共找到 479 条与 石英晶体、压电元件 相关的标准,共 32 页
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (IEC 61837-1:2012); German version EN 61837-1:2012
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
This International Standard applies to the manufacture of synthetic quartz@ lithium niobate (LN)@ lithium tantalate (LT)@ lithium tetraborate (LBO)@ and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Plastic moulded enclosure outlines
Surface acoustic wave (SAW) filters of assessed quality Guidelines for the use
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics (IEC/TS 61994-4-2:2011)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (IEC 61837-2:2011); German version EN 61837-2:2011
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators (IEC/TS 61994-3:2011)
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters (IEC/TS 61994-2:2011)
이 표준은 주파수 제어용 수정진동자를 마이크로프로세서 실리콘 소자와 일체화된 집적 회로 발
Quartz crystal units for frequency control and selection-Part 2:Guide to the use of quartz crystal units for frequency control and selection-Section one:Quartz crystal units for microprocessor clock supply
本规范规定了ZC547(ZWB-1)型温补晶体振荡器(以下简称振荡器)的详细要求。
Detail specification for type ZC547(ZWB-1)temperature compensated crystal oscillators
本规范规定了ZC545(ZWC-6B-1/2)型温补晶体振荡器(以下简称振荡器)的详细要求。
Detail specification for type ZC545(ZWC-6B-1/2)temperature compensated crystal oscillator
本规范规定了JA500型石英晶体元件(以下简称晶体元件)的详细要求。 本规范覆盖了原JA550型、JA8型和JA90型等三个型号石英晶体元件的全部技术内容。
Detail specification for type JA500 quartz crystal unit
本规范规定了ZA511(ZPB-5)型石英晶体振荡器(以下简称振荡器)的详细要求。
Detail specification for type ZA511(ZPB-5)crystal oscillator
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices (IEC/TS 61994-4-4:2010)
Piezoelectric and dielectric devices for frequency control and selection. Glossary. Piezoelectric and dielectric resonators
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric and dielectric oscillators
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections (IEC 60122-3:2010); German version EN 60122-3:2010
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240.
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures
Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号