IEC/PAS 62500-2006
航空电子设备的过程管理.航空电子系统高速试验的规定和执行指南已作废

Process management for avionics - Guide for defining and performing highly accelerated tests in avionic systems

IEC/PAS 62500-2006 发布历史

In an increasingly harsh economic context (tighter performance requirements, shorter development cycles, reduced cost of ownership, etc.), it is essential to ensure product maturity rapidly and, in any case, by the time of commissioning. It is with a view to remedying shortcomings in traditional development methods that "highly accelerated" tests have been developed. The main underlying principle behind this new type of test strategy is as follows: rather than reasoning in terms of conformity with a specification and simply performing conventional tests, we on the contrary attempt to push the product to its limits by applying environmental stresses and/or stimuli of levels higher than the specification. The aim is thus to take full advantage of current technologies, by eliminating defects which generate potential failures, as of the first prototypes. A well-conducted accelerated test process should, in a relatively short time, lead to a significant increase in the robustness of a product, as early as the initial prototypes stage at the beginning of the development phase, thus accelerating early maturity of this product. Furthermore, identification of the margins available on a "mature" product helps design and size its future environmental stress screening profile more accurately, by increasing the severity of the loadings applied to just what is needed, leading to a particularly significant boost in the efficiency of this environmental stress screening process.

IEC/PAS 62500-2006由国际电工委员会 IX-IEC 发布于 2006-11，于 2008-07 废止。

IEC/PAS 62500-2006 在中国标准分类中归属于: V40 电气系统与设备，在国际标准分类中归属于: 03.100.50 生产、生产管理,31.020 电子元器件综合,49.020 航空器和航天器综合。

IEC/PAS 62500-2006的历代版本如下：

• 2006年11月 IEC/PAS 62500-2006 航空电子设备的过程管理.航空电子系统高速试验的规定和执行指南

IEC/PAS 62500-2006 航空电子设备的过程管理.航空电子系统高速试验的规定和执行指南 于 2008-07 变更为 IEC/TS 62500-2008 电子设备用生产管理.航空器用定义和实施高速试验.应用指南。

标准号

IEC/PAS 62500-2006

发布日期

2006年11月

实施日期

废止日期

2008-07

中国标准分类号

V40

国际标准分类号

03.100.50;31.020;49.020

发布单位

IX-IEC

代替标准

IEC/TS 62500-2008

适用范围

In an increasingly harsh economic context (tighter performance requirements, shorter development cycles, reduced cost of ownership, etc.), it is essential to ensure product maturity rapidly and, in any case, by the time of commissioning. It is with a view to remedying shortcomings in traditional development methods that "highly accelerated" tests have been developed. The main underlying principle behind this new type of test strategy is as follows: rather than reasoning in terms of conformity with a specification and simply performing conventional tests, we on the contrary attempt to push the product to its limits by applying environmental stresses and/or stimuli of levels higher than the specification. The aim is thus to take full advantage of current technologies, by eliminating defects which generate potential failures, as of the first prototypes. A well-conducted accelerated test process should, in a relatively short time, lead to a significant increase in the robustness of a product, as early as the initial prototypes stage at the beginning of the development phase, thus accelerating early maturity of this product. Furthermore, identification of the margins available on a "mature" product helps design and size its future environmental stress screening profile more accurately, by increasing the severity of the loadings applied to just what is needed, leading to a particularly significant boost in the efficiency of this environmental stress screening process.