BS EN 15991-2011 陶瓷原料和基本材料的测试.电热蒸发(ETV)电感耦合等离子体发射光谱法(ICP-OES)直接测定碳化硅粉末和颗粒中杂质质量分数
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)