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UV test carrier

UV test carrier, Total:97 items.

In the international standard classification, UV test carrier involves: Testing of metals, Semiconducting materials, Electrical and electronic testing, Inorganic chemicals, Insulating fluids, Space systems and operations, Microbiology, Semiconductor devices, Electromechanical components for electronic and telecommunications equipment, Water quality.

国家市场监督管理总局、中国国家标准化管理委员会, UV test carrier

GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method

Professional Standard - Electron, UV test carrier

SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection
SJ 3244.4-1989 Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials--Electrochemical voltage capacitance method

ECSS - European Cooperation for Space Standardization, UV test carrier

Q-ST-70-06C-2008 Particle and UV radiation testing for space materials (First Issue)

Group Standards of the People's Republic of China, UV test carrier

T/ZSA 39-2020 Characterization of Graphene - Work function - Ultraviolet photoelectron spectroscopy (UPS) method
T/ZGIA 002-2020 Graphene Test Methods Determination of Work Function Ultraviolet Photoelectron Spectroscopy
T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, UV test carrier

GB/T 11068-1989 Gallium arsenide epitaxial layer--Determination of carrier concentration--Voltage-capacitance method
GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
GB/T 11068-2006 Gallium arsenide epitaxial layer.Determination of carrier concentration voltage-capacitance method
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
GB 11068-1989 GaAs Epitaxial Layer Carrier Concentration Capacitance-Voltage Measurement Method
GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
GB/T 42907-2023 Non-contact eddy current induction method for testing non-equilibrium carrier recombination lifetime in silicon ingots, blocks and wafers
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes
GB/T 5095.3-1997 Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. Part 3: Current-carrying capacity tests
GB/T 26068-2018 Measurement of Carrier Recombination Lifetime of Silicon Wafer and Ingot Non-contact Microwave Reflection Photoconductivity Decay Method
GB/T 14863-1993 Standard test method for net carrier density in silicon eqitaxial layers by voltage-capacitance of gated and ungated diodes

British Standards Institution (BSI), UV test carrier

BS EN 16602-70-06:2014 Space product assurance. Particle and UV radiation testing for space materials
BS EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Current-carrying capacity tests - Test 5b - Current-temperature derating
BS EN IEC 60512-9-5:2020 Connectors for electrical and electronic equipment. Tests and measurements - Endurance tests. Test 9e: Current loading, cyclic
BS EN 60512-5-1:2002 Connectors for electronic equipment - Tests and measurements - Current-carrying capacity tests - Test 5a - Temperature rise
BS 5772-3:1979 Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods. Current-carrying capacity tests
BS EN 60512-9-5:2010 Connectors for electronic equipment - Tests and measurements - Endurance tests - Test 9e - Current loading, cyclic
BS 8628:2022 Disinfection using ultraviolet radiation. Methods for quantitative testing of automated ultraviolet disinfection activities by direct illumination. Determination of bactericidal, mycobactericidal, sporicidal, yeasticidal, fungicidal, virucidal…
21/30390982 DC BS 8628. Disinfection using ultraviolet radiation. Methods for quantitative testing of automated ultraviolet disinfection activities by direct illumination. Determination of bactericidal, mycobactericidal, sporicidal, yeasticidal, fungicidal, virucidal...
18/30388795 DC BS EN 60512-9-5 Ed.2.0. Connectors for electrical and electronic equipment. Tests and measurements. Part 9-5. Endurance tests. Test 9e: Current loading, cyclic

