ZH
RU
ES

imaging collector

imaging collector, Total:496 items.

In the international standard classification, imaging collector involves: Integrated circuits. Microelectronics, Fibre optic communications, Optical equipment, Non-destructive testing, Protection against crime, Electronic components in general, Optoelectronics. Laser equipment, Vocabularies, Astronomy. Geodesy. Geography, Data storage devices, Photography, Technical drawings, Optics and optical measurements, Medical equipment, Surface treatment and coating, Cereals, pulses and derived products, Semiconducting materials, Graphic technology, Accident and disaster control, Electronic display devices, Protection against fire, Semiconductor devices, Lamps and related equipment, Audio, video and audiovisual engineering, Automatic controls for household use, Farming and forestry, Mechanical testing, Glass, Paints and varnishes, Linear and angular measurements, Vibrations, shock and vibration measurements, Character sets and information coding, Software development and system documentation, Shafts and couplings, Road engineering, Solar energy engineering, Installations in buildings, Applications of information technology, Kitchen equipment, Lighting, Electronic tubes, Air quality, Industrial automation systems, Aircraft and space vehicles in general, Analytical chemistry, Welding, brazing and soldering, Transformers. Reactors, Electromechanical components for electronic and telecommunications equipment.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, imaging collector

GB/T 43063-2023 Integrated circuit CMOS image sensor testing method
GB/T 28511.1-2012 Integrated optical path devices based on planar lightwave circuit.Part 1:Optical power splitter based on PLC technology
GB/T 29846-2013 Photoimageable plating and etching resist paste of printed circuit board
GB/T 28511.2-2012 Integrated optical path devices based on planar lightwave circuit.Part 2:DWDM filter based on AWG technology
GB/T 15651-1995 Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices
GB/T 17574-1998 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
GB/T 17940-2000 Semiconductor devices Integrated circuits Part 3:Analogue integrated circuits
GB/T 17574.9-2006 Semiconductor devices.Integrated circuits.Part 2-9:Digital integrated circuits.Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories
GB/T 17574.20-2006 Semiconductor devices Integrated circuits Part 2-20: Digital integrated circuits Family specification Low voltage integrated circuits
GB/T 20515-2006 Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
GB/T 17574.10-2003 Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
GB/T 24791.3-2009 Photography.Sensitometry of screen/film system for medical radiography.Part 3:Determination of sensitometric curve shape,speed and average gradient for mammography
GB/T 15651.3-2003 Discrete semiconductor devices and integrated circuits Part 5-3:Optoelectronic devices Measuring methods

工业和信息化部, imaging collector

YD/T 3540-2019 Integrated Optical Power Detector (IPM)
YD/T 2000.2-2018 Planar optical waveguide integrated optical circuit device Part 2: Dense wavelength division multiplexing (DWDM) filter based on arrayed waveguide grating (AWG) technology
YD/T 2799.1-2015 Technical conditions for integrated coherent optical receivers Part 1: 40Gb/s
YD/T 2799.2-2015 Technical specifications for integrated coherent optical receivers Part 2: 100Gb/s
YD/T 2799.4-2021 Technical conditions for integrated coherent optical receivers Part 4: 400Gb/s
YD/T 2904.2-2018 Integrated Tunable Laser Components Part 2: Miniaturized Components
YD/T 2904.3-2019 Integrated Tunable Laser Components Part 3: Dual Channel Components
YD/T 2799.3-2018 Technical conditions for integrated coherent optical receivers Part 3: 100Gbit/s miniaturization
YD/T 3831.1-2021 Integrated Coherent Transceiver and Light Components Part 1: 100Gb/s
YD/T 3831.2-2022 Integrated Coherent Transceiver and Light Components Part 2: 400Gb/s
YD/T 3126.1-2016 Integrated Tunable Light Source Module Part 1: Interface

U.S. Military Regulations and Norms, imaging collector

ARMY MIL-PRF-49384 B NOTICE 1-2013 OPTICAL IMAGER, SU-121/UA
ARMY MIL-PRF-49384B-1997 OPTICAL IMAGER, SU-121/UA
ARMY MIL-PRF-49173 B NOTICE 1-2013 OPTICAL IMAGER, SU-103/UA AND SU-103A/UA
ARMY MIL-PRF-49173B-1997 OPTICAL IMAGER, SU-103/UA AND SU-103A/UA
ARMY MIL-PRF-49170 B NOTICE 1-2013 OPTICAL IMAGER, SU-97/UA, SU-97A/UA, AND SU-97B/UA
ARMY MIL-PRF-49170B-1997 OPTICAL IMAGER, SU-97/UA, SU-97A/UA, AND SU-97B/UA
ARMY MIL-F-48267 NOTICE 2-1997 FUZE TIMER, MINE (INTEGRATED CIRCUIT)
ARMY MIL-F-48267 VALID NOTICE 1-1987 FUZE TIMER, MINE (INTEGRATED CIRCUIT)
ARMY MIL-F-48267 (2)-1975 FUZE TIMER, MINE (INTEGRATED CIRCUIT)
ARMY MIL-F-48267-1973 FUZE TIMER, MINE (INTEGRATED CIRCUIT)

