IEC 61124-2006
可靠性试验.恒定失效率和恒定失效强度的符合性试验

Reliability testing - Compliance tests for constant failure rate and constant failure intensity

IEC 61124-2006 发布历史

This International Standard gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of – failure rate, – failure intensity, – mean time to failure (MTTF), – mean operating time between failures (MTBF), conforms to a given requirement. It is assumed, except where otherwise stated, that during the accumulated test time, the times to failure or the operating times between failures are independent and identically exponentially distributed. This assumption implies that the failure rate or failure intensity is constant. Four types of test plans are described as follows: – truncated sequential tests; – time/failure terminated tests; – fixed calendar time terminated tests without replacement; – combined test plans. This standard does not cover guidance on how to plan, perform, analyse and report a test. This information can be found in IEC 60300-3-5. This standard does not describe test conditions. This information can be found in IEC 60605-2 and in IEC 60605, Parts 3-1 to 3-6.

IEC 61124-2006由国际电工委员会 IX-IEC 发布于 2006-03。

IEC 61124-2006 在中国标准分类中归属于: L05 可靠性和可维护性，在国际标准分类中归属于: 29.020 电气工程综合。

IEC 61124-2006的历代版本如下：

• 1997年07月 IEC 61124-1997 可靠性试验 恒定失效率和恒定失效密度假设下的验证试验
• 2006年03月 IEC 61124-2006 可靠性试验.恒定失效率和恒定失效强度的符合性试验
• 2012年05月 IEC 61124-2012 可靠性试验.恒定失效率和恒定失效强度的符合性试验
•  IEC 61124-2012 cor 1-2013 IEC 61124-2012 cor 1-2013

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标准号

IEC 61124-2006

发布日期

2006年03月

实施日期

废止日期

无

中国标准分类号

L05

国际标准分类号

29.020

发布单位

IX-IEC

代替标准

IEC 61124-2012

适用范围

This International Standard gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of – failure rate, – failure intensity, – mean time to failure (MTTF), – mean operating time between failures (MTBF), conforms to a given requirement. It is assumed, except where otherwise stated, that during the accumulated test time, the times to failure or the operating times between failures are independent and identically exponentially distributed. This assumption implies that the failure rate or failure intensity is constant. Four types of test plans are described as follows: – truncated sequential tests; – time/failure terminated tests; – fixed calendar time terminated tests without replacement; – combined test plans. This standard does not cover guidance on how to plan, perform, analyse and report a test. This information can be found in IEC 60300-3-5. This standard does not describe test conditions. This information can be found in IEC 60605-2 and in IEC 60605, Parts 3-1 to 3-6.

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