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Molecular mass spectrometry analysis

Molecular mass spectrometry analysis, Total:499 items.

In the international standard classification, Molecular mass spectrometry analysis involves: Analytical chemistry, Rubber, Raw materials for rubber and plastics, Plastics, Laboratory medicine, Inorganic chemicals, Standardization. General rules, Education, Natural gas, Water quality, Testing of metals, Non-ferrous metals, Medical equipment, Products of the chemical industry, Refractories, Petroleum products in general, Nuclear energy engineering, Ferrous metals, Non-destructive testing, Vocabularies, Particle size analysis. Sieving, Woodworking equipment, Metalliferous minerals, Biology. Botany. Zoology, Quality, Optics and optical measurements, Microbiology, General methods of tests and analysis for food products, Fruits. Vegetables, Prepackaged and prepared foods, Optical equipment, Paint ingredients, Linear and angular measurements, Fuels, Printed circuits and boards, Powder metallurgy, Coals, Construction materials, Tobacco, tobacco products and related equipment, Products of the textile industry, Test conditions and procedures in general, Integrated circuits. Microelectronics, Products of non-ferrous metals, Air quality, Ferroalloys, Iron and steel products, Organic chemicals, Soil quality. Pedology.


General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Molecular mass spectrometry analysis

  • GB/Z 32494-2016 Analysis of Surface Chemical Analysis Auger Electron Spectroscopy Chemical Information Interpretation
  • GB/T 6041-2020 General rules for mass spectrometric analysis
  • GB/T 6041-2002 General rules for mass spectrometric analysis
  • GB/T 32495-2016 Surface chemical analysis.Secondary-ion mass spectrometry.Method for depth profiling of arsenic in silicon
  • GB/T 25186-2010 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of relative sensitivity factors from ion-implanted reference materials
  • GB/Z 35959-2018 General rule for liquid chromatography-mass spectrometry
  • GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
  • GB/T 20176-2006 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of boron atomic concentration in silicon using uniformly doped materials
  • GB/T 15337-1994 General rules for atomic absorption spectrometric analysis
  • GB/T 15337-2008 General rules for atomic absorption spectrometric analysis
  • GB/T 19627-2005 Particle size analysis-Photon correlation spectroscopy
  • GB/T 15249.5-1994 Crude Gold-Determination of mercury content-Cold atomic absorption spectrometric method
  • GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
  • GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
  • GB/T 29858-2013 Standard guidelines for molecular spectroscopy multivariate calibration quantitative analysis
  • GB/T 20255.6-2008 Methods for chemical analysis of hardmetals.Flame atomic absorption spectrometry.General requirements
  • GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
  • GB/T 28726-2012 Gas analysis.Gas chromatograph with helium ionization detector
  • GB/T 8151.26-2023 Methods of Chemical Analysis of Zinc Concentrates Part 26: Determination of Silver Content by Acid Dissolution-Flame Atomic Absorption Spectrometry
  • GB/T 15249.5-2009 Methods for chemical analysis of crude gold.Part 5:Determination of mercury content.Cold atomic absorption spectrometry
  • GB/T 20255.5-2006 Mehods for chemical analysis of hardmetals. Determination of chromium content. Flame atomic absorption spectrometric method
  • GB/T 22572-2008 A Method for Estimating Depth-Resolved Parameters Using Multi-delta Layered Reference Materials for Secondary Ion Mass Spectrometry in Surface Chemistry
  • GB/T 42699.2-2023 Qualitative and Quantitative Analysis of the Proteome of Certain Animal Hair Fibers in Textiles Part 2: Peptide Analysis of Reduced Proteins Matrix-Assisted Laser Desorption Ionization Time-of-Flight Mass Spectrometry (MALDI-TOF-MS) Method
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 13701-1992 Isotopic analysis of uranium by single-standard gas mass-spectrometer method
  • GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
  • GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
  • GB/T 18340.1-2010 Organic geochemical analysis methods for geological samples.Part 1:Analysis of light crude oils.Gas chromatography
  • GB/T 14203-2016 General rules for spark discharge atomic emission spectrometry
  • GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • GB/T 42699.1-2023 Textiles—Qualitative and quantitative proteomic analysis of some animal hair fibres—Part 1:Peptide detection using LC-ESI-MS with protein reduction

International Organization for Standardization (ISO), Molecular mass spectrometry analysis

  • ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • ISO 10638:2010 Rubber - Identification of antidegradants by gas chromatography/mass spectrometry
  • ISO 10638:2017 Rubber - Identification of antidegradants by gas chromatography/mass spectrometry
  • ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
  • ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
  • ISO/CD 2620 Analysis of natural gas — Biomethane — Determination of VOCs by thermal desorption gas chromatography with flame ionization and/or mass spectrometry detectors
  • ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
  • ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
  • ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 19340:2017 Water quality - Determination of dissolved perchlorate - Method using ion chromatography (IC)
  • ISO 15061:2001 Water quality - Determination of dissolved bromate - Method by liquid chromatography of ions
  • ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • ISO 13321:1996 Particle size analysis - Photon correlation spectroscopy
  • ISO/DIS 2620:2023 Analysis of natural gas — Biomethane — Determination of VOCs by thermal desorption gas chromatography with flame ionization and/or mass spectrometry detectors
  • ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • ISO 23674:2022 Cosmetics — Analytical methods — Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
  • ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
  • ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
  • ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 15680:2003 Water quality - Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption
  • ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • ISO 7627-1:1983 Methods for chemical analysis of hardmetals Flame atomic absorption spectrometry General requirements
  • ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
  • ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • ISO 18114:2021 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • ISO 16200-2:2000 Workplace air quality - Sampling and analysis of volatile organic compounds by solvent desorption/gas chromatography - Part 2: Diffusive sampling method
  • ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
  • ISO 5666-3:1984 Water quality; Determination of total mercury by flameless atomic absorption spectrometry; Part 3 : Method after digestion with bromine
  • ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p

