ZH
RU
ES

Scanning Probe Atomic Force

Scanning Probe Atomic Force, Total:9 items.

In the international standard classification, Scanning Probe Atomic Force involves: Linear and angular measurements, Analytical chemistry, Non-ferrous metals, Optical equipment.

RU-GOST R, Scanning Probe Atomic Force

• GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
• GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
• GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope

International Organization for Standardization (ISO), Scanning Probe Atomic Force

• ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

British Standards Institution (BSI), Scanning Probe Atomic Force

• BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

Korean Agency for Technology and Standards (KATS), Scanning Probe Atomic Force

• KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
• KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
• KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope

Others:   atomic force probe, Atomic force scanning probe microscope - identification method, atomic force scan, Scanning Probe Atomic Force Microscopy, AFM Scanning Probe, Scan Tunneling and Atomic Force, Scanning Tunneling Atomic Force, Atomic Force and Scanning Tunneling, Scanning Tunneling Atomic Force, Scanning Probe Microscopy and Atomic Force, atomic force probe afm, scanning atomic force, Atomic Force Scanning Probe Microscope, Scanning Kelvin Probe Atomic Force Microscopy, Scan Kelvin Atomic Force, Scanning Probe Atomic Force, Atomic Force Scanning Probe, Atomic Force Scanning Tunnel, tunnel scanning atomic force, AFM.