N32 放大镜与显微镜 标准查询与下载

ISO 11884-2:2007 光学和光子学.立体显微镜的最低要求.第2部分:高性能显微镜

This part of ISO 11884 specifies minimun requirements for high performance stereomicroscopes.It is not applicable to operation microscopes.

Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes

BS EN ISO 14880-2:2007 光学和光子学.显微物镜系列.波像差的试验办法

ISO 14880-2:2006 specifies methods for testing wavefront aberrations for microlenses within microlens arrays. It is applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.

Optics and photonics - Microlens arrays - Test methods for wavefront aberrations

JB/T 10573-2006 工具显微镜

Toolmakers microscope

NF S10-132-4*NF EN ISO 14880-4:2006 光学和光子学.显微物镜系列.第4部分:几何学特征的试验办法

Optics and phonotics - Microlens arrays - Part 4 : test methods for geometrical properties.

DIN EN ISO 14880-4:2006 光学和光子学.显微物镜系列.第4部分:几何学特征的试验办法(ISO 14880-4-2006)

This standard specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006) English version of DIN EN ISO 14880-4:2006-08

DIN EN ISO 14880-3:2006 光学和光子学.显微物镜系列.第3部分:不同于波像差的光学特征的试验办法(ISO 14880-3-2006)

This standard specifies methods for testing optical properties, other than wavefront aberrations, of microlenses in microlens arrays. It is applcable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO 14880-3:2006) English version of DIN EN ISO 14880-3:2006-08

BS EN ISO 14880-3:2006 光学和光子学.显微镜系列.不同于波前像差的光学特征试验办法

ISO 14880-3:2006 specifies methods for testing optical properties, other than wavefront aberrations, of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations

BS EN ISO 14880-4:2006 光学和光子学.显微透镜系列.几何学特征试验方法

ISO 14880-4:2006 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

Optics and photonics - Microlens arrays - Test methods for geometrical properties

BS ISO 8036:2006 光学和光子学.显微镜.光学显微学的浸液

This International Standard describes the characteristics of immersion liquids used in microscopy. It classifies immersion liquids according to their field of application and specifies requirements and test methods for each type. This International Standard further specifies a system of designation for immersion liquids, the information to be included on container labels and the information to be supplied in technical data sheets.

Optics and photonics - Microscopes - Immersion liquids for light microscopy

KS B ISO 8038-1:2006 光学和光学仪器.显微镜.物镜及物镜座螺纹.第1部分:螺纹类型RMS(4/5in×1/36in)

이 규격은 현미경의 대물렌즈를 노즈피스에 연결하는 나사의 한 유형인 RMS 나사산의 치 수

Optics and optical instruments－Microscopes－Screw threads for objectives and related nosepieces－Part 1：Screw thread type RMS(4/5 in×1/36 in)

KS B ISO 8040:2006 光学和光学仪器.显微镜.镜筒导板和镜筒槽的连接尺寸

이 규격은 전 제조업체에 의해 제조되는 현미경에 장착되는 보조 광학 및 보상기의 상호 교

Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections

KS B ISO 9345-1:2006 光学和光学仪器.显微镜.相对机械参考面的象距.第1部分:160mm筒长

이 규격은 기계적인 경통 길이가 160 mm이거나 이와 동일한 현미경의 대물렌즈 및 접안

Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm

KS B ISO 8039:2006 光学和光学仪器.显微镜.放大率

이 규격은 광학 현미경의 상(image) 구성 요소들의 배율에 대한 일련의 값을 규정하고

Optics and optical instruments Microscopes Magnification

KS B ISO 8038-2:2006 光学和光学仪器.显微镜.物镜和相关目镜转换盘的螺纹.第2部分:M型螺纹25×0.75mm

이 규격은 현미경의 대물렌즈를 노즈피스에 연결하는 RMS 나사산 이외의 다른 유형인 M25

Optics and optical instruments－Screw threads for microscope objectives and related nosepieces－Part 2：Screw thread type M25×0.75 mm

KS B ISO 9345-2:2006 光学和光学仪器.显微镜.相对机械参考面的象距.第2部分:无限光学校正系统

이 규격은 무한보정 광학계가 장착된 현미경의 대물렌즈와 접안렌즈의 상거리 및 “정상” 경

Optics and optical instruments-Microscopes:Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems

ISO 14880-4:2006 光学和光子学.显微物镜系列.第4部分:几何学特征的试验办法

This part of ISO 14880 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties

ISO 14880-3:2006 光学和光子学.显微物镜系列.第3部分:不同于波像差的光学特征的试验办法

This part of ISO 14880 specifies methods for testing optical properties, other than wavefront aberrations, of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations

JJG 77-2006 干涉显微镜检定规程

本规程适用于双光束干涉显微镜的首次检定、后续检定和使用中检验。

Verification Regulation of Interference Microscopes

ISO 8036:2006 光学和光子学.显微镜.光学显微镜浸液

This International Standard describes the characteristics of immersion liquids used in microscopy. It classifies immersion liquids according to their field of application and specifies requirements and test methods for each type. This International Standard further specifies a system of designation for immersion liquids, the information to be included on container labels and the information to be supplied in technical data sheets.

Optics and photonics - Microscopes - Immersion liquids for light microscopy

NF X21-005:2006 微电子束分析.扫描电子显微镜.校准图像放大指南

Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.