Korean Agency for Technology and Standards (KATS), imaging collector

KS B ISO 9358:2006 Optics and optical instruments Veiling glare of image-forming systems - Definitions and methods of measurement
KS B ISO 9358-2006(2016) Optics and optical instruments -- Veiling glare of image forming systems -- Definitions and methods of measurement
KS B ISO 9358-2006(2021) Optics and optical instruments -- Veiling glare of image forming systems -- Definitions and methods of measurement
KS A ISO 18925:2006 Imaging materials-Optical disc media-Storage practices
KS A ISO 18925-2016(2021) Imaging materials－Optical disc media－Storage practices
KS A ISO 18925:2016 Imaging materials－Optical disc media－Storage practices
KS C IEC 60747-5:2004 Semiconductor devices－Discrete devices－Part 5：Optoelectronic devices
KS C IEC 60747-5-1:2020 Discrete semiconductor devices and integrated circuits —Part 5-1: Optoelectronic devices — General
KS C IEC 60748-3-1:2002 Semiconductor devices－Integrated circuits－Part 3：Analogue integrated circuits－Section 1：Blank detail specification for monolithic integrated operational amplifiers
KS C IEC 60748-2-8:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS A ISO 12234-2-2006(2021) Electronic still-picture imaging－Removable memory－Part 2：TIFF/EP image data format
KS A ISO 12234-2-2006(2016) Electronic still-picture imaging－Removable memory－Part 2：TIFF/EP image data format
KS C IEC 60748-4:2004 Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
KS C IEC 60748-3:2002 Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-2:2001 Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2-2001(2021) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2-2001(2016) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-4-2004(2020) Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
KS C IEC 60748-3-2002(2017) Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-3-2002(2022) Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS G ISO 11380-2001(2016) Optics and optical instruments－Ophthalmic optics－Formers
KS C IEC 62149-3-2005(2020) Fibre optic active components and devices－Performance standards－Part 3：2.5 Gbit/s modulator－integrated laser diode transmitters
KS B ISO 9345-1-2016(2021) Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-2-2016(2021) Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS C IEC 60748-2-6-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
KS C IEC 60748-2-6-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60747-5-1:2004 Discrete semiconductor devices and integrated circuits－Part 5－1：Optoelectronic devices－General
KS C IEC 60747-5-3:2020 Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods
KS C IEC 60748-2-20:2002 Semiconductor devices－Integrated circuits－Part 2－20：Digital integrated circuits－Family specification－Low voltage integrated circuits
KS C IEC 60748-2-20:2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
KS C IEC 60748-3-1-2002(2017) Semiconductor devices－Integrated circuits－Part 3：Analogue integrated circuits－Section 1：Blank detail specification for monolithic integrated operational amplifiers
KS C IEC 60748-3-1-2002(2022) Semiconductor devices－Integrated circuits－Part 3：Analogue integrated circuits－Section 1：Blank detail specification for monolithic integrated operational amplifiers
KS C IEC 60748-5:2003 Semiconductor devices－Integrated circuits－Part 5：Semicustom integrated circuits
KS C IEC 60748-20:2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60747-5-3:2004 Semiconductor devices－Discrete devices－Part 5－3：optoelectronic devices－Measuring method
KS C IEC 60050-521-2002(2022) Semiconductor devices and integrated circuits
KS C IEC 60050-521-2002(2017) Semiconductor devices and integrated circuits
KS C IEC 60748-20-1:2003 Semiconductor devices－Integrated circuits－Part 20：Generic specification for film integrated circuits and hybrid film integrated circuits－Section 1：Requirements for internal visual examination
KS C IEC 60748-20:2003 Semiconductor devices－Integrated circuits－Part 20：Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60748-2-10:2001 Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
KS C IEC 60748-2-8-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-8-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS A ISO 12234-1-2016(2021) Electronic still-picture imaging－Removable memory－Part 1：Basic removable-memory model
KS B ISO 11807-2-2017(2022) Integrated optics — Vocabulary — Part 2: Terms used in classification
KS C IEC 60748-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60748-2-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60748-2-12-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 12：Digital integrated circuits－Blank detail specification for programmable logic devices(PLDs)
KS C IEC 60748-2-9:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 9：Blank detail specification for MOS ultraviolet light erasable electrically programmable read－only memories
KS C IEC 60748-2-9-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 9：Blank detail specification for MOS ultraviolet light erasable electrically programmable read－only memories
KS C IEC 60748-2-9-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 9：Blank detail specification for MOS ultraviolet light erasable electrically programmable read－only memories
KS C IEC 60748-2-7:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 7：Blank detail specification for integrated circuits fusible－link programmable bipolar read－only memories
KS A 4730-1997(2007) Mono-tank X-ray units for diagnostic use
KS C ISO 10656-2001(2006) Electric resistance welding－Integrated transformers for welding guns
KS A ISO 18929:2007 Imaging materials－Wet－processed silver－gelatin type black－and－white photographic reflection prints－ Specifications for dark storage
KS G ISO 11380-2001(2021) Optics and optical instruments－Ophthalmic optics－Formers
KS C IEC 60748-2-12-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 12：Digital integrated circuits－Blank detail specification for programmable logic devices(PLDs)
KS C IEC 60748-2-3-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 3：Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
KS B ISO 14881:2006 Integrated optics－Interfaces－Parameters relevant to coupling properties
KS B ISO 11807-2:2007 Integrated optics－Vocabulary－Part 2：Terms used in classification
KS C 8577-2022 Building integrated photovoltaic(BIPV) modules — The requirement of performance evaluation
KS C 8577-2016(2021) Building integrated photovoltaics(BIPV) modules — The requirement of performance evaluation
KS C IEC 60748-2-11:2002 Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
KS C IEC 60747-5-2:2020 Discrete semiconductor devices and integrated circuits —Part 5-2: Optoelectronic devices — Essential ratings and characteristics

International Organization for Standardization (ISO), imaging collector

ISO 9358:1994 Optics and optical instruments - Veiling glare of image-forming systems - Definitions and methods of measurement
ISO 18925:2008 Imaging materials - Optical disc media - Storage practices
ISO 15529:1999 Optics and optical instruments - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems
ISO 18925:2013 Imaging materials - Optical disc media - Storage practices
ISO 18938:2008 Imaging materials - Optical discs - Care and handling for extended storage
ISO 18938:2014 Imaging materials - Optical discs - Care and handling for extended storage
ISO 11380:1994 Optics and optical instruments - Ophthalmic optics - Formers
ISO/CD 18221:2023 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
ISO 18943:2014 Imaging materials - Magnetic hard drives used for image storage - Care and handling
ISO 18221:2016 Microscopes - Microscopes with digital imaging displays - Information provided to the user regarding imaging performance
ISO/CIE TR 21783:2022 Light and lighting — Integrative lighting — Non-visual effects
ISO 12234-3:2016 Electronic still picture imaging - Removable memory - Part 3: XMP for digital photography
ISO 18920:2000 Imaging materials - Processed photographic reflection prints - Storage practices
ISO 18929:2012 Imaging materials - Wet-processed silver-gelatin type black-and-white photographic reflection prints - Specifications for dark storage
ISO 18929:2003 Imaging materials - Wet-processed silver-gelatin type black-and-white photographic reflection prints - Specifications for dark storage
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO/CD 18937-3:2014 Imaging materials — Methods for measuring indoor light stability of photographic prints — Part 3: LED lamp exposure
ISO 19962:2019 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
ISO 11807-2:2001 Integrated optics - Vocabulary - Part 2: Terms used in classification
ISO 14881:2001 Integrated optics - Interfaces - Parameters relevant to coupling properties
ISO 14881:2021 Integrated optics - Interfaces - Parameters relevant to coupling properties
ISO 11807-2:2021 Integrated optics - Vocabulary - Part 2: Terms used in classification
ISO/TR 12037:1998 Electronic imaging - Recommendations for the expungement of information recorded on write-once optical media
ISO 18937:2014 Imaging materials - Photographic reflection prints - Methods for measuring indoor light stability
ISO 11807-1:2021 Integrated optics — Vocabulary — Part 1: Optical waveguide basic terms and symbols
ISO 14535:2001 Photography - Room-light loading packages for electronic scanners and image-setting film and paper rolls - Dimensions and related requirements
ISO 18902:2001 Imaging materials - Processed photographic films, plates and papers - Filing enclosures and storage containers
ISO 18434-2:2019 Condition monitoring and diagnostics of machine systems — Thermography — Part 2: Image interpretation and diagnostics
ISO/CD 18937-3.2 Imaging materials — Methods for measuring indoor light stability of photographic prints — Part 3: LED lamp exposure
ISO 1073-1:1976/Amd 1:1978 Alphanumeric character sets for optical recognition; Part 1: Character set OCR-A; Shapes and dimensions of the printed image
ISO 1073-1:1976 Alphanumeric character sets for optical recognition; Part 1: Character set OCR-A; Shapes and dimensions of the printed image
ISO 1073-2:1976 Alphanumeric character sets for optical recognition; Part 2: Character set OCR-B; Shapes and dimensions of the printed image
ISO 1073-2:1976/Amd 1:1978 Alphanumeric character sets for optical recognition; Part 2: Character set OCR-B; Shapes and dimensions of the printed image

