L85 电子测量与仪器综合 标准查询与下载

ANSI/IEEE 1652:2008 自由场声学基准对电话测量的设施用标准

This standard provides the techniques and rationale for referencing acoustic telephony measurements to the free field. It applies to ear related measurements such as receive, sidetone and overall.

Standard for the Application of Free Field Acoustic Reference to Telephony Measurements

BS EN 55016-1-4:2007+A2:2009 无线电干扰和抗干扰测量装置和方法用规范.第1-4部分:无线电干扰和抗干扰测量装置.辅助设备.辐射干扰

This part of CISPR 16 is designated a basic standard, which specifies the characteristics and performance of equipment for the measurement of radiated disturbances in the frequency range 9 kHz to 18 GHz. Specifications for ancillary apparatus are included for: antennas and test sites, TEM cells, and reverberating chambers. The requirements of this publication must be complied with at all frequencies and for all levels of radiated disturbances within the CISPR indicating range of the measuring equipment. Methods of measurement are covered in Part 2-3, and further information on radio disturbance is given in Part 3 of CISPR 16. Uncertainties, statistics and limit modelling are covered in Part 4 of CISPR 16.

Specification for radio disturbance and immunity measuring apparatus and methods — Part 1-4: Radio disturbance and immunity measuring apparatus — Ancillary equipment — Radiated disturbances

DLA SMD-5962-95820 REV A-2007 抗辐射互补金属氧化物半导体静态时钟控制器或发生器硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS STATIC CLOCK CONTROLLER/GENERATOR, MONOLITHIC SILICON

NAVY MIL-G-3124 D NOTICE 2-2007 60赫兹交流电发生器(海军军舰用途)

MIL-G-3124D(SH), dated 14 October 1955, is hereby reactivated and may be used for either new or existing acquisition.

GENERATOR, ALTERNATING CURRENT, 60-HERTZ (NAVAL SHIPBOARD USE)

JEDEC JESD61A-2007 等温线的电迁移测试程序

As the copper damascene technology has gained widespread use for ULSI interconnections, a renewed interest has developed in fast wafer level reliability (WLR) measurements to evaluate electromigration. The standard package level reliability (PLR) tests, used in the semiconductor industry, are very expensive when applied to copper metallizations, in comparison with aluminum-based structures, due to the considerable cost of the high temperature environmental chambers required (a typical stress temperature is 350 °C) and to the time (weeks, months) required to perform some characterizations.

Isothermal Electromigration Test Procedure

DLA SMD-5962-06240 REV A-2007 硅单片装有TTL可兼容输入输出,有正相三态输出的奇偶发生器及奇偶校验器,耐辐射高级氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/ CHECKER WITH NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON

DLA SMD-5962-93141 REV A-2007 硅单片,TTL兼容输入,装有正向三态输出及奇偶发生器/校验器的9位可锁存收发器,改进型氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are flected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER, NON-INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

NAVY MIL-PRF-32236-2007 电解氯气发生器 (PECG)

This specification covers portable electrolytic chlorine generator (PECG) system components intended to provide protection against marine biological fouling (biofouling) in seawater piping systems on Navy Surface Ships.

GENERATOR, CHLORINE ?PORTABLE ELECTROLYTIC (PECG)

KS B ISO 15212-2:2006 振荡式密度计.第2部分:均质液体用过程测量仪器

이 규격은 진동식 밀도계의 기능 단위용(4.2 참조)과 같도록 진동식 밀도계를 위한 도량형

Oscillation-type density meters－Part 2：Process instruments for homogeneous liquids

KS B ISO 14839-2:2006 机械振动.装配有主动磁性轴承的旋转机械装置的振动.第2部分:振动评估

이 규격은 다음 두 가지 지표에 대하여 능동 자기 베어링(Active Magnetic Be

Mechanical vibration-Vibration of rotating machinery equippedwith N magnetic bearings-Part 2:Evaluation of vibration

