ZH
RU
ES

liquid oscillator

liquid oscillator, Total:381 items.

In the international standard classification, liquid oscillator involves: Measurement of volume, mass, density, viscosity, Equipment for the chemical industry, Equipment for the rubber and plastics industries, Electric filters, Piezoelectric and dielectric devices, Materials for aerospace construction, Dentistry, Electronic components in general, Environmental testing, Electrical equipment for working in special conditions, Semiconductor devices, Rubber, Horology, Measurement of time, velocity, acceleration, angular velocity, Crude petroleum, Fuels, Optics and optical measurements, Integrated circuits. Microelectronics, Aircraft and space vehicles in general, Vibration and shock with respect to human beings, Vibrations, shock and vibration measurements, Wastes, Power stations in general, Water quality, Rotating machinery, Physics. Chemistry, Products of the chemical industry, Audio, video and audiovisual engineering, Adhesives, Equipment for petroleum and natural gas industries, Petroleum products in general, Vocabularies, Transformers. Reactors, Mechanical structures for electronic equipment, Electromagnetic compatibility (EMC), Lubrication systems, Plastics, Electrical and electronic testing, Measurement of fluid flow, Components for electrical equipment, Electricity. Magnetism. Electrical and magnetic measurements, Lubricants, industrial oils and related products, Quality, Analytical chemistry.

Association Francaise de Normalisation, liquid oscillator

NF EN ISO 15212-2:2002 Densimètres à oscillation - Partie 2 : instruments industriels pour liquides homogènes
NF B35-212-2*NF EN ISO 15212-2:2002 Oscillation-type density meters - Part 2 : process instruments for homogeneous liquids
NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
NF EN 60679-6:2011 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6 : méthode de mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW - Lignes directrices pour l'application
NF EN ISO 15212-1:1999 Densimètres à oscillations - Partie 1 : instruments de laboratoire
NF T43-015:2009 Rubber - Measurement of vulcanization characteristics with the oscillating disc curemeter.
NF M08-016:1992 Petroleum and liquid petroleum products. Determination of density for metrological purposes. Oscillation frequence method.
NF M07-096:2000 Émulsions eau dans gazole - Détermination dans la masse volumique - Méthode du tube en U-oscillant
NF T46-017-2*NF ISO 6502-2:2018 Rubber - Measurement of vulcanization characteristics using curemeters - Part 2 : oscillating disc curemeter
NF ISO 6502-2:2018 Caoutchouc - Mesure des caractéristiques de vulcanisation à l'aide de rhéomètres- Partie 2 : rhéomètre à disque oscillant
NF T43-015:1996 Rubber - Measurement of vulcanization characteristics with the oscillating curemeter.
NF E90-403:2005 Human response to vibration - Measuring instrumentation.
NF C96-016-5*NF EN 60747-16-5:2014 Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
NF EN 60747-16-5/A1:2020 Dispositifs à semiconducteurs - Partie 16-5 : circuits intégrés hyperfréquences - Oscillateurs
NF EN 60747-16-5:2014 Dispositifs à semiconducteurs - Partie 16-5 : Circuits intégrés hyperfréquences - oscillateurs
NF M08-016:2005 Petroleum and liquid petroleum products - Determination of density for metrological purposes - Oscillation frequency method.
NF M08-016:2014 Petroleum and liquid petroleum products - Determination of density for metrological purposes - Oscillation frequency method
NF C93-611:1975 Components for electronic equipment. Piezoelectric devices. Quartz crystal units for oscillators.
NF C93-620-1:2013 Quartz crystal controlled oscillators of assessed quality - Part 1: generic specification
UTE C93-611U*UTE C93-611:1975 Components for electric equipment. Piezoelectric devices. Quartz crystal units for oscillators.
NF EN 60679-4-1:1999 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 4-1 : spécification particulière cadre. Agrément de savoir-faire.
NF EN 60679-3:2013 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 3 : encombrements normalisés et connexions des sorties
NF E90-403-1*NF EN ISO 8041-1:2017 Human response to vibration - Measuring instrumentation - Part 1 : general purpose vibration meters
NF C93-620-4*NF EN 60679-4:1999 Quartz crystal controlled oscillators of assessed quality - Part 4 : sectional specification - Capability approval

Danish Standards Foundation, liquid oscillator

DS/EN ISO 15212-2/AC:2009 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids
DS/EN ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids
DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
DS/EN ISO 15212-1:1999 Oscillation-type density meters - Part 1: Laboratory instruments
DS/EN ISO 15212-1/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments
DS/EN 169200:1998 Sectional Specification: Quartz crystal controlled oscillators (Qualification approval)
DS/EN 169201:1998 Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval)
DS/EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
DS/ENV 28041:1993 Human response to vibration. Measuring instrumentation
DS/EN ISO 8041/AC:2008 Human response to vibration - Measuring instrumentation
DS/EN ISO 8041:2005 Human response to vibration - Measuring instrumentation
DS/EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
DS/EN ISO 8041-2:2021 Human response to vibration – Measuring instrumentation – Part 2: Personal vibration exposure meters (ISO 8041-2:2021)
DS/EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
DS/EN 60679-5:1999 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

Korean Agency for Technology and Standards (KATS), liquid oscillator

KS B ISO 15212-2-2006(2021) Oscillation-type density meters－Part 2：Process instruments for homogeneous liquids
KS B ISO 15212-2-2006(2016) Oscillation-type density meters－Part 2：Process instruments for homogeneous liquids
KS B ISO 15212-2:2006 Oscillation-type density meters－Part 2：Process instruments for homogeneous liquids
KS C 6503-1999 Quartz crystal units for oscillators
KS C 6503-1984 Quartz crystal units for oscillators
KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
KS C 6504-1987 Ovens for Quartz Crystal Units
KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS B ISO 15212-1:2006 Oscillation-type density meters－Part 1：Laboratory instruments
KS B ISO 15212-1-2006(2016) Oscillation-type density meters－Part 1：Laboratory instruments
KS B ISO 15212-1-2006(2021) Oscillation-type density meters－Part 1：Laboratory instruments
KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators
KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS
KS M ISO 3417-2012(2022) Rubber－Measurement of vulcanization characteristics with the oscillating disc curemeter
KS C 6509-2013 General Rules of Quartz Crystal Controlled Oscillators
KS C 6508-1990(2010) Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS B ISO 8041:2013 Human response to vibration－Measuring instrumentation
KS C IEC 62860-1:2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
KS B ISO 4868-2003(2008) Code for the measurement and reporting of local vibration data of ship structure and equipment
KS C IEC 60679-5:2018 Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
KS C IEC 60679-4:2018 Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
KS C IEC 60679-4-2023 Evaluating the quality of quartz crystal oscillators Part 4: Certification of competency to segment specifications
KS C IEC 60679-5-2023 Evaluating the quality of quartz crystal oscillators Part 5: Partial Specification Qualification
KS B ISO 8041-1:2019 Human response to vibration — Measuring instrumentation — Part 1: General purpose vibration meters
KS C IEC 60679-3:2021 Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections

German Institute for Standardization, liquid oscillator

DIN EN ISO 15212-2 Berichtigung 1:2009-07 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002); German version EN ISO 15212-2:2002, Corrigendum to DIN EN ISO 15212-2:2002-07; German version EN ISO 15212-2:2002/AC:2009
DIN EN ISO 15212-2:2002-07 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002); German version EN ISO 15212-2:2002
DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
DIN EN ISO 15212-1 Berichtigung 1:2009-07 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998); German version EN ISO 15212-1:1999, Corrigendum to DIN EN ISO 15212-1:1999-06; German version EN ISO 15212-1:1999/AC:2009
DIN EN ISO 15212-1:1999-06 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998); German version EN ISO 15212-1:1999
DIN IEC 60679-2:1997-09 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
DIN EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
DIN EN 169200:1996-05 Sectional specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169200:1995
DIN EN ISO 8041:2006 Human response to vibration - Measuring instrumentation (ISO 8041:2005); English version of DIN EN ISO 8041:2006-06
DIN 53513:1990 Determination of the viscoelastic properties of elastomers on exposure to forced vibration at non-resonant frequencies
DIN EN 60747-16-5:2021-08 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013 + A1:2020 + COR1:2020); German version EN 60747-16-5:2013 + A1:2020 / Note: DIN EN 60747-16-5 (2014-04) remains valid alongside this standard until 2023...
DIN EN 169201:1996-05 Blank detail specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169201:1995
DIN EN 60679-1:2008 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2007); German version EN 60679-1:2007
DIN EN 60679-5:1999-05 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification; qualification approval (IEC 60679-5:1998); German version EN 60679-5:1998
DIN 53019-4:2016 Rheometry - Measurement of rheological properties using rotational rheometers - Part 4: Oscillatory rheology
DIN 53019-4:2016-10 Rheometry - Measurement of rheological properties using rotational rheometers - Part 4: Oscillatory rheology
DIN EN 60747-16-5/A1:2019 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/649/CD:2019); Text in German and English
DIN EN ISO 8041-1:2017-10 Human response to vibration - Measuring instrumentation - Part 1: General purpose vibration meters (ISO 8041-1:2017); German version EN ISO 8041-1:2017
DIN EN 60679-4:1998-11 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998
DIN EN 60679-4-1:1998-12 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification; capability approval (IEC 60679-4-1:1998); German version EN 60679-4-1:1998 / Note: Applies in conjunction with DIN EN 60679-1 (2008-02), DIN EN 60679-4 (1...
DIN EN 60679-5-1:1999-05 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification; qualification approval (IEC 60679-5-1:1998); German version EN 60679-5-1:1998 / Note: Applies in conjunction with DIN EN 60679-1 (1998-09), DIN EN 60679-5...
DIN 51810-4:2021 Testing of lubricants - Determination of the consistency of metal saponified lubricating greases using an oscillatory rheometer with a cone/plate system
DIN 51810-4:2021-04 Testing of lubricants - Determination of the consistency of metal saponified lubricating greases using an oscillatory rheometer with a cone/plate system
DIN EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998