American Society for Testing and Materials (ASTM), UV test carrier

ASTM E3179-18 Standard Test Method for Determining Antimicrobial Efficacy of Ultraviolet Germicidal Irradiation against Influenza Virus on Fabric Carriers with Simulated Soil
ASTM D7511-12(2017)e1 Standard Test Method for Total Cyanide by Segmented Flow Injection Analysis, In-Line Ultraviolet Digestion and Amperometric Detection
ASTM D7511-09e1 Standard Test Method for Total Cyanide by Segmented Flow Injection Analysis, In-Line Ultraviolet Digestion and Amperometric Detection
ASTM D7511-09 Standard Test Method for Total Cyanide by Segmented Flow Injection Analysis, In-Line Ultraviolet Digestion and Amperometric Detection
ASTM D8234-19 Standard Test Method for Anions in High Ionic Water by Ion Chromatography using Tandem Suppressed Conductivity and UV Detection
ASTM D7511-09e2 Standard Test Method for Total Cyanide by Segmented Flow Injection Analysis, In-Line Ultraviolet Digestion and Amperometric Detection
ASTM D7511-12 Standard Test Method for Total Cyanide by Segmented Flow Injection Analysis, In-Line Ultraviolet Digestion and Amperometric Detection
ASTM F398-92(1997) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
ASTM F1393-92(1997) Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe
ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
ASTM F391-96 Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
ASTM D6994-10 Standard Test Method for Determination of Metal Cyanide Complexes in Wastewater, Surface Water, Groundwater and Drinking Water Using Anion Exchange Chromatography with UV Detection

Association Francaise de Normalisation, UV test carrier

NF L90-200-70-06*NF EN 16602-70-06:2015 Space product assurance - Particle and UV radiation testing for space materials
NF EN 62416:2010 Dispositifs à semiconducteurs - Essai de porteur chaud sur les transistors MOS
NF C93-400-5-2*NF EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2 : current-carrying capacity tests - Test 5b : current-temperature derating.
NF C93-400-5-1*NF EN 60512-5-1:2002 Connectors for electronic equipment - Tests and measurements - Part 5-1 : current-carrying capacity tests - Test 5a : temperature rise.
NF EN IEC 60512-9-5:2020 Connecteurs pour équipements électriques et électroniques - Essais et mesures - Partie 9-5 : essais d'endurance - Essai 9e : charge en courant, essai cyclique
NF C93-400-99-002*NF EN IEC 60512-99-002:2019 Connectors for electronic equipment - tests and measurements - Part 99-002 : endurance test schedules - Test 99b : test schedule for unintended unmating under electrical load
NF C93-400-9-5*NF EN 60512-9-5:2011 Connectors for electronic equipment - Tests and measurements - Part 9-5 : endurance tests - Test 9e : current loading, cyclic
NF C93-400-9-5*NF EN IEC 60512-9-5:2020 Connectors for electrical and electronic equipment - Tests and measurements - Part 9-5 : endurance tests - Test 9e : current loading, cyclic

German Institute for Standardization, UV test carrier

DIN EN 16602-70-06:2015-01 Space product assurance - Particle and UV radiation testing for space materials; English version EN 16602-70-06:2014
DIN EN 62416:2010-12 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
DIN EN 60512-5-1 Berichtigung 1:2015-06 Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests -Test 5a: Temperature rise (IEC 60512-5-1:2002); German version EN 60512-5-1:2002, Corrigendum to DIN EN 60512-5-1:2003-01
DIN 50440:1998 Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
DIN EN 60512-5-2:2003-01 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002); German version EN 60512-5-2:2002 / Note: DIN IEC 60512-3 (1994-05) remains valid along...
DIN EN 16602-70-06:2015 Space product assurance - Particle and UV radiation testing for space materials; English version EN 16602-70-06:2014
DIN EN 60512-5-1:2003-01 Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise (IEC 60512-5-1:2002); German version EN 60512-5-1:2002 / Note: DIN IEC 60512-3 (1994-05) remains valid alongside this st...
DIN EN 60512-5-2:2003 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002); German version EN 60512-5-2:2002
DIN EN 60512-5-1 Berichtigung 1:2015 Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests -Test 5a: Temperature rise (IEC 60512-5-1:2002); German version EN 60512-5-1:2002, Corrigendum to DIN EN 60512-5-1:2003-01
DIN EN 60512-5-1:2003 Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise (IEC 60512-5-1:2002); German version EN 60512-5-1:2002

ES-UNE, UV test carrier

UNE-EN 16602-70-06:2014 Space product assurance - Particle and UV radiation testing for space materials (Endorsed by AENOR in November of 2014.)
UNE-EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
UNE-EN IEC 60512-9-5:2020 Connectors for electrical and electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic (Endorsed by Asociación Española de Normalización in September of 2020.)