未注明发布机构, imaging collector

BS ISO 9358:1994(2000) Optics and optical instruments — Veiling glare of image - forming systems — Definitions and methods of measurement
BS EN 60747-5-1:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 1 : Optoelectronic devices — General
BS EN 60747-5-3:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 3 : Optoelectronic devices — Measuring methods
GJB 6916-2009 Design and finalization test procedures for individual soldier imaging mine detectors
BS EN 60747-5-2:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 2 : Optoelectronic devices — Essential ratings and characteristics

German Institute for Standardization, imaging collector

DIN ISO 9358:2021-08 Optics and optical instruments - Veiling glare of image-forming systems - Definitions and methods of measurement (ISO 9358:1994)
DIN EN 17501:2020 Non-destructive testing - Thermographic testing - Active thermography with laser excitation; German and English version prEN 17501:2020
DIN EN 17501:2022-08 Non-destructive testing - Thermographic testing - Active thermography with laser excitation; German version EN 17501:2022
DIN 54185:2021-06 Non-destructive testing - Thermographic testing - Lock-In thermography using optical excitation
DIN ISO 9358:2021 Optics and optical instruments - Veiling glare of image-forming systems - Definitions and methods of measurement (ISO 9358:1994)
DIN ISO 9358:2020 Optics and optical instruments - Veiling glare of image forming systems - Definitions and methods of measurement (ISO 9358:1994); Text in German and English
DIN 54184:2017-10 Non-destructive testing - Pulse thermography using optical excitation
DIN EN ISO 24157:2020-06 Ophthalmic optics and instruments - Reporting aberrations of the human eye (ISO 24157:2008 + Amd 1:2020); German version EN ISO 24157:2008 + A1:2020
DIN 58002:2001 Integrated optics - Near-field-measurement for single-mode optical chip components
DIN EN ISO 11380:1996-08 Optics and optical instruments - Ophthalmic optics - Formers (ISO 11380:1994); German version EN ISO 11380:1996
DIN EN ISO 14881:2005 Integrated optics - Interfaces - Parameters relevant to coupling properties (ISO 14881:2001); German version EN ISO 14881:2005
DIN EN 62149-3:2004 Fibre optic active components and devices - Performance standards - Part 3: 2,5 Gbit/s modulator-integrated laser diode transmitters (IEC 62149-3:2004); German version EN 62149-3:2004
DIN 19277:2015-12 Condition monitoring and diagnostics of machines - Thermography - General procedures (ISO 18434-1:2008, modified)
DIN EN ISO 11807-2:2005 Integrated optics - Vocabulary - Part 2: Terms used in classification (ISO 11807-2:2001); German version EN ISO 11807-2:2005
DIN EN ISO 11146-1:2021-11 Lasers and laser-related equipment - Test methods for laser beam widths, divergence angles and beam propagation ratios - Part 1: Stigmatic and simple astigmatic beams (ISO 11146-1:2021); German version EN ISO 11146-1:2021
DIN EN 14603:2005 Information technology - Alphanumeric glyph image set for optical character recognition OCR-B - Shapes and dimensions of the printed image; English version EN 14603:2004
DIN EN ISO 11807-1:2022-05 Integrated optics - Vocabulary - Part 1: Optical waveguide basic terms and symbols (ISO 11807-1:2021); German version EN ISO 11807-1:2021
DIN EN 61964:2000 Integrated circuits - Memory devices pin configurations (IEC 61964:1999); German version EN 61964:1999

ES-UNE, imaging collector

UNE-EN 17501:2022 Non-destructive testing - Thermographic testing - Active thermography with laser excitation
IEEE 3333.1.4-2022 IEEE Recommended Practice for the Quality Assessment of Light Field Imaging
UNE-EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices - Measuring methods. (Endorsed by AENOR in October of 2001.)
UNE-EN 60747-5-3:2001/A1:2002 Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices - Measuring methods (Endorsed by AENOR in November of 2002.)
UNE-EN 190110:1994 BDS: DIGITAL MICROPROCESSOR INTEGRATED CIRCUITS. (Endorsed by AENOR in November of 1996.)
UNE-EN ISO 11146-1:2021 Lasers and laser-related equipment - Test methods for laser beam widths, divergence angles and beam propagation ratios - Part 1: Stigmatic and simple astigmatic beams (ISO 11146-1:2021) (Endorsed by Asociación Española de Normalización in September ...
UNE-EN ISO 11807-1:2021 Integrated optics - Vocabulary - Part 1: Optical waveguide basic terms and symbols (ISO 11807-1:2021) (Endorsed by Asociación Española de Normalización in December of 2021.)
UNE-EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic devices - Essential ratings and characteristics. (Endorsed by AENOR in October of 2001.)
UNE-EN 60747-5-2:2001/A1:2002 Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic devices - Essential ratings and characteristics (Endorsed by AENOR in November of 2002.)