ES-UNE, liquid oscillator

UNE-EN ISO 15212-2:2002/AC:2010 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002/Cor 1:2008)
UNE-EN ISO 15212-1:1999/AC:2010 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)
UNE-EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
UNE-EN ISO 8041-1:2018 Human response to vibration - Measuring instrumentation - Part 1: General purpose vibration meters (ISO 8041-1:2017)
UNE-EN 60679-4:1998 QUARZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 4: SECTORIAL SPECIFICATION. CAPABILITY APPROVAL. (Endorsed by AENOR in June of 1998.)
UNE-EN 60679-5:1998 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5: SECTIONAL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.)

未注明发布机构, liquid oscillator

BS EN ISO 15212-2:2002(2009) Oscillation - typedensity meters — Part 2 : Process instruments for homogenous liquids
DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
BS EN ISO 15212-1:1999(2009) Oscillation - typedensity meters — Part 1 : Laboratory instruments

Professional Standard - Education, liquid oscillator

JY 0018-1990 Demonstrator of electromagnetic oscillation

工业和信息化部, liquid oscillator

HG/T 3121-2017 Disk Oscillating Vulcanizer
JC/T 2419-2017 Potassium titanyl phosphate crystal for optical parametric oscillation

International Organization for Standardization (ISO), liquid oscillator

ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids
ISO 15212-2:2002/cor 1:2008 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids; Technical Corrigendum 1
ISO 15212-1:1998 Oscillation-type density meters - Part 1: Laboratory instruments
ISO 3159:2009 Timekeeping instruments - Wrist-chronometers with spring balance oscillator
ISO 3159:1976 Timekeeping instruments; Wrist-chronometers with spring balance oscillator
ISO 8041:2005 Human response to vibration - Measuring instrumentation
ISO 8041:1990 Human response to vibration; measuring instrumentation
ISO 15212-1:1998/cor 1:2008 Oscillation-type density meters - Part 1: Laboratory instruments; Technical Corrigendum 1
ISO 8041:1990/Amd 1:1999 Human response to vibration - Measuring instrumentation; Amendment 1
ISO 8041:1990/Cor 1:1993 Human response to vibration; measuring instrumentation; technical corrigendum 1
ISO 23350:2021 Hydrometry — Catching-type liquid precipitation measuring gauges

European Committee for Standardization (CEN), liquid oscillator

EN ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids (ISO 15212-2:2002)
EN ISO 15212-2:2002/AC:2009 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002/Cor 1:2008)
EN ISO 15212-1:1999 Oscillation-Type Density Meters - Part 1: Laboratory Instruments
EN ISO 15212-1:1999/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)
EN ISO 8041:2005 Human response to vibration - Measuring instrumentation (ISO 8041:2005)
DD ENV 28041-1993 Human Response to Vibration - Measuring Instrumentation (ISO 8041 : 1990)