Danish Standards Foundation, UV test carrier

DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
DS/EN 60512-9-5:2010 Connectors for electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic
DS/EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating
DS/EN 60512-5-1:2002 Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise

AENOR, UV test carrier

UNE-EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements -- Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating.
UNE-EN 60512-5-1:2002 Connectors for electronic equipment - Tests and measurements -- Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise.

Lithuanian Standards Office , UV test carrier

LST EN 62416-2010 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
LST EN 60512-5-2-2003 Connectors for electronic equipment. Tests and measurements. Part 5-2: Current-carrying capacity tests. Test 5b: Current-temperature derating (IEC 60512-5-2:2002)
LST EN 60512-5-1-2003 Connectors for electronic equipment. Tests and measurements. Part 5-1: Current-carrying capacity tests. Test 5a: Temperature rise (IEC 60512-5-1:2002)
LST EN 60512-9-5-2010 Connectors for electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic (IEC 60512-9-5:2010)

Korean Agency for Technology and Standards (KATS), UV test carrier

KS C IEC 60512-5-1:2003 Connectors for electronic equipment-Tests and measurements-Part 5-1:Current-carrying capacity tests-Test 5a:Temperature rise
KS C IEC 60512-5-1:2014 Connectors for electronic equipment-Tests and measurements-Part 5-1:Current-carrying capacity tests-Test 5a:Temperature rise
KS C IEC 60512-5-2:2003 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating
KS C IEC 60512-5-2-2003(2008) Connectors for electronic equipment－Tests and measurements－Part 5－2：Current－carrying capacity tests－Test 5b：Current－temperature derating
KS C IEC 60512-5-2:2014 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating
KS C IEC 60512-5-1-2003(2008) Connectors for electronic equipment－Tests and measurements－Part 5－1：Current－carrying capacity tests－Test 5a：Temperature rise
KS C IEC 60512-3-2002(2013) Electromechanical components for electronic equipment－Basic testing procedures and measuring methods－Part 3：Current－carrying capacity tests

PL-PKN, UV test carrier

PN T05123-1986 Electromechanical components for electronic e?uipment; basie testing procedures and measuring methods Current-carrying capacity tests
PN-EN IEC 60512-9-5-2021-03 E Connectors for electrical and electronic equipment -- Tests and measurements -- Part 9-5: Endurance tests -- Test 9e: Current loading, cyclic (IEC 60512-9-5:2020)

International Electrotechnical Commission (IEC), UV test carrier

IEC 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating
IEC 60512-5-1:2002 Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise
IEC 60512-9-5:2010 Connectors for electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic
IEC 60512-9-5:2020 Connectors for electrical and electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic
IEC 60512-3:1976 Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3 : Current-carrying capacity tests
IEC 60512-9-5:2020 RLV Connectors for electrical and electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic

Japanese Industrial Standards Committee (JISC), UV test carrier

JIS C 5402-5-2:2005 Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating
JIS C 5402-5-1:2005 Connectors for electronic equipment -- Tests and measurements -- Part 5-1: Current-carrying capacity tests -- Test 5a: Temperature rise

European Committee for Electrotechnical Standardization（CENELEC）, UV test carrier

EN IEC 60512-9-5:2020 Connectors for electrical and electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic
EN 60512-5-2:2002 Connectors for Electronic Equipment - Tests and Measurements Part 5-2: Current-Carrying Capacity Tests - Test 5b: Current-Temperature Derating
EN 60512-9-5:2010 Connectors for electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic
EN 60512-5-1:2002 Connectors for Electronic Equipment - Tests and Measurements Part 5-1: Current-Carrying Capacity Tests - Tests 5a: Temperature Rise

工业和信息化部, UV test carrier

YS/T 679-2018 Surface photovoltage method for measuring minority carrier diffusion length in extrinsic semiconductors

IN-BIS, UV test carrier

IS 12448 Pt.3-1989

Professional Standard - Non-ferrous Metal, UV test carrier

YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-state surface photovoltage

AT-OVE/ON, UV test carrier

OVE EN IEC 60512-9-5:2021 Connectors for electrical and electronic equipment - Tests and measurements - Part 9-5: Endurance tests - Test 9e: Current loading, cyclic (( IEC 60512-9-5:2020) EN IEC 60512-9-5:2020) (german version)