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scanning atomic force microscope

scanning atomic force microscope, Total:7 items.

In the international standard classification, scanning atomic force microscope involves: Linear and angular measurements, Analytical chemistry, Thermodynamics and temperature measurements.

American Society for Testing and Materials (ASTM), scanning atomic force microscope

• ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

International Organization for Standardization (ISO), scanning atomic force microscope

• ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

British Standards Institution (BSI), scanning atomic force microscope

• BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

Group Standards of the People's Republic of China, scanning atomic force microscope

• T/QGCML 1940-2023

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