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Semiconductor Environmental Test Equipment

Semiconductor Environmental Test Equipment, Total:500 items.

In the international standard classification, Semiconductor Environmental Test Equipment involves: Industrial automation systems, Environmental testing, Semiconductor devices, Integrated circuits. Microelectronics, Shipbuilding and marine structures in general, Linear and angular measurements, Languages used in information technology, Electrical and electronic testing, Photography, Telecommunication terminal equipment, Telecommunications in general, Telecontrol. Telemetering, Aircraft and space vehicles in general, Standardization. General rules, Vibrations, shock and vibration measurements, Interface and interconnection equipment, Integrated Services Digital Network (ISDN), Electricity. Magnetism. Electrical and magnetic measurements, Telecommunication systems, Insulation, Electromechanical components for electronic and telecommunications equipment, On-board equipment and instruments, Analytical chemistry, Ceramics, Electronic component assemblies, Components for electrical equipment, Electrical equipment for working in special conditions, Alarm and warning systems, TELECOMMUNICATIONS. AUDIO AND VIDEO ENGINEERING, Aerospace electric equipment and systems, Piezoelectric and dielectric devices, Applications of information technology, Medical equipment, Hospital equipment, Explosion protection, Optoelectronics. Laser equipment, Electrical engineering in general, Radiocommunications.


International Electrotechnical Commission (IEC), Semiconductor Environmental Test Equipment

  • IEC 62526:2007 Standard for extensions to Standard Test Interface Language (STIL) for semiconductor design environments
  • IEC 60749-1:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
  • IEC 60749-8:2002/COR2:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
  • IEC 60749-13:2002 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
  • IEC 60749-13:2002/COR1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
  • IEC 60749-30:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
  • IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
  • IEC 60749-19:2003/AMD1:2010 Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test
  • IEC 62047-3:2006 Semiconductor devices - Micro electromechanical devices - Part 3: Thin film standard test piece for tensile-testing
  • IEC 62047-37:2020 Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application
  • IEC 62047-36:2019 Semiconductor devices – Micro-electromechanical devices – Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
  • IEC 60068-3-3:1991 Environmental testing; part 3: guidance; seismic test methods for equipments
  • IEC 60749-34:2005 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
  • IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
  • IEC 60749-34:2004 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
  • IEC 60079-4:1975 Electrical apparatus for explosive gas atmospheres. Part 4 : Method of test for ignition temperature

German Institute for Standardization, Semiconductor Environmental Test Equipment

  • DIN IEC 60068-3-3:1993 Environmental testing; seismic test methods for equipments; guidance; identical with IEC 60068-3-3:1991
  • DIN EN 300019-2-6:2004 Equipment Engineering (EE) - Evironmental conditions and environmental tests for telecommunications equipment - Part 2-6: Specification of environmental tests; Ship environments (Endorsement of the English version EN 300019-2-6 V3.0.0 (2002-12) as German
  • DIN EN 300019-2-1:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-1: Specification of environmental tests; Storage (Endorsement of the English version EN 300019-2-1 V2.1.2 (2000-09) as German standard)
  • DIN EN 300019-2-0:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-0: Specification of environmental tests; Introduction (Endorsement of the English version EN 300019-2-0 V2.1.2 (2003-05) as German stan
  • DIN EN 300019-2-8:2000 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-8: Specification of environmental tests; stationary use at underground locations (Endorsement of the English version EN 300019-2-8 V 2.
  • DIN EN 300019-2-7:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-7: Specification of environmental tests; Portable and non-stationary use (Endorsement of the English version EN 300019-2-7 V3.0.0 (2002
  • DIN EN 300019-2-1:2016 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-1: Specification of environmental tests; Storage (Endorsement of the English version EN 300 019-2-1 V2.2.1 (2014-10) as German stan
  • DIN EN 300019-2-5:2004 Equipment Engineering (EE) - Evironmental conditions and environmental tests for telecommunications equipment - Part 2-5: Specification of environmental tests; Ground vehicle installations (Endorsement of the English version EN 300019-2-5 V3.0.0 (2002-12)
  • DIN EN 300019-2-4:2004 Equipment Engineering (EE) - Evironmental conditions and environmental tests for telecommunications equipment - Part 2-4: Specification of environmental tests; Stationary use at non-weatherprotected locations (Endorsement of the English version EN 300019-
  • DIN EN 300019-2-3:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-3: Specification of environmental tests; Stationary use at weather protected locations (Endorsement of the English version EN 300019-2-
  • DIN EN 300019-1-6:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-6: Classification of environmental conditions; Ship environments (Endorsement of the English version EN 300019-1-6 V2.1.4 (2003-04) as
  • DIN EN 62047-3:2007 Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006); German version EN 62047-3:2006
  • DIN EN 300019-1-7:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-7: Classification of environmental conditions; Portable and non-stationary use (Endorsement of the English version EN 300019-1-7 V2.1.4
  • DIN EN 300019-1-0:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-0: Classification of environmental conditions; Introduction (Endorsement of the English version EN 300019-1-0 V2.1.2 (2003-05) as Germa
  • DIN EN 300019-1-1:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-1: Classification of environmental conditions; Storage (Endorsement of the English version EN 300019-1-1 V2.1.4 (2003-04) as German sta
  • DIN EN 300019-1-2:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-2: Classification of environmental conditions; Transportation (Endorsement of the English version EN 300019-1-2 V2.1.4 (2003-04) as Ger
  • DIN EN 300019-1-8:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-8: Classification of environmental conditions; Stationary use at underground locations (Endorsement of the English version EN 300019-1-
  • DIN EN 50130-5:2012 Alarm systems - Part 5: Environmental test methods; German version EN 50130-5:2011
  • DIN EN 300019-1-3:2016 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-3: Classification of environmental conditions; Stationary use at weatherprotected locations (Endorsement of the English version EN
  • DIN ETS 300019-1-4/A1:1998 Equipment engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-4: Classification of environmental conditions; stationary use at non-weatherprotected locations; Amendment A1; English version ETS 3000
  • DIN EN 300019-1-3:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-3: Classification of environmental conditions; Stationary use at weatherprotected locations (Endorsement of the English version EN 3000
  • DIN EN 300019-1-1:2016 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-1: Classification of environmental conditions; Storage (Endorsement of the English version EN 300 019-1-1 V2.2.1 (2014-04) as Germa
  • DIN EN 300019-1-2:2016 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-2: Classification of environmental conditions; Transportation (Endorsement of the English version EN 300 019-1-2 V2.2.1 (2014-04) a
  • DIN EN 300019-1-5:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-5: Classification of environmental conditions; Ground vehicle installations (Endorsement of the English version EN 300019-1-5 V2.1.4 (2
  • DIN EN 300019-1-4:2016 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-4: Classification of environmental conditions; Stationary use at non-weatherprotected locations (Endorsement of the English version
  • DIN EN 300019-1-4:2004 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-4: Classification of environmental conditions; Stationary use at non-weatherprotected locations (Endorsement of the English version EN
  • DIN EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003); German version EN 60749-25:2003

Korean Agency for Technology and Standards (KATS), Semiconductor Environmental Test Equipment

