GSO IEC 60749-17:2014
半导体仪器机械和气候测试方法 第17部分：中子辐射

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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标准号

GSO IEC 60749-17:2014

发布

2014年

发布单位

GSO

当前最新

GSO IEC 60749-17:2014

 

 

适用范围

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. The tests described herein are applicable to integrated circuits and discrete semiconductor devices. This test is intended for militaryand space-related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 4).

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