British Standards Institution (BSI), Molecular mass spectrometry analysis

  • BS ISO 10638:2010 Rubber - Identification of antidegradants by gas chromatography/mass spectrometry
  • BS ISO 10638:2017 Rubber. Identification of antidegradants by gas chromatography/mass spectrometry
  • BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • BS ISO 13084:2018 Tracked Changes. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
  • BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • BS ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • BS EN ISO 23674:2022 Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser)
  • BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
  • BS EN ISO 15061:2001 Water quality. Determination of dissolved bromate. Method by liquid chromatography of ions
  • BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
  • 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
  • BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • BS DD ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectromerty (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), without separation of the lead matrix
  • BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • BS EN ISO 10927:2011 Plastics. Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
  • BS EN ISO 10927:2018 Plastics. Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
  • BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
  • BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • BS 7455-1:1991 Analysis of nickel alloys by flame atomic absorption spectrometry - General requirements and sample dissolution
  • 21/30387777 DC BS EN ISO 23674. Cosmetics. Analytical methods. Direct determination of traces of mercury in cosmetics by thermal decomposition. Atomic absorption spectrometry (mercury analyzer)
  • BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
  • BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • 23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • BS ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
  • BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
  • BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • BS PD CEN/TS 17200:2018 Construction products. Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by Inductively Coupled Plasma. Mass Spectrometry (ICP-MS)
  • BS EN 12938:2000 Methods for the analysis of pewter. Determination of alloying and impurity element contents by atomic spectrometry
  • BS EN 12938:2000(2001) Methods for the analysis of pewter. Determination of alloying and impurity element contents by atomic spectrometry
  • 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
  • BS ISO 18118:2015 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • BS EN ISO 19340:2017 Water quality. Determination of dissolved perchlorate. Method using ion chromatography (IC)
  • BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • BS PD CEN/TR 15641:2007 Food analysis — Determination of pesticide residues by LC-MS/MS — Tandem mass spectrometric parameters
  • BS EN ISO 17852:2006 Water quality - Determination of mercury - Method using a combined preservation and digestion step followed by atomic fluorescence spectrometry
  • 22/30419108 DC BS EN 17200. Construction products: Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
  • BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
  • BS PD CEN/TS 17197:2018 Construction products: Assessment of release of dangerous substances. Analysis of inorganic substances in digests and eluates. Analysis by Inductively Coupled Plasma. Optical Emission Spectrometry (ICP-OES). Analysis by Inductive Coupled Plasma. Optical E
  • BS 3727-20:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Spectrographic method
  • 20/30409889 DC BS ISO 18114. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
  • BS EN 60746-3:2002 Expression of performance of electrochemical analyzers - Electrolytic conductivity
  • BS ISO 18114:2021 Tracked Changes. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

Japanese Industrial Standards Committee (JISC), Molecular mass spectrometry analysis

  • JIS K 6241:2012 Rubber -- Identification of antidegradants by gas chromatography/mass spectrometry
  • JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • JIS K 0127:1992 General rules for ion chromatographic analysis
  • JIS K 0127:2001 General rules for ion chromatographic analysis
  • JIS K 0127:2013 General rules for ion chromatography
  • JIS K 0118:1979 General rules for mass spectrometric analysis
  • JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
  • JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • JIS K 0133:2022 General rules for ICP-mass spectrometry
  • JIS K 0123:1995 General rules for analytical methods in gas chromatography mass spectrometry
  • JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
  • JIS H 1630:1995 Method for atomic emission spectrometric analysis of titanium
  • JIS H 1683:2002 Tantalum -- Method for atomic absorption spectrometric analysis
  • JIS H 1630:1975 Method for atomic emission spectrometric analysis of titanium
  • JIS Z 8826:2005 Particle size analysis -- Photon correlation spectroscopy
  • JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • JIS K 0136:2004 General rules for high performance liquid chromatography / mass spectrometry
  • JIS K 0136:2015 General rules for high performance liquid chromatography / mass spectrometry
  • JIS G 1257:1994 Iron and steel -- Methods for atomic absorption spectrometric analysis
  • JIS K 5601-3-1:1999 Testing methods for paint components -- Part 3: Component analysis in solvent insoluble matter -- Section 1: Total leads (Flame atomic absorption spectrometric method)
  • JIS H 1103:1995 Method for photoelectric emission spectrochemical analysis of electrolytic cathode copper
  • JIS G 1258-5:2007 Iron and steel -- ICP atomic emission spectrometric method -- Part 5: Determination of boron content -- Dissolution in phosphoric and sulfuric acids
  • JIS G 1258-2:2014 Iron and steel -- ICP atomic emission spectrometric method -- Part 2: Determination of various elements -- Decomposition with phosphoric and sulfuric acids
  • JIS K 0143:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
  • JIS G 1258-4:2007 Iron and steel -- ICP atomic emission spectrometric method -- Part 4: Determination of niobium content -- Dissolution in phosphoric and sulfuric acids or Dissolution in acids and fusion with potassium disulfate
  • JIS K 0143:2000 Surface chemical analysis -- Secondary ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
  • JIS K 0400-52-30:2001 Water quality -- Determination of 33 elements by inductively coupled plasma atomic emission spectroscopy
  • JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
  • JIS G 1258-6:2007 Iron and steel -- ICP atomic emission spectrometric method -- Part 6: Determination of boron content -- Dissolution in acids and fusion with sodium carbonate
  • JIS G 1258-1:2014 Iron and steel.ICP atomic emission spectrometric method.Part 1: Determination of various elements.Decomposition with acids and fusion with potassium disulfate
  • JIS H 1306:1992 Methods for atomic absorption spectrometric analysis of aluminium and aluminium alloys
  • JIS G 1257 AMD 2:2000 Iron and steel -- Methods for atomic absorption spectrometric analysis (Amendment 2)
  • JIS G 1253:2002 Iron and steel -- Method for spark discharge atomic emission spectrometric analysis

