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Electronic equipment aging test time

Electronic equipment aging test time, Total:87 items.

In the international standard classification, Electronic equipment aging test time involves: Electromechanical components for electronic and telecommunications equipment, Electrical wires and cables, Industrial furnaces, Road vehicle systems, Optoelectronics. Laser equipment, Glass, Capacitors, Electronic components in general, Semiconductor devices.

German Institute for Standardization, Electronic equipment aging test time

DIN EN 60512-25-3:2002 Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c: Rise time degradation (IEC 60512-25-3:2001); German version EN 60512-25-3:2001
DIN EN 60512-25-3:2002-08 Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c: Rise time degradation (IEC 60512-25-3:2001); German version EN 60512-25-3:2001
DIN EN 60831-2:1997 Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1 kV - Part 2: Ageing test, self-healing test and destruction test (IEC 60831-2:1995); German version EN 60831-2:1996
DIN EN ISO 11554:2008 Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics (ISO 11554:2006);English version of DIN EN ISO 11554:2008-11
DIN EN 60931-2:1997 Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1 kV - Part 2: Ageing test and destruction test (IEC 60931-2:1995); German version EN 60931-2:1996

British Standards Institution (BSI), Electronic equipment aging test time

BS EN 60512-25-3:2001 Connectors for electronic equipment. Test and measurements. Test 25c. Rise time degradation
BS DD IEC/TS 60680:2008 Test methods of plasma equipment for electroheat and electrochemical applications
BS EN 60512-9-4:2011 Connectors for electronic equipment. Tests and measurements. Endurance tests. Test 9d. Durability of contact retention system and seals (maintenance, ageing)
BS EN 60512-14-6:2006 Connectors for electronic equipment - Tests and measurements - Sealing tests - Test 14f - Interfacial sealing
DD IEC/TS 60680:2008 Test methods of plasma equipment for electroheat and electrochemical applications
BS EN 60512-11-4:2002 Connectors for electronic equipment - Tests and measurements - Climatic tests - Test 11d - Rapid change of temperature
BS EN ISO 11554:2017 Optics and photonics. Lasers and laser-related equipment. Test methods for laser beam power, energy and temporal characteristics
BS EN ISO 11554:2009 Optics and photonics. Lasers and laser-related equipment. Test methods for laser beam power, energy and temporal characteristics
BS EN ISO 11554:2008 Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics
BS EN IEC 60512-99-002:2022 Connectors for electrical and electronic equipment. Tests and measurements - Endurance test schedules. Test 99b: Test schedule for unmating under electrical load (IEC 60512-99-002:2022)
BS ISO 16750-5:2010 Road vehicles - Environmental conditions and testing for electrical and electronic equipment - Chemical loads
BS IEC 60747-5-13:2021 Semiconductor devices. Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
BS EN 60512-12-1:2006 Connectors for electronic equipment - Tests and measurements - Soldering tests - Test 12a - Solderability, wetting, solder bath method
20/30427721 DC BS EN 60512-99-002. Connectors for electrical and electronic equipment. Tests and measurements. Part 99-002. Endurance test schedules. Test 99b: Test schedule for unmating under electrical load

Korean Agency for Technology and Standards (KATS), Electronic equipment aging test time

KS C IEC 60512-25-3:2004 Connectors for electronic equipment-Tests and measurements-Part 25-3:Test 25c-Rise time degradation
KS C IEC 60512-25-3:2014 Connectors for electronic equipment－Tests and measurements－Part 25－3：Test 25c－Rise time degradation
KS C IEC 60512-25-3-2004(2009) Connectors for electronic equipment－Tests and measurements－Part 25－3：Test 25c－Rise time degradation
KS C IEC 60680:2006 The methods of plasma equipment for electroheat applications
KS B ISO 11554:2013 Optics and optical instruments ?; Laser and laser-related equipment ?; Test methods for laser beam power, energy and temporal characteristics
KS B ISO 11554:2003 Optics and optical instruments-Lasers and laser-related equipment-Test methods for laser beam power, energy and temporal characteristics
KS B ISO 11554:2015 Optics and optical instruments ― Laser and laser-related equipment ― Test methods for laser beam power, energy and temporal characteristics
KS C IEC 60512-23-4-2004(2009) Connectors for electronic equipment－Tests and measurements－Part 23－4：Screening and filtering tests－Test 23d：Transmission line reflections in the time domain
KS C IEC 60512-23-4:2004 Connectors for electronic equipment-Tests and measurements-Part 23-4:Screening and filtering tests-Test 23d:Transmission line reflections in the time domain
KS C IEC 60512-23-4:2014 Connectors for electronic equipment－Tests and measurements－Part 23－4：Screening and filtering tests－Test 23d：Transmission line reflections in the time domain
KS C IEC 60512-11-4:2003 Connectors for electronic equipment-Tests and measurements-Part 11-4:Climatic tests-Test 11d:Rapid change of temperature
KS C IEC 60512-11-4:2014 Connectors for electronic equipment-Tests and measurements-Part 11-4:Climatic tests-Test 11d:Rapid change of temperature

Danish Standards Foundation, Electronic equipment aging test time

DS/EN 60512-25-3:2002 Connectors for electronic equipment - Testing and measurements - Part 25-3: Test 25c - Rise time degradation
DS/EN 60512-11-4:2002 Connectors for electronic equipment - Tests and measurements - Part 11-4: Climatic tests - Test 11d: Rapid change of temperature

Association Francaise de Normalisation, Electronic equipment aging test time

NF EN 60512-25-3:2002 Connecteurs pour équipements électroniques - Essais et mesures - Partie 25-3 : Essai 25c - Dégradation du temps de montée
NF EN IEC 61051-2:2021 Varistances utilisées dans les équipements électroniques - Partie 2 : spécification intermédiaire pour varistances pour limitations de surtensions transitoires
NF C93-400-25-3*NF EN 60512-25-3:2002 Connectors for electronic equipment - Tests and measurement - Part 25-3 : test 25c - Rise time degradation
NF C93-400-9-4*NF EN 60512-9-4:2012 Connectors for electronic equipment - Tests and measurements - Part 9-4 : endurance tests - Test 9d : durability of contact retention system and seals (maintenance, ageing).
NF S10-121:2008 Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics.
NF C93-400-23-4*NF EN 60512-23-4:2002 Connectors for electronic equipment - Tests and measurements - Part 23-4 : screening and filtering tests - Test 23d : transmission line reflections in the time domain.
NF C93-400-11-4*NF EN 60512-11-4:2002 Connectors for electronic equipment - Tests and measurements - Part 11-4 : climatic tests - Test 11d : rapid change of temperature
NF C93-400-2-3*NF EN 60512-2-3:2002 Connectors for electronic equipment - Tests and measurements - Part 2-3 : electrical continuity and contact resistance tests - Test 2c : contact resistance variation

International Electrotechnical Commission (IEC), Electronic equipment aging test time

IEC 60512-25-3:2001 Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c; Rise time degradation
IEC TS 60680:2008 Test methods of plasma equipment for electroheat and electrochemical applications
IEC 60512-9-4:2011 Connectors for electronic equipment - Tests and measurements - Part 9-4: Endurance tests - Test 9d: Durability of contact retention system and seals (maintenance, ageing)
IEC 60512-23-4:2001 Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests; Test 23d: Transmission line reflections in the time domain
IEC 63203-406-1:2021 Wearable electronic devices and technologies - Part 406-1: Test method for measuring surface temperature of wrist-worn wearable electronic devices while in contact with human skin
IEC 27/581/DTS:2007 IEC 60680 TS, Ed. 1: Test methods of plasma equipment for electroheat and electrochemical applications
IEC 60512-11-4:2002 Connectors for electronic equipment - Tests and measurements - Part 11-4: Climatic tests; Test 11d: Rapid change of temperature

国家市场监督管理总局、中国国家标准化管理委员会, Electronic equipment aging test time

GB/T 5095.2503-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-3: Test 25c: Rise time degradation
GB/T 5095.2504-2021 Electromechanical components for electronic equipment—Basic testing procedures and measuring methods—Part 25-4: Test 25d: Propagation delay

ES-UNE, Electronic equipment aging test time

UNE-EN IEC 60512-99-002:2022 Connectors for electrical and electronic equipment - Tests and measurements - Part 99-002: Endurance test schedules - Test 99b: Test schedule for unmating under electrical load (Endorsed by Asociación Española de Normalización in April of 2022.)
UNE-EN IEC 60512-99-002:2019 Connectors for electrical and electronic equipment - Tests and measurements - Part 99-002: Endurance test schedules - Test 99b: Test schedule for unmating under electrical load (Endorsed by Asociación Española de Normalización in June of 2019.)

European Committee for Electrotechnical Standardization（CENELEC）, Electronic equipment aging test time

EN 60512-25-3:2001 Connectors for Electronic Equipment - Tests and Measurement Part 25-3: Test 25c - Rise Time Degradation
EN 60512-23-4:2001 Connectors for Electronic Equipment - Tests and Measurements Part 23-4: Screening and Filtering Tests - Test 23D: Transmission Line Reflections in the Time Domain
EN 60512-9-4:2011 Connectors for electronic equipment - Tests and measurements - Part 9-4: Endurance tests - Test 9d: Durability of contact retention system and seals (maintenance, ageing)

AENOR, Electronic equipment aging test time

UNE-EN 60512-25-3:2002 Connectors for electronic equipment - Tests and measurement -- Part 25-3: Test 25c - Rise time degradation.
UNE-EN 60512-11-4:2002 Connectors for electronic equipment - Tests and measurements -- Part 11-4: Climatic tests - Test 11d: Rapid change of temperature.

