A60 光学计量 标准查询与下载

JIS Z 8725:1999 光源温度分布及色温或相关色温的测量方法

この規格は，ガラス球に波長選択的な吸収，反射がない白熱電球(ハロゲン電球を含む。)の可視波長域における放射の分布温度を測定する方法，及び光源色がほぽ無彩色であるような光源の放射の相関色温度又は色温度を測定する方法について規定する。

Methods for determining distribution temperature and color temperature or correlated color temperature of light sources

DIN 5032-4:1999 光测量.第4部分:光源测量

The document applies to luminaires for lighting application. It specifies the methods of measurement and determination as well as presentation of lighting quantities for luminaires.

Photometry - Part 4: Measurement of luminaires

ASTM F448-99 测量稳态原始光电流的标准试验方法

1.1 This test method covers the measurement of steady-state primary photocurrent, Ipp, generated in semiconductor devices when these devices are exposd to ionizing radiation. These procedures are intended for the measurement of photocurrents greater than 10-9 A-s/Gy(Si or Ge), in cases for which the relaxation time of the device being measured is less than 25% of the pulse width of the ionizing source. The validity of these procedures for ionizing dose rates as great as 108Gy(Si or Ge)/s has been established. The procedures may be used for measurements at dose rates as great as 1010Gy(Si or Ge)/s; however, extra care must be taken. Above 108Gy/s the package response may dominate the device response for technologies such as complementary metal-oxide semiconductor, (CMOS)/silicon-on sapphire (SOS). Additional precautions are also required when measuring photocurrents of 10-9 A-s/Gy(Si or Ge) or lower. 1.2 Setup, calibration, and test circuit evaluation procedures are also included in this test method. 1.3 Because of the variability between device types and in the requirements of different applications, the dose rate range over which any specific test is to be conducted is not given in this test method but must be specified separately. 1.4 The values state in International System of Units (SI) are to be regarded as the standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Test Method for Measuring Steady-State Primary Photocurrent

ASTM E169-99 紫外线-可见光定量分析的一般技术的标准操作规程

1.1 These practices are intended to provide general information on the techniques most often used in ultraviolet and visible quantitative analysis. The purpose is to render unnecessary the repetition of these descriptions of techniques in individual methods for quantitative analysis. 1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practices for General Techniques of Ultraviolet-Visible Quantitative Analysis

ASTM F448-99(2005) 测量稳态原始光电流的标准试验方法

The steady-state photocurrent of a simple p-n junction diode is a directly measurable quantity that can be directly related to device response over a wide range of ionizing radiation. For more complex devices the junction photocurrent may not be directly related to device response. Zener Diode8212; In this device, the effect of the photocurrent on the Zener voltage rather than the photocurrent itself is usually most important. The device is most appropriately tested while biased in the Zener region. In testing Zener diodes or precision voltage regulators, extra precaution must be taken to make certain the photocurrent generated in the device during irradiations does not cause the voltage across the device to change during the test. Bipolar Transistor8212;As device geometries dictate that photocurrent from the base-collector junction be much greater than current from the base-emitter junction, measurements are usually made only on the collector-base junction with emitter open; however, sometimes, to obtain data for computer-aided circuit analysis, the emitter-base junction photocurrent is also measured. Junction Field-Effect Device8212;A proper photocurrent measurement requires that the source be shorted (dc) to the drain during measurement of the gate-channel photocurrent. In tetrode-connected devices, the two gate-channel junctions should be monitored separately. Insulated Gate Field-Effect Device8212;In this type of device, the true photocurrent is between the substrate and the channel, source, and drain regions. A current which can generate voltage that will turn on the device may be measured by the technique used here, but it is due to induced conductivity in the gate insulator and thus is not a junction photocurrent.1.1 This test method covers the measurement of steady-state primary photocurrent, Ipp, generated in semiconductor devices when these devices are exposd to ionizing radiation. These procedures are intended for the measurement of photocurrents greater than 10-9 A-s/Gy(Si or Ge), in cases for which the relaxation time of the device being measured is less than 25% of the pulse width of the ionizing source. The validity of these procedures for ionizing dose rates as great as 108Gy(Si or Ge)/s has been established. The procedures may be used for measurements at dose rates as great as 1010Gy(Si or Ge)/s; however, extra care must be taken. Above 108Gy/s the package response may dominate the device response for technologies such as complementary metal-oxide semiconductor, (CMOS)/silicon-on sapphire (SOS). Additional precautions are also required when measuring photocurrents of 10-9 A-s/Gy(Si or Ge) or lower. 1.2 Setup, calibration, and test circuit evaluation procedures are also included in this test method. 1.3 Because of the variability between device types and in the requirements of different applications, the dose rate range over which any specific test is to be conducted is not given in this test method but must be specified separately. 1.4 The values state in International System of Units (SI) are to be regarded as the standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Test Method for Measuring Steady-State Primary Photocurrent

