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atomic force microscope, scanning tunneling microscope
atomic force microscope, scanning tunneling microscope, Total:175 items.
In the international standard classification, atomic force microscope, scanning tunneling microscope involves: Linear and angular measurements, Non-ferrous metals, Optical equipment, Thermodynamics and temperature measurements, Optics and optical measurements, Analytical chemistry, Vocabularies, Education, Air quality, Protection against crime, Electronic display devices, Surface treatment and coating, Physics. Chemistry, Construction materials, Materials for aerospace construction, Test conditions and procedures in general, Iron and steel products, Ceramics, Nuclear energy engineering, Paints and varnishes, Medical sciences and health care facilities in general.
American Society for Testing and Materials (ASTM), atomic force microscope, scanning tunneling microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM F1438-93(1999) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
- ASTM F1438-93(2020) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM F1438-93(2012) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
- ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
- ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
- ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
Korean Agency for Technology and Standards (KATS), atomic force microscope, scanning tunneling microscope
International Organization for Standardization (ISO), atomic force microscope, scanning tunneling microscope
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
- ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
Japanese Industrial Standards Committee (JISC), atomic force microscope, scanning tunneling microscope
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
RU-GOST R, atomic force microscope, scanning tunneling microscope
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
- GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
- GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
- GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
- GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
KR-KS, atomic force microscope, scanning tunneling microscope
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
Group Standards of the People's Republic of China, atomic force microscope, scanning tunneling microscope
National Metrological Technical Specifications of the People's Republic of China, atomic force microscope, scanning tunneling microscope
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery, atomic force microscope, scanning tunneling microscope
National Metrological Verification Regulations of the People's Republic of China, atomic force microscope, scanning tunneling microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, atomic force microscope, scanning tunneling microscope
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
British Standards Institution (BSI), atomic force microscope, scanning tunneling microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
Professional Standard - Education, atomic force microscope, scanning tunneling microscope
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
German Institute for Standardization, atomic force microscope, scanning tunneling microscope
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
- DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
- DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
- DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
Professional Standard - Petroleum, atomic force microscope, scanning tunneling microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Shanghai Provincial Standard of the People's Republic of China, atomic force microscope, scanning tunneling microscope
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
国家能源局, atomic force microscope, scanning tunneling microscope
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
Association Francaise de Normalisation, atomic force microscope, scanning tunneling microscope
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
- NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
Jiangsu Provincial Standard of the People's Republic of China, atomic force microscope, scanning tunneling microscope
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
Professional Standard - Judicatory, atomic force microscope, scanning tunneling microscope
ESDU - Engineering Sciences Data Unit, atomic force microscope, scanning tunneling microscope
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
- SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, atomic force microscope, scanning tunneling microscope
- GB/Z 26083-2010 Determination for Copper(Ⅱ) octaakoxyl-substituted phthalocyanine on graphite surface(scanning tunneling microscope)
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
- GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
- GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
- GB/T 32189-2015 Atomic Force Microscopy Examination of Surface Roughness of Gallium Nitride Single Crystal Substrate
SE-SIS, atomic force microscope, scanning tunneling microscope
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
European Committee for Standardization (CEN), atomic force microscope, scanning tunneling microscope
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
- prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
Danish Standards Foundation, atomic force microscope, scanning tunneling microscope
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
ES-UNE, atomic force microscope, scanning tunneling microscope
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
Professional Standard - Public Safety Standards, atomic force microscope, scanning tunneling microscope
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
- GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
AENOR, atomic force microscope, scanning tunneling microscope
- UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
Lithuanian Standards Office , atomic force microscope, scanning tunneling microscope
- LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
AT-ON, atomic force microscope, scanning tunneling microscope
- OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
BE-NBN, atomic force microscope, scanning tunneling microscope
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
Association of German Mechanical Engineers, atomic force microscope, scanning tunneling microscope
- VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
- VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
- VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
国家市场监督管理总局、中国国家标准化管理委员会, atomic force microscope, scanning tunneling microscope
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
Professional Standard - Nuclear Industry, atomic force microscope, scanning tunneling microscope
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
American National Standards Institute （ANSI), atomic force microscope, scanning tunneling microscope
- ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
Professional Standard - Commodity Inspection, atomic force microscope, scanning tunneling microscope
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method
未注明发布机构, atomic force microscope, scanning tunneling microscope
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice