EIA-364-25E-2017

TP-25E Probe Damage Test Procedure for Electrical Connectors


 

 

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标准号
EIA-364-25E-2017
发布日期
2017年03月01日
实施日期
2017年04月07日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
ECIA - Electronic Components Industry Association
引用标准
13
适用范围
This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows: - to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing; - to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).

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