L47 其他 标准查询与下载

IEC 61788-8:2010 超导性.第8部分:交流电损耗测量.用拾波线圈法在液氮温度下测量暴露于横向交流磁场中循环超导导线的交流电总损耗量

This part of IEC 61788 specifies the measurement method of total AC losses by the pickup coil method in composite superconducting wires exposed to a transverse alternating magnetic field. The losses may contain hysteresis, coupling and eddy current losses. The standard method to measure only the hysteresis loss in DC or low-sweep-rate magnetic field is specified in IEC 61788-13 [2]. In metallic and oxide round superconducting wires expected to be mainly used for pulsed coil and AC coil applications, AC loss is generated by the application of time-varying magnetic field and/or current. The contribution of the magnetic field to the AC loss is predominant in usual electromagnetic configurations of the coil applications. For the superconducting wires exposed to a transverse alternating magnetic field, the present method can be generally used in measurements of the total AC loss in a wide range of frequency up to the commercial level, 50/60 Hz, at liquid helium temperature. For the superconducting wires with fine filaments, the AC loss measured with the present method can be divided into the hysteresis loss in the individual filaments, the coupling loss among the filaments and the eddy current loss in the normal conducting parts. In cases where the wires do not have a thick outer normal conducting sheath, the main components are the hysteresis loss and the coupling loss by estimating the former part as an extrapolated level of the AC loss per cycle to zero frequency in the region of lower frequency, where the coupling loss per cycle is proportional to the frequency.

Superconductivity - Part 8: AC loss measurements - Total AC loss measurement of round superconducting wires exposed to a transverse alternating magnetic field at liquid helium temperature by a pickup coil method

DIN EN 61988-2-3:2010 等离子体显示板.第2-3部分:光电测量方法.图像质量:缺陷和退降(IEC 61988-2-3-2009); 德文版本 EN 61988-2-3-2009

This part of IEC 61988 determines the measuring methods for defects and degradation of colour plasma display (PDP) module in the following areas: a) cell defects; b) image sticking; c) luminance lifetime.

Plasma display panels - Part 2-3: Measuring methods - Image quality: defects and degradation (IEC 61988-2-3:2009); German version EN 61988-2-3:2009

DIN EN 61988-5:2010 等离子显示器.第5部分:通用规范

This Standard for Plasma display panels specifies general procedures for quality assessment to be used in the IECQ-CECC system and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.

Plasma display panels - Part 5: Generic specification (IEC 61988-5:2009); German version EN 61988-5:2009

DIN EN 61988-3-2:2010 等离子体显示板.第3-2部分:接口.电气接口

This part of IEC 61988 defines the electrical interface of digital video data signals, synchronization signals and functional signals between the image processing board of the PDP set and the control board of the PDP module, and defines the description of the pin assignment of the connectors.

Plasma display panels - Part 3-2: Interface - Electrical interface (IEC 61988-3-2:2009); German version EN 61988-3-2:2009

ANSI/UL 2305-2010 展览用展示装置的制造和安装安全性标准

1. Proposed Addition Of Construction, Performance, Marking, and Installation Instruction Requirements For The Investigation Of Booth Stringer Type Cord Sets Intended For Indoor Use For The Purpose Of Illuminating, Animating, Activating, Or Displaying With Respect To Temporary Expositions, Exhibits, Show Conventions, Meetings, or Assemblies Where Display Booths Or Units Are Installed

Standard for Safety for Exhibition Display Units, Fabrication, and Installation

DB35/T 969-2009 LED背光源测试方法

本标准规定了LED背光源(以下简称“背光源”)的术语和定义及各项主要性能的测试方法。 本标准适用于尺寸规格不大于400mm的背光源的测试。

LED backlight test method

IEC 61988-3-2:2009 等离子显示板.第3-2部分:接口.电接口

Plasma Display Panels - Part 3-2: Interface - Electrical interface

IEC 61988-2-3:2009 等离子显示板.第2-3部分:测量方法.图像质量,缺陷和等级

Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation

IEC 61747-5-3:2009 液晶显示装置.第5-3部分:环境、耐久性和机械试验方法.玻璃强度和可靠性

Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability

KS C 6520-2008 半导体工艺零件的等离子耐磨性测试

이 표준은 플라즈마 식각 또는 증착 공정장비 내부의 부품에 적용되며, 플라즈마에 노출되는

Components and materials of semiconductor process－Measurement of wear characteristics by plasma

SN/T 1667.2-2007 进出口机电产品检测方法第2部分:彩色液晶显示器件电光性能的测量

SN/T 1667的本部分规定了彩色液晶显示器件电光性能的测量方法。本部分没有规定评价液晶显示器性能的各项参数的限定值。 本部分适用于彩色液晶显示器件功耗电流、最大亮度、对比度、视角范围、响应时间、色度的测量。

Inspection of mechanical and electrical commodity for import and export.Part 2:Measurement of electrical&optical performance for color liquid crystal display devices

KS C IEC 62341-6-2:2007 有机发光二极管(OLED)显示器.第6-2部分:视觉质量和环境性能的测量方法

이 규격은 유기발광다이오드 디스플레이 모듈(이하 “OLED 모듈”)의 화질을 평가하는 방법

Organic light emitting diode(OLED) displays－Part 6－2：Measuring methods of visual quality

KS C IEC 61747-5-3:2007 液晶显示装置.第5-3部分:环境、耐久性和机械试验方法.玻璃强度和可靠性

이 규격은 액정 디스플레이 모듈의 일반 규격이다. 이 규격은 광원이 내장되어 있거나 광원이

Liquid crystal display devices－Part 5－3：Glass strength and reliability measurement method

KS C IEC 61988-5:2007 等离子显示板.第5部分:通用规范

이 규격은 IECQ-CECC 시스템에서 사용되는 품질평가의 일반적인 절차를 규정하고, 전기

Plasma display panels－Part 5：Generic specification

KS C IEC 61988-2-3:2007 等离子显示板.第2-3部分:测量方法.图像质量、缺陷和等级

이 규격은 컬러 플라즈마 디스플레이 모듈의 성능 특성에 있어서, 아래의 측정 방법에 대하여

Plasma display panels－Part 2－3：Measuring methods－Quality

KS C 6111-3-2007 超导电子特性的测量.高温超导薄膜的高频固有表面阻抗测量方法

이 규격은 두 공진모드(two-tone) 유전체 공진기 방법을 이용한 초전도 박막의 고주파

Electronic characteristic measurements－Intrinsic surface impedance of high-TC superconductor films at microwave frequencies

SANS 1210:2007 六角扳手键

Covers the material, dimensional, and mechanical strength requirements for hexagon wrench keys (Allen keys) in sizes ranging from 2 mm to 36 mm inclusive.

Hexagon wrench keys

IEC 61788-4:2007 超导性.第4部分:剩余电阻率的测量.Nb-Ti复合超导体的剩余电阻率

This part of IEC 61788 covers a test method for the determination of the residual resistance ratio (RRR} of a composite superconductor comprised of Nb-Ti filaments and Cu, Cu-Ni or Cu/Cu-Ni matrix. This method is intended for use with superconductors that have a monolithic structure with rectangular or round cross-section, RRR less than 350, and cross-sectional area less than 3 mm2. All measurements are done without an applied magnetic field. The method described in the body of this standard is the "reference" method and optional acquisition methods are outlined in Clause A.4.

Superconductivity - Part 4: Residual resistance ratio measurement - Residual resistance ratio of Nb-Ti composite superconductors

KS C IEC 61747-6-2:2006 液晶和固态显示器件.第6-2部分:液晶显示模块的测量方法.反射类型

이 규격은 액정 디스플레이 모듈 평가에 요구되는 품질 평가 절차, 검사 요건, 선별 순서,

Liquid crystal display devices-Part 6-2:Measuring methods for liquid crystal modules-Reflective type

KS C IEC 61747-5-2:2006 液晶显示装置.第5-2部分:环境、耐久性和机械试验方法.有源矩阵彩色液晶显示模块的外观检查

이 규격은 액정 디스플레이 모듈에 관한 일반적인 표준이다. 이 규격은 칼라 능동 매트릭스

Liquid crystal display devices－Part 5－2：Visual inspection of active matrix liquid crystal display modules