JJG(建材) 134-1999 点光源检测装置

Point light detection device

JJG 45-1999 光学计检定规程

Verification Regulation of Optimeter

BS ISO 4037-1:1998 校准剂量计和剂量强度计及测定作为光子能函数灵敏度用X和γ基准放射线.第1部分:放射特性和产生方法

Specifies the characteristics and production methods of X and gamma reference radiation for calibrating dosemeters and rate dosemeters at air kerma rates from 10 Gy/h to 10 Gy/h and for determining their response as a function of photon energy.

X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy - Radiation characteristics and production methods

BS ISO 4037-2:1998 校准剂量计和剂量强度计及测定作为光子能函数灵敏度用X和γ基准放射线.能量范围在8 KeV-1,3 MeV和4 MeV-9 MeV放射保护用放射量测定

This part of ISO 4037 specifies the procedures for the dosimetry of X and gamma reference radiation for the calibration of radiation protection instruments over the energy range from approximately 8 keV to 1,3 MeV and from 4 MeV to 9 MeV. The methods of production and nominal kerma rates obtained from these reference radiations are given in ISO 4037-1.

X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy. Dosimetry for radiation protection over the energy ranges 8 keV to 1, 3 MeV and 4 MeV to 9 MeV

JJG 579-1998 验光镜片箱检定规程

Verification Regulation of Trial Case Lenses

JJG 939-1998 非色散原子荧光光度计检定规程

Verification Regulation of Non-disperse Atomic Fluoreacence Spectrometer

ASTM E991-98 荧光样品的色彩测量

1.1 This practice describes procedures for measuring the colors of fluorescent specimens as they would be perceived when illuminated by daylight, and for calculating tristimulus values and chromaticity coordinates for these conditions. 1.2 This practice applies to the use of the one-monochromator spectrophotometer employing polychromatic illumination of the specimen and monochromatic detection of the radiant energy. 1.3 This practice can be used to provide specifications for fluorescent colors in either the 1931 or the 1964 CIE system. 1.4 This practice covers only fluorescent specimens that emit visible light. It is not intended for use with other types of luminescent materials such as phosphorescent, chemiluminescent, or electroluminescent. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Color Measurement of Fluorescent Specimens

ISO 13321:1996 粒度分析 相关光子光谱学

This International Standard describes the application of photon correlation spectroscopy (PCS) to the measurement of an average particle size and a measure of the broadness of the size distribution of particles dispersed in liquids. It is applicable to particle sizes ranging from a few nanometres to about 1 μm, or to the onset of sedimentation. In the data analysis procedure (see annexes A and C) it is assumed that the particles are isotropic and spherically shaped. NOTE 1 — The technique is also known or referred to under other names, e.g. quasi-elastic light scattering (QELS) and dynamic light scattering (DLS).

Particle size analysis - Photon correlation spectroscopy

JJG 920-1996 漫透射视觉密度计检定规程

Verification Regulation of Diffuse Transmission Visual Densitometer

JJG 923-1996 啤酒色度仪检定规程

Verification Regulation of Beer(EBC)Colorimeter

JJG 311-1996 焦距仪检定规程

Verification Regulation of Focometer

JJG 580-1996 焦度计检定规程

Verification Regulation of Focimeters

JJG 922-1996 验光仪顶焦度标准器检定规程

Verification Regulation of The Standard Device of Vertex Power for Refractometers

ASTM E179-96 材料的反射和透射性能测量用几何条件的选择的标准指南

1.1 This guide is intended for use in selecting terminology, measurement scales, and instrumentation for describing or evaluating such appearance characteristics as glossiness, opacity, lightness, transparency, and haziness in terms of reflected or transmitted light. This guide does not consider the spectral variations responsible for color, but the geometric variables described herein can importantly affect instrumentally measured values of color. This guide is general in scope rather than specific as to instrument or material.

Standard Guide for Selection of Geometric Conditions for Measurement of Reflection and Transmission Properties of Materials

ASTM E179-96(2003) 材料的反射和透射性能测量用几何条件的选择的标准指南

1.1 This guide is intended for use in selecting terminology, measurement scales, and instrumentation for describing or evaluating such appearance characteristics as glossiness, opacity, lightness, transparency, and haziness in terms of reflected or transmitted light. This guide does not consider the spectral variations responsible for color, but the geometric variables described herein can importantly affect instrumentally measured values of color. This guide is general in scope rather than specific as to instrument or material.

Standard Guide for Selection of Geometric Conditions for Measurement of Reflection and Transmission Properties of Materials