ISO/TS 10867-2010
纳米技术.单层碳纳米管使用的近红外光激发光谱仪的特性
Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
- 标准号
- ISO/TS 10867-2010
- 发布日期
- 2010年09月15日
- 实施日期
- 2010年09月15日
- 废止日期
- 无
- 中国标准分类号
- N52
- 国际标准分类号
- 07.030
- 发布单位
- IX-ISO
- 引用标准
- ISO/TS 80004-3
- 适用范围
- This Technical Specification provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. This Technical Specification provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities. The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.