A60 光学计量 标准查询与下载

JJG 677-2006 光干涉式甲烷测定器

本规程适用于光干涉式甲烷测定器（以下简称测定器）的首次检定、后续检定和使用中检验。

Interference Type Methane Measuring Device

BS ISO 23539:2006 光度测量法.物理光度测量法的CIE系统

ISO 23539:2005 specifies the characteristics of the system of physical photometry established by the CIE and accepted as the basis for the measurement of light. It defines the photometric quantities, units and standards that make up the CIE system of physical photometry and that have been officially accepted by the Comité International des Poids et Mesures (CIPM).

Photometry - The CIE system of physical photometry

ASTM E2450-06 混合中子-光子环境中CaF2(Mn)热发光剂量计应用的标准实施规程

1.1 This practice describes a procedure for measuring gamma-ray absorbed dose in CaF2(Mn) thermoluminescence dosimeters (TLDs) exposed to mixed neutron-photon environments during irradiation of materials and devices. The practice has broad application, but is primarily intended for use in the radiation-hardness testing of electronics. The practice is applicable to the measurement of absorbed dose from gamma radiation present in fields used for neutron testing.1.2 This practice describes a procedure for correcting for the neutron response of a CaF2(Mn) TLD. The neutron response may be subtracted from the total response to give the gamma-ray response. In fields with a large neutron contribution to the total response, this procedure may result in large uncertainties.1.3 More precise experimental techniques may be applied if the uncertainty derived from this practice is larger than the user can accept. These techniques are not discussed here. The references in Section 8 describe some of these techniques.1.4 This practice does not discuss effects on the TLD reading of neutron interactions with material surrounding the TLD to ensure charged particle equilibrium. These effects depend on the surrounding material and its thickness, and on the neutron spectrum (1).

Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

JJG 580-2005 焦度计

本规程适用于测量眼镜镜片和测量角膜接触镜这两种用途的焦度计的首次检定、后续检定和使用中检验。 焦度计的型式评价中对计量性能的要求可参考本规程执行。

Focimeters

GJB/J 5463-2005 光学薄膜折射率和厚度测试仪检定规程

本检定规程规定了光谱范围 250nm～1700nm 椭偏法光学薄膜折射率和厚度测试仪（以下简称测试仪）的检定技术要求、检定项目、检定条件、检定方法、检定结果的处理和检定周期。 本检定规程适用于新制造、使用中与修理后的测试仪的检定。

Verification regulation for measurement equipment of optical film refractive index and thickness

JJG 739-2005 激光干涉仪

本规程适用于激光干涉仪的首次检定和后续检定。

Laser Interferometers

JJF 1032-2005 光学辐射计量名词术语及定义

本规范是对JJF 1032-1992《光学辐射计量名词及定义》（试行）规范进行修订、扩充而成。它涉及该专业相关的基本概念、量和单位、计量基准与标准、校准与测试方法、仪器与标准物质以及工程计量术语，总计达到557条。并按其内在联系细分：一般术语、辐射度、光度、光谱光度、色度、激光辐射度、光纤特性测量、辐射探测器和光学元器件等九章，以便查阅。

Terminology and Derfinitions for Optical Radiation Measurements

JJG 998-2005 激光小角度测量仪

本规程适用于测量范围为0～±5°，利用正弦原理测量角度的激光小角度测量仪的首次检定、后续检定和使用中检验。

Laser Measuring Instruments for Small Angles

JIS Z 8725 ERRATUM 1:2005 勘误

ERRATUM

JJG 245-2005 光照度计

本规程适用于光照度计(以下简称照度计)的首次检定、后续检定和使用中检验。定型鉴定、样机试验中有关计量性能的要求可参照执行。

Illuminance Meter

JJG 2083-2005 光谱辐射亮度、光谱辐射照度计量器具检定系统表

Spectral radiance, spectral irradiance measuring instrument verification system table

