BS ISO 21222:2020
Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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- 标准号
- BS ISO 21222:2020
- 发布
- 2020年
- 发布单位
- 英国标准学会
- 当前最新
- BS ISO 21222:2020
- 适用范围
- What is ISO 21222 about? ISO 21222 is an international standard that discusses surface chemical analysis for scanning probe microscopy. ISO 21222 describes a procedure for the determination of elastic modulus for complaint materials using an atomic force microscope (AFM). Under ISO 21222 force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. ISO 21222 applies to complaint materials having elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contract radius between the AFM probe and the surface and is typically approximately 10-20nm.