Association Francaise de Normalisation, imaging collector

NF EN 17501:2022 Essais non destructifs - Analyse thermographique - Thermographie active avec excitation laser
NF S10-043*NF ISO 9358:1998 Optics and optical instruments. Veiling glare of image-forming systems. Definitions and methods of measurement.
NF C96-005:1994 Discrete devices and integrated circuits. Part 5 : optoelectronic devices.
NF ISO 9358:1998 Optique et instruments d'optique - Lumière parasite diffuse des systèmes d'imagerie - Définitions et méthodes de mesure.
NF S10-045:1999 Optics and optical instruments - General optical test methods - Measurement of relative irradiance in the image field.
NF S10-051*NF ISO 15795:2002 Optics and optical instruments - Quality evaluation of optical systems - Assessing the image quality degradation due to chromatic aberrations
NF C96-005-1/A1*NF EN 60747-5-1/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
NF C96-005-1*NF EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
NF EN 60747-5-1/A1:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
NF EN 60747-5-1/A2:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
NF EN 60747-5-1:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
NF C96-042:1989 Semiconductor Devices Integrated circuits Part 2:Digital integrated circuits
NF C96-005-1/A2*NF EN 60747-5-1/A2:2002 Discrete semiconductor devices and integrated circuits - Partie 5-1 : optoelectronic devices - General
NF EN 50201:2002 Interfaces pour décodeur DVB intégré
NF C96-005-3*NF EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Part 5-3 : optoelectronic devices - Measuring methods
NF C96-005-3/A1*NF EN 60747-5-3/A1:2002 Discrete semiconductor devices and integrated circuits - Partie 5-3 : optoelectronic devices - Measuring methods
NF EN 60747-5-3:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-3 : dispositifs optoélectroniques - Méthodes de mesure
NF EN 60747-5-3/A1:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-3 : dispositifs optoélectroniques - Méthodes de mesure
NF ISO 18251-2:2023 Essais non destructifs - Thermographie infrarouge - Partie 2 : Méthode d'essai relative aux performances intégrées du système et de l'appareillage
NF EN 1837:2020 Sécurité des machines - Eclairage intégré aux machines
NF EN IEC 62878-1:2019 Techniques d'assemblage avec appareil(s) integré(s) - Partie 1 : spécification générique pour substrats avec appareil(s) intégré(s)
NF EN 14603:2005 Technologies de l'information - Jeu d'images de glyphe alphanumérique pour la reconnaissance optique de caractères ROC-B - Formes et cotes de l'image imprimée
NF ISO 18434-2:2019 Surveillance et diagnostic de l'état des systèmes de machines - Thermographie - Partie 2 : interprétation d'image et diagnostic
NF C93-884-3:2004 Fibre optic active components and devices - Performance standards - Part 3 : 2,5 Gbit/s modulator-integrated laser diode transmitters.
NF EN 61964:2000 Circuits intégrés - Configuration de broches de mémoires
NF EN 60747-5-2:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-2 : dispositifs optoélectroniques - Valeurs limites et caractéristiques essentielles
NF EN 60747-5-2/A1:2003 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-2 : dispositifs optoélectroniques - Valeurs limites et caractéristiques essentielles
NF S10-048*NF ISO 19962:2019 Optics and photonics - Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
NF S10-131:2005 Integrated optics - Interfaces - Parameters relevant to coupling properties.
NF S10-130-2:2005 Integrated optics - Vocabulary - Part 2 : terms used in classification.
NF EN ISO 14881:2021 Optique intégrée - Interfaces - Paramètres caractérisant les propriétés de couplage
NF Z62-013*NF EN 14603:2005 Information technology - Alphanumeric glyph image set for optical character recognition OCR-B - Shapes and dimensions of the printed image.
NF S10-130-1*NF EN ISO 11807-1:2021 Integrated optics - Vocabulary - Part 1 : optical waveguide basic terms and symbols
NF C96-005-2/A1*NF EN 60747-5-2/A1:2003 Discrete semiconductor devices and integrated circuits - Partie 5-2 : optoelectronic devices - Essential ratings and characteristics
NF C96-005-2*NF EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits - Part 5-2 : optoelectronic devices - Essential ratings and characteristics
NF C96-012*NF EN 61964:2000 Integrated circuits - Memory devices pin configurations
NF A82-043:1996 Electric resistance welding. Integrated transformers for welding guns.

Military Standard of the People's Republic of China-General Armament Department, imaging collector

GJB 9631-2019 Specifications for optical imaging sensors for manned spacecraft rendezvous and docking
GJB 4026A-2014 General specification for LiNbO<下标3> integrated optics devices
GJB 9888-2020 Lithium niobate integrated optical device test method
GJB 4026-2000 General specification for lithium niobate integrated optical devices
GJB 9726-2020 Specifications for spaceborne hyperspectral imagers
GJB 5546-2006 General specification for airborne optics imaging reconnaissance
GJB 7951-2012 Measuring methods for charge coupled imaging devices
GJB 5968-2007 General specincation for imaging charge coupled devices
GJB 5968A-2021 General specifications for charge-coupled imaging devices
GJB 10036-2021 Cloud and smoke adaptability assessment method for laser imaging system
GJB 10245-2022 Specifications for Staring Infrared Imagers for Airborne Missiles
GJB 4799-1997*GJBz 20432-1997 Inspection and acceptance rules for military infrared thermal imaging instruments
GJB/Z 42.4-1993 Military Microcircuit Series Spectrum Semiconductor Integrated Circuit Interfacer Integrated Circuit
GJB 2438/25-2021 Detailed specifications for hybrid integrated circuit WHZD6500M-11 microwave hybrid integrated voltage controlled oscillator
GJB 2438/23-2021 Hybrid integrated circuit WHZD950M1050M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
GJB 2438/24-2021 Hybrid integrated circuit WHZD800M1100M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
GJB 2438/28-2021 Hybrid integrated circuit WHZD2200M2600M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
GJB 2438/21-2021 Hybrid integrated circuit WHZD8240M8600M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications

Society of Automotive Engineers (SAE), imaging collector

SAE ARP4967C-2023 Night Vision Imaging Systems (NVIS) Integrally Illuminated Information Panels
SAE J2661-2011 Optical Imaging Evaluation of Impact Damage Resistance Testing on Exterior Finishes
SAE J2661-2023 Optical Imaging Evaluation of Impact Damage Resistance Testing on Exterior Finishes

GB-REG, imaging collector

REG NASA-LLIS-0526-1994 Lessons Learned ?Magnetic Field Distribution in the Magneto-Optic Imaging Instrument
REG NASA-LLIS-0903-2000 Lessons Learned ?High Energy Spectroscopic Imager Test Mishap