JJG 2069-2005 镜向光泽度计量器具检定系统表

Specular Gloss Measuring Instrument Verification System Table

JJG 863-2005 V棱镜折射仪

本规程适用于V棱镜折射仪的首次检定、后续检定和使用中检验。V棱镜折射仪的定型鉴定、样机试验中对有关计量性能的要求可参照本规程执行。

V - prism Refractometer

JJG 2032-2005 光照度计量器具检定系统表

Illuminance Measuring Instrument Verification System Table

JJG 2034-2005 发光强度计量器具检定系统表

Luminous intensity measuring instrument verification system table

JJG 246-2005 发光强度标准灯

本规程适用于发光强度标准灯(简称标准灯)的首次检定、后续检定和使用中检验。标准灯定型鉴定中有关计量性能的要求可参照执行。

Standard Lamp of Luminous Intensity

JJG 211-2005 亮度计

本规程适用于亮度计(含彩色亮度计)的首次检定、后续检定和使用中检验。亮度计的定型鉴定、样机试验中有关计量性能的要求可参照本规程执行。

Luminance Meter

ASTM E2387-05(2011) 测角光学散射量的标准实施规程

The angular distribution of scatter is a property of surfaces that may have direct consequences on an intermediate or final application of that surface. Scatter defines many visual appearance attributes of materials, and specification of the distribution and wavelength dependence is critical to the marketability of consumer products, such as automobiles, cosmetics, and electronics. Optically diffusive materials are used in information display applications to spread light from display elements to the viewer, and the performance of such displays relies on specification of the distribution of scatter. Stray-light reduction elements, such as baffles and walls, rely on absorbing coatings that have low diffuse reflectances. Scatter from mirrors, lenses, filters, windows, and other components can limit resolution and contrast in optical systems, such as telescopes, ring laser gyros, and microscopes. The microstructure associated with a material affects the angular distribution of scatter, and specific properties can often be inferred from measurements of that scatter. For example, roughness, material inhomogeneity, and particles on smooth surfaces contribute to optical scatter, and optical scatter can be used to detect the presence of such defects. The angular distribution of scattered light can be used to simulate or render the appearance of materials. Quality of rendering relies heavily upon accurate measurement of the light scattering properties of the materials being rendered.p>1.1 This practice describes procedures for determining the amount and angular distribution of optical scatter from a surface. In particular it focuses on measurement of the bidirectional scattering distribution function (BSDF). BSDF is a convenient and well accepted means of expressing optical scatter levels for many purposes. It is often referred to as the bidirectional reflectance distribution function (BRDF) when considering reflective scatter or the bidirectional transmittance distribution function (BTDF) when considering transmissive scatter.1.2 The BSDF is a fundamental description of the appearance of a sample, and many other appearance attributes (such as gloss, haze, and color) can be represented in terms of integrals of the BSDF over specific geometric and spectral conditions.1.3 This practice also presents alternative ways of presenting angle-resolved optical scatter results, including directional reflectance factor, directional transmittance factor, and differential scattering function.1.4 This practice applies to BSDF measurements on opaque, translucent, or transparent samples.1.5 The wavelengths for which this practice applies include the ultraviolet, visible, and infrared regions. Difficulty in obtaining appropriate sources, detectors, and low scatter optics complicates its practical application at wavelengths less than about 0.2 m (200 nm). Diffraction effects start to become important for wavelengths greater than 15 m (15 000 nm), which complicate its practical application at longer wavelengths. Measurements pertaining to visual appearance are restricted to the visible wavelength region.1.6 This practice does not apply to materials exhibiting significant fluorescence.1.7 This practice applies to flat or curved samples of arbitrary shape. However, only a flat sample is addressed in the discussion and examples. It is the users responsibility to define an appropriate sample coordinate system to specify the measurement location on the sample surface and appropriate beam properties for samples that are not flat.1.8 This practice does not provide a method for ascribing the measured BSDF to any scattering mechanism or source.1.9 This practice does not provide a method to extrapolate data from one wavelength, scattering geometry, sample location, or polarization to any other wavelength, scattering geometry, sample location, or......

