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four-probe method

four-probe method, Total:21 items.

In the international standard classification, four-probe method involves: Testing of metals, Non-ferrous metals, Materials for the reinforcement of composites, Linear and angular measurements, Semiconductor devices, Test conditions and procedures in general, Semiconducting materials, Farming and forestry.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, four-probe method

GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array

RU-GOST R, four-probe method

GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method

Group Standards of the People's Republic of China, four-probe method

T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method
T/ZGIA 001-2019 Graphene test method for the determination of powder conductivity four-probe method

Japanese Industrial Standards Committee (JISC), four-probe method

JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe

Hebei Provincial Standard of the People's Republic of China, four-probe method

DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method
DB13/T 5026.3-2019 Method for Determination of Physical Properties of Graphene Conductive Paste Part 3: Four-probe Method for Determination of Electrode Resistivity of Paste

Jiangsu Provincial Standard of the People's Republic of China, four-probe method

DB32/T 4027-2021 Dynamic four-probe method for the determination of electrical conductivity of graphene powder
DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface

国家市场监督管理总局、中国国家标准化管理委员会, four-probe method

GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method

American Society for Testing and Materials (ASTM), four-probe method

ASTM F390-98(2003) Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
ASTM F390-11 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array

British Standards Institution (BSI), four-probe method

PD IEC TS 62607-6-1:2020 Nanomanufacturing. Key control characteristics. Graphene-based material. Volume resistivity: four probe method

Korean Agency for Technology and Standards (KATS), four-probe method

KS C IEC TS 62607-6-1:2022 Nanomanufacturing — Key control characteristics — Part 6-1: Graphene-based material — Volume resistivity: four probe method
KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE

International Electrotechnical Commission (IEC), four-probe method

IEC TS 62607-6-1:2020 Nanomanufacturing - Key control characteristics - Part 6-1: Graphene-based material - Volume resistivity: four probe method

KR-KS, four-probe method

KS C IEC TS 62607-6-1-2022 Nanomanufacturing — Key control characteristics — Part 6-1: Graphene-based material — Volume resistivity: four probe method