TM-650 2.1.1F-2015

Microsectioning@ Manual and Semi or Automatic Method


 

 

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标准号
TM-650 2.1.1F-2015
发布日期
2015年06月01日
实施日期
2015年06月23日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IPC - Association Connecting Electronics Industries
引用标准
8
适用范围
This method is to be used as a guideline for preparing a metallographic specimen of printed boards. The finished microsection is used for evaluating the quality of the laminate system and plated structures (plated-through holes@ solder joints@ vias@ etc.). The plated structures can be evaluated for characteristics of the copper foils@ plating@ and/or coatings to determine compliance with applicable performance specification requirements. Metallographic sample preparation is regarded by many as essentially a highly developed skill; this method describes those techniques that have been found to be generally acceptable. It does not attempt to be so specific as to not allow acceptable variations that can differentiate metallographers. Furthermore@ the success of these techniques remains highly dependent upon the skill of the individual metallographer. Note: These microsection techniques are processes and are intended as guidelines and thus variations are allowed. Note: The use of the materials listed in Section 4 may be limited or forbidden in some environments. Please review the Safety Data Sheet (SDS) for the materials being used. Method A (Manual) Description Manual metallographic preparation of sample(s). Method B (Semi or Automatic) Description Semi or automatic metallographic preparation utilizing dedicated microsection equipment to prepare multiple samples.




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