C62.35-2010

Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components


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标准号
C62.35-2010
发布日期
2010年03月25日
实施日期
2012年08月01日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
引用标准
26
适用范围
This standard applies to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD)@ which are one type of surge protective device component (SPDC). In this document@ these devices will be called ABDs. ABDs limit (clamp) transient voltages and divert transient currents. This standard contains terms@ symbols and definitions@ and provides test methods for verifying ratings and measuring device characteristics. Service conditions and failure mode are also provided. This standard may also apply to other silicon surge protective device components with similar V-I characteristics.




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