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Electron Diffraction Secondary Diffraction

Electron Diffraction Secondary Diffraction, Total:67 items.

In the international standard classification, Electron Diffraction Secondary Diffraction involves: Vocabularies, Analytical chemistry, Optical equipment, Optics and optical measurements, Testing of metals, Protection against fire, Linear and angular measurements, Edible oils and fats. Oilseeds, Fuels, Petroleum products in general.

United States Navy, Electron Diffraction Secondary Diffraction

NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION

International Organization for Standardization (ISO), Electron Diffraction Secondary Diffraction

ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 23703:2022 Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Diffraction Secondary Diffraction

GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
GB/T 36165-2018 Determination of average grain size of metal.Electron backscatter diffraction (EBSD)method
GB/T 30703-2014 Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction

工业和信息化部, Electron Diffraction Secondary Diffraction

YB/T 4677-2018 Determination of Texture in Steel Electron Backscattered Diffraction (EBSD) Method

Shanghai Provincial Standard of the People's Republic of China, Electron Diffraction Secondary Diffraction

DB31/T 1156-2019 Electron backscatter diffraction method for technical identification of electrical fire melt marks

Association Francaise de Normalisation, Electron Diffraction Secondary Diffraction

NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

German Institute for Standardization, Electron Diffraction Secondary Diffraction

DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN EN 14107:2003-10 Fat and oil derivatives - Fatty acid methylesters (FAME) - Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry; German version EN 14107:2003

British Standards Institution (BSI), Electron Diffraction Secondary Diffraction

BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 23703:2022 Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
21/30395106 DC BS ISO 23703. Microbeam analysis. Guideline for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
BS EN 14107:2003 Fat and oil derivatives - Fatty acid methyl esters (FAME) - Determination of phosphorous content by inductively coupled plasma (ICP) emission spectrometry
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS EN 16294:2012 Petroleum products and fat and oil derivatives. Determination of phosphorus content in fatty acid methyl esters (FAME). Optical emission spectral analysis with inductively coupled plasma (ICP OES)

国家市场监督管理总局、中国国家标准化管理委员会, Electron Diffraction Secondary Diffraction

GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron Diffraction Secondary Diffraction

GB/T 34172-2017 Microbeam analysis—Electron backscatter diffraction—Phase analysis method of metal and alloy

RU-GOST R, Electron Diffraction Secondary Diffraction

GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer
GOST R ISO 13067-2016 State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

Professional Standard - Commodity Inspection, Electron Diffraction Secondary Diffraction

SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

IX-IX-IEC, Electron Diffraction Secondary Diffraction

IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy

American Society for Testing and Materials (ASTM), Electron Diffraction Secondary Diffraction

ASTM E2627-13 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM E2627-13(2019) Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM E2627-10 Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials

GOSTR, Electron Diffraction Secondary Diffraction

GOST R EN 14107-2009 Fat and oil derivatives. Fatty acid methylesters (FAME). Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry
GOST R EN 14538-2009 Fat and oil derivatives. Fatty acid methyl ester (FAME). Determination of Ca, K, Mg and Na content by optical emission spectral method with inductively coupled plasma (ICP OES)

AENOR, Electron Diffraction Secondary Diffraction

UNE-EN 14107:2003 Fat and oil derivatives. Fatty Acid Methyl Esters (FAME). Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry
UNE-EN 16294:2013 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES)

Danish Standards Foundation, Electron Diffraction Secondary Diffraction

DS/EN 14107:2003 Fat and oil derivatives - Fatty Acid Methyl Esters (FAME) - Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry
DS/EN 16294:2013 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES)

Lithuanian Standards Office , Electron Diffraction Secondary Diffraction

LST EN 14107-2004 Fat and oil derivatives - Fatty Acid Methyl Esters (FAME) - Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry
LST EN 16294-2013 Petroleum products and fat and oil derivatives - Determination of phosphorus content in fatty acid methyl esters (FAME) - Optical emission spectral analysis with inductively coupled plasma (ICP OES)

European Committee for Standardization (CEN), Electron Diffraction Secondary Diffraction

EN 14107:2003 Fat and oil derivatives - Fatty Acid Methyl Esters (FAME) - Determination of phosphorus content by inductivity coupled plasma (ICP) emission spectrometry

ZA-SANS, Electron Diffraction Secondary Diffraction

SANS 54107:2007 Fat and oil derivatives - Fatty Acid Methyl Esters (FAME) - Determination of phosphorus content by inductively coupled plasma (ICP) emission spectrometry