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mass spectrometer silicon

mass spectrometer silicon, Total:4 items.

In the international standard classification, mass spectrometer silicon involves: Analytical chemistry.

国家市场监督管理总局、中国国家标准化管理委员会, mass spectrometer silicon

• GB/T 40109-2021 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of boron in silicon

Japanese Industrial Standards Committee (JISC), mass spectrometer silicon

• JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, mass spectrometer silicon

• GB/T 32495-2016 Surface chemical analysis.Secondary-ion mass spectrometry.Method for depth profiling of arsenic in silicon

International Organization for Standardization (ISO), mass spectrometer silicon

• ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon

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