DIN EN 60749-17:2003
半导体器件.机械和气候试验方法.第17部分:中子辐射
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2003); German version EN 60749-17:2003
- 标准号
- DIN EN 60749-17:2003
- 发布
- 2003年
- 发布单位
- 德国标准化学会
- 当前最新
- DIN EN 60749-17:2003
- 被代替标准
- DIN EN 60749-17:2002
- 适用范围
- The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. The tests described herein are applicable to integrated circuits and discrete semiconductor devices. This test is intended for military- and space-related applications. It is a destructive test.