L47 其他 标准查询与下载

KS C IEC 61747-6-3:2006 液晶显示器.第6-3部分:液晶显示模块测量方法.有源矩阵液晶显示模块的运动伪影测量

이 규격은 능동 액정 디스플레이 모듈 평가에 대한 일반적인 규격이다. 이 규격은 능동 액정

Liquid crystal display devices－Part 6－3：Motion artifact measurement of active matrix liquid crystal display modules

IEC 61788-7:2006 超导性.第7部分:电特性测量.微波频率下超导体的表面电阻

This part of IEC 61788 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of surface resistances for this method is as follows: – Frequency: 8 GHz < f < 30 GHz – Measurement resolution: 0,01 mΩ at 10 GHz The surface resistance data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, are reported.

Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies

IEC 61788-10:2006 超导性.第10部分:临界温度测量.用电阻法对复合超导体的临界温度的测量

This part of IEC 61788 specifies a test method for the resistive determination of the critical temperature of composite superconductors for industrial use. The composite superconductors covered in this standard include Cu/Nb-Ti, Cu/Cu-Ni/Nb-Ti and Cu-Ni/Nb-Ti composite superconductors, Cu/Nb3Sn and Cu/Nb3Al composite superconductors, and metal-sheathed MgB2 composite superconductors, and metal-stabilized Bisystem oxide superconductors and Yttrium- or rare-earth-based coated conductors that have a monolithic structure and a shape of round, flat or square wire containing mono- or multicores of superconductors.

Superconductivity - Part 10: Critical temperature measurement - Critical temperature of composite superconductors by a resistance method

DIN EN 61988-3-1:2006 等离子体显示板.第3-1部分:机械接口(IEC 61988-3-1-2005)

This part of DIN EN 61988 defines drawings and required dimensions of plasma display (PDP) modules, PDP components, PDP sub-assemblies and ancillary components.

Plasma display panels - Part 3-1: Mechanical interface (IEC 61988-3-1:2005); German version EN 61988-3-1:2005

IEC 61788-3:2006 超导性.第3部分:临界电流测量.银和/或银合金铠装的铋-2212和铋-2223氧化物超导体的临界直流电流

This part of IEC 61788 covers a test method for the determination of the dc critical current of short and straight Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides. This method is intended for use with superconductors that have critical currents less than 500 A and n-values larger than 5. The test is carried out with and without an applying external magnetic field. For all tests in a magnetic field, the magnetic field is perpendicular to the length of the specimen. In the test of a tape specimen in a magnetic field, the magnetic field is parallel or perpendicular to the wider tape surface (or one surface if square). The test specimen is immersed either in a liquid helium bath or a liquid nitrogen bath during testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard.

Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors

ASTM D5138-06 液晶聚合物(LCP)的标准分类系统

1.1 This classification system covers liquid crystal polymeric (LCP) materials suitable for injection molding and extrusion. This classification system allows the use of liquid crystal polymers that are recycled, reconstituted, recycled-regrind, recovered, or reprocessed, or a combination thereof, provided that the requirements as stated in this classification system are met. It is the responsibility of the supplier and the buyer of liquid crystal polymers that are recycled, reconstituted, recycled-regrind, recovered, or reprocessed, or a combination thereof, to ensure compliance.1.2 The properties included in this classification system are those required to identify the compositions covered. There may be other requirements necessary to identify particular characteristics important to specialized applications. These shall be agreed upon between the user and the supplier, by using suffixes as given in Section 5.1.3 This classification system and subsequent line callout (specification) are intended to be a means of calling out plastic materials used in the fabrication of end-use items or parts. It is not intended for the selection of materials. Material selection should be made by those having expertise in the plastics field after careful consideration of the design and the performance required of the part, the environment to which it will be exposed, the fabrication process to be employed, the costs involved, and the inherent properties of the material other than those covered by this classification system.1.4 The values stated in SI units are to be regarded as standard.The following precautionary caveat pertains only to the test method portion, Section 11, of this classification system: This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Note 1There is no known ISO equivalent to this classification system.

Standard Classification System for Liquid Crystal Polymers (LCP)

CB 1381-2005 军用加固液晶显示器通用规范

本规范规定了军用加固液晶显示器（以下简称军用LCD）的要求、质量保证规定及交货准备等。 本规范适用于军用LCD的设计、制造和验收。

General specification for military rugged liquid crystal display

KS C 6111-1-2005 超电导.超电导体的临界温度测定.使用SQUID磁化系统的Nb-Ti、Nb3Sn、Bi系复合超导导线的临界温度测定法

이 규격은 복합 초전도체의 임계 온도를 SQUID 자화계를 이용하여 결정하는 시험법을 수

Superconductivity－Critical temperature measurement－Critical temperature of Nb-Ti, Nb3Sn, and Bi-system compositesuperconductors by a magnetic method using a SQUID magnetometer

KS C 6111-2-2005 超电导.超电导体的临界温度测定.使用超导电性交流磁化率的Nb-Ti、Nb3Sn、Bi系复合超导导线临界温度测定法

이 규격은 교류 자화율계를 이용하여 복합 초전도체의 임계 온도를 결정하는 시험법을 수 록하

Superconductivity－Critical temperature measurement－Critical temperature of Nb-Ti, Nb3Sn, and Bi-system composite superconductors by a magnetic method using an ac susceptometer

IEC 61988-3-1:2005 等离子体显示板.第3-1部分:机械接口

This part of IEC 61988 defines drawings and required dimensions of plasma display (PDP) modules, PDP components, PDP sub-assemblies and ancillary components. This standard serves as a basis to establish a set of PDP modules with a standard description of dimensions.

Plasma display panels - Part 3-1: Mechanical interface

DLA QPL-28803-10-2005 背部分割点光电读数显示器一般规格

This list has been prepared for use by or for the Government in the acquisition of products covered by Specification MIL-DLT-28803. Listing of a product is not intended to and does not connote endorsement of the product by the Department of Defense.

DISPLAY, OPTOELECTRONIC, READOUTS, BACK LIGHTED SEGMENTED, GENERAL SPECIFICATION FOR

KS C IEC 61988-3-2:2005 等离子显示板.第3-2部分:PDP的电接口

이 규격은 PDP 세트의 영상 처리 보드와 PDP 모듈 제어 보드 간에 디지털 비디오 데이

Electrical interface of plasma display panels

ARINC 764-2005 加盖子显示器系统

HEAD-UP DISPLAY (HUD) SYSTEM

HEAD-UP DISPLAY (HUD) SYSTEM

ARINC 661-2-2005 使用者系统驾驶员座舱显示器系统2001包括附录1到2

COCKPIT DISPLAY SYSTEM INTERFACES TO USER SYSTEMS 2001; Includes Supplement 1 and 2

COCKPIT DISPLAY SYSTEM INTERFACES TO USER SYSTEMS 2001; Includes Supplement 1 and 2

KS C IEC 61988-4:2005 等离子显示板.第4部分:气候和机械测试方法

이 규격은 플라즈마 디스플레이 모듈(PDP 모듈)의 환경 및 기구적 특성을 평가하기 위한

Plasma display panels－Part 4：Environmental and mechanical endurance test methods

DIN EN 61747-4-1:2005 液晶显示器件.第4-1部分:矩阵彩色LCD模件.基本额定值和特性

This part of DIN EN 61747 describes the essential ratings and characteristics of matrix colour liquid crystal display (LCD) modules.

Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics (IEC 61747-4-1:2004); German version EN 61747-4-1:2004

DIN EN 61747-2-2:2005 液晶显示装置.第2-2部分:矩阵彩色液晶显示模块.空白详细规范(IEC 61747-2-2-2004)

This standard contains a blank detail specification for Liquid Crystal Display (LCD) modules (here: matrix colour LCD modules) for quality assessment within the IECQ system for electronic components.

Liquid crystal display devices - Part 2-2: Matrix colour LCD modules - Blank detail specification (IEC 61747-2-2:2004); German version EN 61747-2-2:2004

KS C IEC 61988-3-1:2005 等离子显示板.第3-1部分:机械接口

이 규격은 PDP 모듈, PDP 부품, PDP 부속 조립품 및 보조 부품의 요구 치수와 도

Plasma display panels－Part 3－1：Mechanical interface

KS C IEC 61747-2-2:2005 液晶显示器件.第2-2部分:矩阵彩色LCD模块.空白详细规范

1.1 이 규격은 매트릭스 컬러 LCD 모듈의 개별 규격 지침에 대하여 규정한다.1.2

Liquid crystal display devices－Part 2－2：Matrix colour LCD modules－Blank detail specification

KS C IEC 61747-6:2005 液晶显示器.第6部分:液晶模块的测定方法.透射型

이 규격은 액정 디스플레이 모듈 평가에 요구되는 품질 평가 절차, 검사 요건, 선 별 순서

Liquid crystal display devices－Part 6：Measuring methods for liquid crystal modules－Transmissive type