British Standards Institution (BSI), imaging collector

BS EN 17501:2022 Non-destructive testing. Thermographic testing. Active thermography with laser excitation
20/30410182 DC BS EN 17501. Non-destructive testing. Thermographic testing. Active thermography with laser excitation
BS ISO 9358:1994 Optics and optical instruments. Veiling glare of image forming systems. Definitions and methods of measurement
BS ISO 13653:1997 Optics and optical instruments - General optical test methods - Measurement of relative irradiance in the image field
BS IEC 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General
BS IEC 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS EN 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Measuring methods
BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
BS ISO 18925:2013 Imaging materials. Optical disc media. Storage practice
BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
PD IEC TS 63202-2:2021 Photovoltaic cells. Electroluminescence imaging of crystalline silicon solar cells
BS IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
BS ISO 15529:2010 Optics and photonics. Optical transfer function. Principles of measurement of modulation transfer function (MTF) of sampled imaging systems
BS EN 60747-16-1:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
BS EN ISO 11807-2:2005 Integrated optics - Vocabulary - Terms used in classification
BS EN ISO 11807-2:2021 Integrated optics. Vocabulary. Terms used in classification
BS 6493-2.3:1987 Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
BS ISO 18938:2008 Imaging materials - Optical discs - Care and handling for extended storage
BS ISO 18938:2014 Imaging materials. Optical discs. Care and handling for extended storage
BS EN 60747-5-2:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Essential ratings and characteristics
BS EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Essential ratings and characteristics
BS IEC 62679-3-3:2016 Electronic paper displays - Optical measuring methods for displays with integrated lighting units
BS EN 62149-3:2004 Fibre optic active components and devices - Performance standards - 2,5 Gbit/s modulator-integrated laser diode transmitters
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS ISO 18943:2014 Imaging materials. Magnetic hard drives used for image storage. Care and handling
BS ISO 18434-2:2019 Condition monitoring and diagnostics of machine systems. Thermography - Image interpretation and diagnostics
BS EN ISO 11807-1:2005 Integrated optics - Vocabulary - Basic terms and symbols
BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
BS IEC 60748-4-3:2006 Semiconductor devices. Integrated circuits - Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
BS EN 62148-11:2004 Fibre optic active components and devices - Package and interface standards - 14-pin modulator-integrated laser diode transmitters
BS EN ISO 24157:2008+A1:2020 Ophthalmic optics and instruments. Reporting aberrations of the human eye
BS EN IEC 62149-3:2020 Fibre optic active components and devices. Performance standards. Modulator-integrated laser diode transmitters for 40-Gbit/s fibre optic transmission systems
BS IEC 60748-4-3:2007 Semiconductor devices - Integrated circuits - Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
BS IEC 60748-1:2002 Semiconductor devices - Integrated circuits - General
BS 6493-2.1:1985 Semiconductor devices - Integrated circuits - General
BS EN 60747-16-1:2002+A1:2007 Semiconductor devices — Part 16-1: Microwave integrated circuits — Amplifiers
BS EN 62228-2:2017 Integrated circuits. EMC evaluation of transceivers. LIN transceivers
BS EN IEC 60747-16-6:2019 Semiconductor devices. Microwave integrated circuits. Frequency multipliers
BS EN 60747-16-1:2002+A2:2017 Semiconductor devices - Microwave integrated circuits. Amplifiers
BS EN 60747-16-3:2002+A2:2017 Semiconductor devices - Microwave integrated circuits. Frequency converters
BS EN 60747-16-5:2013+A1:2020 Semiconductor devices - Microwave integrated circuits. Oscillators
BS EN 61223-3-2:2008 Evaluation and routine testing in medical imaging departments -Part 3-2: Acceptance tests - Imaging performance of mammographic X-ray equipment
BS ISO 18929:2012 Imaging materials. Wet-processed silver-gelatin type black-and-white photographic reflection prints. Specifications for dark storage
BS EN ISO 11146-1:2021 Tracked Changes. Lasers and laser-related equipment. Test methods for laser beam widths, divergence angles and beam propagation ratios. Stigmatic and simple astigmatic beams
BS EN 61291-6-1:2009 Optical amplifiers. Interfaces. Command set
BS EN 61291-6-1:2008 Optical amplifiers - Interfaces - Command set
BS EN ISO 14881:2005 Integrated optics - Interfaces - Parameters relevant to coupling properties
PD IEC/TR 63072-1:2017 Photonic integrated circuits. Introduction and roadmap for standardization
BS ISO 18937:2014 Imaging materials. Photographic reflection prints. Methods for measuring indoor light stability
BS PD IEC TS 63140:2021 Photovoltaic (PV) modules. Partial shade endurance testing for monolithically integrated products
BS EN ISO 11807-1:2021 Tracked Changes. Integrated optics. Vocabulary. Optical waveguide basic terms and symbols
BS IEC 60748-2-12:2001 Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification for programmable logic devices (PLDs)
BS EN 62149-3:2014 Fibre optic active components and devices. Performance standards. Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems
BS EN IEC 62228-6:2022 Integrated circuit. EMC evaluation of transceivers - PSI5 transceivers
BS EN IEC 62228-3:2019 Integrated circuits. EMC evaluation of transceivers - CAN transceivers

Professional Standard - Electron, imaging collector

SJ/T 11404-2009 General specifications for LiNbOintegrated optical devices
SJ 20869-2003 Measuring methods for LiNbO3 integrated optical guided-wave modulators
SJ 20868-2003 Measuring methods for charge coupled imaging device

Professional Standard - Public Safety Standards, imaging collector

GA/T 1195-2014 Spectral imaging methods by tunable filter in forensic science
GA/T 1775-2021 Forensic Science Thermoluminescence Imaging Technology Specifications for Displaying Fingerprints
GA/T 1202-2022 General technical requirements for traffic technology monitoring imaging supplementary light device
GA/T 1202-2014 General technical requirements for traffic technology monitoring imaging supplementary light device

KR-KS, imaging collector

KS B ISO 9358-2023 Optics and optical instruments — Veiling glare of image forming systems — Definitions and methods of measurement
KS A ISO 18925-2016 Imaging materials－Optical disc media－Storage practices
KS C IEC 60747-5-1-2020 Discrete semiconductor devices and integrated circuits —Part 5-1: Optoelectronic devices — General
KS B ISO 9345-2-2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60747-5-3-2020 Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods
KS C IEC 60748-2-20-2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
KS B ISO 9345-1-2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS C IEC 60748-20-2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS A ISO 12234-1-2016 Electronic still-picture imaging－Removable memory－Part 1：Basic removable-memory model
KS C IEC 60748-2-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60748-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60747-5-2-2020 Discrete semiconductor devices and integrated circuits —Part 5-2: Optoelectronic devices — Essential ratings and characteristics

