G04 基础标准与通用方法 标准查询与下载
共找到 1685 条与 基础标准与通用方法 相关的标准，共 113 页
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-10-31
- 实施
- 2015-10-31
Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-10-20
- 实施
Determination of SBS Content in Modified Asphalt by Infrared Spectroscopy
- ICS
- 71.040.50
- CCS
- G04
- 发布
- 2015-09-25
- 实施
- 2015-10-25
Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-08-31
- 实施
- 2015-08-31
Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-08
- 实施
Gas analysis. Purity analysis and the treatment of purity data
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-07-31
- 实施
- 2015-07-31
Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-06-30
- 实施
- 2015-06-30
Nanotechnologies - Vocabulary - Part 2: Nano-objects
- ICS
- 01.040.07;07.030
- CCS
- G04
- 发布
- 2015-06
- 实施
Gas analysis. Vocabulary
- ICS
- 01.040.71;71.040.40
- CCS
- G04
- 发布
- 2015-05-31
- 实施
- 2015-05-31
This International Standard defines terms related to gas analysis, with the main focus on terms related to calibration gas mixtures for use in gas analysis and gas measurements. It does not cover terms which relate only to specific applications.
Gas analysis - Vocabulary
- ICS
- 01.040.71;71.040.40
- CCS
- G04
- 发布
- 2015-05
- 实施
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-04-30
- 实施
- 2015-04-30
This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-04
- 实施
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-03-31
- 实施
- 2015-03-31
Diese Internationale Norm legt Mindestanforderungen an die Inhalte von Zertifikaten fur homogene Gasgemische in Gaszylindern fest, die als Kalibriergasgemische verwendet werden sollen. Reine Gase, wenn sie als Kalibriergasgemische verwendet werden, werden von dieser Internationalen Norm abgedeckt. Gase und Gasgemische, hergestellt fur andere Verwendungszwecke, werden nicht berucksichtigt. Die Anforderungen in dieser Internationalen Norm beziehen sich auf die messtechnischen Aspekte von Kalibriergasgemischen. Andere, wie z. B. Sicherheits- oder legislative Aspekte, werden nicht abgedeckt. Diese Internationale Norm legt zusatzlich empfohlene Informationen (freiwillige Angaben) zur Kennzeichnung homogener Gasgemische fest, die unter Druck in Druckgasflaschen oder anderen Behaltern geliefert werden. Sie enthalt keine Festlegungen zu sicherheitstechnischen Angaben und diesbezuglicher Kennzeichnung.
Gas analysis - Contents of certificates for calibration gas mixtures
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-03
- 实施
Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2015-03
- 实施
Diagrams for the chemical and petrochemical industry. Specification of diagrams
- ICS
- 01.110;71.020;75.020
- CCS
- G04
- 发布
- 2015-01-31
- 实施
- 2015-01-31
Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
- ICS
- 71.040.30;71.040.99
- CCS
- G04
- 发布
- 2014-12-31
- 实施
- 2014-12-31
Expression of performance of fluorometric oxygen analyzers in liquid media (IEC 62703:2013); German version EN 62703:2013
- ICS
- 01.040.71;71.040.40
- CCS
- G04
- 发布
- 2014-12
- 实施
Rapid screening and detection method for cobalt, arsenic, chromium, sodium, tin, lead, zinc, silicon, aluminum, molybdenum, potassium, strontium, zirconium and calcium in substances of high concern under REACH regulation Wavelength dispersive X-ray fluore
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2014-11-19
- 实施
- 2015-05-01
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2014-09-30
- 实施
- 2014-09-30
