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Rationale for Testing
Rationale for Testing, Total:61 items.
In the international standard classification, Rationale for Testing involves: Integrated circuits. Microelectronics, Freight distribution of goods, Glass, Metrology and measurement in general, Energy and heat transfer engineering in general.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Rationale for Testing
- GB/T 14030-1992 General principles of measuring methods of timer circuits for semiconductor integrated circuits
- GB 14030-1992 Basic principles of semiconductor integrated circuit time-based circuit testing methods
- GB/T 14028-1992 General principles of measuring methods of analogue switches for semiconductor integrated circuits
- GB 14028-2018 Basic principles of semiconductor integrated circuit analog switch test methods
- GB/T 6798-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage comparators
- GB/T 4377-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
- GB/T 14031-1992 General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
- GB/T 14032-1992 General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
- GB/T 14029-1992 General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
- GB 14029-1992 Basic principles of semiconductor integrated circuit analog multiplier testing methods
- GB 14031-1992 Basic principles of semiconductor integrated circuit analog phase-locked loop testing methods
- GB 14032-1992 Basic principles of digital phase-locked loop testing methods for semiconductor integrated circuits
- GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits
- GB/T 14115-1993 General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
- GB 3442-1986 Basic principles of semiconductor integrated circuit operational (voltage) amplifier testing methods
- GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semiconductor audio integrated circuits
- GB/T 14114-1993 General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits
- GB/T 12843-1991 General principle of measuring methods of microprocessors and peripheral interface circuits' parameters for semiconductor integrated circuits
- GB 12843-1991 Basic principles of electrical parameter testing methods for semiconductor integrated circuit microprocessors and peripheral interface circuits
Professional Standard - Electron, Rationale for Testing
- SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
- SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
- SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
- SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
- SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
- SJ/T 10804-2000 Semiconductor integrated circuits.General principles of measuring methods for level translator
- SJ/T 10805-2000 Semiconductor integrated circuits.General principles of measuring methods for voltage comparators
- SJ/T 10882-1996 Semiconductor integrated circuits - General principles of measuring methods for linear amplifiers
- SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits
- SJ/T 10803-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits
- SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
- SJ/T 10738-1996 Semiconductor integrated circuits - General principles of measuring methods for operational (voltage) amplifiers
- SJ/T 10800-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for sense amplifiers
- SJ/T 10802-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for peripheral drivers
- SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
- SJ/T 10804-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator
- SJ/T 10806-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for display drivers
- SJ/T 11005-1996 Semiconductor TV integrated circuits - General principles of measuring methods for audio channel circuits
- SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
- SJ/T 10401-1993 General principles of measuring methods for motor speed stablizers of semiconductor audio integrated circuits
- SJ/T 10740-1996 Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories
- SJ 2480-1984 General principles of static measurement for D/A converters for hybrid integrated circuits
- SJ/T 10402-1993 General principles of measuring methods for automatic music selectors of semiconductor audio integrated circuits
- SJ/T 10400-1993 General principles of measuring methods for graphic equalizers of semiconductor audio integrated circuits
- SJ/T 11004-1996 Semiconductor TV integrated circuits - General principles of measuring methods for picture channel circuits
- SJ/T 10880-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
- SJ 2481-1984 General principles of static measurement for A/D converters for hybrid integrated circuits
- SJ/T 10879-1996 Semiconductor integrated audio circuits - General principles of measuring methods for audio preamplifiers
- SJ/T 10427.1-1993 Grneral Principles of measuring methods of FM converter for semiconductor audio integrated circuits
- SJ/T 10427.2-1993 General principles of measuring methods of intermediate-frequency amplifier for semiconductor audio integrated circuits
- SJ/T 10881-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
- SJ/T 10801-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for magnetic memory drivers
- SJ/T 11007-1996 Semiconductor TV integrated circuits - General principles of measuring methods for video signal and chrominance signal processing circuits
- SJ/T 10818-1996 Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits
Danish Standards Foundation, Rationale for Testing
NATO - North Atlantic Treaty Organization, Rationale for Testing
- AOP-25-1999 Rationale and Guidance Concerning STANAG 4327 Lightning@ Munition Assessment and Test Procedures (ED 1; To obtain please contact your national Defense Standardization Office or the NATO Standardization Office website: http:/ so.nato.int so@ Phone: +32 (0)
Lithuanian Standards Office , Rationale for Testing
- LST EN 1288-1-2002 Glass in building - Determination of the bending strength of glass - Part 1: Fundamentals of testing glass
AENOR, Rationale for Testing
- UNE-EN 1288-1:2000 Glass in building - Determination of the bending strength of glass - Part 1: Fundamentals of testing glass.
Association of German Mechanical Engineers, Rationale for Testing
- VDI 2048 Blatt 1-2000 Uncertainties of measurements at acceptance tests for energy conversion and power plants - Fundamentals