  • KS C IEC 62526-2015(2020) Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
  • KS C 6049-1980(2020) Environmental Testing Methods and Endurance Testing Methods for Semiconductor Integrated Circuits
  • KS C 6046-1978(2001) ENVIRONMENTAL TESTING METHODS AND ENDURANCE TESTING METHODS FOR DISCRETE SEMICONDUCTOR DEVICES
  • KS C 6046-1986 ENVIRONMENTAL TESTING METHODS AND ENDURANCE TESTING METHODS FOR DISCRETE SEMICONDUCTOR DEVICES
  • KS C IEC 62526:2015 Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
  • KS C IEC 60068-3-3:2020 Environmental testing — Part 3-3: Guidance seismic test methods for equipments
  • KS C IEC 60749-13:2002 Semiconductor devices-Mechanical and climatic test methods-Part 13:Salt atmosphere
  • KS C IEC 60749-34:2006 Semiconductor devices-Mechanical and climatic test methods-Part 34:Power cycling
  • KS C IEC 60749-34:2017 Semiconductor devices-Mechanical and climatic test methods-Part 34:Power cycling
  • KS W 0811-2004 Environmental test methods for aerospace equipment
  • KS B ISO 10813-1:2018 Vibration generating machines — Guidance for selection — Part 1: Equipment for environmental testing
  • KS C IEC 60068-3-3:2001 Environmental testing-Part 3:Guidance seismic test methods for equipments
  • KS W 0811-2004(2019) Environmental test methods for aerospace equipment
  • KS W 0926-2014 Environmental tests for aircraft equipment - Insulation resistance and high voltage tests for electrical equipment
  • KS C 0915-1995 Electrical apparatus for explosive gas atmospheres-Construction and verification test of flameproof enclosures of electrical apparatus
  • KS W 0924-1999 Environmental tests for aircraft equipment-Steady- ­state acceleration
  • KS W 0923-1997(2002) AIRBORNE EQUIPMENT - ENVIRONMENTAL CONDITIONS AND TEST PROCEDURES
  • KS W 0926-1997(2012) Environmental tests for aircraft equipment - Insulation resistance and high voltage tests for electrical equipment
  • KS V 0818-2013 General rules for environmental test of marine electrical apparatus
  • KS C 0912-2002 TEST METHODS ON ELECTRICAL APPARATUS FOR EXPLOSIVE GAS ATMOSPHERES IN GENERAL INDUSTRY
  • KS W ISO 2669:2007 Environmental tests for aircraft equipment-Steady-state acceleration
  • KS W ISO 2669:2018 Environmental tests for aircraft equipment-Steady-state acceleration
  • KS W 0926-1997 Environmental tests for aircraft equipment - Insulation resistance and high voltage tests for electrical equipment
  • KS C 0915-1995(2000) ELECTRICAL APPARATUS FOR EXPLOSIVE GAS ATMOSPHERES-CONSTRUNCTION AND VERTIFICATION TEST OF FLAMEPROOF ENCLOSURES OF ELECTRICAL APPARATUS
  • KS W 0925-2013 Environmental tests for aircraft equipment-Part 3.4 : Acoustic vibration
  • KS W ISO 7137:2018 Aircraft-Environmental conditions and test procedures for airborne equipment
  • KS C IEC 60749-34-2017(2022) Semiconductor devices-Mechanical and climatic test methods-Part 34:Power cycling

Japanese Industrial Standards Committee (JISC), Semiconductor Environmental Test Equipment

  • JIS C 7021:1977 Environmental testing methods and endurance testing methods for discrete semiconductor devices
  • JIS C 7022:1979 Environmental testing methods and endurance testing methods for semiconductor integrated circuits
  • JIS W 0801:1983 Environmental test methods for aerospace equipment
  • JIS W 0812:2004 Airborne equipment -- Environmental conditions and test procedures
  • JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
  • JIS C 0051:2002 Environmental testing -- Part 2-21: Tests -- Test U: Robustness of termination and integral mounting devices
  • JIS W 7004:1981 Testing, environmental, airborne electronic and associated equipment
  • JIS C 0931:1993 Electrical apparatus for explosive gas atmospheres -- Construction and verification test of flameproof enclosures of electrical apparatus
  • JIS W 7002:1981 Environmental conditions and test procedures for airborne equipment and instruments
  • JIS C 60068-3-3:2000 Environmental testing -- Part 3: Guidance Seismic test method for equipments
  • JIS W 0823:1994 Environmental tests for aircraft equipment -- Insulation resistance and high voltage tests for electrical equipment
  • JIS C 0055:2000 Environmental testing -- Part 3: Guidance Seismic test method for equipments
  • JIS W 0812:1993 Airborne equipment -- Environmental conditions and test procedures (RTCA/DC - 160C)

未注明发布机构, Semiconductor Environmental Test Equipment

  • BS IEC 62526:2007(2010) Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
  • GJB 150.4-1986 Environmental test methods for military equipment Low temperature test
  • GJB 4.2-1983 Environmental testing of ship electronic equipment High temperature testing
  • GJB 4.3-1983 Environmental testing of ship electronic equipment Low temperature testing
  • GJB 150.11-1986 Environmental test methods for military equipment Salt spray test
  • GJB 4.4-1983 Environmental testing of ship electronic equipment Low temperature storage testing
  • GJB 4.5-1983 Environmental test of ship electronic equipment Constant humidity and heat test
  • GJB 150.6-1986 Environmental test methods for military equipment temperature-altitude test
  • BS ISO 2678:1985(2022) Environmental tests for aircraft equipment — Insulation resistance and high voltage tests for electrical equipment
  • GJB 150.19-1986 Environmental test methods for military equipment temperature-humidity-altitude test

Taiwan Provincial Standard of the People's Republic of China, Semiconductor Environmental Test Equipment

  • CNS 5070-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Cycle Test for Temperature)
  • CNS 5071-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Cycle Test for Temperature & Humidity)
  • CNS 5076-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Vibration Test)
  • CNS 5073-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Shock Test)
  • CNS 5072-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Sealing Test)
  • CNS 6117-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Damp Heat Test)
  • CNS 5069-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Thermal Shock)
  • CNS 5077-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Terminal Strength)
  • CNS 5547-1988 1
  • CNS 5074-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Free Fall)
  • CNS 5075-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Constant Acceleration)
  • CNS 6118-1988 1
  • CNS 5078-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Salt Mist Spray)
  • CNS 5541-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Continuous Operation Test of Transistor)
  • CNS 5543-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Intermittent Operation Test of Transistor)
  • CNS 6122-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Continuous Applying Voltage Test of Thyristors)
  • CNS 6120-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Continuous Operation Test of Thyristors)
  • CNS 6124-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Intermittent Applying Voltage Test of Thyristors)
  • CNS 6126-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (High Temperature for Applying Voltage Test of Thyristors)
  • CNS 5067-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Test of Soft Solders for Heat Endurance)
  • CNS 5068-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Solderability Testing for Adhesion)
  • CNS 5545-1988 Environmental Testing Methods and Endurance Testing Methods for Discrate Semiconductor Devices Reverse Bias Test of Transistor Under High Temperature)
  • CNS 5542-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Continuous Operation Test of Field Effect Transistor
  • CNS 5544-1988 Environmantal Testing Methods and Endurance Testing Methods for Discrate Semiconductor Devices (Intermittent Operation Test of Fleld Effect Transistor)
  • CNS 5066-1983 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (General Rules)
  • CNS 5546-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Reverse Bias Test of Field Effect Transistor Under High Temperature)
  • CNS 6121-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Continuous Applying Voltage Test of Rectifier Diodes)
  • CNS 5539-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Continuous Operation Test of Constant Voltage Diode)
  • CNS 6119-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Continuous Operation Test of Rectifier Diodes)
  • CNS 6125-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(High Temperature for Applying Voltage Test of Rectifier Diodes)
  • CNS 6123-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Intermittent Appling Voltage Test of Rectifier Diodes)
  • CNS 9589-1982 General Rules of Environmental Testing Method for Automotive Electronic Equipment
  • CNS 5538-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Continuous Operation Test of Small Signal Diodes)

British Standards Institution (BSI), Semiconductor Environmental Test Equipment

  • BS EN 60749-34:2010 Semiconductor devices. Mechanical and climatic test methods. Power cycling
  • BS IEC 62526:2007 Standard for extensions to standard test interface language (STIL) for semiconductor design environments
  • BS EN 60749-44:2016 Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
  • BS IEC 62047-37:2020 Semiconductor devices. Micro-electromechanical devices - Environmental test methods of MEMS piezoelectric thin films for sensor application
  • BS IEC 62047-41:2021 Semiconductor devices. Micro-electromechanical devices. RF MEMS circulators and isolators
  • BS EN 60068-3-3:1991 Environmental testing - Guidance - Environmental testing - Miscellaneous - Guide to seismic test methods for equipment
  • BS IEC 60747-5-13:2021 Semiconductor devices. Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
  • BS EN 60749-34:2004 Semiconductor devices - Mechanical and climatic test methods - Power cycling
  • BS EN 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Temperature cycling
  • BS ISO 10813-1:2023 Vibration generating machines. Guidance for selection - Equipment for environmental testing
  • BS EN 60079-26:2004 Electrical apparatus for explosive gas atmospheres - Part 26: Construction, test and marking of Group Ⅱ Category 1 G electrical apparatus
  • BS EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices - Thin film standard test piece for tensile testing
  • 21/30400636 DC BS ISO 10813-4. Vibration generating machines. Guidance for selection. Part 4. Equipment for multi-axial environmental testing
  • BS EN 60068-2-31:2008 Environmental testing –– Part 2-31: Tests – Test Ec: Rough handling shocks, primarily for equipment-type specimens
  • 3G 229-1993 Schedule for environmental conditions and test procedures for airborne equipment
  • BS EN 60749-15:2011 Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices
  • BS EN 60749-15:2003 Semiconductor devices - Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices
  • BS IEC 62047-36:2019 Semiconductor devices. Micro-electromechanical devices - Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
  • BS EN 60079-18:2004 Electrical apparatus for explosive gas atmospheres. Construction, test and marking of type of protection encapsulation "m" electrical apparatus

Professional Standard-Ships, Semiconductor Environmental Test Equipment

  • CB 1146.6-1996 Environmental testing of ship equipment and impact of engineering guidelines
  • CB 1146.11-1996 Guidelines for environmental testing and engineering of marine equipment mold
  • CB 1146.12-1996 Environmental test and engineering guidelines for marine equipment salt spray
  • CB 1146.17-1996 Environmental Test and Engineering Guidelines for Ship Equipment Ice Accumulation
  • CB 1146.18-1996 Environmental test and engineering guidelines for naval equipment wind speed
  • CB 1146.3-1996 Guidelines for environmental testing and engineering of marine equipment at high temperatures
  • CB 1146.1-1996 General Rules for Environmental Test and Engineering Guidelines for Ship Equipment
  • CB 1146.2-1996 Environmental testing and engineering guidelines for naval equipment at low temperature
  • CB 1146.4-1996 Environmental testing and engineering guidelines for marine equipment damp heat
  • CB 1146.7-1996 Collision between marine equipment environmental test and engineering guidelines
  • CB 1146.14-1996 Guidelines for environmental testing and engineering of ship equipment sand and dust
  • CB 1146.9-1996 Environmental Test and Engineering Guidelines for Marine Equipment Vibration (Sinusoidal)
  • CB 1146.15-1996 Environmental testing and engineering guidelines for marine equipment waterproofing of shells
  • CB 1146.16-1996 Guidelines for environmental testing and engineering of marine equipment solar radiation
  • CB 1146.8-1996 Guidelines for Environmental Testing and Engineering of Ship Equipment Tilting and Rolling
  • CB 1146.13-1985 Environmental test method test Kb for ship equipment: Alternating salt spray

Group Standards of the People's Republic of China, Semiconductor Environmental Test Equipment

Association Francaise de Normalisation, Semiconductor Environmental Test Equipment

