L85 电子测量与仪器综合 标准查询与下载

DOD MIL-STD-2410 ADMIN NOTICE 1-2004 用于面貌和属性定义的地图,海图和测量学术语表

The purpose of this notice is to inform users of the change in name of the preparing activity from the Defense and Mapping Agency (DMA) to the National Geospatial-Intelligence Agency(NGA).

MAPPING, CHARTING, AND GEODESY REPRODUCTION AND PRINTING

DOD MIL-STD-2408 ADMIN NOTICE 3-2004 用于面貌和属性定义的地图,海图和测量学术语表

The purpose of this notice is to inform users of the change in name of the preparing activity from the Defense Mapping Agency (DMA) to the National Geospatial-Intelligence Agency (NGA).

MAPPING, CHARTING& GEODESY GLOSSARY OF FEATURE AND ATTRIBUTE DEFINITIONS

DOD MIL-STD-2402 ADMIN NOTICE 1-2004 用于图像产品的地图,海图和测量学符号

The purpose of this notice is to inform users of the change in name of the preparing activity from the Defense and Mapping Agency (DMA) to the National Geospatial-Intelligence Agency (NGA).

MAPPING, CHARTING, AND GEODESY SYMBOLS FOR GRAPHIC PRODUCTS

DOD MIL-STD-600001 ADMIN NOTICE 1-2004 地图,海图和测量学精确性

The purpose of this notice is to inform users of the change in name of the preparing activity from the Defense and Mapping Agency (DMA) to the National Geospatial-Intelligence Agency (NGA).

MAPPING, CHARTING, AND GEODESY ACCURACY

DOD MIL-T-89101 ADMIN NOTICE 1-2004 战术领港海图(TPC)

The purpose of this notice is to inform users of the change in name of the preparing activity from the Defense Mapping Agency (DMA) to the National Geospatial-Intelligence Agency (NGA).

TACTICAL PILOTAGE CHARTS (TPC)

DOD MIL-PRF-89201 B ADMIN NOTICE 1-2004 沿海港口,港口航道,海岸和航海总海图

Users should refer corrections, additions, and comments to the NGA Operational Help Desk: 1-800-455-0899; commercial 314-263-4864; DSN 693-4864; or write to: Director, National Geospatial-Intelligence Agency, ATTN: ES, Mail Stop L-88, 4600 Sangamore Road

HARBOR, APPROACH, COASTAL AND GENERAL NAUTICAL CHARTS

AIR FORCE A-A-58090 A-2004 甚高频全向( 无线电)信标/统一后勤支援的信号发生器

This Commercial Item Description (CID), describes a VOR/ILS/MB signal generator.This CID is meant as a minimum requirement for the VOR/ILS/MB signal generator in which only those manufacturers that meet or surpass the following requirements are supplied

GENERATOR, SIGNAL, VOR/ILS

JEDEC JESD22-A103C-2004 高温贮存

The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices.

High Temperature Storage Life

AIR FORCE A-A-59751-2004 带有内部跟踪发生器的2.9千兆赫射频频谱分析仪

This amendment forms a part of MIL-W-70434 (AR), dated 17 October 1983, and is approved for use by the US Army Armament, Munitions, and Chemical Command, and is available for use by all Departments and Agencies of the Department of Defense.

ANALYZER, SPECTRUM, 2.9 GHZ RF WITH INTERNAL TRACKING GENERATOR

JEDEC JESD22-B110A-2004 副装配机械冲击

The Subassembly Mechanical Shock Test Method is intended to describe a method to evaluate subassemblies for use in electrical equipment. It is intended to determine the compatibility of the subassemblies to withstand moderately severe shocks as a result of suddenly applied forces or abrupt change in motion produced by handling, transportation or field operation. Mechanical shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test intended for the subassembly and is a means to test the components in a mounted state.

Subassembly Mechanical Shock

JEDEC JESD91A-2003 为电子部件故障设备发展加速度模型的方法

The electronics industry often conducts testing at accelerated conditions to predict failure mechanism behavior at customer use conditions. As a consequence, the development of acceleration models for individual failure mechanisms in electronic components has become a crucial element in defining appropriate accelerated stress conditions and sequences for known mechanisms and establishing their rate of occurrence, with the goal of accurately predicting customer field performance.

Method for Developing Acceleration Models for Electronic Component Failure Mechanisms

DLA SMD-5962-92201 REV A-2003 硅单片,9位奇偶发生器/校验器,改进型氧化物半导体数字微型电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, NINE-BIT PARITY GENERATOR/CHECKER, MONOLITHIC SILICON

DLA SMD-5962-86027 REV D-2003 硅单块 4比特双极微程序序列发生器数字微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, 4-BIT BIPOLAR MICROPROGRAM SEQUENCER, MONOLITHIC SILICON

DLA SMD-5962-89441 REV C-2002 硅单片隔离反馈发生器线性微电路

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, ISOLATED FEEDBACK GENERATOR, MONOLITHIC SILICON

DLA SMD-5962-89535 REV C-2002 硅单片八双向收发器与8位奇偶发生器/检查器和三态输出肖特基促进双极数字微电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, OCTAL BIDIRECTIONAL TRANSCEIVER WITH 8-BIT PARITY GENERATOR/CHECKER AND THREE-STATE OUTPUTS, MONOLITHIC SILICON

DLA SMD-5962-86709 REV E-2002 硅单块 16X48X8现场可编程逻辑序列发生器主体存储器双极数字微型电路

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, DIGITAL, BIPOLAR, MEMORY, 16 X 48 X 8 FIELD PROGRAMMABLE LOGIC SEQUENCER, MONOLITHIC SILICON

WJ 2592-2002 双四象限光电探测器组件规范

Dual Quadrant Photodetector Assembly Specifications

SJ/T 2089-2001 电子测量仪器型号命名方法

本标准规定了电子测量仪器(以下简称仪器)的型号命名方法。 本标准适用于电子测量仪器、软件产品、附件、组合单元、模块化仪器及由仪器组成的测试系统等。

Type designation for electronic measuring instruments

DOD MIL-PRF-89201 B-2001 沿海港口,港口航道,海岸和航海总海图

These specifications define requirements for the National Imagery and Mapping Agency’s Harbor, Approach, Coastal and General nautical charts at all scales.

HARBOR, APPROACH, COASTAL AND GENERAL NAUTICAL CHARTS

DLA SMD-5962-01507-2001 单片硅两极化的数字微电路高速率预测进位发生器

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, DIGITAL, BIPOLAR, HIGH-SPEED LOOK-AHEAD CARRY GENERATOR, MONOLITHIC SILICON