Group Standards of the People's Republic of China, imaging collector

T/CIE 079-2020 Evaluation of Industrial High Reliability Integrated Circuits Part 14: Image Sensors
T/ZZB 1335-2019 Optical low pass filter for high-definition imaging
T/SCGS 313003-2023 Standards for image quality evaluation of near-infrared second-zone fluorescence imaging technology
T/CAIA YQ007-2021 General test method for photoelectric performance of electron multiplying charge coupled imaging device
T/YNBX 098-2023 Determination of rice seed vigor - Multispectral imaging method
T/NJAF 001-2020 Infrared thermal imaging method for rapid screening of body temperature in crowded areas
T/CFPA 027-2023 Infrared Thermography Heat Fire Detector
T/CADBM 61-2022 Integrated electrical controller for ceiling
T/ICMTIA 5.1-2020 ArF Dry photo resist for Integrated circuits
T/CPIA 0009-2019 Electroluminescence Imaging Method for Defect Detection of Crystalline Silicon Photovoltaic Modules
T/ICMTIA 5.3-2020 Lithography ArF Photo Resist of measurement for Intergraded circuits
T/ZZB 2866-2022 Variable frequency controller for integrated stove
T/ICMTIA 5.2-2020 ArF immersion photo resist for integrated circuits
T/QGCML 1273-2023 Image intensifier fluorescent screen vacuum test bench
T/CESA 1151-2021 Intelligent photovoltaic（PV） cloud platform—Scheme of system integration
T/SHMHZQ 018-2022 Technical specification for diaphragm coupling integrated explosion-proof optical fiber torque detection system
T/SZCX 003-2019 Gas-burning appliance for integration cooking appliances
T/CNHA 1061-2023 Quality Technical Requirements for Kitchen Appliances for Centralized Purchase and Similar Purposes integration (electromagnetism) cooking appliances
T/CSBME 047-2022 Specification for acquisition and post-processing of arterial spin labeling magnetic resonance cerebral perfusion imaging
T/AHEPI 0002-2023 Technical guide for hyperspectral targeted imaging remote sensing monitoring of trace gases
T/CIRA 37-2022
T/SZCX 001-2019 Electronic controller of integration cooking appliances
T/CASME 403-2023 Vco for hybrid integrated circuits

U.S. Air Force, imaging collector

AIR FORCE MIL-I-25861 D VALID NOTICE 2-2008 Indicator, Pressure, Hydraulic, 0-4,000 PSI, Integrally Lighted
AIR FORCE QPL-27202-21 NOTICE 1-2009 Indicator, Electrical Tachometer, 0-110 Percent RPM, 2-Inch Size, Integrally Lighted
AIR FORCE QPL-25863-22 NOTICE 1-2009 Indicator, Electrical Tachometer, 0-110 Percent RPM 2-Inch Size, Integrally Lighted
AIR FORCE MIL-DTL-25949 F VALID NOTICE 2-2008 Accelerometer, Aircraft Range -5 to 10G Units, Integrally Lighted
AIR FORCE MIL-DTL-25949F-1995 ACCELEROMETER, AIRCRAFT RANGE -5 TO 10G UNITS, INTEGRALLY LIGHTED

US-RTCA, imaging collector

RTCA DO-275-2001 Minimum Operational Performance Standards for Integrated Night Vision Imaging System Equipment

国家市场监督管理总局、中国国家标准化管理委员会, imaging collector

GB/T 38935-2020 On-orbit radiometric characteristics assessment for optical imaging remote sensor—VIS-SWIR
GB/T 36301-2018 Pre-processing product levels for spaceborne hyperspectral imaging data
GB/T 40139-2021 Measuring method for surface areas of materials—Three dimensional area measurement base on hyperspectral imaging
GB/T 36614-2018 Integrated circuits—Memory devices pin configuration

Danish Standards Foundation, imaging collector

DS/ISO 18925:2013 Imaging materials - Optical disc media - Storage practices
DS/ISO 18918:2001 Imaging materials - Processed photographic plates - Storage practices
DS/EN 60747-5-1/A2:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
DS/EN 60747-5-1/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
DS/EN 60747-5-1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
DS/EN ISO 11380:1997 Optics and optical instruments - Ophthalmic optics - Formers
DS/EN 60747-5-3/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
DS/EN 60747-5-3:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
DS/IEC 748-20:1990 Semiconductor devices. Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
DS/ISO 12234-1:2012 Electronic still-picture imaging - Removable memory - Part 1: Basic removable-memory model
DS/EN 62149-3:2004 Fibre optic active components and devices - Performance standards - Part 3: 2,5 Gbit/s modulator-integrated laser diode transmitters
DS/EN ISO 24157:2008 Ophthalmic optics and instruments - Reporting aberrations of the human eye
DS/EN IEC 62149-3:2021 Fibre optic active components and devices – Performance standards – Part 3: Modulator-integrated laser diode transmitters for 40-Gbit/s fibre optic transmission systems
DS/EN 14603:2006 Information technology - Alphanumeric glyph image set for optical character recognition OCR-B - Shapes and dimensions of the printed image
DS/ISO 11807-1:2021 Integrated optics – Vocabulary – Part 1: Optical waveguide basic terms and symbols
DS/IEC 748-2-6:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section six: Blank detail specification for microprocessor integrated circuits
DS/EN 60747-5-2/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
DS/EN 60747-5-2:2002 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

ANSI - American National Standards Institute, imaging collector

IT9.25-1998 Imaging Materials - Optical Disc Media - Storage (IS&T)
IT9.18-1996 Imaging Materials - Processed Photographic Plates - Storage Practices (IS&T)

RU-GOST R, imaging collector

GOST R IEC 61223-3-1-2001 Evaluation and routine testing in medical imaging departments. Part 3-1. Imaging performance of X-ray equipment for radiographic and radioscopic systems. Acceptance tests
GOST 29283-1992 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices
GOST R ISO 4090-2006 Photography. Medical radiographic cassettes/screens/films and hard-copy imaging films. Dimensions and technical requirements
GOST R IEC 61675-2-2002 Radionuclide imaging devices. Characteristics and test conditions. Part 2. Single photon emission computed tomographs
GOST R IEC 61675-2-2006 Radionuclide imaging devices. Characteristics and test conditions. Part 2. Single photon emission computed tomographs
GOST R IEC 61223-2-10-2001 Evaluation and routine testing in medical imaging departments. Part 2-10. Constancy tests. X-ray equipment for mammography
GOST 29108-1991 Semiconductor devices. Integrated circuits. Part 3. Analog integrated circuits
GOST 29107-1991 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits
GOST 29109-1991 Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits
GOST R IEC 60627-2005 Diagnostic X-ray imaging equipment. Characteristics of general purpose and mammographic anti-scatter grids
GOST R IEC/TO 61948-2-2008 Nuclear medicine instrumentation. Routine tests. Part 2. Scintillation cameras and single photon emission computed tomography imaging
GOST 24613.0-1981 Optoelectronic integrated microcircuits and opto-couples. General requirements at measuring of electrical parameters
GOST 24613.9-1983 Optoelectronic integrated microcircuits and optocouplers. Method for measuring switching times
GOST 24613.18-1977 Optoelectronic integrated microcircuits and optocouplers. Methods for measuring isolation resistance
GOST 21815.14-1986 Image intensifier and image converter tubes. Method of measuring the image drift
GOST 24613.1-1981 Optoelectronic integrated microcircuits and optocouplers. Method for measuring of input-to-output capacitance
GOST 24613.2-1981 Optoelectronic integrated microcircuits and opto-couples. Method for measuring leatage current
GOST 24613.3-1981 Optoelectronic integrated microcircuits and opto-couples. Method for measuring input voltage
GOST 24613.6-1981 Optoelectronic integrated microcircuits and optocouplers. Method for measuring of isolation voltage
GOST 24613.17-1977 Optoelectronic integrated microcircuits. Method for measuring output differential resistance of analogue signal commutators
GOST 24613.19-1977 Optoelectronic integrated microcircuits and optocouplers. Method for measuring current transfer ratio
GOST R ISO 18434-2-2021 Condition monitoring and diagnostics of machine systems. Thermography. Part 2. Image interpretation and diagnostics

Professional Standard - Post and Telecommunication, imaging collector

YD/T 2000.1-2014 Integrated optical path devices based on planar lightwave circuit.Part 1: Optical power splitter based on PLC technology
YD/T 2000.1-2009 Integrated optical path devices based on planar lightwave circuit.Part 1:Optical power splitter based on PLC technology
YD/T 2000.2-2009 Integrated optical path devices based on planar lightwave circuit.Part 2:DWDM filter based on AWG technology
YD/T 2799.5-2023
YD/T 2904.1-2015 Integrated tunable laser assembly.Part 1: Butterfly package assembly

North Atlantic Treaty Organization Standards Agency, imaging collector

STANAG 4161-1982 THE OPTICAL TRANSFER FUNCTION OF IMAGING SYSTEMS - AISP-01

IET - Institution of Engineering and Technology, imaging collector

INTRO SEN RNG IMG-2009 Introduction to Sensors for Ranging and Imaging
DES HIGH FREQ INTEG ANLG FILT-2002 Design of High Frequency Integrated Analogue Filters

Professional Standard - Machinery, imaging collector

JB/T 5453-2011 Non-destructive testing instruments.Industrial X-ray image intensifer imaging system

American Society for Testing and Materials (ASTM), imaging collector

ASTM D5767-95(2004) Standard Test Methods for Instrumental Measurement of Distinctness-of-Image Gloss of Coating Surfaces
ASTM F1443-93(2003) Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images
ASTM E1260-03(2020) Standard Test Method for Determining Liquid Drop Size Characteristics in a Spray Using Optical Nonimaging Light-Scattering Instruments
ASTM E1260-03(2009) Standard Test Method for Determining Liquid Drop Size Characteristics in a Spray Using Optical Nonimaging Light-Scattering Instruments
ASTM F1443-93(2009) Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images

ESDU - Engineering Sciences Data Unit, imaging collector

SPA-M10-2-2010 Apr.09: Probing into petroleum heath-exchanger deposits with spectroscopic imaging

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, imaging collector

GB/T 35437-2017 General specification for spaceborne opto-electronic tracking and imaging system
GB/T 33806-2017 Technical requirement of area fluorescent imaging microarray scanner

International Electrotechnical Commission (IEC), imaging collector

IEC 60747-5:1992 Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices
IEC 60858:1986 Determination of the image distortion of electro-optical X-ray image intensifiers
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
IEC 60747-5-1:1997/AMD2:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 2
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60747-5-1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General
IEC 60748-2-20:2000 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits; Family specifications: Low voltage integrated circuits
IEC 60748-20:1988 Semiconductor devices - Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
IEC 60748-2-6:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section six: blank detail specification for microprocessor integrated circuits
IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
IEC 60748-2-20:2008 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
IEC 62149-3:2020 RLV Fibre optic active components and devices - Performance standards - Part 3: Modulator-integrated laser diode transmitters for 40-Gbit/s fibre optic transmission systems
IEC TS 63202-2:2021 Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
IEC 60747-5-3:1997/AMD1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 62149-3:2020 Fibre optic active components and devices - Performance standards - Part 3: Modulator-integrated laser diode transmitters for 40-Gbit/s fibre optic transmission systems
IEC 60748-3-1:1991 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; section 1: blank detail specification for monolithic integrated operational amplifiers
IEC 60748-2-10:1994 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
IEC 60748-3:1986/AMD2:1994 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2
IEC 60748-3:1986/AMD1:1991 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 1
IEC 60748-3/AMD2/COR1:1996 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2
IEC 62149-3:2004 Fibre optic active components and devices - Performance standards - Part 3: 2,5 Gbit/s modulator-integrated laser diode transmitters
IEC 60747-5-1:1997/AMD1:2001 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 1
IEC 62679-3-3:2016 Electronic paper displays - Part 3-3: Optical measuring methods for displays with integrated lighting units
IEC 60748-20:1988/AMD1:1995 Amendment 1 - Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
IEC 60748-2/AMD1:1991 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; amendment 1
IEC 60748-4/AMD1:1991 Semiconductor devices; intergrated circuits; part 4: interface integrated circuits; amendment 1
IEC 62148-11:2003 Fibre optic active components and devices - Package and interface standards - Part 11: 14-pin modulator-integrated laser diode transmitters

Association of German Mechanical Engineers, imaging collector

VDI/VDE 3717 Blatt 10-1993 Mask engineering; masks for integrated optics
VDI/VDE 2634 Blatt 1-2002 Optical 3D measuring systems - Imaging systems with point-by-point probing

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, imaging collector

GJB 5984-2007 Specification for generation Ⅲ image intensiner assembly

Professional Standard - Military and Civilian Products, imaging collector

WJ 2091-1992 Low-light image intensifier test method

European Committee for Electrotechnical Standardization（CENELEC）, imaging collector

HD 515 S1-1989 Determination of the Image Distortion of Electro-Optical X-Ray Image Intensifiers
EN 62148-11:2009 Fibre optic active components and devices - Package and interface standards - Part 11: 14-pin active device modules
EN 61964:1999 Integrated Circuits - Memory Devices Pin Configurations

IN-BIS, imaging collector

IS 13814-1993 Determination of the image distortion of electro-optical X-ray image intensifiers
IS 12970 Pt.2/Sec.3-1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Essential rating and characteristics. Section 3: Integrated circuit microprocessors
IS 12970 Pt.2/Sec.2-1992
IS 5001 Pt.2-1973
IS 9076-1979
IS 12970 Pt.6/Sec.3-1992

Institute of Electrical and Electronics Engineers (IEEE), imaging collector

IEEE P3333.1.4/D1.1, July 2022 IEEE Draft Recommended Practice for the Quality Assessment of Light Field Imaging
IEEE P3333.1.4 IEEE Approved Draft Recommended Practice for the Quality Assessment of Light Field Imaging
IEEE P3333.1.4 /D1.2, September 2022 IEEE Approved Draft Recommended Practice for the Quality Assessment of Light Field Imaging
IEEE Std 538-1976*ANSI C37.13a-1975 IEEE Low Voltage AC Integrally Fused Power Circuit Breakers

Professional Standard - Medicine, imaging collector

YY/T 1895-2023 Intravascular optical coherence tomography imaging device
YY/T 1418-2016 Ophthalmic optics and instruments.Reporting aberrations of the human eye