  • NF C96-022-13:2002 Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere.
  • NF Z87-019-26*NF ETS 300019-2-6:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 2-6 : specification of environmental tests. Ship environments.
  • NF Z87-019-25:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 2-5 : specification of environmental tests. Ground vehicle installations.
  • NF Z87-019-22:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 2-2 : specification of environmental tests. Transport.
  • NF X10-812:2013 Marine environment - Underwater equipment - Environment tests and recommendations
  • NF Z87-019-20:1995 Equipement engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 2-0 : specification of environmental tests. Introduction.
  • NF Z87-019-27:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 2-7 : specification of environmental tests. Portable and non-stationary use.
  • NF Z87-019-16:1995 Equipement engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 1-6 : classification of environmental conditions. Ship environments.
  • NF Z87-019-2-0*NF EN 300019-2-0:2003 Environnental Engineering (EE) - Environmental conditions and environmental tests for telecommunication equipment - Part 2-0 : Specification of environmental tests - Introduction (V2.1.2)
  • NF Z87-019-2-2:2013 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-2 : specification of environmental tests - Transportation (V2.3.1)
  • NF C96-022-15*NF EN 60749-15:2011 Semiconductor devices - Mechanical and climatic test methods - Part 15 : resistance to soldering temperature for through-hole mounted devices.
  • NF Z87-019-2-4:2013 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-4 : specification of environmental tests - Stationary use at non-weatherprotected locations (V2.3.1)
  • NF Z87-019-11:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 1-1 : classification of environmental conditions. Storage.
  • NF X10-811:1995 Marine environment-Oceanographic instrumentation-Environmental tests and recommendations for equipments in marine atmosphere
  • NF C96-050-3*NF EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices - Part 3 : thin film standard test piece for tensile testing
  • NF Z87-019-21:1995 Equipement engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 2-1 : specification of environmental tests. Storage.
  • NF Z87-019-1-2*NF EN 300019-1-2:2014 Environmental Engineering (EE) - Environmental conditions and environmental test for telecommunications equipment - Part 1-2 : classification of environmental conditions - Transportation (V2.2.1)
  • NF Z87-019-1-1*NF EN 300019-1-1:2014 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-1 : classification of environmental conditions - Storage (V2.2.1)
  • NF Z87-019-1-6*NF EN 300019-1-6:2004 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-6 : classification of environmental conditions - Ship environments (V2.1.4).
  • NF Z87-019-1-8*NF EN 300019-1-8:2004 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-8 : Classification of environmental conditions - Stationary use at underground locations (V2.1.4)
  • NF Z87-019-17:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 1-7 : classification of environmental conditions. Portable and non-stationary use.
  • NF Z87-019-10:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 1-0 : classification of environmental conditions. Introduction.
  • NF Z87-019-15:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 1-5 : classification of environmental conditions. Ground vehicle installations.
  • NF Z87-019-2-8:2020 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-8 : specification of environmental tests - Stationary use at underground locations (V2.2.1)
  • NF Z87-019-1-0*NF EN 300019-1-0:2003 Environnental Engineering (EE) - Environmental conditions and environmental tests for telecommunication equipment - Part 1-0 : classification of environmental conditions - Introduction (V2.1.2)
  • NF Z87-019-2-7*NF EN 300019-2-7:2006 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-7 : specification of environmental tests - Portable and non-stationary use (V3.0.1)
  • NF ISO 14605:2013 Céramiques techniques - Sources lumineuses destinées aux essais des matériaux photocatalytiques semi-conducteurs dans un environnement d'éclairage intérieur
  • NF C20-420*NF EN 60068-3-3:1994 Environmental testing. Part 3 : guidance seismic test methods for equipments.
  • NF Z87-019-1-3*NF EN 300019-1-3:2014 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunication equipment - Part 1-3 : classification of environmental conditions - Stationary use at weatherproted locations (V2.4-1)
  • NF Z87-019-1-4*NF EN 300019-1-4:2014 Environmental Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-4 : classification of environmental conditions - Stationary use at non-weatherprotected locations (V2.2.1)
  • NF EN 61747-5:1999 Dispositifs d'affichages à cristaux liquides et à semiconducteurs - Partie 5 : méthodes d'essais d'environnement, d'endurance et mécaniques
  • NF X10-821:1995 Marine environment-Oceanographic instrumentation-Environmental tests and recommendations for air-conditioned equipments
  • NF C96-022-34:2005 Semiconducteur devices - Mechanical and climatic test methods - Part 34 : power cycling.
  • NF C96-022-25*NF EN 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25 : temperature cycling.
  • NF C96-022-34*NF EN 60749-34:2011 Semiconducteur devices - Mechanical and climatic test methods - Part 34 : power cycling
  • NF Z87-019-12:1995 Equipment engineering (ee). Environmental conditions and environmental tests for telecommunication equipment. Part 1-2 : classification of environmental conditions. Transport.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor Environmental Test Equipment

  • GB/T 5170.11-2017 Inspection methods for environmental testing equipments.Part 11:Corrosive gas testing equipments
  • GB/T 5170.11-2008 Inspection methods for environmental testing equipments for electric and electronic products.Corrosive gas testing equipments
  • GB/T 12858-1991 Environment requirements and test methods for ground radio-navigation equipment
  • GB/T 5170.20-2022 Inspection methods for environmental testing equipments—Part 20:Water testing equipments
  • GB/T 5170.8-2017 Inspection methods for environmental testing equipments.Part 8:Salt mist testing equipments
  • GB/T 5170.2-2017 Test methods for environmental test equipment Part 2: Temperature test equipment
  • GB/T 5170.11-1996 Inspection methods for basic parameters of environmental testing equipments for electric and electronic products--Corrosive gas testing equipments
  • GB/T 5170.18-2022 Inspection methods for environmental testing equipments—Part 18:Composite temperature/humidity cyclic testing equipments
  • GB/T 13543-1992 Environmental test methods for digital communication equipments
  • GB/T 5170.9-2017 Inspection methods for environmental testing equipments.Part 9:Solar radiation testing equipments
  • GB/T 5170.2-2008 Inspection methods for environmental testing equipments for electric and electronic products.Temperature testing equipments
  • GB/T 5170.5-2008 Inspection methods for environmental testing equipments for electric and electronic products.Damp heat testing equipments
  • GB/T 5170.8-2008 Inspection methods for environmental testing equipments for electric and electronic products.Salt mist testing equipments
  • GB/T 32710.7-2016 Safety requirements for environmental testing and conditioning equipment.Part 7:Climatic and environmental test chambers
  • GB/T 5170.10-2017 Inspection methods for environmental testing equipments.Part 10:Combined high and low temperature/low air pressure testing equipments
  • GB/T 5170.9-2008 Inspection methods for environmental testing equipments for electric and electronic products.Solar radiation testing equipments
  • GB/T 5170.10-2008 Inspection methods for environmental testing equipments for electric and electronic products.Combined high and low temperature/low air pressure testing equipments
  • GB/T 14710-1993 The environmental requirements and test methods for medical electrical equipment
  • GB/T 5170.20-1990 Inspection methods for basic parameters of environmental testing equipments for electric and electronic products--Water testing equipments
  • GB/T 5170.20-2005 Inspection methods for basic parameters of environmental testing equipments for electric and electronic products Water testing equipments
  • GB/T 18328.1-2009 Vibration generating machines-Guidance for selection-Part 1: Equipment for environmental testing
  • GB/T 5170.2-1996 Inspection methods for basic parameters of environmental testing equipments for electric and electronic products. Temperature testing equipments
  • GB/T 5170.8-1996 Inspection methods for basic parameters of environmental testing equipments for electric and electronic products--Salt mist testing equipments
  • GB/T 5170.5-1996 Inspection on methods for basic parameters of environmental testing equipments for electric and electronic products--Damp heat testing equipments
  • GB/T 5170.1-2008 Inspection methods for environmental testing equipments for electric and electronic products.Genernal
  • GB/T 5170.18-2005 Inspection methods for basic parameters of environmental testing equipments for electric and electronic products--Composite temperature/humidity cyclic testing equipments
  • GB/T 5170.18-1987 Inspection methods for basic parameters of environmental testing equipments for electric and electronic products--Composite temperature/humidity cyclic testing equipments

