republic of China, half electric full electric

International Telecommunication Union (ITU), half electric full electric

  • ITU-T M.726-1988 MAINTENANCE ORGANIZATION FOR THE WHOLLY DIGITAL INTERNATIONAL AUTOMATIC AND SEMI-AUTOMATIC TELEPHONE SERVICE
  • ITU-T M.726 FRENCH-1988 MAINTENANCE ORGANIZATION FOR THE WHOLLY DIGITAL INTERNATIONAL AUTOMATIC AND SEMI-AUTOMATIC TELEPHONE SERVICE
  • ITU-T M.726 SPANISH-1988 MAINTENANCE ORGANIZATION FOR THE WHOLLY DIGITAL INTERNATIONAL AUTOMATIC AND SEMI-AUTOMATIC TELEPHONE SERVICE
  • ITU-T M.733-1988 Transmission routine maintenance measurements on automatic and semi-automatic telephone circuits

Shanghai Provincial Standard of the People's Republic of China, half electric full electric

  • DB31/ 149-1994 Safety standard for flame retardant semi-rigid polyethylene wire conduit for buildings

SE-SIS, half electric full electric

Professional Standard - Electron, half electric full electric

  • SJ/T 10086-1991 Detail specification for electronic components.Semiconductor integrated circuit CT54H183/CT74H183 dual carry-save full adders
  • SJ/T 10758-1996 Semiconductor integrated circuit TV circuit series and varieties
  • SJ/T 10335-1993 Series and products of semiconductor integrated circuits for use in TV
  • SJ 20642-1997 Semiconductor opto-electronic module General specification for
  • SJ 20786-2000 General specification for semiconductor opto-electronic assembly
  • SJ/T 10334-1993 Series and products of audio circuits of semiconductor integrated circuits
  • SJ/T 10757-1996 Semiconductor integrated circuit audio circuit series and varieties
  • SJ/T 10038-1991 Detail specification for electronic component.Semicondutor integrated circuit-CC4008 CMOS 4-bit binary full adder with look ahead carry
  • SJ/T 10044-1991 Detail specification for electronic components.Semiconductor integrated circuit.CT54LS283/CT74LS283 4-bit binary full adder
  • SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
  • SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits
  • SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits
  • SJ/T 10831-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits
  • SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
  • SJ 20298-1993 Detail specification for Types JB555 and JB556 precision timers of semiconductor integrated circuits
  • SJ 50597/23-1994 Semiconductor integrated circuits.Detail specification for type JJ710 Voltage comparator
  • SJ/T 10734-1996 Letter symbols for semiconductor integrated circuits - Letter symbols for electrical parameters
  • SJ/T 11875-2022 Stress test procedures for semiconductor integrated circuits for electric vehicles
  • SJ/T 2215-2015 Measuring methods for semiconductor photocouplers
  • SJ 2247-1982 Outlines dimension for semiconductor optoelectronic devices
  • SJ/T 10988-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5132CP PIF amplifying circuits
  • SJ/T 11009-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11215ACP PIF amplifying circuits
  • SJ/T 11010-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD1124ACP SIF amplifying circuits
  • SJ/T 10989-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5622CP PAL system chrominance signal processing circuits
  • SJ 50033/112-1996 Scmiconductor optoelectronic devices.Detail specification for type GD3251Y photodiodes
  • SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
  • SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
  • SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
  • SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
  • SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
  • SJ 50033/113-1996 Semiconductor optoelectronic devices.Detail specification for type GD3252Y photodiodes
  • SJ/T 11005-1996 Semiconductor TV integrated circuits - General principles of measuring methods for audio channel circuits
  • SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
  • SJ/T 10076-1991 Detail specification for electronic components.Semiconductor integrated circuit Voltage comparator type CJ 710
  • SJ/T 11004-1996 Semiconductor TV integrated circuits - General principles of measuring methods for picture channel circuits
  • SJ/T 10990-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5612CP Picture chrominance signal processing circuits
  • SJ/T 9534-1993 Grading standard of quality for semiconductor integrated circuits
  • SJ 1795-1981 Detail specification for 50-1000mA low current thyristors
  • SJ 20644.1-2001 Semiconductor optoelectronic devices Detail specification for type GD3550Y PIN photodiode
  • SJ 20644.2-2001 Semiconductor optoelectronic devices Detail specification for type GD101 PIN photodiode
  • SJ 50597/34-1995 Semiconductor integrated circuits.Detail specification for type JC4085,JC4086,JC4070,JC4077 CMOS gates
  • SJ 50597/52-2000 Semiconductor integrated circuits.Detail specification for type JB537 voltage-to-frequency converter
  • SJ 50597/36-1995 Semiconductor integrated circuits.Detail specification of type JC54HC08,JC54HC11,JC54HC32,JC54HC86 HCMOS gates
  • SJ/T 10832-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7611CP PIF amplifying circuits
  • SJ/T 10991-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CW574CS voltage regulators for electronic tuners

YU-JUS, half electric full electric

Japanese Industrial Standards Committee (JISC), half electric full electric

  • JIS C 3107:1993 Half-hard-drawn aluminium wires for electric purposes
  • JIS C 6442:1976 Cut cores for electronic equipment
  • JIS Z 3605:1977 Recommended practice for semi-automatic arc welding
  • JIS B 9960-33:2012 Safety of machinery -- Electrical equipment of machines -- Part 33: Requirements for semiconductor fabrication equipment
  • JIS C 5630-19:2014 Semiconductor devices -- Micro-electromechanical devices -- Part 19: Electronic compasses

NEMA - National Electrical Manufacturers Association, half electric full electric

  • NEMA PV 5-1976 constant-potential-type electric utility (semiconductor static converter) battery chargers
  • NEMA RI 6-1959 ELECTROCHEMICAL PROCESSING SEMICONDUCTOR RECTIFIER EQUIPMENT

Danish Standards Foundation, half electric full electric

  • DS/IEC 748-11/A1,2:2001 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
  • DS/EN 60204-33:2011 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
  • DS/EN 61811-50:2003 Electromechanical all-or-nothing relays - Part 50: Sectional specification - Electromechanical all-or-nothing telecom relays of assessed quality
  • DS/EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
  • DS/EN 62415:2010 Semiconductor devices - Constant current electromigration test
  • DS/IEC 748-11:1992 Semiconductor devices. Integrated circuits. Part 11: Section specification for semiconductor integrated circuits excluding hybrid circuits
  • DS/EN IEC 63244-1:2021 Semiconductor devices – Semiconductor devices for wireless power transfer and charging – Part 1: General requirements and specifications
  • DS/IEC 748-2:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
  • DS/IEC 748-3:1993 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
  • DS/IEC 748-4:1993 Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits
  • DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
  • DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
  • DS/EN IEC 62435-7:2021 Electronic components – Long-term storage of electronic semiconductor devices – Part 7: Micro-electromechanical devices

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, half electric full electric

  • JEDEC JESD390A-1981 Standard Test Procedure for Noise Margin Measurements for Semiconductor Logic Gating Microcircuits
  • JEDEC JESD51-1-1995 Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
  • JEDEC JESD12-6-1991 Interface Standard for Semicustom Integrated Circuits
  • JEDEC JEB5-A-1970 Methods of Measurement for Semiconductor Logic Gating Microcircuits

Group Standards of the People's Republic of China, half electric full electric

  • T/CEEIA 610-2022 Semi-conductive tapes for buffer layer of power cables of rated voltages 110 kV and above
  • T/SHPTA 014.2-2021 Modified polypropylene insulating compounds and semi-conductive shielding compounds for power cables of rated voltages from 6kV up to 35kV – Part 2 : Semi-conductive shielding compounds for polypropylene insulating power cables of rated voltages fro
  • T/SDAS 243-2021 Semi-conductive shielding material for extruded insulated cables with rated voltage 35kV and below
  • T/QGCML 2020-2023
  • T/CAS 374-2019 Semi-conductive buffer layer material for extruded insulated power cables with rated voltage above 26/35kV

NZ-SNZ, half electric full electric

  • NZSS GP 34-1967 ELECTRICALLY-DRIVEN SEMI-AUTOMATIC FOOD-SLICING MACHINES
  • AS/NZS 1102.105:1997 Graphical Symbols for Electrotechnical Documentation Part 105: Semiconductors and Electron Tubes

ES-AENOR, half electric full electric

German Institute for Standardization, half electric full electric

  • DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
  • DIN EN 62047-19:2014-04 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013); German version EN 62047-19:2013
  • DIN EN 62415:2010-12 Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010
  • DIN VDE 0472-512:1985 Testing of cables, wires and flexible cords; resistance between protective conductor and semi-conductive layer

Standard Association of Australia （SAA）, half electric full electric

  • AS 1852.521:1988 International electrotechnical vocabulary - Semiconductor devices and integrated circuits
  • AS 61508 Set:2005 Functional safety of electrical/electronic/programmable electronic safety-related systems Set

Aerospace Industries Association, half electric full electric

  • AIA NAS 4122-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Extruded
  • AIA NAS 4119-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Press-On Type
  • AIA NAS 4124-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Dual Link
  • AIA NAS 4121-1996 Heat Sink, Electrical-Electronic Component, Semiconductor Devices, Formed FSC 5999
  • AIA NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type
  • AIA NAS 4120-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Encapsulating Type, TO-5

AIA/NAS - Aerospace Industries Association of America Inc., half electric full electric

  • NAS4122-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Extruded
  • NAS4121-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Formed
  • NAS4124-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Dual Link
  • NAS4119-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Press-On Type
  • NAS4118-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Retainer Clip Type
  • NAS4120-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Encapsulating Type@ TO-5
  • NAS4122-2013 HEAT SINK@ ELECTRICAL-ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ EXTRUDED (REV 1)
  • NAS4121-2012 HEAT SINK@ ELECTRICAL@ ELECTRONIC COMPONENT@ SEMICONDUCTOR DEVICES@ FORMED (Rev 1)

工业和信息化部, half electric full electric

  • SJ/T 10805-2018 Semiconductor integrated circuit voltage comparator test method

PH-BPS, half electric full electric

  • PNS IEC 62830-2:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
  • PNS IEC 62435-7:2021 Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices

FI-SFS, half electric full electric

Aerospace Industries Association/ANSI Aerospace Standards, half electric full electric

  • AIA/NAS NAS 4122-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Extruded
  • AIA/NAS NAS 4124-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Dual Link
  • AIA/NAS NAS 4119-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Press-On Type
  • AIA/NAS NAS4120-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, ENCAPSULATING TYPE, TO-5
  • AIA/NAS NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type
  • AIA/NAS NAS 4120-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Encapsulating Type, TO-5
  • AIA/NAS NAS4121-2012 HEAT SINK, ELECTRICAL, ELECTRONIC COMPONENT, SEMICONDUCTOR DEVICES, FORMED (Rev 1)

Professional Standard - Textile, half electric full electric

  • FZ/T 01042-1996 Determination of electrostatic half-life of electrostatic properties of textile materials

电子工业部, half electric full electric

  • SJ/T 10249-1991 Detailed specifications for semiconductor integrated circuit CB555 type time base circuit

US-FCR, half electric full electric

国家市场监督管理总局、中国国家标准化管理委员会, half electric full electric

  • GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits

Professional Standard - Aerospace, half electric full electric

  • QJ 2212-1991 Semiconductor Integrated Circuit Design Guidelines
  • QJ 259-1977 器件
  • QJ 786-1983 Screening technical conditions for semiconductor integrated circuits
  • QJ 2660-1994 Test method for pulse width modulator of semiconductor integrated circuit switching power supply

机械电子工业部, half electric full electric

机械工业部, half electric full electric

ES-UNE, half electric full electric

  • UNE-EN 60204-33:2011 Safety of machinery - Electrical equipment of machines -- Part 33: Requirements for semiconductor fabrication equipment (Endorsed by AENOR in December of 2011.)
  • UNE-EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (Endorsed by AENOR in November of 2013.)
  • UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
  • UNE-EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)

CENELEC - European Committee for Electrotechnical Standardization, half electric full electric

  • EN 60204-33:2011 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
  • EN 61811-50:2002 Electromechanical All-or-Nothing Relays Part 50: Sectional Specification Electromechanical All-or-Nothing Telecom Relays of Assessed Quality
  • EN 62415:2010 Semiconductor devices - Constant current electromigration test

AENOR, half electric full electric

  • UNE 21302-521:2004 Electrotechnical Vocabulary - Part 521: Semiconductor devices and integrated circuits.

European Committee for Electrotechnical Standardization（CENELEC）, half electric full electric

  • EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
  • EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

SG-SPRING SG, half electric full electric

  • SS 202 Pt.4-1992 Graphical Symbols For Electrical, Electronics And Telecommunications Diagrams Part 4 : Semiconductors And Electron Tubes

Indonesia Standards, half electric full electric

  • SNI 04-2064-1990 Polyethyelene insulated and sheathed, self supporting overhead telephone cables

Professional Standard - Non-ferrous Metal, half electric full electric

  • YS/T 287-2005 Partially graphitiferous cathode carbon block for aluminium electrolysis
  • YS/T 287-1999 Semi-graphitic cathode carbon block for aluminum electrolysis

National Electrical Manufacturers Association（NEMA), half electric full electric

Electronic Components, Assemblies and Materials Association, half electric full electric

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., half electric full electric

  • ASHRAE 4756-2005 A Semi-Empirical Model for Residential Electric Hot Water Tanks

GOSTR, half electric full electric

  • GOST 18577-1980 Thermoelectric semiconductor devices. Terms and definitions

ECIA - Electronic Components Industry Association, half electric full electric

  • 199-A-1972 Solid and Semi-Solid Dielectric Transmission Lines
  • 196-A-1970 Fixed Film Resistors - Precision and Semiprecision

中国轻工总会, half electric full electric

  • QB 2099.4-1995 Special requirements for motor thermal protectors of fully enclosed and semi-hermetic motor-compressors for electrical automatic controls for household and similar purposes

PT-IPQ, half electric full electric

  • NP 2626-521-2001 International Electrotechnical Vocabulary Chapter 521: Semiconductor devices and integrated circuits

American Society for Testing and Materials (ASTM), half electric full electric

  • ASTM D4388-97 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
  • ASTM D4388-02 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
  • ASTM D4388-08 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
  • ASTM D4388-13 Standard Specification for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
  • ASTM D4325-97 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
  • ASTM D4325-02 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
  • ASTM D4325-08 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes
  • ASTM D4325-13 Standard Test Methods for Nonmetallic Semi-Conducting and Electrically Insulating Rubber Tapes

TIA - Telecommunications Industry Association, half electric full electric

  • 258-1962 Semi-Flexible Air Dielectric Coaxial Cables and Connectors@ 50 Ohms

IEC - International Electrotechnical Commission, half electric full electric

  • IEC 60050 CHAP 521:1984 Vocabulaire Electrotechnique International Chapitre 521 : Dispositifs semi-conducteurs et des circuits intégrés

PK-PSQCA, half electric full electric

AT-ON, half electric full electric

  • ONORM E 7420-1977 Aluminium for electrical purposes; semi finished products technical terms of delivery

U.S. Military Regulations and Norms, half electric full electric

General Motors Corporation (GM), half electric full electric

IN-BIS, half electric full electric

Jiangxi Provincial Standard of the People's Republic of China, half electric full electric

  • DB3603/T 4-2022 Technical specifications for the manufacture of semiconducting glazes for electric porcelain

Lithuanian Standards Office , half electric full electric

  • LST EN 61811-50-2003 Electromechanical all-or-nothing relays. Part 50: Sectional specification. Electromechanical all-or-nothing telecom relays of assessed quality (IEC 61811-50:2002)

National Metrological Verification Regulations of the People's Republic of China, half electric full electric

  • JJG(电子) 05009-1988 TS-109 Type Electrolytic Capacitor Semi-automatic Sorting Apparatus Trial Verification Regulations

  Semi-dry meter voltage, Semi-dry electricity, All Electric System, semi-dry electrode, Semi-dry electric instrument, All Electric, all electric, half electric full electric, half wave, full electric half electric, semiconducting.

 



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