Standard Association of Australia （SAA）, imaging collector

AS/NZS 4184.3.4:2002 Evaluation and routine testing in medical imaging departments - Acceptance tests - Imaging performance of dental X-ray equipment
AS/NZS 4184.3.3:1998 Evaluation and routine testing in medical imaging departments - Acceptance tests - Imaging performance of X-ray equipment for digital subtraction angiography (DSA)
IEC 62149-3:2023 Fibre optic active components and devices — Performance standards — Part 3: Modulator-integrated laser diode transmitters for 40-Gbit/s fibre optic transmission systems

Guangdong Provincial Standard of the People's Republic of China, imaging collector

DB44/T 1645-2015 Integrated (COB) White LED Technical Requirements

Japanese Industrial Standards Committee (JISC), imaging collector

JIS Z 4721:2000 Medical X-ray image intensifiers
JIS R 3421:1991 Textile finished glass fabrics for bag filter
JIS X 6319-1:2005 Specification of implementation for integrated circuit(s) cards -- Part 1: Integrated circuit(s) cards with contacts
JIS X 6319-1:2010 Specification of implementation for integrated circuit cards -- Part 1: Integrated circuit cards with contacts
JIS C 5953-3:2019 Fiber optic active components and devices -- Performance standards -- Part 3: Modulator-integrated laser diode transmitters for 40 Gbit/s fiber optic transmission systems

Taiwan Provincial Standard of the People's Republic of China, imaging collector

CNS 13197-1993 Determination of the Image Distortion of Electro - Optical X - Ray Image Intensifiers
CNS 12365-1988 Alphanumeric Character Sets for Optical Recognition - Part II : Character Set OCR-B-Shapes and Dimensions of the Printed Image

Electronic Components, Assemblies and Materials Association, imaging collector

ECA CB16-1999 Integrated Passive Device (IPD) Definitions

Shandong Provincial Standard of the People's Republic of China, imaging collector

DB37/T 2888-2016 Moderate Resolution Imaging Spectrometer (MODIS) Remote Sensing Image Wheat Growth Monitoring Technical Regulations

Professional Standard - Energy, imaging collector

NB/T 11081-2023 Photovoltaic Module Infrared Thermal Imaging (TIS) Inspection Technical Specifications
NB/T 10433-2020 Specifications for the collection and archiving of audio and video files for photovoltaic power generation construction projects

RO-ASRO, imaging collector

SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

PL-PKN, imaging collector

PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods
PN T01303-03-A1-1991 Semiconductor devices Integrated circuits Analogue integrated circuits Measuring methods Amendment 1

ECIA - Electronic Components Industry Association, imaging collector

CB16-1999 Integrated Passive Device (IPD) Definitions

CENELEC - European Committee for Electrotechnical Standardization, imaging collector

EN 62149-3:2004 Fibre optic active components and devices Performance standards Part 3: 2@5 Gbit/s modulator-integrated laser diode transmitters

American National Standards Institute （ANSI), imaging collector

ANSI/ASTM E1260:1995 Test Method for Determining Liquid Drop Size Characteristics in a Spray Using Optical Non-Imaging Light-Scattering Instruments
ANSI/INCITS/ISO 1073-1:1976 Alphanumeric Character Sets for Optical Recognition - Part 1: Character Set OCR-A - Shapes and Dimensions of the Printed Image
ANSI/INCITS/ISO 1073-2:1976 Alphanumeric Character Sets for Optical Recognition - Part 2: Character Set OCR-B - Shapes and Dimensions of the Printed Image
ANSI/INCITS/ISO/IEC 1073-2:1976 Alphanumeric Character Sets for Optical Recognition - Part 2: Character Set OCR-B - Shapes and Dimensions of the Printed Image

Compressed Gas Association (U.S.), imaging collector

CGA E-18-2008 Medical gas valve integrated pressure regulators

International Telecommunication Union (ITU), imaging collector

ITU-R BT.1664-2003 Representation of various image aspect ratios into the image of large screen digital imagery applications that use a 16:9 raster
ITU-R BT.1664 FRENCH-2003 Representation of various image aspect ratios into the image of large screen digital imagery applications that use a 16:9 raster
ITU-R BT.1664 SPANISH-2003 Representation of various image aspect ratios into the image of large screen digital imagery applications that use a 16:9 raster

Lithuanian Standards Office , imaging collector

LST EN ISO 11380:2000 Optics and optical instruments - Ophthalmic optics - Formers (ISO 11380:1994)
LST EN 14603-2005 Information technology - Alphanumeric glyph image set for optical character recognition OCR-B - Shapes and dimensions of the printed image

IT-UNI, imaging collector

UNI EN ISO 24157:2021 Ophthalmic optics and instruments - Reporting aberrations of the human eye

International Commission on Illumination (CIE), imaging collector

CIE X036-2010 Proceedings of the CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry

European Committee for Standardization (CEN), imaging collector

PD CEN/TR 16791:2017 Quantifying irradiance for eye-mediated non-imageforming effects of light in humans
CEN/TR 16791:2017 Quantifying irradiance for eye-mediated non-image-forming effects of light in humans
EN 62148-11:2003 Fibre optic active components and devices — Package and interface standards — Part 11: 14-pin modulator-integrated laser diode transmitters
EN ISO 11807-2:2021 Integrated optics - Vocabulary - Part 2: Terms used in classification (ISO 11807-2:2021)
EN ISO 14881:2021 Integrated optics - Interfaces - Parameters relevant to coupling properties (ISO 14881:2021)
EN 14603:2004 Information technology - Alphanumeric glyph image set for optical character recognition OCR-B - Shapes and dimensions of the printed image

National Metrological Technical Specifications of the People's Republic of China, imaging collector

JJF 2044-2023 Calibration Specification for Single Photon Emission Computed Tomography System(SPECT)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., imaging collector

IEEE 538-1976 Low-voltage ac integrally fused power circuit breakers

Aeronautical Radio Inc., imaging collector

ARINC 743 ITEM 5.0 Integrated Antenna/ Preamplifier/Filter Design
ARINC 743A-4 ITEM 5.0 Integrated Antenna/Preamplifier/Filter Design

CEN - European Committee for Standardization, imaging collector

EN ISO 11807-2:2005 Integrated optics - Vocabulary - Part 2: Terms used in classification

ES-AENOR, imaging collector

UNE 20-575-1981

Professional Standard - Aviation, imaging collector

HB 8428-2014 Inspecting method for infrared flash thermography of composite materials for aerospace

Society of Motion Picture and Television Engineers (SMPTE), imaging collector

SMPTE RP 133-1991 Specifications for Medical Diagnostic Imaging Test Pattern for Television Monitors and Hard-Copy Recording Cameras

Institute of Interconnecting and Packaging Electronic Circuits (IPC), imaging collector

IPC TM-650 2.4.1.3-1987 Adhesion, Resistors (Hybrid Circuits)