Danish Standards Foundation, Semiconductor Environmental Test Equipment

  • DS/ETS 300019-2-6:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-6:Specification of environmental tests - Ship environments
  • DS/ETS 300019-2-0:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-0:Specification of environmental tests - Introduction
  • DS/ETS 300019-2-1:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-1:Specification of environmental tests - Storage
  • DS/ETS 300019-2-2:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-2:Specification of environmental tests - Transportation
  • DS/EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
  • DS/EN 300019-2-6 V3.0.0:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-6: Specification of environmental tests; Ship environments
  • DS/ETS 300019-2-5:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-5:Specification of environmental tests - Ground vehicle installations
  • DS/ETS 300019-2-2 V2.1.2:2003 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation
  • DS/EN 300019-2-1 V2.1.2:2001 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-1: Specification of environmental tests; Storage
  • DS/ETS 300019-1-6:1993 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment. Part 1-6: Classification of environmental conditions Ship environments
  • DS/EN 300019-2-0 V2.1.2:2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-0: Specification of environmental tests; Introduction
  • DS/EN 300019-2-1 V2.2.1:2012 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation
  • DS/EN 300 019-2-2 V2.3.1:2013 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation
  • DS/ETS 300019-2-7:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-7:Specification of environmental tests - Portable and non-stationary use
  • DS/ETS 300019-1-1:1993 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment. Part 1-1: Classification of environmental conditions. Storage
  • DS/ETS 300019-1-2:1993 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment. Part 1-2: Classification of environmental conditions. Transportation
  • DS/ETS 300019-1-0:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 1-0:Classification of environmental conditions - Introduction
  • DS/EN prEN 300019-1-6 V 2:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-6: Classification of environmental conditions; Ship environments
  • DS/ETS 300019-2-3:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-3:Specification of environmental tests - Stationary use at weatherprotected locations
  • DS/ETS 300019-2-4:1994 Equipment Engineering (EE) - Environmental conditions and environmental tests for telecommunications equipment - Part 2-4:Specification of environmental tests - Stationary use at non-weatherprotected locations
  • DS/EN 300019-2-8 V2.1.1:2000 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-8: Specification of environmental tests; Stationary use at underground locations
  • DS/EN 300019-1-0 V2.1.2:2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-0: Classification of environmental conditions; Introduction
  • DS/EN 300019-1-1 V2.1.4:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-1: Classification of environmental conditions; Storage
  • DS/EN 300019-1-2 V2.1.4:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-2: Classification of environmental conditions; Transportation
  • DS/EN 300019-2-5 V3.0.0:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-5: Specification of environmental tests; Ground vehicle installations
  • DS/EN 300 019-2-3 V2.3.1:2013 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmsuppental tests; Stationary use at weatherprotected locations
  • DS/ETS 300019-1-5:1993 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment. Part 1-5: Classification of environmental conditions. Ground vehicle installations
  • DS/EN prEN 300019-1-5 V2.:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-5: Classification of environmental conditions; Ground vehicle installations
  • DS/EN 300019-2-3 V2.2.2:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations
  • DS/EN 300019-2-7 V3.0.0:2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-7: Specification of environmental tests; Portable and non-stationary use
  • DS/ETS 300019-1-7:1993 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment. Part 1-7: Classification of environmental conditions. Portable and non-stationary use

European Committee for Electrotechnical Standardization(CENELEC), Semiconductor Environmental Test Equipment

  • HD 323.3.3 S1-1991 Environmental Testing Part 3: Guidance - Seismic Test Methods for Equipments
  • EN 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
  • EN 60068-3-3:1993 Environmental Testing Part 3: Guidance Seismic Test Methods for Equipments

Institute of Electrical and Electronics Engineers (IEEE), Semiconductor Environmental Test Equipment

  • IEEE 1450.1/COR-2005 Extension to Standard Test Interface Language (STIL) (IEEE Std 1450<(hoch)TM)>-1999) for semiconductor design environments
  • IEEE 1450.1-2005 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450?999) for Semiconductor Design Environments IEEE Computer Society Document; Errata:12/20/2005
  • IEEE Std C62.37/COR-2009 Errata to IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices
  • IEEE Std 1450.1-2005 IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
  • IEC 62526:2007(E) IEEE 1450.1-2005(E) IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
  • IEC 62526:2007*IEEE 1450.1:2005 IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
  • IEEE/IEC 62526-2007 IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

American National Standards Institute (ANSI), Semiconductor Environmental Test Equipment

  • ANSI PH3.713-1985 Photography (Equipment) - Environmental Testing
  • ANSI/IEEE 1450.1:2005 Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Semiconductor Design Environments
  • ANSI/ASA S2.62-2009 Shock Test Requirements for Equipment in a Rugged Shock Environment

Professional Standard - Aerospace, Semiconductor Environmental Test Equipment

  • QJ 1184.1-1987 Coastal Defense Missile Environmental Specification High Temperature Test of Missile Equipment
  • QJ 1184.2-1987 Low-temperature test of equipment on board the coastal defense missile environment specification
  • QJ 1184.5-1987 Damp heat test of missile equipment on environmental specification for coastal defense missile
  • QJ 1184.6-1987 Coastal Defense Missile Environmental Specifications Mold Test on Missile Equipment
  • QJ 1184.7-1987 Coastal Defense Missile Environmental Specifications Salt Spray Test of Missile Equipment
  • QJ 1184.8-1987 Coastal Defense Missile Environmental Specifications Shock Test of Missile Equipment
  • QJ 1184.9-1987 Coastal Defense Missile Environmental Specification Missile Equipment Collision Test
  • QJ 1184.10-1987 Coastal Defense Missile Environmental Specification Missile Equipment Vibration Test
  • QJ 1184.12-1987 Vibration test of equipment mounted on missiles in coastal defense missile environment specification
  • QJ 1184.11-1987 Coastal Defense Missile Environmental Specifications Acceleration Test of Missile Equipment
  • QJ 1184.3-1987 Coastal Defense Missile Environmental Specifications Temperature Shock Test of Missile Equipment
  • QJ 1184.4-1987 Coastal Defense Missile Environmental Specifications Temperature Altitude Test of Missile Equipment
  • QJ 1184.13-1987 Coastal Defense Missile Environmental Regulations Road Transport Test of Missile Equipment
  • QJ 1986-1990 Environmental Test Equipment Manual for Aerospace Products

IN-BIS, Semiconductor Environmental Test Equipment

KR-KS, Semiconductor Environmental Test Equipment

  • KS C IEC 60068-3-3-2020 Environmental testing — Part 3-3: Guidance seismic test methods for equipments
  • KS B ISO 10813-1-2018 Vibration generating machines — Guidance for selection — Part 1: Equipment for environmental testing
  • KS W ISO 2669-2018 Environmental tests for aircraft equipment-Steady-state acceleration
  • KS W ISO 7137-2018 Aircraft-Environmental conditions and test procedures for airborne equipment
  • KS C IEC 60749-34-2017 Semiconductor devices-Mechanical and climatic test methods-Part 34:Power cycling

Lithuanian Standards Office , Semiconductor Environmental Test Equipment

  • LST ETS 300 019-2-6 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-6: Specification of environmental tests; Ship environments
  • LST EN 300 019-2-6 V3.0.0-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-6: Specification of environmental tests; Ship environments
  • LST EN 300 019-2-6 V2.1.2-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-6: Specification of environmental tests; Ship environments
  • LST EN 300 019-2-2 V2.1.2-2000 Equipment Engineering (EE). Environmental conditions and environmental tests for telecommunications equipment. Part 2-2: Specification of environmental tests. Transportation
  • LST ETS 300 019-2-2 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation
  • LST ETS 300 019-2-0 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-0: Specification of environmental tests; Introduction
  • LST EN 300 019-2-1 V2.1.2-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-1: Specification of environmental tests; Storage
  • LST ETS 300 019-2-5 Leid.1-2007 Equipment Engineering (EE);Environmental conditions and environmental tests for telecommunications equipment;Part 2-5: Specification of environmental tests;Ground vehicle installations
  • LST ETS 300 019-1-1 Leid.1-2006 Equipment Engineering (EE);Environmental conditions and environmental tests for telecommunications equipment;Part 1-1: Classification of environmental conditions;
  • LST EN 60068-3-3-2001 Environmental testing. Part 3: Guidance. Seismic test methods for equipments (IEC 60068-3-3:1991)
  • LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
  • LST ETS 300 019-1-0 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-0: Classification of environmental conditions; Introduction
  • LST ETS 300 019-1-2 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-2: Classification of environmental conditions; Transportation
  • LST EN 300 019-2-0 V2.1.2-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-0: Specification of environmental tests; Introduction
  • LST EN 300 019-2-2 V2.2.1-2012 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation
  • LST EN 300 019-1-6 V2.1.4-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-6: Classification of environmental conditions; Ship environments
  • LST EN 300 019-1-6 V2.1.2-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-6: Classification of environmental conditions; Ship environments
  • LST ETSI EN 300 019-2-5 V3.1.1-2021 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2: Specification of environmental tests; Sub-part 5: Ground vehicle installations
  • LST EN 300 019-2-8 V2.1.2-2000 Equipment Engineering (EE). Environmental conditions and environmental tests for telecommunications equipment. Part 2-8: Specification of environmental tests. Stationary use at underground locations
  • LST ETS 300 019-2-8 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-8: Specification of environmental tests; Stationary use at underground locations
  • LST EN 300 019-1-1 V2.1.4-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-1: Classification of environmental conditions; Storage
  • LST EN 300 019-1-2 V2.1.4-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-2: Classification of environmental conditions; Transportation
  • LST EN 300 019-1-0 V2.1.2-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-0: Classification of environmental conditions; Introduction
  • LST EN 300 019-1-1 V2.1.2-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-1: Classification of environmental conditions; Storage
  • LST ETS 300 019-1-5 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-5: Classification of environmental conditions; Ground vehicle installations
  • LST EN 300 019-2-5 V2.1.2-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-5: Specification of environmental tests; Ground vehicle installations
  • LST EN 300 019-2-5 V3.0.0-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-5: Specification of environmental tests; Ground vehicle installations
  • LST EN 300 019-2-3 V2.1.2-2000 Equipment Engineering (EE). Environmental conditions and environmental tests for telecommunications equipment. Part 2-3: Specification of environmental tests. Stationary use at weatherprotected locations
  • LST ETS 300 019-2-3 Leid.1-2005/A1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations
  • LST ETS 300 019-2-3 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations
  • LST ETS 300 019-1-8 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-8: Classification of environmental conditions; Stationary use at underground locations
  • LST EN 300 019-1-5 V2.1.4-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-5: Classification of environmental conditions; Ground vehicle installations
  • LST EN 300 019-2-7 V3.0.1-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-7: Specification of environmental tests; Portable and non-stationary use
  • LST EN 300 019-2-3 V2.2.2-2004 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations
  • LST EN 300 019-2-3 V2.2.1-2005 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations
  • LST ETSI EN 300 019-2-3 V2.5.1-2020 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations
  • LST ETS 300 019-1-3 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-3: Classification of environmental conditions; Stationary use at weatherprotected locations
  • LST ETS 300 019-1-7 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-7: Classification of environmental conditions; Portable and non-stationary use
  • LST ETS 300 019-1-3 Leid.1-2005/A1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment;Part 1-3: Classification of environmental conditions; Stationary use at weatherprotected locations
  • LST EN 300 019-2-4 V2.1.2-2000 Equipment Engineering (EE). Environmental conditions and environmental tests for telecommunications equipment. Part 2-4: Specification of environmental tests. Stationary use at non-weatherprotected locations
  • LST ETS 300 019-2-4 Leid.1-2005/A1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-4: Specification of environmental tests; Stationary use at non-weatherprotected locations
  • LST ETS 300 019-2-3 Leid.1-2005/A2-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests T 3.1 to T 3.5; Stationary use at weatherprotected locations
  • LST ETS 300 019-2-4 Leid.1-2005 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-4: Specification of environmental tests; Stationary use at non-weatherprotected locations

AENOR, Semiconductor Environmental Test Equipment

  • UNE-EN 60068-3-3:1994 ENVIRONMENTAL TESTING. PART 3: GUIDANCE. SEISMIC TEST METHODS FOR EQUIPMENTS.
  • UNE 73350-2:2003 Procedure for the determination of ambient radioactivity. Measurement equipment. Part 2: Alpha spectrometry by semiconductor sensors.
  • UNE 73350-1:2003 Procedure for the determination of ambient radioactivity. Measurement equipment. Part 1: Gamma spectrometry by semiconductor sensors.
  • UNE-EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
  • UNE-EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling

European Telecommunications Standards Institute (ETSI), Semiconductor Environmental Test Equipment

  • ETSI ETS 300 019- 2-0-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-0: Specification of Environmental Tests Introduction
  • ETSI ETS 300 019- 1-0-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-0: Classification of Environmental Conditions Introduction
  • ETSI EN 300 019-2-1-2014 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-1: Specification of environmental tests; Storage (V2.2.1)
  • ETSI EN 300 019-2-0-2003 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-0 Specification of environmental tests; Introduction (V2.1.2)
  • ETSI EN 300 019-1-0-2003 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-10: Classification of environmental conditions; Introductions (V2.1.2)
  • ETSI EN 300 019-1-2-2014 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-2: Classification of environmental conditions; Transportation (V2.2.1)
  • ETSI EN 300 019-1-1-2014 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-1: Classification of environmental conditions; Storage (V2.2.1)
  • ETSI EN 300 019-2-3-2015 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations (V2.4.1)

ETSI - European Telecommunications Standards Institute, Semiconductor Environmental Test Equipment

  • PRETS 300 019-2-0-1992 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-0: Specification of Environmental Tests Introduction
  • PRETS 300 019-2-2-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-2: Specification of Environmental Tests Transportation
  • ETS 300 019- 2-0-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-0: Specification of Environmental Tests Introduction
  • PRETS 300 019-2-0-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-0: Specification of Environmental Tests Introduction
  • ETS 300 019- 2-2-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-2: Specification of Environmental Tests Transportation
  • ETS 300 019- 2-1-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-1: Specification of Environmental Tests Storage
  • PRETS 300 019-2-1-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 2-1: Specification of Environmental Tests Storage
  • ETS 300 019-1-6-1992 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-6: Classification of Environmental Conditions Ship Environments
  • PRETS 300 019-1-6-1991 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-6: Classification of Environmental Conditions Ship Environments
  • ETSI EN 300 019-2-1:2014 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-1: Specification of environmental tests; Storage (V2.2.1)
  • ETSI EN 300 019-2-1:2017 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-1: Specification of environmental tests; Storage (V2.2.8)
  • ETSI EN 300 019-2-2:2011 Equipment Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation (V2.2.1)
  • PRETS 300 019-B-1990 Equipment Engineering Environmental Conditions and Environmental Tests for Telecommunications Equipment Part B - Classification of Environmental Conditions (T/TR 02-12)
  • PRETS 300 019-1-0-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-0: Classification of Environmental Conditions Introduction
  • PRETS 300 019-1-2-1991 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-2: Classification of Environmental Conditions Transportation
  • PRETS 300 019-1-0-1992 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-0: Classification of Environmental Conditions Introduction
  • ETS 300 019- 1-0-1994 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-0: Classification of Environmental Conditions Introduction
  • ETS 300 019-1-2-1992 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-2: Classification of Environmental Conditions Transportation
  • ETS 300 019-1-1-1992 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-1: Classification of Environmental Conditions Storage
  • PRETS 300 019-1-1-1991 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-1: Classification of Environmental Conditions Storage
  • ETSI EN 300 019-2-0:2003 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-0 Specification of environmental tests; Introduction (V2.1.2)
  • ETSI EN 300 019-2-2:2017 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation (V2.3.6)
  • ETSI EN 300 019-2-2:2012 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation (V2.3.1)
  • ETSI EN 300 019-2-2:2013 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-2: Specification of environmental tests; Transportation (V2.3.1)
  • PRETS 300 019-1-5-1991 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-5: Classification of Environmental Conditions Ground Vehicle Installations
  • ETS 300 019-1-5-1992 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-5: Classification of Environmental Conditions Ground Vehicle Installations
  • ETSI EN 300 019-1-1:2014 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-1: Classification of environmental conditions; Storage (V2.2.1)
  • ETSI EN 300 019-1-2:2014 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-2: Classification of environmental conditions; Transportation (V2.2.1)
  • ETSI EN 300 019-1-0:2003 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-10: Classification of environmental conditions; Introductions (V2.1.2)
  • ETSI EN 300 019-1-2:2013 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 1-2: Classification of environmental conditions; Transportation (V2.1.7)
  • ETSI EN 300 019-2-3:2015 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations (V2.3.7)
  • ETSI EN 300 019-2-3:2013 Environmental Engineering (EE); Environmental conditions and environmental tests for telecommunications equipment; Part 2-3: Specification of environmental tests; Stationary use at weatherprotected locations (V2.3.1)
  • ETS 300 019-1-3-1992 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-3: Classification of Environmental Conditions Stationary Use at Weatherprotected Locations
  • PRETS 300 019-1-3-1991 Equipment Engineering (EE); Environmental Conditions and Environmental Tests for Telecommunications Equipment Part 1-3: Classification of Environmental Conditions Stationary Use at Weatherprotected Locations

RO-ASRO, Semiconductor Environmental Test Equipment

  • STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
  • STAS 11115/11-1992 Environmental condition and test procedures for airborne equipment. Section 11: Fluids susceptibility
  • STAS 8393/10-1970 Basic environmental testing procedures for electronic equipment TEST Hb: STORAGE

SE-SIS, Semiconductor Environmental Test Equipment

  • SIS SS-IEC 749:1991 Semiconductor devices - Mechanical and climatic test methods
  • SIS SS 436 15 03-1986 Electronic equipment for industry and trade - Immunity to conducted electromagnetic interference - Environmental classification and tests
  • SIS SS 436 15 03-1984 Electronic equiprnent for industry and trade - Immunity to conducted electromagnetic interference - Environmental classification and tests
  • SIS SS-ISO 7137:1982 Aircraft - Environmental conditions and test procedures for airborne equipment

CZ-CSN, Semiconductor Environmental Test Equipment

Military Standard of the People's Republic of China-General Armament Department, Semiconductor Environmental Test Equipment

  • GJB 150.9-1986 Laboratory environmental test methods for military materiel.Part 9:Damp heat test
  • GJB 150.12-1986 Environmental test methods for military equipment Sand and Dust Test
  • GJB 150.10-1986 Environmental test methods for military equipment Mold testing
  • GJB 4.9-1983 Environmental testing of ship electronic equipment and impact testing
  • GJB 150.16-1986 Environmental test methods for military equipment Vibration test
  • GJB 150.18-1986 Environmental testing methods for military equipment Impact testing
  • GJB 150.17-1986 Environmental test methods for military equipment Noise test
  • GJB 4.7-1983 Environmental testing of ship electronic equipment and vibration testing
  • GJB 150.8-1986 Environmental test methods for military equipment rain test
  • GJB 4.8-1983 Environmental test of ship electronic equipment, vibration test
  • GJB 4.11-1983 Environmental testing of ship electronic equipment Salt spray test
  • GJB 150.21-1987 Environmental test methods for military equipment Wind pressure test
  • GJB 4.10-1983 Environmental testing of ship electronic equipment Mold testing
  • GJB 150.3-1986 Environmental test methods for military equipment High temperature test
  • GJB 150.14-1986 Environmental test methods for military equipment - immersion test
  • GJB 150.15-1986 Environmental test methods for military equipment Acceleration test
  • GJB 4.1-1983 General principles for environmental testing of ship electronic equipment
  • GJB 150.1-1986 General Principles of Environmental Test Methods for Military Equipment
  • GJB 4.13-1983 Marine electronic equipment environmental test shell waterproof test
  • GJB 4.6-1983 Environmental test of ship electronic equipment, alternating damp heat test
  • GJB 150.5-1986 Environmental test methods for military equipment Temperature shock test
  • GJB 150.20-1986 Environmental test methods for military equipment Aircraft gun vibration test
  • GJB 150.7-1986 Environmental test methods for military equipment Solar radiation test
  • GJB 150.22-1987 Military Equipment Environmental Test Methods Ice Accumulation/Freezing Rain Test
  • GJB 4.12-1983 Environmental testing of ship electronic equipment Solar radiation testing
  • GJB 150.2-1986 Environmental test methods for military equipment Low pressure (altitude) test
  • GJB 150.13-1986 Environmental test methods for military equipment Explosive atmosphere testing
  • GJB 150.23-1991 Military Equipment Environmental Test Methods Tilt and Swing Test
  • GJB 805.4-1990 General specifications for environmental conditions and test methods for surface-to-surface strategic missile ground equipment
  • GJB 150.25-1992 Environmental test methods for military equipment vibration-noise-temperature test
  • GJB 150.24-1992 Environmental test methods for military equipment Temperature-humidity-vibration-height test
  • GJB 150.26-2009 Labortory environmental test methods for military materiel.Part 26:Contamination by fluids test

Electronic Components, Assemblies and Materials Association, Semiconductor Environmental Test Equipment

  • ECA CB 5-1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
  • ECA CB 5-1-1971 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices Addendum to CB5

ATIS - Alliance for Telecommunications Industry Solutions, Semiconductor Environmental Test Equipment

  • 0600063-2017 Guidelines for Environmental Testing and Evaluation of Communication Equipment

European Committee for Standardization (CEN), Semiconductor Environmental Test Equipment

  • prEN 60068-3-3-1992 Environmental testing; part 3: guidance; seismic test methods for equipments (IEC 68-3-3:1991)
  • EN 60068-2-45:1992 Environmental testing; part 2: test methods; test XA and guidance: immersion in cleaning solvents (IEC 68-2-45:1980 + corrigendum:1981)

