IEC/PAS 62500-2006
航空电子设备的过程管理.航空电子系统高速试验的规定和执行指南已作废

Process management for avionics - Guide for defining and performing highly accelerated tests in avionic systems

标准号

IEC/PAS 62500-2006

发布日期

2006年11月

实施日期

废止日期

2008-07

中国标准分类号

V40

国际标准分类号

03.100.50;31.020;49.020

发布单位

IX-IEC

代替标准

IEC/TS 62500-2008

适用范围

In an increasingly harsh economic context (tighter performance requirements, shorter development cycles, reduced cost of ownership, etc.), it is essential to ensure product maturity rapidly and, in any case, by the time of commissioning. It is with a view to remedying shortcomings in traditional development methods that "highly accelerated" tests have been developed. The main underlying principle behind this new type of test strategy is as follows: rather than reasoning in terms of conformity with a specification and simply performing conventional tests, we on the contrary attempt to push the product to its limits by applying environmental stresses and/or stimuli of levels higher than the specification. The aim is thus to take full advantage of current technologies, by eliminating defects which generate potential failures, as of the first prototypes. A well-conducted accelerated test process should, in a relatively short time, lead to a significant increase in the robustness of a product, as early as the initial prototypes stage at the beginning of the development phase, thus accelerating early maturity of this product. Furthermore, identification of the margins available on a "mature" product helps design and size its future environmental stress screening profile more accurately, by increasing the severity of the loadings applied to just what is needed, leading to a particularly significant boost in the efficiency of this environmental stress screening process.