Standard Practice for Goniometric Optical Scatter Measurements

ASTM E2450-05 混合中子-光子环境中CaF2(Mn)热发光剂量计应用的标准实施规程

1.1 This practice describes a procedure for measuring gamma-ray absorbed dose in CaF2(Mn) thermoluminescence dosimeters (TLDs) exposed to mixed neutron-photon environments during irradiation of materials and devices. The practice has broad application, but is primarily intended for use in the radiation-hardness testing of electronics. The practice is applicable to the measurement of absorbed dose from gamma radiation present in fields used for neutron testing.1.2 This practice describes a procedure for correcting for the neutron response of a CaF2(Mn) TLD. The neutron response may be subtracted from the total response to give the gamma-ray response. In fields with a large neutron contribution to the total response, this procedure may result in large uncertainties.1.3 More precise experimental techniques may be applied if the uncertainty derived from this practice is larger than the user can accept. These techniques are not discussed here. The references in Section 8 describe some of these techniques.1.4 This practice does not discuss effects on the TLD reading of neutron interactions with material surrounding the TLD to ensure charged particle equilibrium. These effects depend on the surrounding material and its thickness, and on the neutron spectrum (1).178;

Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

ASTM E2387-05 测角光学散射测量的标准实施规程

The angular distribution of scatter is a property of surfaces that may have direct consequences on an intermediate or final application of that surface. Scatter defines many visual appearance attributes of materials, and specification of the distribution and wavelength dependence is critical to the marketability of consumer products, such as automobiles, cosmetics, and electronics. Optically diffusive materials are used in information display applications to spread light from display elements to the viewer, and the performance of such displays relies on specification of the distribution of scatter. Stray-light reduction elements, such as baffles and walls, rely on absorbing coatings that have low diffuse reflectances. Scatter from mirrors, lenses, filters, windows, and other components can limit resolution and contrast in optical systems, such as telescopes, ring laser gyros, and microscopes. The microstructure associated with a material affects the angular distribution of scatter, and specific properties can often be inferred from measurements of that scatter. For example, roughness, material inhomogeneity, and particles on smooth surfaces contribute to optical scatter, and optical scatter can be used to detect the presence of such defects. The angular distribution of scattered light can be used to simulate or render the appearance of materials. Quality of rendering relies heavily upon accurate measurement of the light scattering properties of the materials being rendered.p>1.1 This practice describes procedures for determining the amount and angular distribution of optical scatter from a surface. In particular it focuses on measurement of the bidirectional scattering distribution function (BSDF). BSDF is a convenient and well accepted means of expressing optical scatter levels for many purposes. It is often referred to as the bidirectional reflectance distribution function (BRDF) when considering reflective scatter or the bidirectional transmittance distribution function (BTDF) when considering transmissive scatter.1.2 The BSDF is a fundamental description of the appearance of a sample, and many other appearance attributes (such as gloss, haze, and color) can be represented in terms of integrals of the BSDF over specific geometric and spectral conditions.1.3 This practice also presents alternative ways of presenting angle-resolved optical scatter results, including directional reflectance factor, directional transmittance factor, and differential scattering function.1.4 This practice applies to BSDF measurements on opaque, translucent, or transparent samples.1.5 The wavelengths for which this practice applies include the ultraviolet, visible, and infrared regions. Difficulty in obtaining appropriate sources, detectors, and low scatter optics complicates its practical application at wavelengths less than about 0.2 m (200 nm). Diffraction effects start to become important for wavelengths greater than 15 m (15 000 nm), which complicate its practical application at longer wavelengths. Measurements pertaining to visual appearance are restricted to the visible wavelength region.1.6 This practice does not apply to materials exhibiting significant fluorescence.1.7 This practice applies to flat or curved samples of arbitrary shape. However, only a flat sample is addressed in the discussion and examples. It is the users responsibility to define an appropriate sample coordinate system to specify the measurement location on the sample surface and appropriate beam properties for samples that are not flat.1.8 This practice does not provide a method for ascribing the measured BSDF to any scattering mechanism or source.1.9 This practice does not provide a method to extrapolate data from one wavelength, scattering geometry, sample location, or polarization to any other wavelength, scattering geometry, sample location, or......

Standard Practice for Goniometric Optical Scatter Measurements