IEC 62526:2007(E) IEEE 1450.1-2005(E)
IEC 62526 版 1 (IEEE Std 1450.1(TM)-2005)：半导体设计环境标准测试接口语言 (STIL) 扩展标准

IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

IEC 62526:2007(E) IEEE 1450.1-2005(E) 发布历史

IEC 62526:2007(E) IEEE 1450.1-2005(E)由美国电气电子工程师学会 US-IEEE 发布于 2007-12-09，并于 2007-12-09 实施。

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

标准号

IEC 62526:2007(E) IEEE 1450.1-2005(E)

发布

2007年

发布单位

美国电气电子工程师学会

 

 

IEC 62526:2007(E) IEEE 1450.1-2005(E)相似标准