Association Francaise de Normalisation, Molecular mass spectrometry analysis

  • NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
  • NF T30-711:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
  • NF ISO 17560:2006 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage du bore dans le silicium par profilage d'épaisseur
  • NF EN ISO 19340:2018 Qualité de l'eau - Détermination du perchlorate dissous - Méthode par chromatographie ionique (IC)
  • NF EN ISO 15061:2001 Qualité de l'eau - Dosage du bromate dissous - Méthode par chromatographie des ions en phase liquide
  • NF ISO 14237:2010 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage des atomes de bore dans le silicium à l'aide de matériaux dopés uniformément
  • NF EN ISO 23674:2022 Cosmétiques - Méthodes d'analyse - Dosage direct des traces de mercure dans les cosmétiques par décomposition thermique et spectrométrie d'absorption atomique (analyseur de mercure)
  • NF ISO 23830:2009 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Répétabilité et constance de l'échelle des intensités relatives en spectrométrie statique de masse des ions secondaires
  • NF T90-052*NF EN ISO 15061:2001 Water quality - Determination of dissolved bromate - Method by liquid chromatography of ions.
  • NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.
  • NF T51-241:2018 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
  • NF EN 1785:2003 Produits alimentaires - Détection d'aliments ionisés contenant des lipides - Analyse par chromatographie en phase gazeuse/Spectrométrie de masse des 2-alkylcytobutanones
  • NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • NF V03-155:2010 Food analysis - Determination of patuline by High performance liquid chromatography - Mass spectrometry/Mass spectrometry method (HPLC-MS/MS).
  • NF X11-672:1996 Particle size analysis. Photon correlation spectroscopy.
  • NF EN 13615:2002 Méthodes pour l'analyse des lingots d'étain - Détermination des teneurs en impuretés dans l'étain de qualité 99,90 % et 99,85 % par spectrométrie atomique
  • NF A08-901:1991 Nickel alloys. Flame atomic absorption spectrometric analysis. Part 1 : general requirements and sample dissolution.
  • NF T90-375*NF EN ISO 19340:2018 Water quality - Determination of dissolved perchlorate - Method using ion chromatography (IC)
  • NF EN ISO 22892:2011 Qualité du sol - Lignes directrices pour l'identification de composés cibles par chromatographie en phase gazeuse et spectrométrie de masse
  • NF EN ISO 10927:2018 Plastiques - Détermination de la masse moléculaire et de la distribution des masses moléculaires des polymères par spectrométrie de masse, à temps de vol, après désorption/ionisation laser assistée par matrice (SM-MALDI-TOF)
  • NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
  • NF T90-129*NF EN ISO 15680:2004 Water quality - Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption.
  • NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
  • NF A95-492-1*NF EN 27627-1:1993 Hardmetals. Chemical analysis by flame atomic absorption spectrometry. Part 1 : general requirements.
  • NF EN 1784:2003 Produits alimentaires - Détection d'aliments ionisés contenant des lipides - Analyse par chromatographie en phase gazeuse des hydrocarbures
  • XP T90-223:2013 Water quality - Determination of some drug residues in the water-dissolved fraction - Method using solid phase extraction (SPE) and liquid chromatographic analysis with tandem mass spectrometric investigation (LC-MS/MS)
  • NF T90-046:2014 Water quality - Determination of short-chain polychlorinated alkanes (SCCPs) in water - Method using gas chromatography-mass spectrometry (GC-MS) and negative-ion chemical ionization (NCI)
  • XP T90-224:2013 Water Quality - Determination of Trihalomethanes in swimming pool water - Method using either static headspace or purge-and-trap with thermal desorption, on-line with gas chromatographic analysis with mass spectrometric detection
  • NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • XP A06-422*XP ENV 14029:2001 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix
  • NF X31-439*NF EN ISO 22892:2011 Soil quality - Guidelines for the identification of target compounds by gas chromatography and mass spectrometry.

Professional Standard - Medicine, Molecular mass spectrometry analysis

National Metrological Verification Regulations of the People's Republic of China, Molecular mass spectrometry analysis

国家市场监督管理总局、中国国家标准化管理委员会, Molecular mass spectrometry analysis

  • GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • GB/T 41072-2021 Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis
  • GB/T 40109-2021 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of boron in silicon
  • GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry
  • GB/T 37847-2019 General rules for isotope composition analysis by mass spectrometry
  • GB/T 37182-2018 Gas analysis—Gas chromatograph with plasma emission detector
  • GB/T 7739.14-2019 Methods for chemical analysis of gold concentrates—Part 14: Determination of thallium content—Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
  • GB/T 40374-2021 Hardmetals—Determination of lead and cadmium content—Flame atomic absorption spectrometric method and inductively coupled plasma atomic emission spectrometry
  • GB/T 40798-2021 Chemical analysis method of ion-adsorption rare earth ore—Determination of total rare earth contents—Inductively coupled plasma mass spectrometry
  • GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

KR-KS, Molecular mass spectrometry analysis

AT-ON, Molecular mass spectrometry analysis

  • ONORM M 6603-1-1997 Water analysis - Determination of potassium and sodium by atomic absorption spectrometry
  • ONORM M 6604-1995 Water analysis - Determination of selenium by atomic absorption spectrometry (hydride technique)
  • ONORM M 6612-2001 Water analysis - Calcit saturation of water
  • ONORM M 6253 Teil.1-1985 Water analysis; determination ofanionic Surfactants by the methylene blue spectrometric method
  • ONORM M 6600-1992 Water analysis - Statistical methods in water analysis - Terms and definitions
  • ONORM M 6605-1992 Water quality - Determination of dissolved silver by electrothermal atomisation atomic absorption spectrometry
  • ONORM M 6615-1994 Water analysis - Determination of dissolved and easily liberated sulfide
  • ONORM M 6617-1997 Water analysis - Determination of aluminium, lead, cadmium, chromium, cobalt, copper and nickel by graphite furnace atomic absorption spectrometry
  • OENORM EN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)
  • ONORM M 6610-2000 Water analysis - Photometric determination of dissolved silicate
  • ONORM M 6279-1991 Water analysis — Determination oj 33 elements by inductively coupled plasma emission spectrometry (ICP-AES)
  • ONORM M 6238 Teil.1-1986 Water analysis; determination ofnitrate; 2,6-dimethylphenol spectrometric method
  • ONORM M 6603-2-1997 Water analysis - Determination of potassium and sodium by flame emission spectrometry
  • ONORM M 6236-1993 Water analysis - Determination of easily volatile halogenated hydrocarbons - Head space gas Chromatographie method

