N32 放大镜与显微镜 标准查询与下载

BS ISO 11884-1:2006 光学和光子学.体视显微镜的最低要求.通用体视显微镜

This part of ISO 11884 specifies minimum requirements for stereomicroscopes used mainly for visual observation for general use.

Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use

ISO 14880-2:2006 光学和光子学.显微物镜系列.第2部分:波像差的试验办法

This part of ISO 14880 specifies methods for testing wavefront aberrations for microlenses within microlens arrays. It is applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.

Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations

DIN ISO 8038-2:2006 光学和光学仪器.显微镜.物镜和相关目镜转换盘的螺纹.第2部分:M型螺纹25*0.75mm

This part of ISO 8038 specifies the dimensions of screw thread type M25 as one type of thread other than the thread type RMS for connecting a microscope objective to the nosepiece.

Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 2: Screw thread type M 25 x 0,75 mm (ISO 8038-2:2001);English version of DIN ISO 8038-2:2006

DIN 58629-1:2006 光学和光学仪器.显微镜学的词汇.第1部分:轻型显微镜

This part of DIN 58629 specifies terms and definitions to be used in the field of microscopy.

Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy

DIN ISO 8038-1:2006 光学和光学仪器.显微镜.物镜和相关目镜转换盘的螺纹.第1部分:RMS型螺纹(4/5in x 1/36in)

This part of ISO 8038 specifies the dimesions of screw thread type RMS as one type for thread for connecting a microscope objective to the nosepiece.

Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 1: Screw thread type RMS (4/5 in x 1/36 in) (ISO 8038-1:1997);English version of DIN ISO 8038-1:2006

ISO 11884-1:2006 光学和光子学.体视显微镜的最低要求.第1部分:通用体视显微镜

This part of ISO 11884 specifies minimum requirements for stereomicroscopes used mainly for visual observation for general use.

Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use

ISO 14880-1:2001/Cor 2:2005 光学和光子学.显微物镜系列.第1部分:词汇.技术勘误2

This is Technical Corrigendum 2 to ISO 14880-1-2001 (Optics and photonics — Microlens arrays — Parti: Vocabulary)

Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2

NF S10-132-1:2005 显微物镜系列.第1部分:词汇

Microlens array - Part 1 : vocabulary.

DIN EN ISO 14880-1:2005 显微透镜系列.第1部分:词汇

This part of ISO 14880 defines terms for microlens arrays. It applies to microlens arrays which consist of arrays of very small lenses formed inside or on one or more surfaces of a common substrate. The aim of this part of ISO 14880 is to improve the compatibility and interchangeability of lens arrays from different suppliers and to enhance the development of technology using microlens arrays.

Microlens array - Part 1: Vocabulary (ISO 14880-1:2001 + Corr. 1:2003); German version EN ISO 14880-1:2005

BS EN ISO 14880-1:2005 光学和光子学.显微透镜系列.词汇

This part of ISO 14880 defines terms for microlens arrays. It applies to microlens arrays which consist of arrays of very small lenses formed inside or on one or more surfaces of a common substrate. The aim of this part of ISO 14880 is to improve the compatibility and interchangeability of lens arrays from different suppliers and to enhance the development of technology using microlens arrays.

Optics and photonics - Microlens array - Vocabulary

DIN ISO 9345-2:2005 光学和光学仪器.显微镜.相对机械参考面的象距.第2部分:完全修正光学系统

Specification of the imaging distances of objectives," eyepieces and the focal length of ""normal"" tube lenses of microscopes with infinity-corrected optical systems.#",,#

Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems (ISO 9345-2:2003)

DIN ISO 12853:2005 光学和光学仪器.显微镜.提供给用户的信息

Specification of the format for the marking of data for optical characteristics on microscope objectives and eyepieces and the positioning of this data. Recommendation of the marking for additional information, particularly colour coding of rings designating the magnification of objectives and the immersion media with which they are used.#,,#

Optics and optical instruments - Microscopes - Information provided to the user (ISO 12853:1997)

ISO 16700:2004 微电子束分析.扫描电子显微镜.校准图像放大指南

This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.

Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

ASTM E2382-04 扫描隧道显微镜学和原子力显微镜学中扫描器和与触点相关物品的指南

1.1 All microscopes are subject to artifacts. The purpose of this document is to provide a description of commonly observed artifacts in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) relating to probe motion and geometric considerations of the tip and surface interaction, provide literature references of examples and, where possible, to offer an interpretation as to the source of the artifact. Because the scanned probe microscopy field is a burgeoning one, this document is not meant to be comprehensive but rather to serve as a guide to practicing microscopists as to possible pitfalls one may expect. The ability to recognize artifacts should assist in reliable evaluation of instrument operation and in reporting of data.1.2 A limited set of terms will be defined here. A full description of terminology relating to the description, operation, and calibration of STM and AFM instruments is beyond the scope of this document.

Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

ASTM E986-04(2010) 扫描电子显微镜射束尺寸特征描述标准实施规程

The traditional resolution test of the SEM requires, as a first step, a photomicrograph of a fine particulate sample taken at a high magnification. The operator is required to measure a distance on the photomicrograph between two adjacent, but separate edges. These edges are usually less than one millimetre apart. Their image quality is often less than optimum limited by the S/N ratio of a beam with such a small diameter and low current. Operator judgment is dependent on the individual acuity of the person making the measurement and can vary significantly. Use of this practice results in SEM electron beam size characterization which is significantly more reproducible than the traditional resolution test using a fine particulate sample.1.1 This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in the specimen, and operator-instrument-material interaction. However, the resolution for any set of conditions is limited by the size of the electron beam. This size can be quantified through the measurement of an effective apparent edge sharpness for a number of materials, two of which are suggested. This practice requires an SEM with the capability to perform line-scan traces, for example, Y-deflection waveform generation, for the suggested materials. The range of SEM magnification at which this practice is of utility is from 1000 to 50 000 × . Higher magnifications may be attempted, but difficulty in making precise measurements can be expected. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Scanning Electron Microscope Beam Size Characterization

ASTM E986-04 扫描电子显微镜射束尺寸特征描述标准实施规程

The traditional resolution test of the SEM requires, as a first step, a photomicrograph of a fine particulate sample taken at a high magnification. The operator is required to measure a distance on the photomicrograph between two adjacent, but separate edges. These edges are usually less than one millimetre apart. Their image quality is often less than optimum limited by the S/N ratio of a beam with such a small diameter and low current. Operator judgment is dependent on the individual acuity of the person making the measurement and can vary significantly. Use of this practice results in SEM electron beam size characterization which is significantly more reproducible than the traditional resolution test using a fine particulate sample.1.1 This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in the specimen, and operator-instrument-material interaction. However, the resolution for any set of conditions is limited by the size of the electron beam. This size can be quantified through the measurement of an effective apparent edge sharpness for a number of materials, two of which are suggested. This practice requires an SEM with the capability to perform line-scan traces, for example, Y-deflection waveform generation, for the suggested materials. The range of SEM magnification at which this practice is of utility is from 1000 to 50 000 x. Higher magnifications may be attempted, but difficulty in making precise measurements can be expected.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Scanning Electron Microscope Beam Size Characterization

DIN ISO 10937:2003 光学和光学仪器.显微镜.可互换目镜的直径

Specification of the diameter of interchangeable eyepieces for microscopes.

Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces (ISO 10937:2000)

ISO 14880-1:2001/Cor 1:2003 显微物镜系列.第1部分:词汇.技术勘误1

This is Technical Corrigendum 1 to ISO 14880-1-2001 (Microlens array — Parti: Vocabulary)

Microlens array - Part 1: Vocabulary; Technical Corrigendum 1

BS ISO 9345-2:2003 光学和光学仪器.显微镜.相对机械参考面的象距.无限大光学校正系统

This part of ISO 9345 specifies the imaging distances of objectives, eyepieces and the focal length of "normal" tube lenses of microscopes with infinity-corrected optical systems. NOTE A specific combination of eyepiece, objective and tube lens is frequently used to correct aberrations. Therefore the combination of an objective from one manufacturer and the tube lens or eyepiece from another manufacturer, although conforming to this part of ISO 9345, may cause errors in magnification and/or in optical performance.

Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems

DIN ISO 8037-1:2003 光学和光学仪器.显微镜.载玻片.第1部分:尺寸、光学性能和标志

Specification of requirements for dimensions, thickness, optical properties and tolerances for microscope slides used for transmitted light microscopy in the visible spectral range.

Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)