Taiwan Provincial Standard of the People's Republic of China, liquid oscillator

CNS 12253-1988 Quartz Crystal Units For Oscillators (For 1 MHz -- 125 MHz)
CNS 12254-1988 Quartz Crystal Units for Oscillators (for 200-1000 kHz)
CNS 12256-1988 Ovens for Quartz Crystal Units
CNS 11624-1986 Crystal Unit Quartz CR-84/U for Radio Oscillation
CNS 3770-1989 Dimensions and Winding of Intermediate Frequency Transformer and Oscillator Coil for Transistor Radio

British Standards Institution (BSI), liquid oscillator

BS EN ISO 15212-2:2002 Oscillation-type density meters — Part 2: Process instruments for homogenous liquids
BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
BS ISO 3159:2009 Timekeeping instruments. Wrist-chronometers with spring balance oscillator
BS ISO 3159:2010 Timekeeping instruments - Wrist-chronometers with spring balance oscillator
BS EN 60747-16-5:2013 Semiconductor devices. Microwave integrated circuits. Oscillators
BS EN 60747-16-5:2013+A1:2020 Semiconductor devices - Microwave integrated circuits. Oscillators
BS ISO 6502-2:2018 Tracked Changes. Rubber. Measurement of vulcanization characteristics using curemeters. Oscillating disc curemeter
BS EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality. Generic specification
BS EN ISO 8041:2005 Human response to vibration - Measuring instrumentation
BS EN 60444-9:2007 Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
BS IEC 62860-1:2013 Test methods for the characterization of organic transistor-based ring oscillators
BS 9620:1975 Specification for quartz crystal oscillators of assessed quality: generic data and methods of test
BS EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections
19/30387856 DC BS EN 17408. Determination of the flowability and application behaviour of viscoelastic adhesives using the oscillatory rheometry
BS ISO 6721-10:2001 Plastics - Determination of dynamic mechanical properties - Complex shear viscosity using a parallel-plate oscillatory rheometer
BS 9625:1983 Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level
BS EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Capability approval
BS EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Qualification approval
BS EN 169101:1995 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval)
BS EN 169100:1993 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
19/30393894 DC BS EN 60747-16-5 AMD1. Semiconductor devices. Part 16-5. Microwave integrated circuits. Oscillators
BS EN 169000:1993 Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
BS EN 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Capability approval
BS EN 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Qualification approval

Lithuanian Standards Office , liquid oscillator

LST EN ISO 15212-2:2003 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002)
LST EN ISO 15212-2:2003/AC:2009 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002/Cor 1:2008)
LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)
LST EN 169000+A1-2001 Generic Specification: Quartz crystal controlled oscillators
LST EN ISO 15212-1:2000 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998)
LST EN 168200-2002/A1-2005 Sectional specification. Quartz crystal units (qualification approval)
LST EN 168200-2002 Sectional specification. Quartz crystal units (qualification approval)
LST EN 169100-2003 Sectional specification: Quartz crystal controlled oscillators (Capability approval)
LST EN 168201-2001 Blank detail specification. Quartz crystal units (qualification approval)
LST EN 168101-2001 Blank detail specification. Quartz crystal units (capability approval)
LST EN ISO 15212-1:2000/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)
LST EN 169101-2003 Blank detail specification: Quartz crystal controlled oscillators (Capability approval)
LST EN 17408-2020 Determination of the flowability and application behaviour of viscoelastic adhesives using the oscillatory rheometry
LST EN ISO 8041:2005 Human response to vibration - Measuring instrumentation (ISO 8041:2005)
LST EN 60679-1-2007 Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification (IEC 60679-1:2007)
LST EN 60747-16-5/A1-2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013/A1:2020)

Defense Logistics Agency, liquid oscillator

DLA A-A-59433 VALID NOTICE 1-2004 MIXERS, LIQUID, REVOLVING SHAFT AND AGITATOR TYPES
DLA A-A-59433-1999 MIXERS, LIQUID, REVOLVING SHAFT AND AGITATOR TYPES
DLA MIL-PRF-55310/21 F-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 60.0 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
DLA MIL-PRF-55310/21 G-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 60.0 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
DLA SMD-5962-81020 REV F-2006 MICROCIRCUIT, DIGITAL, CMOS, MONOSTABLE/ASTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-97553 REV A-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-87711 REV A-2001 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, DUAL MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA DSCC-DWG-05014 REV A-2013 OSCILLATOR, CRYSTAL CONTROLLED, 5 VOLT, ENABLE/TRI-STATE, 312KHZ TO 120 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
DLA SMD-5962-77055 REV B-1981 MICROCIRCUITS, DIGITAL, CMOS DUAL, RETRIGGERABLE/RESETTABLE MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-82022 REV A-2001 MICROCIRCUIT, DIGITAL, CMOS, HEX D FLIP-FLOP, MONOLITHIC SILICON
DLA DSCC-DWG-05013 REV A-2013 OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 312KHZ TO 170 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT

AENOR, liquid oscillator

UNE-EN ISO 15212-2:2003 Osscilation-type density meters. Part 2: Process instruments for homogenous liquids. (ISO 15212-2:2002)
UNE-EN ISO 15212-1:1999 OSCILLATION-TYPE DENSITY METERS. PART 1: LABORATORY INSTRUMENTS (ISO 15212-1:1999)
UNE-EN ISO 8041:2006 Human response to vibration - Measuring instrumentation (ISO 8041:2005)

Electronic Components, Assemblies and Materials Association, liquid oscillator

ECA 417-A-1991 Crystal Outlines

Japanese Industrial Standards Committee (JISC), liquid oscillator

JIS T 5504:2021 Dental rotary and oscillating instruments -- Shanks
JIS C 6701:1995 Quartz crystal units for oscillators
JIS C 6710:1995 General rules of quartz crystal controlled oscillators
JIS C 6710:1999 Generic specification of crystal controlled oscillators
JIS C 6710:2007 Generic specification of crystal controlled oscillators
JIS K 6296-2:2023 Rubber -- Measurement of vulcanization characteristics using curemeters -- Part 2: Oscillating disc curemeter

TR-TSE, liquid oscillator

TS 2319-1976 Quartz Crystal Units For Oscilators
TS 3436-1979 RUBBER - MEASUREMENT OF VULCANIZATION CHARACTERISTICS WITHE THE OSCILLATING DISC CUREMETER
TS 2268-1976 Quartz Crystal Unit Holders For Oscillators And Pin Connectiors

Professional Standard - Electron, liquid oscillator

SJ/Z 9155.2-1987 Quartz crystal oscillator Part 2: Guide to the use of quartz crystal oscillator
SJ 1852-1981 Terms for quartz crystal controlled oscillators
SJ 51648/5-1997 Type ZC 503,oscillators,crystal,detail specification for
SJ/T 10638-1995 Measurement methods for quartz crystal oscillators
SJ 51648.4-1995 Oscillator,crystal,type ZC505E,detail specification for
SJ 51648/1-1994 Oscillator,crystal,Type ZF507 detail specification for
SJ 51648/2-1994 Oscillator,crystal Type ZD509,detail specification for
SJ/T 9570.3-1995 Quality grading standard for quartz crystal oscillators
SJ 51648/3-1994 Oscillator,crystal,Type ZC505(A～D) detail specification for
SJ 2073-1982 Cores for IF transformers and medium wave oscillator coil of transistor radio receivers
SJ/T 11256-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 1:Generic specification
SJ/T 10685-1995 Intermediate-frequency transformers and oscillator coils for transistorized amplitude modulation broadcast receivers
SJ/T 11257-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 5:Sectional specification Qualification approval
SJ 2072-1982 Cores for IF transformers of transistor and for short wave oscillator coils of radio receivers
SJ/Z 9155.1-1987 Quartz crystal controlled oscillators--Part 1: General information,test conditions and methods

International Electrotechnical Commission (IEC), liquid oscillator

IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60747-16-5:2013+AMD1:2020 CSV Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60679-1:1997 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 62860-1:2013 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
IEC 60679-3:1989 Quartz crystal controlled oscillators; part 3: standard outlines and lead connections
IEC 60679-1/AMD1:2002 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification; Amendment 1
IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60747-16-5:2013/AMD1:2020/COR1:2020 Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60679-1:1980 Quartz crystal controlled oscillators. Part 1 : General information, test conditions and methods
IEC 60679-1/AMD1:1985 Quartz crystal controlled oscillators. Part 1 : General information, test conditions and methods
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 60679-1/AMD2:2003 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification; Amendment 2