American Society for Testing and Materials (ASTM), Molecular mass spectrometry analysis

  • ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM C1637-21 Standard Test Method for Determination of Impurities in Plutonium Materials—Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
  • ASTM C1637-13 Standard Test Method for the Determination of Impurities in Plutonium Metal: Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
  • ASTM C1637-06 Standard Test Method for the Determination of Impurities in Plutonium Metal: Acid Digestion and Inductively Coupled Plasma-Mass Spectroscopy (ICP-MS) Analysis
  • ASTM C1432-03 Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis
  • ASTM C1432-99 Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis
  • ASTM C1432-03(2008) Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis
  • ASTM C1432-15 Standard Test Method for Determination of Impurities in Plutonium: Acid Dissolution, Ion Exchange Matrix Separation, and Inductively Coupled Plasma-Atomic Emission Spectroscopic (ICP/AES) Analysis
  • ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
  • ASTM C791-83(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
  • ASTM C1413-05(2011) Standard Test Method for Isotopic Analysis of Hydrolyzed Uranium Hexafluoride and Uranyl Nitrate Solutions by Thermal Ionization Mass Spectrometry
  • ASTM E1881-06 Standard Guide for Cell Culture Analysis with SIMS
  • ASTM UOP1031-19 Chromium (III) and Chromium (VI) Speciation in Water by IC-ICP-MS (Ion Chromatography- Inductively Coupled Plasma Mass Spectrometry)
  • ASTM C1379-10 Standard Test Method for Analysis of Urine for Uranium-235 and Uranium-238 Isotopes by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C1476-00 Standard Test Method for Analysis of Urin for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM D1977-98 Standard Test Method for Nickel and Vanadium in FCC Equilibrium Catalysts by Hydrofluoric/Sulfuric Acid Decomposition and Atomic Spectroscopic Analysis
  • ASTM D1977-22 Standard Test Method for Nickel and Vanadium in FCC Equilibrium Catalysts by Hydrofluoric/Sulfuric Acid Decomposition and Atomic Spectroscopic Analysis
  • ASTM C1476-06 Standard Test Method for Analysis of Urine for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM C696-11 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
  • ASTM D1977-03 Standard Test Method for Nickel and Vanadium in FCC Equilibrium Catalysts by Hydrofluoric/Sulfuric Acid Decomposition and Atomic Spectroscopic Analysis
  • ASTM D1977-03(2008) Standard Test Method for Nickel and Vanadium in FCC Equilibrium Catalysts by Hydrofluoric/Sulfuric Acid Decomposition and Atomic Spectroscopic Analysis
  • ASTM E1880-06 Standard Practice for Tissue Cryosection Analysis with SIMS
  • ASTM UOP1037-20 Trace Metals Analysis in Liquefied Petroleum Gases by Inductively Coupled Plasma-Mass Spectrometry
  • ASTM E1880-12 Standard Practice for Tissue Cryosection Analysis with SIMS
  • ASTM D8469-22 Standard Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
  • ASTM D846-84 Standard Test Method for Analysis of Multiple Elements in Cannabis Matrices by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

Professional Standard - Machinery, Molecular mass spectrometry analysis

Taiwan Provincial Standard of the People's Republic of China, Molecular mass spectrometry analysis

  • CNS 12511-1989 General Rules for Mass Spectrometric Analysis
  • CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry
  • CNS 14896-14-2005 Titanium - Method for atomic emission spectrometric analysis
  • CNS 12416-2006 General rules for atomic emission spectrometry
  • CNS 14896.14-2005 Titanium - Method for atomic emission spectrometric analysis
  • CNS 11209-1995 General Rules for Chemical Analysis by Atomic Absorption Spectrophotometry
  • CNS 11206-2002 Iron and steel─Methods for atomic absorption spectrometric analysis
  • CNS 8413-2002 Methods of test for chemical, mass spectrometric, spectrochemical, nuclear, and radiochemical analysis of nuclear-grade plutonium nitrate solutions
  • CNS 12126-1987 Method of Chemical Analysis by Atomic Absorption Spectrophotometry for Copper and Copper Alloys

Professional Standard - Education, Molecular mass spectrometry analysis

Professional Standard - Petroleum, Molecular mass spectrometry analysis

  • SY/T 6188-1996 Gas Chromatographic Analysis Method of Rock Pyrolysis
  • SY/T 6188-2016 Gas Chromatographic Analysis Method of Rock Pyrolysis
  • SY/T 5258-1991 Chromatography-mass spectrometry identification method for biomarkers
  • SY/T 6242-1996 Gas Chromatography Analysis Method of Oleaginous Colloid Wax Content in Crude Oil

Korean Agency for Technology and Standards (KATS), Molecular mass spectrometry analysis