Professional Standard - Machinery, Electronic equipment aging test time

JB/T 4278.6-1993 Rubber plastic wire and cable test equipment verification method natural ventilation thermal aging test chamber
JB/T 4278.9-1993 Rubber plastic wire and cable test equipment verification method Oxygen bomb, air bomb aging test chamber
JB/T 4278.6-2011 Verification procedure for test equipment of rubber plastic wire and cable.Part 6: Natural ventilation thermal aging test oven
JB/T 4278.9-2011 Verification procedure for test equipment of rubber plastic wire and cable.Part 9: Oxygen bomb, air bomb aging test oven
JB/T 4278.13-2011 Verification procedure for test equipment of rubber plastic wire and cable.Part 13: Forced air heat aging test oven

Guangdong Provincial Standard of the People's Republic of China, Electronic equipment aging test time

DB44/T 1758-2015 Reliability strengthening test method for electric vehicle electronic equipment

YU-JUS, Electronic equipment aging test time

JUS N.R4.448-1987 Elcctromecltanical components for electronic equipment. Test methods. Test 13e: Polarization method
JUS N.R4.482-1987 Electromechanicd components for electronic equipment. Test metho?s. Test 2h: Resistance (earthing) from actuator to mounting bushing (surface)

CZ-CSN, Electronic equipment aging test time

CSN 35 4055 Cast.26-1984 Electromechanical components for electronic equipment. Durability of contact retention system and seals /maintenance, ageing/ test

TR-TSE, Electronic equipment aging test time

TS 2153-1975 BASIC ENV?RONMENTAL TESTING PROCEDURES FOR ELECTRONIC COMPONENTS AND ELECTRONIC EQUIPMENT TEST Db : DAMP HEAT (12 + 12—HOUR CYCLE)

IN-BIS, Electronic equipment aging test time

Japanese Industrial Standards Committee (JISC), Electronic equipment aging test time

JIS C 5402-14-6:2016 Connectors for electronic equipment -- Tests and measurements -- Part 14-6: Sealing tests -- Test 14f: Interfacial sealing
JIS C 5402-23-4:2006 Connectors for electronic equipment -- Tests and measurements -- Part 23-4: Screening and filtering tests -- Test 23d: Transmission line reflections in the time domain
JIS C 5402-19-3:2002 Connectors for electronic equipment -- Tests and measurements -- Part 19-3: Chemical resistance tests -- Test 19c: Fluid resistance
JIS C 5402-11-4:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature

Lithuanian Standards Office , Electronic equipment aging test time

LST EN 60512-25-3-2002 Connectors for electronic equipment. Tests and measurements. Part 25-3: Test 25c: Rise time degradation (IEC 60512-25-3:2001)

International Organization for Standardization (ISO), Electronic equipment aging test time

ISO 11554:2006 Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics

American Society for Testing and Materials (ASTM), Electronic equipment aging test time

ASTM E2141-14 Standard Test Method for Accelerated Aging of Electrochromic Devices in Sealed Insulating Glass Units
ASTM E2953-14 Standard Specification for Evaluating Accelerated Aging Performance of Electrochromic Devices in Sealed Insulating Glass Units

NL-NEN, Electronic equipment aging test time

NEN 10068-2-57-1994 Climatic and mechanical testing of electrical equipment. Part 2-57: Test methods. Test Ff: Vibration. Time-history method (IEC 68-2-57:1989)

RU-GOST R, Electronic equipment aging test time

GOST R ISO 11554-2008 Optics and photonics. Lasers and laser-related equipment. Test methods for laser beam power, energy and temporal characteristics
GOST R 59741-2021 Optics and photonics. Lasers and laser-related equipment. Test methods for laser radiation power, energy and temporal characteristics

European Committee for Standardization (CEN), Electronic equipment aging test time

EN ISO 11554:1998 Optics and Optical Instruments - Lasers and Laser-Related Equipment - Test Methods for Laser Beam Power, Energy and Temporal Characteristics ISO 11554:1998
EN ISO 11554:2003 Optics and optical instruments Lasers and laser-related equipment Test methods for laser beam power, energy and temporal characteristics
EN ISO 11554:2017 Optics and photonics -Lasers and laser-related equipment - Test methods for laser beam power@ energy and temporal characteristics
EN ISO 11554:2008 Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power, energy and temporal characteristics (ISO 11554:2006)

CEN - European Committee for Standardization, Electronic equipment aging test time

EN ISO 11554:2006 Optics and photonics - Lasers and laser-related equipment - Test methods for laser beam power@ energy and temporal characteristics

KR-KS, Electronic equipment aging test time

KS C IEC 60512-2-3-2008 Connectors for electronic equipment－Tests and measurements－Part 2-3：Electrical continuity and contact resistance tests－Test 2c：Contact resistance variation

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electronic equipment aging test time

GB/T 10066.5-2014 Test methods for electroheat installations.Part 5:Plasma equipment for electroheat and electrochemical applications