BS ISO 21222:2020

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

BS ISO 21222:2020 发布历史

What is ISO 21222 about?   ISO 21222 is an international standard that discusses surface chemical analysis for scanning probe microscopy.   ISO 21222 describes a procedure for the determination of elastic modulus for complaint materials using an atomic force microscope (AFM). Under ISO 21222 force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory.   ISO 21222 applies to complaint materials having elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contract radius between the AFM probe and the surface and is typically approximately 10-20nm.

BS ISO 21222:2020由英国标准学会 GB-BSI 发布于 2020-02-29，并于 2020-02-29 实施。

BS ISO 21222:2020在国际标准分类中归属于: 71.040.40 化学分析。

BS ISO 21222:2020的历代版本如下：

• 2020年 BS ISO 21222:2020

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标准号

BS ISO 21222:2020

发布

2020年

发布单位

英国标准学会

当前最新

BS ISO 21222:2020

 

 

适用范围

What is ISO 21222 about?   ISO 21222 is an international standard that discusses surface chemical analysis for scanning probe microscopy.   ISO 21222 describes a procedure for the determination of elastic modulus for complaint materials using an atomic force microscope (AFM). Under ISO 21222 force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory.   ISO 21222 applies to complaint materials having elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contract radius between the AFM probe and the surface and is typically approximately 10-20nm.

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