  • KS M 0035-1993 General rules for ion chromatographic analysis
  • KS M 0025-2008(2018) General rules for mass spectrometric analysis
  • KS D ISO 20341:2005 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
  • KS D 1899-2003 Methods for emission spectrochemical analysis of electrolytic cathode copper
  • KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS M 0025-1993 General rules for mass spectrometric analysis
  • KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS I ISO 15061-2006(2021) Water quality-Determination of dissolved bromate-Method by liquid chromatography of ions
  • KS I ISO 15061-2006(2016) Water quality-Determination of dissolved bromate-Method by liquid chromatography of ions
  • KS M 0035-2008 General rules for ion chromatographic analysis
  • KS D 2553-2015 Tantalum-Method for atomic absorption spectrometric analysis
  • KS D ISO 18114-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS D ISO 7530-1-2012(2017) Nickel alloys-Flame atomic absorption spectrometric analysis-Part 1:General requirements and sample dissolution
  • KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS I ISO 15061:2006 Water quality-Determination of dissolved bromate-Method by liquid chromatography of ions
  • KS D 2568-2008 Tantalum-Method for atomic absorption spectrometric analysis
  • KS D 2553-2015(2020) Tantalum-Method for atomic absorption spectrometric analysis
  • KS E 3030-2007(2012) Atomic absorption spectrochemical analysis for iron ores
  • KS D 2568-2019 Tantalum-Method for atomic absorption spectrometric analysis
  • KS E 3030-1982 Atomic absorption spectrochemical analysis for iron ores
  • KS M 0027-2008(2018) General rules for analytical methods in gas chromatography mass spectrometry
  • KS M 0027-2008 General rules for analytical methods in gas chromatography mass spectrometry
  • KS M 9103-1996 Water quality-Determination of total mercury by flameless atomic absorption spectrometry(Method after digestion with bromine)
  • KS D 1899-1993 Methods for emission spectrochemical analysis of electrolytic cathode copper
  • KS M 0012-2009(2019) General rules for molecular absorptiometric analysis
  • KS D 1659-2008 Methods for atomic absorption spectrophotometric analysis of iron and steel
  • KS M 0016-1995 General rules for atomic absorption spectrochemical analysis
  • KS M 0016-2010(2020) General rules for atomic absorption spectrochemical analysis
  • KS D 2086-2019 Methods for atomic emission spectrometric analysis of titanium
  • KS D ISO 18118:2005 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • KS D ISO 7530-1:2012 Nickel alloys-Flame atomic absorption spectrometric analysis-Part 1:General requirements and sample dissolution
  • KS D 1899-2019 Methods for photoelectric emission spectrochemical analysis of electrolytic cathode copper
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 7627-1-2012(2017) Hardmetals-Chemical analysis by flame atomic absorption spectrometry-Part 1:General requirements
  • KS D ISO 7627-1-2012(2022) Hardmetals-Chemical analysis by flame atomic absorption spectrometry-Part 1:General requirements
  • KS I ISO 15680:2010 Water quality-Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption
  • KS H ISO 22634:2012 Cigarettes-Determination of benzo[a]pyrene in cigarette mainstream smoke-Method using gas chromatography/mass spectrometry
  • KS D ISO 7627-1:2012 Hardmetals-Chemical analysis by flame atomic absorption spectrometry-Part 1:General requirements
  • KS D ISO 7627-6-2012(2022) Hardmetals-Chemical analysis by flame atomic absorption spectrometry-Part 6:Determination of chromium in contents from 0.01 to 2 % (mass fraction)
  • KS D ISO 7627-6-2012(2017) Hardmetals-Chemical analysis by flame atomic absorption spectrometry-Part 6:Determination of chromium in contents from 0.01 to 2 % (mass fraction)
  • KS D ISO 19319:2005 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 20341-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS L ISO 26845-2012(2022) Chemical analysis of refractories-General requirements for wet chemical analysis, atomic absorption spectrometry and inductively coupled plasma atomic emission spectrometry methods
  • KS L ISO 26845-2012(2017) Chemical analysis of refractories-General requirements for wet chemical analysis, atomic absorption spectrometry and inductively coupled plasma atomic emission spectrometry methods
  • KS D ISO 18114:2005 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of relative sensitivity factors from ion-implanted reference materials
  • KS I ISO 10304-4:2008 Water quality-Determination of dissolved anions by liquid chromatography of ions-Part 4:Determination of chlorate, chloride and chlorite in water with low contamination
  • KS I ISO 16200-2:2006 Workplace air quality-Sampling and analysis of volatile organiccompounds by solvent desorption/gas chromatography-Part 2:Diffusive sampling method
  • KS D 1679-1993 Methods for atomic absorption spectrometric analysis of aluminium and aluminium alloys
  • KS D ISO 7627-4-2012(2017) Hardmetals-Chemical analysis by flame atomic absorption spectrometry-Part 4:Determination of molybdenum, titanium and vanadium in contents from 0.01 to 0.5 % (mass fraction)
  • KS D ISO 17560:2003 Surface chemical analysis-Secondary-on mass spectrometry- Method for depth profiling of boron in silicon
  • KS D ISO 13898-1:2002 Steel and iron ? Determination of nickel, copper and cobalt contents-Inductively coupled plasma atomic emission spectrometric method-Part 1:General requirements and sample dissolution

(U.S.) Ford Automotive Standards, Molecular mass spectrometry analysis

工业和信息化部, Molecular mass spectrometry analysis

  • YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
  • YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
  • YS/T 739.3-2020 Methods for chemical analysis of aluminum electrolytes Part 3: Determination of elemental contents of sodium, calcium, magnesium, potassium and lithium by inductively coupled plasma atomic emission spectrometry
  • YB/T 4700-2018 Determination of the amount of precipitated phase of manganese sulfide in iron and steel by electrolytic separation-flame atomic absorption spectrometry
  • YB/T 4799-2018 Determination of the precipitated phase amount of aluminum nitride in steel by electrolytic separation-inductively coupled plasma atomic emission spectrometry
  • YS/T 739.2-2020 Methods of chemical analysis of aluminum electrolytes Part 2: Determination of molecular ratios Aluminum trichloride titration method
  • HG/T 5831-2021 Online gas mass spectrometer analyzer for chemical industry
  • YS/T 540.5-2018 Methods for chemical analysis of vanadium Part 5: Determination of impurity elements by inductively coupled plasma atomic emission spectrometry
  • YS/T 870-2020 Chemical Analysis Methods for Pure Aluminum Determination of Trace Impurity Element Contents Inductively Coupled Plasma Mass Spectrometry
  • YS/T 1050.10-2016 Methods for chemical analysis of lead and antimony concentrates Part 10 Determination of thallium content Inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 445.14-2019 Methods for chemical analysis of silver concentrates Part 14: Determination of thallium content by inductively coupled plasma mass spectrometry and inductively coupled plasma atomic emission spectrometry
  • YS/T 1261-2018 Hafnium Chemical Analysis Method Determination of Impurity Element Content Inductively Coupled Plasma Atomic Emission Spectrometry

RU-GOST R, Molecular mass spectrometry analysis

  • GOST R 56240-2014 Copper. Spectral methods of impurity analysis
  • GOST 17261-2008 Zinc. Methods of atomic-emission spectral analysis
  • GOST R ISO 7530-1-2016 Nickel alloys. Flame atomic absorption spectrometric analysis. Part 1. General requirements and sample dissolution
  • GOST 27981.1-1988 Copper of high purity. Methods of atomic-spectral analysis
  • GOST 27981.1-2015 High purity copper. Method of atomic-spectral analysis
  • GOST R 54153-2010 Steel. Method of atomic emission spectral analysis
  • GOST 4.361-1985 Product-quality index system. Mass-spectrometric analysers. Index nomenclature
  • GOST 6012-2011 Nickel. Methods of chemical-atomic-emission spectral analysis
  • GOST 8776-2010 Cobalt. Methods of chemical-atomic-emission spectral analysis
  • GOST 6012-1978 Nickel. Methods of chemical-atomic-emission spectral analysis
  • GOST 9519.3-1977 Lead-calcium bearing alloys. Method of atomic-absorbing spectral analysis

Group Standards of the People's Republic of China, Molecular mass spectrometry analysis

  • T/ZPP 017-2023 Mass Cytometry Analyzer
  • T/NAIA 091-2021 Determination of Mercury in Light Oil Products Microwave Digestion-Atomic Fluorescence Spectrometry
  • T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
  • T/HZAS 14-2021 Determination of migration of decomposable aromatic amines on plastic chopping boards by gas chromatography-mass spectrometry
  • T/QAS 082.6-2023 Chemical Analysis of Rock Salt and Glauber's Salt Part 6: Determination of Iodine by Inductively Coupled Plasma Mass Spectrometry
  • T/QAS 082.14-2023 Chemical Analysis of Rock Salt and Glauber's Salt - Part 14: Determination of Bromine by Inductively Coupled Plasma Mass Spectrometry
  • T/CSTM 00253-2020 Test method of thermal analysis coupled with mass spectrometry for phenolic resin

Liaoning Provincial Standard of the People's Republic of China, Molecular mass spectrometry analysis

  • DB21/T 2070-2013 Chemical Analysis of Aluminosilicate Refractories by Atomic Absorption Spectrometry
  • DB21/T 2555-2016 Determination of BTEX in seawater by purge and trap gas chromatography-mass spectrometry

未注明发布机构, Molecular mass spectrometry analysis

  • BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
  • BS EN ISO 15061:2001(2008)*BS 6068-2.73:2001 Water quality — Determination of dissolved bromate — Method by liquid chromatography of ions
  • BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
  • BS EN 14242:2023 Aluminium and aluminium alloys — Chemical analysis — Inductively coupled plasma optical emission spectrometric analysis

European Committee for Standardization (CEN), Molecular mass spectrometry analysis

  • PD CEN/TR 15522-2:2012 Oil spill identification - Waterborne petroleum and petroleum products - Part 2: Analytical methodology and interpretation of results based on GC-FID and GC-MS low resolution analyses
  • EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
  • prEN ISO 23674:2021 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition - Atomic absorption spectrometry (mercury analyzer) (ISO/DIS 23674:2021)
  • PD CEN/TS 17200:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
  • CEN/TS 17200:2018+AC:2018 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS)
  • FprEN 17200 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS)
  • EN ISO 15680:2003 Water quality - Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption ISO 15680:2003

Professional Standard - Non-ferrous Metal, Molecular mass spectrometry analysis

  • YS/T 739-2010 Determination of cryolite rate and main components of electrolyte-X-ray fluorescence spectrometric analysis method
  • YS/T 768-2011 Flame atomic absorption spectrometric analysis method of lithium in electrolyte cryolite
  • YS/T 473-2015 Methods for chemical analysis industrial gallium.Determination of impurity elements.ICP-MS analytical method
  • YS/T 473-2005 Determination of impurity elements in gallium for industrial use-ICP-MS analytical method
  • YS/T 742-2010 Methods for chemical analysis of gallium oxide Determination of impurities Inductively coupled plasma mass spectrometer method
  • YS/T 244.9-2008 Chemical analysis methods of high purity aluminum.Part 9: Determination of trace impurities in high purity aluminumby inductively coupled mass spectrometry
  • YS/T 870-2013 Chemical analysis of high purity aluminium.Determination of trace impurities.Inductively coupled plasma mass spectrometry
  • YS/T 896-2013 Methods for chemical analysis of high purity niobium.Determination of trace impurity element content.Inductively coupled plasma mass spectrometry
  • YS/T 892-2013 Methods for chemical analysis of high purity titanium.Determination of trace impurity element content.Inductively coupled plasma mass spectrometry
  • YS/T 898-2013 Methods for chemical analysis of the high purity tantalum.Determination of trace impurity element content.Inductively coupled plasma mass spectrometry
  • YS/T 900-2013 Methods for chemical analysis of the high purity tungsten.Determination of trace impurity element content.Inductively coupled plasma mass spectrometry
  • YS/T 361-2006 Determination of trace impurities in purity platinum by atomic emission spectrometric
  • YS/T 362-2006 Determination of trace impurities in purity palladium by atomic emission spectrometric
  • YS/T 363-2006 Determination of trace impurities in purity rhodium by atomic emission spectrometric
  • YS/T 364-2006 Determination of trace impurities in purity iridium by atomic emission spectrometric
  • YS/T 361-1994 Emission Spectral Analysis of Impurity Elements in Pure Platinum
  • YS/T 362-1994 Emission spectrum analysis of impurity elements in pure palladium
  • YS/T 363-1994 Emission spectrum analysis of impurity elements in pure rhodium
  • YS/T 364-1994 Emission Spectral Analysis of Impurity Elements in Pure Iridium
  • YS/T 666-2008 Chemical analysis methods of gallium for industrial use.Determination of impurity elements.Inductively coupled plasma atomic emission spectrometric method
  • YS/T 365-2006 Determination of trace impurities in high purity palladium by atomic emission spectrometric
  • YS/T 365-1994 Emission Spectrum Analysis of Impurity Elements in High Purity Platinum

CEN - European Committee for Standardization, Molecular mass spectrometry analysis

