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Atomic Force Scanning Probe

Atomic Force Scanning Probe, Total:3 items.

In the international standard classification, Atomic Force Scanning Probe involves: Linear and angular measurements.

RU-GOST R, Atomic Force Scanning Probe

• GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
• GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
• GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope

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