Professional Standard - Aviation, Semiconductor Environmental Test Equipment

  • HB 6167.9-1989 Environmental conditions and test methods for airborne equipment of civil aircraft Fluid sensitivity test
  • HB 6167.20-1989 Environmental conditions and test methods for airborne equipment of civil aircraft
  • HB 5830.1-1984 Airborne Equipment Environmental Conditions and General Rules of Test Methods
  • HB 5830.11-1986 Airborne equipment environmental conditions and test methods damp heat
  • HB 5830.13-1986 Airborne Equipment Environmental Conditions and Test Methods Mold
  • HB 5830.2-1982 Airborne equipment environmental conditions and test method impact
  • HB 5830.3-1982 Airborne Equipment Environmental Conditions and Test Methods Collision
  • HB 5830.5-1984 Airborne Equipment Environmental Conditions and Test Method Vibration
  • HB 5830.9-1984 Airborne Equipment Environmental Conditions and Test Methods Low Temperature
  • HB 5830.8-1984 Airborne Equipment Environmental Conditions and Test Methods High Temperature
  • HB 5830.12-1986 Airborne Equipment Environmental Conditions and Test Methods Salt Spray
  • HB 6167.9-2014 Environmental conditions and test procedures for airborne equipment of civil airplane.Part 9: Fluids susceptibility test
  • HB 6167.15-1989 Environmental conditions and test methods for airborne equipment of civil aircraft
  • HB 6167.13-1992 Environmental conditions and test methods for civil aircraft airborne equipment icing test
  • HB 6167.12-1989 Environmental conditions and test methods for civil aircraft airborne equipment Salt spray test
  • HB 6167.10-1989 Environmental conditions and test methods for airborne equipment of civil aircraft Sand and dust test
  • HB 6167.4-1989 Environmental conditions and test methods for airborne equipment of civil aircraft Damp heat test
  • HB 6167.6-1989 Vibration test of civil aircraft airborne equipment environmental conditions and test methods

Professional Standard - Machinery, Semiconductor Environmental Test Equipment

  • JB/T 7439.3-1994 Terminology relating to laboratory instruments - Climatic and environmental test equipment
  • JB/T 4219-1999 Type designation of measuring equipments for power semiconductor devices
  • JB/T 9512-1999 Climate environmental testing equipment and cabinet - Determination of sound power level of noise emitted

Professional Standard - Post and Telecommunication, Semiconductor Environmental Test Equipment

  • YD/T 2379.4-2011 Environmental test requirements and test methods for telecommunication equipment .Part 4:terminal equipment

工业和信息化部, Semiconductor Environmental Test Equipment

  • YD/T 2379.9-2019 Environmental test requirements and test methods for telecommunications equipment Part 9: Shipborne equipment
  • YD/T 2379.10-2020 Environmental test requirements and test methods for telecommunications equipment Part 10: Airborne equipment for civil aircraft
  • YD/T 2379.11-2022 Environmental test requirements and test methods for telecommunications equipment Part 11: Equipment for underground fixed use

National Metrological Technical Specifications of the People's Republic of China, Semiconductor Environmental Test Equipment

  • JJF 1101-2003 Calibration Specification for the Equipment of the Environmental Testing for Temperature and Humidity
  • JJF 1101-2019 Calibration Specification for the Equipment of the Environmental Testing for Temperature and Humidity
  • JJF 1895-2021 Calibration Specification for Semiconductor Devices DC and Low Frequency Parameters Test Equipments

JP-JASO, Semiconductor Environmental Test Equipment

  • JASO D001-1987 General Rules of Environmental Testing Method for Automotive Electronic Equipment
  • JASO D001-1994 General rules of environmental testing methods for automotive electronic equipment

International Organization for Standardization (ISO), Semiconductor Environmental Test Equipment

  • ISO 2653-1:1975 Environmental tests for aircraft equipment — Part 1: Ice formation
  • ISO 2669:1995 Environmental tests for aircraft equipment - Steady-state acceleration
  • ISO 2678:1985 Environmental tests for aircraft equipment; Insulation resistance and high voltage tests for electrical equipment
  • ISO 2678:1977 Title missing - Legacy paper document
  • ISO 7137:1981 Aircraft; environmental conditions and test procedures for airborne equipment
  • ISO 7137:1992 Aircraft; environmental conditions and test procedures for airborne equipment
  • ISO 2678-1:1977 Environmental tests for aircraft equipment — Part 1: Insulation resistance and high voltage tests for electrical equipment

Professional Standard - Electron, Semiconductor Environmental Test Equipment

  • SJ/Z 2312-1983 Methods of measurement for climatic environmental test equipnent for electronic industry
  • SJ 2311-1983 Generic specification for environmental test equipment for electronic industry
  • SJ 2325-1983 Environmental test conditions and test procedures for land microwave communication equipment

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Semiconductor Environmental Test Equipment

  • GB/T 5170.5-2016 Inspection methods for environmental testing equipments for electric and electronic products—Part 5:Damp heat testing equipments
  • GB/T 36005-2018 Measuring methods of optical radiation safety for semiconductor lighting equipments and systems

国家市场监督管理总局、中国国家标准化管理委员会, Semiconductor Environmental Test Equipment

  • GB/T 5170.19-2018 Inspection methods for environmental testing equipments—Part 19:Combined temperature vibration(sinusoidal) testing equipment
  • GB/T 39555-2020 Intelligent laboratory—Instruments and equipment—Data interface of climatic and environmental testing equipment

HU-MSZT, Semiconductor Environmental Test Equipment

Professional Standard - Medicine, Semiconductor Environmental Test Equipment

  • YY/T 1420-2016 Environmental requirement and test methods for medical ultrasonic equipment
  • YY/T 0291-2016 Environmental requirements and test methods for medical X-ray equipment
  • YY/T 0291-1997 Environmental requirements and test methods for medical X-ray equipment
  • YY/T 0291-2007 Environmental requirements and test methods for medical X-ray equipment

Professional Standard - Water Conservancy, Semiconductor Environmental Test Equipment

  • SL 144-1995 Check method of water environmental detecting instrument and experimental equipment
  • SL 144-1995(条文说明) Calibration (inspection) method of water environment testing instruments and test equipment

Standard Association of Australia (SAA), Semiconductor Environmental Test Equipment

  • AS/NZS 60079.15:2006 Electrical apparatus for explosive gas atmospheres - Construction, test and marking of type of protection, ?n? electrical apparatus
  • AS 60068.2.21:2004 Environmental testing - Tests - Test U: Robustness of terminations and integral mounting devices
  • AS/NZS 60079.18:2005 Electrical apparatus for explosive gas atmospheres - Construction, test and marking of type of protection encapsulation ?m? electrical apparatus

RU-GOST R, Semiconductor Environmental Test Equipment

  • GOST 30852.1-2002 Explosionproof electrical equipment. Part 1. Flameproof enclusure type explosion protection
  • GOST R 51330.4-1999 Electrical apparatus for explosive gas atmospheres. Part 3. Spart-test apparatus for intrinsically-safe circuits

国家质量监督检验检疫总局, Semiconductor Environmental Test Equipment

  • SN/T 3480.4-2016 Technical requirements for inspection of complete sets of equipment for the imported electronics and electrical industry Part 4: Semiconductor packaging and testing equipment

BG-BDS, Semiconductor Environmental Test Equipment

  • BGC IEC 60079-1:2000 Electrical apparatus for explosive gas atmospheres-Part 1:Construction and verification test of flameproof enclosures of electrical apparatus

Defense Logistics Agency, Semiconductor Environmental Test Equipment

  • DLA MIL STD 750 1-2012 TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
  • DLA MIL-STD-750-1 CHANGE 1-2013 TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999
  • DLA MIL-STD-750-1 CHANGE 2-2013 TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999

ZA-SANS, Semiconductor Environmental Test Equipment

  • SANS 60079-4:1975 Electrical apparatus for explosive gas atmospheres Part 4: Method of test for ignition temperature




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