  • EN ISO 19340:2017 Water quality - Determination of dissolved perchlorate - Method using ion chromatography (IC)

Danish Standards Foundation, Molecular mass spectrometry analysis

  • DS/EN ISO 15061:2001 Water quality - Determination of dissolved bromate - Method by liquid chromatography of ions
  • DS/EN ISO 10927:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS)
  • DS/EN 27627-1:1993 Hardmetals. Chemical analysis by flame atomic absorption spectrometry. Part 1: General requirements
  • DS/EN 12938/AC:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
  • DS/EN 12938:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
  • DS/ISO 29441:2010 Water quality - Determination of total nitrogen after UV digestion - Method using flow analysis (CFA and FIA) and spectrometric detection
  • DS/EN 27627-1:1994 Hardmetals - Chemical analysis by flame atomic absorption spectrometry - Part 1: General requirements
  • DS/ISO 7627-1:1994 Hardmetals - Chemical analysis by flame atomic absorption spectrometry - Part 1: General requirements
  • DS/ENV 14029:2001 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES), after separation of the lead matrix

国家能源局, Molecular mass spectrometry analysis

  • SY/T 6404-2018 Inductively coupled plasma atomic emission spectrometry and mass spectrometry analysis methods of metal elements in rocks

国家药监局, Molecular mass spectrometry analysis

  • YY/T 1795-2021 sperm quality analyzer
  • YY/T 1740.2-2021 Medical Mass Spectrometry Part 2: Matrix-Assisted Laser Desorption Ionization Time-of-Flight Mass Spectrometry
  • YY/T 1675-2019 Serum Electrolytes (Potassium, Sodium, Calcium, Magnesium) Reference Measurement Procedure (Ion Chromatography)

Professional Standard - Geology, Molecular mass spectrometry analysis

  • DZ/T 0064.87-2021 Groundwater Quality Analysis Methods Part 87: Determination of 13C Online Phosphoric Acid Hydrolysis-Gas Isotope Mass Spectrometry
  • DZ/T 0064.81-2021 Methods of Analytical Groundwater Quality Part 81: Determination of Mercury Amounts by Atomic Fluorescence Spectrometry
  • DZ/T 0064.28-2021 Methods of analysis of groundwater quality - Part 28: Determination of potassium, sodium, lithium and ammonium by ion chromatography

US-ACEI, Molecular mass spectrometry analysis

IPC - Association Connecting Electronics Industries, Molecular mass spectrometry analysis

Standard Association of Australia (SAA), Molecular mass spectrometry analysis

  • AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • AS 4549.1:1999 Particle size analysis - Photon correlation spectroscopy
  • AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
  • AS 4873.1:2005 Recommended practice for inductively coupled plasma-mass spectrometry (ICP-MS) - Principles and techniques

German Institute for Standardization, Molecular mass spectrometry analysis

  • DIN V ENV 13800:2000 Lead and lead alloys - Analysis by flame atomic absorption spectrometry (FAAS) or inductively coupled plasma emission spectrometry (ICP-ES) without separation of the lead matrix; German version ENV 13800:2000
  • DIN 55674:2006 Synthetic Polymers - Determination of molecular mass and molecular mass distribution of polymers by matrix assisted laser desorption/ionization-time-of-flight-mass spectrometry
  • DIN 51009:2013 Optical atomic spectral analysis - Principles and definitions
  • DIN ISO 13321:2004 Particle size analysis - Photon correlation spectroscopy (ISO 13321:1996)
  • DIN 51009:2001 Optical atomic spectral analysis - Principles and definitions
  • DIN EN ISO 10927:2018 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2018)
  • DIN EN ISO 15061:2001-12 Water quality - Determination of dissolved bromate - Method by liquid chromatography of ions (ISO 15061:2001); German version EN ISO 15061:2001
  • DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
  • DIN 51009:2013-11 Optical atomic spectral analysis - Principles and definitions
  • DIN EN ISO 23674:2022 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
  • DIN EN 17200:2022-06 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German and English version prEN 17200:2022 / Note: Date ...
  • DIN EN 17200:2022 Construction products: Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by inductively coupled plasma mass spectrometry (ICP-MS); German and English version prEN 17200:2022
  • DIN EN ISO 19340:2019-01 Water quality - Determination of dissolved perchlorate - Method using ion chromatography (IC) (ISO 19340:2017); German version EN ISO 19340:2017
  • DIN 51456:2013 Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
  • DIN CEN/TS 17200:2019-03*DIN SPEC 18484:2019-03 Construction products - Assessment of release of dangerous substances - Analysis of inorganic substances in digests and eluates - Analysis by Inductively Coupled Plasma - Mass Spectrometry (ICP-MS); German version CEN/TS 17200:2018+AC:2018 / Note: To b...
  • DIN 51820:2013-12 Testing of lubricants - Analysis of greases by infrared spectrometer - Recording and interpretation of an infrared spectrum / Note: Applies in conjunction with DIN 51451 (2004-09).
  • DIN ISO 22634:2012 Cigarettes - Determination of benzo[a]pyrene in cigarette mainstream smoke - Method using gas chromatography/mass spectrometry (ISO 22634:2008)
  • DIN 51401-1 Bb.1:2000 Atomic absorption spectrometry (AAS) - Part 1: Terms; explanations
  • DIN EN 14242:2023-04 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis; German version EN 14242:2023
  • DIN EN 14242:2023 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis

RO-ASRO, Molecular mass spectrometry analysis

  • STAS SR ISO 7530-1:1995 Nickel alloys. Flame atomic absorption spectrometric analysis. Part 1: General requirements and sample dissolution
  • STAS SR 12271-18-1996 Uranium dioxide. Uranium isotopic analysis by mass spectrometry
  • STAS SR EN 27627-1-1996 Hardmetals. Chemical analysis by flame atomic absorption spectrometry. Part 1: General requirements

Professional Standard - Petrochemical Industry, Molecular mass spectrometry analysis

  • SH/T 0696-2000 Standard test method for nickel and vanadium in FCC equilibrium catalysts by hydrofluoric/sulfuric acid decomposition and atomic spectroscopic analysis

ES-UNE, Molecular mass spectrometry analysis

  • UNE-EN ISO 10927:2019 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2018)
  • UNE-EN ISO 23674:2023 Cosmetics - Analytical methods - Direct determination of traces of mercury in cosmetics by thermal decomposition and atomic absorption spectrometry (mercury analyser) (ISO 23674:2022)
  • UNE-EN 12938:1999 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
  • UNE-EN ISO 19340:2018 Water quality - Determination of dissolved perchlorate - Method using ion chromatography (IC) (ISO 19340:2017)
  • UNE-EN 13615:2001 Methods for the analysis of ingot tin - Determination of impurity element contents in tin grades 99,90 % and 99,85 % by atomic spectrometry
  • UNE-EN 14242:2023 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectrometric analysis (Endorsed by Asociación Española de Normalización in April of 2023.)