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, liquid oscillator

GB/T 32710.13-2016 Safety requirements for environmental testing and conditioning equipment.Part 13:Shakers, shaking water baths and shaking incubators
GB 12274-1990 Quartz crystal controlled oscillators Generic specificatoin for
GB/T 12275-1990 The rule of type designation for quarz crystal oscillators
GB 12275-1990 Quartz Crystal Oscillator Model Nomenclature
GB/T 9869-1997 Rubber--Measurement of vulcanization characteristics with the oscillating disc curemeter
GB/T 9869-2014 Rubber.Measurement of vulcanization characteristics with the oscillating disc curemeter
GB/T 12274-1990 Quartz crystal controlled oscillators--Generic specification for
GB 5086.2-1997 Test method standard for leaching toxicity of solid wastes--Horizontal vibration extraction procedure
GB/T 20870.5-2023 Semiconductor Devices Part 16-5: Microwave Integrated Circuit Oscillators
GB/T 12274.1-2012 Quartz crystal controlled oscillators of assessed quality.Part 1:Generic specification
GB/T 23716-2009 Human response to vibration.Measuring instrumentation

National Metrological Verification Regulations of the People's Republic of China, liquid oscillator

JJG 180-2002 Verification Regulation of Crystal Oscillators inside the Electrical Measuring Instruments
JJG(电子) 01002-1989 QF16101GAJF 5MHz Voltage Controlled Crystal Oscillator Verification Regulations
JJG 1058-2010 Verification Regulation of Laboratory Oscillation-type Liquid Density meters
JJG 370-2019 On-line Oscillation Tube Liquid Density Meters

National Metrological Technical Specifications of the People's Republic of China, liquid oscillator

JJF 1984-2022 Specification for calibration of quartz crystal oscillators in electronic measuring instruments
JJF(机械) 1013-2018 Calibration specification for impulse oscillating current interference tester
JJF(机械)1013-2018 Calibration specification for impulse oscillating current interference tester
JJF 1866-2020 Calibration Specification for Immersion Oscillation-type Electronic Liquid Density Meters

Military Standard of the People's Republic of China-General Armament Department, liquid oscillator

GJB 1648-1993 General specifications for crystal oscillators
GJB 1648-2-2011 Genenral specification for crystal oscillators
GJB 1648A-2011 Genenral specification for crystal oscillators
GJB 1648/1-2011 Detail specification for type ZA511(ZPB-5)crystal oscillator
GJB 1648/2-2011 Detail specification for type ZC547(ZWB-1)temperature compensated crystal oscillators
GJB/Z 45.2-1993 Military piezoelectric device series spectrum crystal oscillator
GJB 1648/3-2011 Detail specification for type ZC545(ZWC-6B-1/2)temperature compensated crystal oscillator

KR-KS, liquid oscillator

KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS B ISO 3159-2008 Timekeeping instruments－Wrist-chronometers with spring balance oscillator
KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS C IEC 62860-1-2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
KS C IEC 62860-1-2018(2023) Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
KS B ISO 8041-2013 Human response to vibration－Measuring instrumentation
KS C IEC 60679-4-2018 Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
KS C IEC 60679-5-2018 Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
KS B ISO 8041-1-2019 Human response to vibration — Measuring instrumentation — Part 1: General purpose vibration meters
KS C IEC 60679-5-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
KS C IEC 60679-4-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
KS C IEC 60679-3-2021 Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections

Group Standards of the People's Republic of China, liquid oscillator

T/HEBQIA 135-2022 OC1409 Constant Temperature Crystal Oscillator

U.S. Military Regulations and Norms, liquid oscillator

ARMY MIL-PRF-55310/29 C-2011 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.2 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, HCMOS
ARMY MIL-PRF-55310/34 C-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/38 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/28 C VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
ARMY MIL-PRF-55310/30 D VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
ARMY QPL-55310-70-2008 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-71-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-74-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-55310/36 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
ARMY MIL-PRF-55310/27 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS
ARMY MIL-PRF-55310/40 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
ARMY MIL-PRF-55310/27 D VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
ARMY MIL-PRF-55310/32 A-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHZ THROUGH 125 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
ARMY QPL-55310-69-2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-76-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-81-2013 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-83-2013 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-84-2013 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-55310/28 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-PRF-55310/8 J-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 Hz THROUGH 50 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-PRF-55310/35-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 133 MHz, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
ARMY MIL-PRF-55310/18 F-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 Hz THROUGH 15.0 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS
ARMY MIL-PRF-55310/25 D-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 25 MHz THROUGH 175 MHz, HERMETIC SEAL, SQUARE WAVE, EMITTER COUPLED LOGIC
ARMY MIL-PRF-55310/30 D-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 450 kHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/12 H-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHz THROUGH 10 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS
ARMY MIL-PRF-55310/37 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
ARMY MIL-PRF-55310/27 D-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS
ARMY MIL-PRF-55310/32 B-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHz THROUGH 125 MHz, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
ARMY MIL-PRF-55310/31 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHz THROUGH 200 MHz, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
ARMY MIL-PRF-55310/33 B-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
ARMY MIL-PRF-55310/34 B-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/38 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/35 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 133 MHz, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
ARMY MIL-PRF-55310/36 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
ARMY MIL-PRF-55310/39 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 133 MHz, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
ARMY MIL-PRF-55310/40 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS

SE-SIS, liquid oscillator

SIS SEN 43 60 01-1964 Quartz crystal units for oscillators

IEC - International Electrotechnical Commission, liquid oscillator

PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)

CENELEC - European Committee for Electrotechnical Standardization, liquid oscillator

EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
EN 169200:1995 Sectional Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
EN 169201:1995 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
EN 60679-1:1998 Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification (Incorporates Amendment A1: 2002)

PL-PKN, liquid oscillator

PN T01029-1985 Quartz crystal controlled oscillators Terminology
PN-EN 17408-2021-02 E Determination of the flowability and application behaviour of viscoelastic adhesives using the oscillatory rheometry
PN N01355-1991 Vibrations. Measuring instrumentation for measuring human response to vibrations. Requirements and tests

American Water Works Association (AWWA), liquid oscillator

AWWA C713-2015 Cold-Water Meters - Fluidic-Oscillator Type
AWWA C713-2010 Cold-Water Meters - Fluidic-Oscillator Type

American National Standards Institute （ANSI), liquid oscillator

ANSI/AWWA C713-2015 Cold-Water Meters - Fluidic-Oscillator Type
ANSI/IEEE 1620.1:2006 Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

VN-TCVN, liquid oscillator

TCVN 6094-2010 Rubber.Measurement of vulcanization characteristics with the oscillating disc curemeter

RO-ASRO, liquid oscillator

STAS 9294-1982 HUBBEH Measurement of vulcanisation characteristics with oscillating disc curemeter
STAS SR ISO 3159:1994 Timekeeping instruments. Wrist-chronometers with spring balance oscillator

European Standard for Electrical and Electronic Components, liquid oscillator

EN 169000:1992 Generic specification: quartz crystal controlled oscillatores

Professional Standard - Aerospace, liquid oscillator

QJ 3047-1998 Detailed specifications for Z602 voltage controlled crystal oscillators
QJ 3046-1998 Detailed specifications for Z601 voltage controlled crystal oscillators
QJ 2658-1994 Detail specification for semiconductor integrated circuit TTL-megahertz main frequency oscillator MF05

YU-JUS, liquid oscillator

JUS G.S2.118-1984 Rubber. Measurement of vulcanization characteristics with the oscillating disc curemeter

CZ-CSN, liquid oscillator

CSN 35 8490 Z1-1996
CSN 35 8490-1965 Piezoelectric crystal units for oscillators and filters
CSN ISO 8041:1992 Human response to vibration — Measuring instrumentatíon
CSN 25 7501-1966 Volumetric measuring apparatuses for liquids. Common regulations

IN-BIS, liquid oscillator

United States Navy, liquid oscillator

NAVY MIL-PRF-2940 D-1999 SNUBBERS, FLUID PRESSURE, INSTRUMENT PROTECTION

American Society for Testing and Materials (ASTM), liquid oscillator

ASTM D7271-06(2012) Standard Test Method for Viscoelastic Properties of Paste Ink Vehicle Using an Oscillatory Rheometer
ASTM D7483-21 Standard Test Method for Determination of Dynamic Viscosity and Derived Kinematic Viscosity of Liquids by Oscillating Piston Viscometer
ASTM D7483-20a Standard Test Method for Determination of Dynamic Viscosity and Derived Kinematic Viscosity of Liquids by Oscillating Piston Viscometer
ASTM D7483-20 Standard Test Method for Determination of Dynamic Viscosity and Derived Kinematic Viscosity of Liquids by Oscillating Piston Viscometer
ASTM D7483-13a(2017) Standard Test Method for Determination of Dynamic Viscosity and Derived Kinematic Viscosity of Liquids by Oscillating Piston Viscometer
ASTM D3987-85(2004) Standard Test Method for Shake Extraction of Solid Waste with Water
ASTM D3987-85(1999) Standard Test Method for Shake Extraction of Solid Waste with Water
ASTM D2084-07 Standard Test Method for Rubber Property-Vulcanization Using Oscillating Disk Cure Meter
ASTM D2084-01 Standard Test Method for Rubber Property-Vulcanization Using Oscillating Disk Cure Meter
ASTM D3987-06 Standard Test Method for Shake Extraction of Solid Waste with Water
ASTM D3987-12 Standard Practice for Shake Extraction of Solid Waste with Water
ASTM D7271-06(2020) Standard Test Method for Viscoelastic Properties of Paste Ink Vehicle Using an Oscillatory Rheometer
ASTM D2084-11 Standard Test Method for Rubber Propertymdash;Vulcanization Using Oscillating Disk Cure Meter
ASTM D7271-06 Standard Test Method for Viscoelastic Properties of Paste Ink Vehicle Using an Oscillatory Rheometer
ASTM D2981-94(1998) Standard Test Method for Wear Life of Solid Film Lubricants in Oscillating Motion
ASTM D2981-94(2019) Standard Test Method for Wear Life of Solid Film Lubricants in Oscillating Motion
ASTM D7217-11 Standard Test Method for Determining Extreme Pressure Properties of Solid Bonded Films Using a High-Frequency, Linear-Oscillation (SRV) Test Machine

Professional Standard - Environmental Protection, liquid oscillator

HJ 557-2010 Solid waste.Extraction procedure for leaching toxicity.Horizontal vibration method

Professional Standard - Electricity, liquid oscillator

DL/T 1988-2019 Sulfur hexafluoride gas density measurement method (U-tube oscillation method)
DL/T 849.5-2004 General technical specification of test instruments used for power equipments Part 5: oscillating wave high voltage generator
DL/T 849.5-2019 General Specifications for Special Test Instruments for Power Equipment Part 5: Oscillating Wave High Voltage Generator

RU-GOST R, liquid oscillator

GOST 16165-1980 Transistor ultrasonic osillators for technological installations. General specifications
GOST 18604.15-1977 Bipolar microwave oscillator transistors. Techniques for measuring critical current
GOST 29179-1991 Electromagnetic compatibility of technical means. HUF equipment. Methods of measurements for side oscillations
GOST 4.166-1985 Product-quality index system. Analysers of liquid. Nomenclature of indices

国家市场监督管理总局、中国国家标准化管理委员会, liquid oscillator

GB/T 5832.4-2020 Gas analysis—Determination of moisture—Part 4: The method of quartz crystal oscillation
GB/T 12274.4-2021 Quartz crystal controlled oscillators of assessed quality—Part 4: Sectional specification—Capability approval

European Committee for Electrotechnical Standardization（CENELEC）, liquid oscillator

EN 169101:1993 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Capability Approval) (Remains Current)
EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
EN 169000:1998 Generic Specification: Quartz Crystal Controlled Oscillators (Incorporates Amendment A1: 1998)

CH-SNV, liquid oscillator

SN EN 17408-2021 Determination of the flowability and application behaviour of viscoelastic adhesives using the oscillatory rheometry

IT-UNI, liquid oscillator

UNI EN 17408-2021 Determination of the flowability and application behaviour of viscoelastic adhesives using the oscillatory rheometry

NL-NEN, liquid oscillator

NVN-ISO 8041:1993 Human response to vibration. Measuring instrumentation (ISO 8041:1990)

Institute of Electrical and Electronics Engineers (IEEE), liquid oscillator

IEC 62860-1:2013*IEEE Std 1620.1:2006 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEEE/IEC 62860-1-2013 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEEE Std 1620.1-2006 IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
IEC 62860-1:2013(E) IEEE Std. 1620.1-2006 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEEE P1871.1/D4, April 2014 IEEE Draft Recommended Practice for Using IEEE 1671.2 Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments Such as Waveform Generators, Digitizers, External Oscillators, and Up & Down Converters
IEEE Std P1620.1/D8, Jul 2005 IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

AT-OVE/ON, liquid oscillator

OVE EN 60747-16-5-2021 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (german version)

ESDU - Engineering Sciences Data Unit, liquid oscillator

ESDU 83010 A-1992 Oscillatory aerodynamics of slender bodies (ASSOCIATED SOFTWARE: ESDUPAC A8310 AVAILABLE THROUGH SUBSCRIPTION ONLY)

AT-ON, liquid oscillator

ONORM ENV 28041-1994 Human response to vibration. Measuring instrumentation (ISO 8041:1990)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., liquid oscillator

IEEE 1620.1-2006 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (IEEE Computer Society)