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Secondary electron diffraction analysis

Secondary electron diffraction analysis, Total:74 items.

In the international standard classification, Secondary electron diffraction analysis involves: Vocabularies, Analytical chemistry, Optical equipment, Optics and optical measurements, Non-ferrous metals, Fuels, Petroleum products in general, Ceramics, Edible oils and fats. Oilseeds.

International Organization for Standardization (ISO), Secondary electron diffraction analysis

ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 23703:2022 Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 22415:2019 Surface chemical analysis — Secondary ion mass spectrometry — Method for determining yield volume in argon cluster sputter depth profiling of organic materials

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Secondary electron diffraction analysis

GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 30703-2014 Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size

国家市场监督管理总局、中国国家标准化管理委员会, Secondary electron diffraction analysis

GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

British Standards Institution (BSI), Secondary electron diffraction analysis

BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 23703:2022 Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
21/30395106 DC BS ISO 23703. Microbeam analysis. Guideline for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS EN 16294:2012 Petroleum products and fat and oil derivatives. Determination of phosphorus content in fatty acid methyl esters (FAME). Optical emission spectral analysis with inductively coupled plasma (ICP OES)
BS EN 14538:2006 Fat and oil derivatives. Fatty acid methyl ester (FAME). Determination of Ca, K, Mg and Na content by optical emission spectral analysis with inductively coupled plasma (ICP OES)

Association Francaise de Normalisation, Secondary electron diffraction analysis

NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
NF M07-151*NF EN 16294:2013 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Secondary electron diffraction analysis

GB/T 34172-2017 Microbeam analysis—Electron backscatter diffraction—Phase analysis method of metal and alloy

German Institute for Standardization, Secondary electron diffraction analysis

DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN EN 14538:2006-09 Fat and oil derivatives - Fatty acid methyl ester (FAME) - Determination of Ca, K, Mg and Na content by optical emission spectral analysis with inductively coupled plasma (ICP OES); German version EN 14538:2006
DIN EN 16294:2013-02 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES); German version EN 16294:2012

RU-GOST R, Secondary electron diffraction analysis

GOST R ISO 13067-2016 State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

Professional Standard - Electron, Secondary electron diffraction analysis

SJ/T 10553-2021 Method of emission specthchemical analysis of impurities in ZrO2 for use in electron ceramics
SJ/T 10552-2021 Method of emission specthchemical analysis of impurities in TiO2 for use in electron ceramics
SJ/T 10552-1994 Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramics
SJ/T 10553-1994 Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics
SJ/T 10551-1994 Method of emission spectrochemical analysis of impurities in AL203 for use in electron ceramics
SJ/T 10551-2021 The measurement of emission spectrum analysis for aluminium oxide used in electronic ceramics

工业和信息化部, Secondary electron diffraction analysis

YS/T 1342.4-2019 Methods for chemical analysis of secondary battery waste Part 4: Determination of lithium content Flame atomic absorption spectrometry
YS/T 1342.1-2019 Methods for chemical analysis of secondary battery waste Part 1: Determination of nickel content Diacetyl oxime gravimetric method and flame atomic absorption spectrometry
YS/T 1342.3-2019 Methods for chemical analysis of secondary battery waste Part 3: Determination of manganese content by potentiometric titration and flame atomic absorption spectrometry
YS/T 1342.2-2019 Methods for chemical analysis of secondary battery waste Part 2: Determination of cobalt content by potentiometric titration and flame atomic absorption spectrometry
YS/T 1200.2-2017 Methods for chemical analysis of 1,1'-bisdiphenylphosphine ferrocene palladium dichloride Part 2: Determination of amounts of lead, nickel, copper, cadmium, chromium, platinum, gold, rhodium and iridium by inductively coupled plasma atomic emission Spectr
YS/T 1395.2-2020 Methods for chemical analysis of palladium dichloride - Part 2: Determination of silver, gold, platinum, rhodium, iridium, lead, nickel, copper, iron, tin and chromium content by inductively coupled plasma atomic emission spectrometry

Lithuanian Standards Office , Secondary electron diffraction analysis

LST EN 16294-2013 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES)

Danish Standards Foundation, Secondary electron diffraction analysis

DS/EN 16294:2013 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES)

AENOR, Secondary electron diffraction analysis

UNE-EN 16294:2013 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES)

Professional Standard - Non-ferrous Metal, Secondary electron diffraction analysis

YS/T 1046.6-2015 Methods for chemical analysis of copper slag concentrates.Part 6:Determination of aluminum oxide content.Inductively coupled plasma atomic emission spectrometry
YS/T 715.2-2009 Methods for chemical analysis of selenium dioxide.Part 2:Determination of arsenic,cadmium,iron,mercury,lead contents.Inductively coupled plasma-atomic emission spectrometry

Professional Standard - Commodity Inspection, Secondary electron diffraction analysis

SN/T 3322.2-2015 Chemical analysis of titanium concentrates.Part 2:Determination of vanadium pentaoxide and chromium sesquioxide content.Inductively coupled plasma atomic emission spectrometry

KR-KS, Secondary electron diffraction analysis

KS L 1671-2023 Method for chemical analysis of titanium dioxide powders using inductively coupled plasma–optical emission spectrometry

ES-UNE, Secondary electron diffraction analysis

UNE-EN 14538:2006 Fat and oil derivatives - Fatty acid methyl ester (FAME) - Determination of Ca, K, Mg and Na content by optical emission spectral analysis with inductively coupled plasma (ICP OES)