Professional Standard - Commodity Inspection, Molecular mass spectrometry analysis

  • SN/T 2698-2010 Elemental analysis of impurities in tungsten products.Inductively coupled plasma atomic emission spectrometric method
  • SN/T 2083-2008 Method for analysis of brass.Spark discharge atomic emission spectrometric

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Molecular mass spectrometry analysis

  • GB/T 33682-2017 General microganism identification method with with matrix-assisted laster desorption/ionization time of flight mass spectrometry
  • GB/T 20899.14-2017 Methods for chemical analysis of gold ores-Part 14: Determination of thallium content - Inductively coupled plasma atomic emission spectrometry and inductively coupled plasma mass spectrometry
  • GB/T 8152.13-2017 Methods for chemical analysis of lead concentrates—Part 13:Determination of thallium content—Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry
  • GB/T 8151.21-2017 Methods for chemical analysis of zinc concentrates—Part 21:Determination of thallium content—Inductively coupled plasma mass spectrometry and inductively coupled plasma-atomic emission spectrometry

Military Standard of the People's Republic of China-General Armament Department, Molecular mass spectrometry analysis

Professional Standard - Electron, Molecular mass spectrometry analysis

  • SJ/T 10553-2021 Method of emission specthchemical analysis of impurities in ZrO2 for use in electron ceramics
  • SJ/T 10552-2021 Method of emission specthchemical analysis of impurities in TiO2 for use in electron ceramics
  • SJ/T 10552-1994 Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramics
  • SJ/T 10553-1994 Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics
  • SJ/T 10551-1994 Method of emission spectrochemical analysis of impurities in AL203 for use in electron ceramics
  • SJ/T 10551-2021 The measurement of emission spectrum analysis for aluminium oxide used in electronic ceramics

Professional Standard - Chemical Industry, Molecular mass spectrometry analysis

  • HG/T 2954~2955-2008 Standard writing format for atomic absorption spectroscopic analysis method Standard writing format for molecular absorption spectroscopic analysis method
  • HG/T 2955-2008 Layouts for standards of molecular absorption spectrometric analysis
  • HG/T 2955-1989(1997) Rules for drafting molecular absorption spectrometry analysis standards

Professional Standard - Ferrous Metallurgy, Molecular mass spectrometry analysis

  • YB/T 4304-2012 General rule for fusion extraction-mass spectrometric analysis method

Lithuanian Standards Office , Molecular mass spectrometry analysis

  • LST EN ISO 15061:2002 Water quality - Determination of dissolved bromate - Method by liquid chromatography of ions (ISO 15061:2001)
  • LST EN ISO 10927:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2011)
  • LST EN 12938-2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
  • LST EN 12938-2000/AC-2003 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

AENOR, Molecular mass spectrometry analysis

  • UNE-EN ISO 15061:2002 Water quality - Determination of dissolved bromate - Method by liquid chromatography of ions. (ISO 15061:2001)
  • UNE-EN ISO 10927:2012 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) (ISO 10927:2011)

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Molecular mass spectrometry analysis

Professional Standard - Environmental Protection, Molecular mass spectrometry analysis

  • HJ/T 99-2003 The technical requirement for water quality automatic analyzer of dissolved oxygen(DO)

Indonesia Standards, Molecular mass spectrometry analysis

  • SNI 13-4694-1998 Composition analysis of coal ash by atomic absorption spectrometry
  • SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers

IT-UNI, Molecular mass spectrometry analysis

  • UNI 3870-1957 Procedures for chemical analysis of minerals. Determination of the lead, copper and zinc content of iron minerals. Electrolytic and gravimetric method for standard analysis.
  • UNI 6714-1970
  • UNI 3869-1957 Procedures for chemical analysis of minerals. Determination of the lead, copper and zinc content of iron minerals. Gravimetric method.

SE-SIS, Molecular mass spectrometry analysis

  • SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

YU-JUS, Molecular mass spectrometry analysis

  • JUS C.A1.541-1990 Eardmetals. Chemical analysis by flame atomic absorption spectrometry. Part 1: General requirewients

CZ-CSN, Molecular mass spectrometry analysis

Hainan Provincial Standard of the People's Republic of China, Molecular mass spectrometry analysis

  • DB46/T 557-2021 Detection of Non-biodegradable Components in Single-Use Plastic Products by Infrared Spectroscopy and Pyrolysis-Gas Chromatography/Mass Spectrometry

Professional Standard - Aviation, Molecular mass spectrometry analysis

  • HB 5219.11-1998 Chemical Analysis Methods of Magnesium Alloys - Determination of Nickel Content by Atomic Absorption Spectrometry
  • HB 5219.13-1998 Magnesium Alloy Chemical Analysis Methods Atomic Absorption Spectroscopic Analysis Determination of Zinc Content
  • HB 5219.20-1998 Methods of chemical analysis of magnesium alloys - Determination of silver content by atomic absorption spectrometry
  • HB 5219.3-1998 Methods of chemical analysis of magnesium alloys - Determination of copper content by atomic absorption spectrometry
  • HB 5219.8-1998 Methods of chemical analysis of magnesium alloys - Determination of manganese content by atomic absorption spectrometry
  • HB 5219.5-1998 Methods of chemical analysis of magnesium alloys - Determination of iron content by atomic absorption spectrometry




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