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Voltage test method

Voltage test method, Total:44 items.

In the international standard classification, Voltage test method involves: Electrical engineering in general, Insulating materials, Electrical wires and cables, Optoelectronics. Laser equipment, Medical equipment, Electromechanical components for electronic and telecommunications equipment, Electricity. Magnetism. Electrical and magnetic measurements, Lamps and related equipment, Transformers. Reactors, Semiconducting materials, Electronic tubes, Semiconductor devices.


Group Standards of the People's Republic of China, Voltage test method

  • T/BEA 43001-2018 The Test Method for Voltage Between Neutral to Protective Earthing

Korean Agency for Technology and Standards (KATS), Voltage test method

RU-GOST R, Voltage test method

Professional Standard - Electron, Voltage test method

  • SJ 2658.3-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for backward voltage
  • SJ 2315-1983 Methods of measurement for d.c. digital voltmeters
  • SJ 2944-1988 Test method for ac digital voltmeter
  • SJ 1872-1981 Methods of measurement for firing voltage of gas laser devices
  • SJ 1717-1981 Measurement of pulse voltage of power klystrons
  • SJ 2140-1982 Methods of measurement for limiting voltage of silicon current regulator diodes
  • SJ 2141-1982 Methods of measurement for breakdown voltage of silicon currenet regulator diodes
  • SJ 811-1974 Methods of measurement for the firing voltage of glow discharge counting tubes
  • SJ 1394-1978 Methods of measurement for firing voltage of gas discharge noise tubes
  • SJ 966-1975 Methods of measurement for reverse breakdown voltage of silicon switching diodes
  • SJ/T 11082-2000 Measuring methods of the heater or filament current and voltage for electronic tubes
  • SJ/T 11082-1996 Measuring methods of the heater or filament current and voltage for electronic tubes
  • SJ 812-1974 Methods of measurement for the firing voltage in dark ambient of glow discharge counting tubes
  • SJ 1387-1978 Methods of measurement for filament current and filament voltage of noise-generator diodes
  • SJ 2354.2-1983 Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes
  • SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Voltage test method

  • GB/T 11755.1-1989 Methods for the measuring of tube voltage of medical diagnostic X-ray equipment
  • GB/T 12272-1990 Measuring method of radio-frequency high potential withstanding voltage for radio-frequency coaxial connectors
  • GB 12272-1990 RF coaxial connector resistance to RF high potential voltage test method
  • GB 12117-1989 Measuring methods for electronic analog voltmeters
  • GB/T 12117-1989 Measuring methods for electronic analog voltmeters
  • GB/T 3789.11-1991 Measurements of the electrical properties of transmitting tubes--Measuring methods of grid No3 cut-off voltage
  • GB/T 3789.10-1991 Measurements of the electrical properties of transmitting tubes--Measuring methods of grid No1 cut-off voltage

Professional Standard - Light Industry, Voltage test method

  • QB/T 4353-2012 Methods of measuring high trigger pulse voltage for high-intensity discharge lamp

AENOR, Voltage test method

  • UNE-EN 60156:1997 INSULATING LIQUIDS. DETERMINATION OF THE BREAKDOWN VOLTAGE AT POWER FRequency. Test method.

Professional Standard - Aerospace, Voltage test method

  • QJ 483-1990 Test method for breakdown voltage of aluminum and aluminum alloy insulating anodized film layer

PL-PKN, Voltage test method

Professional Standard - Non-ferrous Metal, Voltage test method

  • YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-state surface photovoltage

British Standards Institution (BSI), Voltage test method

  • BS IEC 60747-5-15:2022 Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
  • BS IEC 60747-5-16:2023 Semiconductor devices - Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy

Indonesia Standards, Voltage test method

  • SNI 04-6271-2000 Test methods for power cables with extruded insulation for rated voltage above 30 kV (Um=36 kV) up to 150 kV (Um=170 kV)

RO-ASRO, Voltage test method





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