L21 石英晶体、压电元件 标准查询与下载
共找到 479 条与 石英晶体、压电元件 相关的标准，共 32 页
This part of IEC 61994 gives the terms and definitions for piezoelectric, dielectric and electrostatic oscillators representing the state of the art, which are intended for use in the standards and documents of IEC TC 49.
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators
- ICS
- 01.040.31
- CCS
- L21
- 发布
- 2021-01-28
- 实施
本标准规定了膜厚监控用石英晶振片的产品分类、技术要求、试验和测量方法、检验规则、标志、包装、运输、贮存的要求。
Quartz crystal resonator for film thickness control
- ICS
- 31.140
- CCS
- L21
- 发布
- 2018-12-14
- 实施
- 2018-12-14
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures
- ICS
- 29.035.30;31.140
- CCS
- L21
- 发布
- 2018-08-08
- 实施
- 2018-08-08
DIN EN 60122-1:2018 经质量评定的石英晶体元件. 第1部分: 总规范 (IEC 60122-1-2002+A1-2017); 德文版本 EN 60122-1-2002+A1-2018
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002 + A1:2017); German version EN 60122-1:2002 + A1:2018
- ICS
- 31.140
- CCS
- L21
- 发布
- 2018-08-01
- 实施
- 2018-08-01
This part of IEC 62884 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017); German version EN 62884-2:2017
- ICS
- 31.140
- CCS
- L21
- 发布
- 2018-05-01
- 实施
This part of IEC 62884 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
- ICS
- 31.140
- CCS
- L21
- 发布
- 2018-03-01
- 实施
- 2018-03-24
This part of IEC 62884 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator").
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017
- ICS
- 31.140
- CCS
- L21
- 发布
- 2018-02-01
- 实施
- 2018-02-01
This part of IEC 62884 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator"). NOTE Dielectric Resonator Oscillators (DROs) and oscillators using FBAR are under consideration.
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
- ICS
- 31.140
- CCS
- L21
- 发布
- 2017-06
- 实施
- 2017-06-12
Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
- ICS
- 31.140
- CCS
- L21
- 发布
- 2017-05-26
- 实施
- 2017-05-26
Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016
- ICS
- 31.140
- CCS
- L21
- 发布
- 2017-04
- 实施
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
- ICS
- 31.140
- CCS
- L21
- 发布
- 2017-01-31
- 实施
- 2017-01-31
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
- ICS
- 31.140
- CCS
- L21
- 发布
- 2016-12-31
- 实施
- 2016-12-31
Synthetic quartz crystal. Specifications and guidelines for use
- ICS
- 31.140
- CCS
- L21
- 发布
- 2016-09-30
- 实施
- 2016-09-30
This International Standard applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications.
Synthetic quartz crystal - Specifications and guidelines for use
- ICS
- 31.140
- CCS
- L21
- 发布
- 2016-05
- 实施
- 2016-05-21
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures (IEC 61837-3:2015); German version EN 61837-3:2015
- ICS
- 31.240
- CCS
- L21
- 发布
- 2016-04
- 实施
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification (IEC 60862-1:2015); German version EN 60862-1:2015
- ICS
- 31.160
- CCS
- L21
- 发布
- 2016-04
- 实施
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines (IEC 61837-4:2015); German version EN 61837-4:2015
- ICS
- 31.240
- CCS
- L21
- 发布
- 2016-02
- 实施
Piezoelectric quartz crystal sheet
- ICS
- 31.140
- CCS
- L21
- 发布
- 2016-01-15
- 实施
- 2016-06-01
General specification for piezoelectric ceramic electroacoustic components
- ICS
- 31.140
- CCS
- L21
- 发布
- 2016-01-15
- 实施
- 2016-06-01