KS B ISO 14835-1:2006 机械振动和冲击.末梢血管功能评定用冷刺激试验.第1部分:手指皮肤温度的测量和评估

이 규격은 다음 사항에 대하여 규정한다.a) 손가락 피부 온도(FST)의 측정 방법

Mechanical vibration and shock-Cold provocation tests for the assessment of peripheral vascular function-Part 1:Measurement and evaluation of finger skin temperature

KS B ISO 15218:2006 气压传动.3/2电磁阀.安装接口表面

이 규격은 3개의 유로(flow passage) 구멍, 2개의 고정 나사 구멍을 가진 마운

Pneumatic fluid power-3/2 solenoid valves-Mounting interface surfaces

JIS C 1005:2006 电气和电子测量设备.性能的表示

この規格は，主に産業用途の次の種類の電気及び電子計測器の性能仕様について規定する。—電気的量を測定する指示及び記録計器—電気的量を供給する実量器(3.2.3参照)—電気的出力信号を出力する測定装置の連鎖のすべての部分について，電気的手段を用いて非電気的量を測定する計器この規格は，通常の産業用途において定常状態(3.1.15参照)で動作する計器の性能仕様に適用する。この規格は，測定の不確かさを表示及び評価するためのGUM (2.参照)に規定する方法に基づき，(トレーサビリティ連鎖における無視できない不確かさを説明する方法を含む。)不確かさを表す区間を決定するのに用いなければならない統計的手法のためのGUMを引用している。この規格は，性能を考慮し，かつ，適合性試験を受ける計測器〔又は測定機器)の枠を超えて不確かさの適用に言及するものではない。この規格の目的は，仕様における一様性を確保し，その適用範囲内の計測器の不確かさを決定する方法を提供する。他のすペての必要な要求事項は，この規格の適用範囲内にある個々の種類の計測器に属する関連日本工業規格(以下. JISという。)による。例えぱ,計量特性及び計量特性の範囲並びに影響量及び影響量の規定の動作範囲の選択は，JISによる。備考この規格の対応国際規格を，次に示す。なお，対応の程度を表す記号は，ISO/IEC Guide 21に基づき， IDT(一致している)，MOD（修正している），NEQ(同等でない)とする。

Electrical and electronic measurement equipment -- Expression of performance

DLA SMD-5962-96583 REV B-2006 抗辐射数字的互补金属氧化物半导体,9-BIT奇偶发生器或监测器,晶体管兼容输入硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V).

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

DLA SMD-5962-96582 REV B-2006 抗辐射数字的互补金属氧化物半导体,9-BIT奇偶发生器或监测器,硅单片电路线型微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V).

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, MONOLITHIC SILICON

DLA MIL-PRF-25670 B (2)-2006 听筒器件 常规

This specification covers the general requirements for earphone elements. These are products, which have screw type terminals and are used in communications headsets for applications requiring communication within high-noise conditions at either ground-level or altitude. These parts meet established United States Air Force safety standards (see 6.1) for signal-generating equipment mounted in close-proximity to the human ear.

EARPHONE ELEMENTS, GENERAL SPECIFICATION FOR

JEDEC JESD78A-2006 IC锁定试验

This specification covers the I-test and the overvoltage latch-up testing of integrated circuits.

IC Latch-Up Test

DLA SMD-5962-92197 REV A-2006 硅单片,TTL兼容输入,装有8位奇偶发生器/校验器的8位双向收发器,改进型氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL BIDIRECTIONAL TRANSCEIVER WITH 8-BIT PARITY GENERATOR/CHECKER, THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

JEDEC JESD82-22-2006 FBDIMM诊断感官线路的使用仪器芯片数据单表

This device is a one-chip spectrum analyzer that operates in the frequency range from 1 to 2 GHz. It requires no external components except some filtering of the voltage supply (one inductor, one bypass capacitor).

Instrumentation Chip Data Sheet for FBDIMM Diagnostic Senselines

DLA SMD-5962-93097 REV A-2006 硅单片,TTL兼容输入,可编程视频同步信号发生器,改进型氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, PROGRAMMABLE VIDEO SYNC GENERATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON